DE69021745T2 - Schaltung zur Prüfbarkeit. - Google Patents

Schaltung zur Prüfbarkeit.

Info

Publication number: DE69021745T2
Authority: DE; Germany
Prior art keywords: testability; circuit
Prior art date: 1989-02-07
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE69021745T

Other languages

English (en)

Other versions

DE69021745D1 (de

Inventor

Toshiyuki Yaguchi

Koichi Tanaka

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Toshiba Corp

Original Assignee

Toshiba Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1989-02-07

Filing date

1990-02-07

Publication date

1996-02-22

1990-02-07 Application filed by Toshiba Corp filed Critical Toshiba Corp

1995-09-28 Publication of DE69021745D1 publication Critical patent/DE69021745D1/de

1996-02-22 Application granted granted Critical

1996-02-22 Publication of DE69021745T2 publication Critical patent/DE69021745T2/de

2010-02-08 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test

DE69021745T 1989-02-07 1990-02-07 Schaltung zur Prüfbarkeit. Expired - Fee Related DE69021745T2 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1026593A JPH0758319B2 (ja)	1989-02-07	1989-02-07	テスト容易化回路

Publications (2)

Publication Number	Publication Date
DE69021745D1 DE69021745D1 (de)	1995-09-28
DE69021745T2 true DE69021745T2 (de)	1996-02-22

Family

ID=12197834

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69021745T Expired - Fee Related DE69021745T2 (de)	1989-02-07	1990-02-07	Schaltung zur Prüfbarkeit.

Country Status (5)

Country	Link
US (1)	US5161160A (de)
EP (1)	EP0382184B1 (de)
JP (1)	JPH0758319B2 (de)
KR (1)	KR930006094B1 (de)
DE (1)	DE69021745T2 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH0455778A (ja) *	1990-06-26	1992-02-24	Toshiba Corp	半導体装置のテスト方法
US5271019A (en) *	1991-03-15	1993-12-14	Amdahl Corporation	Scannable system with addressable scan reset groups
JPH06506333A (ja)	1991-03-18	1994-07-14	クウォリティ・セミコンダクタ・インコーポレイテッド	高速トランスミッションゲートスイッチ
US6208195B1 (en)	1991-03-18	2001-03-27	Integrated Device Technology, Inc.	Fast transmission gate switch
JP2822724B2 (ja) *	1991-09-20	1998-11-11	日本電気株式会社	論理集積回路
US5390191A (en) *	1992-01-31	1995-02-14	Sony Corporation	Apparatus and method for testing the interconnection between integrated circuits
US5270642A (en) *	1992-05-15	1993-12-14	Hewlett-Packard Company	Partitioned boundary-scan testing for the reduction of testing-induced damage
JP3247937B2 (ja) *	1992-09-24	2002-01-21	株式会社日立製作所	論理集積回路
US5951703A (en) *	1993-06-28	1999-09-14	Tandem Computers Incorporated	System and method for performing improved pseudo-random testing of systems having multi driver buses
JP3533451B2 (ja) *	1993-09-16	2004-05-31	クウォリティ・セミコンダクタ・インコーポレイテッド	高速伝送ゲートスイッチを用いたスキャンテスト回路
DE4340899A1 (de) *	1993-12-01	1995-06-08	Philips Patentverwaltung	Meßvorrichtung zum Testen der Verbindungen zwischen wenigstens zwei Baugruppen
US5636227A (en) *	1994-07-08	1997-06-03	Advanced Risc Machines Limited	Integrated circuit test mechansim and method
US5875197A (en) *	1995-05-15	1999-02-23	Motorola Inc.	Addressable serial test system
US5828985A (en) *	1996-11-20	1998-10-27	Advantest Corp.	Semiconductor test system
US5936976A (en) *	1997-07-25	1999-08-10	Vlsi Technology, Inc.	Selecting a test data input bus to supply test data to logical blocks within an integrated circuit
US6115836A (en) *	1997-09-17	2000-09-05	Cypress Semiconductor Corporation	Scan path circuitry for programming a variable clock pulse width
US6041427A (en) *	1997-10-27	2000-03-21	Vlsi Technology	Scan testable circuit arrangement
US6405335B1 (en)	1998-02-25	2002-06-11	Texas Instruments Incorporated	Position independent testing of circuits
US6728915B2 (en)	2000-01-10	2004-04-27	Texas Instruments Incorporated	IC with shared scan cells selectively connected in scan path
US6769080B2 (en)	2000-03-09	2004-07-27	Texas Instruments Incorporated	Scan circuit low power adapter with counter
JP3606520B2 (ja) *	2001-12-05	2005-01-05	沖電気工業株式会社	システムｌｓｉのテストパターン作成方法，システムｌｓｉのテストパターン作成装置，及びシステムｌｓｉのテスト方法
US20040076166A1 (en) *	2002-10-21	2004-04-22	Patenaude Jean-Marc Guy	Multi-service packet network interface
US7733900B2 (en) *	2002-10-21	2010-06-08	Broadcom Corporation	Multi-service ethernet-over-sonet silicon platform
US7163458B2 (en) *	2003-10-21	2007-01-16	David Schugar	Casino game for betting on bidirectional linear progression
US7294054B2 (en) *	2003-04-10	2007-11-13	David Schugar	Wagering method, device, and computer readable storage medium, for wagering on pieces in a progression
KR100768549B1 (ko) *	2006-07-27	2007-10-18	연세대학교 산학협력단	분할된 ｌｆｓｒ을 이용한 저전력 결정패턴 ｂｉｓｔ 방법및 장치
KR101116956B1 (ko) *	2009-08-31	2012-03-14	한양대학교 산학협력단	Ｔａｍ 기반 테스트가 가능한 시스템 온 칩 및 이의 테스트 방법
US8694843B2 (en) *	2011-08-04	2014-04-08	Texas Instruments Incorporated	Clock control of pipelined memory for improved delay fault testing

