JP2855019B2
(ja)
*
|
1992-02-10 |
1999-02-10 |
富士通株式会社 |
外部記憶装置のデータ保証方法及び外部記憶装置
|
US5349611A
(en)
*
|
1992-11-13 |
1994-09-20 |
Ampex Systems Corporation |
Recovering synchronization in a data stream
|
US5424881A
(en)
*
|
1993-02-01 |
1995-06-13 |
Cirrus Logic, Inc. |
Synchronous read channel
|
US5530705A
(en)
*
|
1995-02-08 |
1996-06-25 |
International Business Machines Corporation |
Soft error recovery system and method
|
US5727004A
(en)
*
|
1995-03-14 |
1998-03-10 |
Adaptive Networks, Inc. |
Method and apparatus for data encoding and communication over noisy media
|
JP2897679B2
(ja)
*
|
1995-03-28 |
1999-05-31 |
株式会社日立製作所 |
ディジタル信号記録装置
|
US5815514A
(en)
*
|
1996-02-09 |
1998-09-29 |
Overland Data, Inc. |
Variable rate bit inserter for digital data storage
|
US6167550A
(en)
*
|
1996-02-09 |
2000-12-26 |
Overland Data, Inc. |
Write format for digital data storage
|
US5712863A
(en)
*
|
1996-02-09 |
1998-01-27 |
Overland Data Inc |
Randomizing encoder for digital data storage
|
US6543024B2
(en)
|
1996-02-09 |
2003-04-01 |
Overland Storage, Inc. |
Write format for digital data storage
|
US5931968A
(en)
*
|
1996-02-09 |
1999-08-03 |
Overland Data, Inc. |
Digital data recording channel
|
US5889796A
(en)
*
|
1996-10-17 |
1999-03-30 |
Maxtor Corporation |
Method of insuring data integrity with a data randomizer
|
US6219814B1
(en)
|
1996-12-23 |
2001-04-17 |
International Business Machines Corporation |
Method and apparatus for selectively varying error correcting code (ECC) power in a direct access storage device (DASD)
|
US6044487A
(en)
*
|
1997-12-16 |
2000-03-28 |
International Business Machines Corporation |
Majority voting scheme for hard error sites
|
JP3910736B2
(ja)
|
1998-07-27 |
2007-04-25 |
株式会社