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH0668732B2 (ja) *	1984-11-21	1994-08-31	株式会社日立製作所	情報処理装置のスキヤン方式
US4698588A (en) *	1985-10-23	1987-10-06	Texas Instruments Incorporated	Transparent shift register latch for isolating peripheral ports during scan testing of a logic circuit
US4710931A (en) *	1985-10-23	1987-12-01	Texas Instruments Incorporated	Partitioned scan-testing system
JPS62228178A (ja) *	1986-03-29	1987-10-07	Toshiba Corp	論理回路の試験方式
JPS63148179A (ja) *	1986-12-10	1988-06-21	Nec Corp	スキヤン・パス回路
US4766593A (en) *	1986-12-22	1988-08-23	Motorola, Inc.	Monolithically integrated testable registers that cannot be directly addressed
JPS63182585A (ja) *	1987-01-26	1988-07-27	Toshiba Corp	テスト容易化機能を備えた論理回路
EP0292116A3 (de) *	1987-05-05	1990-08-01	Control Data Corporation	Prüfsystem für VLSI-Schaltungen
JPS643744A (en) *	1987-06-26	1989-01-09	Hitachi Ltd	Lsi test method
JP2725258B2 (ja) *	1987-09-25	1998-03-11	三菱電機株式会社	集積回路装置
JPH0820967B2 (ja) *	1987-09-25	1996-03-04	三菱電機株式会社	集積回路

1989
- 1989-02-07 JP JP1026593A patent/JPH0758319B2/ja not_active Expired - Fee Related
1990
- 1990-02-01 US US07/472,382 patent/US5161160A/en not_active Expired - Lifetime
- 1990-02-07 EP EP90102402A patent/EP0382184B1/de not_active Expired - Lifetime
- 1990-02-07 DE DE69021745T patent/DE69021745T2/de not_active Expired - Fee Related
- 1990-02-07 KR KR1019900001520A patent/KR930006094B1/ko not_active IP Right Cessation

Also Published As

Publication number	Publication date
JPH0758319B2 (ja)	1995-06-21
DE69021745D1 (de)	1995-09-28
EP0382184A3 (de)	1991-08-21
JPH02206772A (ja)	1990-08-16
KR930006094B1 (ko)	1993-07-07
KR900013315A (ko)	1990-09-05
US5161160A (en)	1992-11-03
EP0382184A2 (de)	1990-08-16
EP0382184B1 (de)	1995-08-23

Legal Events

Date	Code	Title	Description
1996-09-19	8364	No opposition during term of opposition
1999-03-11	8339	Ceased/non-payment of the annual fee

Publication	Publication Date	Title
DE69021745D1 (de)	1995-09-28	Schaltung zur Prüfbarkeit.
NO900543D0 (no)	1990-02-05	Fremgangsmaate for retningsbestemmelse i borehull.
DE68921269T2 (de)	1995-06-22	Integrierte Prüfschaltung.
DE69003429D1 (de)	1993-10-28	Tastkopf.
DE69022343D1 (de)	1995-10-19	Überprüfungssystem.
FI905832A (fi)	1991-05-29	Anordning.
DE69003149T2 (de)	1994-01-05	Tastkopf.
DE69019670T2 (de)	1996-02-22	Verzögerungsmessschaltung.
DE69005755T2 (de)	1994-05-26	Strommessschaltung.
DE69014371D1 (de)	1995-01-12	Schaltung zur Konstanthaltung eines Gleichstroms.
DE3885994T2 (de)	1994-04-28	Schaltung zur Bewegungsdetektion.
DE58908860D1 (de)	1995-02-16	Schaltungsanordnung zur Nachlaufsynchronisation.
DE69017601T2 (de)	1995-09-14	Schaltungsanordnung.
DE69008464T2 (de)	1994-11-24	Schaltungsanordnung.
DE68911084D1 (de)	1994-01-13	Sequenzvorrichtung zur Bildung von Schaltkreisen.
DE69017367T2 (de)	1995-07-27	Schaltung zur Prüfbarkeit.
DE69015694D1 (de)	1995-02-16	Gerät zur Prüfung der Leberfunktion.
DE58908705D1 (de)	1995-01-12	Schaltungsanordnung zur Produktsummenberechnung.
DE69018103T2 (de)	1995-08-03	Schaltung zur Einstellung der Phase.
NO900183D0 (no)	1990-01-12	Magnetkrets.
DE59009116D1 (de)	1995-06-29	Versuchsträger.
DE3853389D1 (de)	1995-04-27	Vorrichtung zur Prüfüng einer Schaltung.
DE69018211D1 (de)	1995-05-04	Einrichtung zur beseitigung von schaltungssignalverschlechterungen.
DE69023612T2 (de)	1996-04-25	Integrierte Schaltung.
FI895448A (fi)	1991-05-16	Antennsystem foer fordon.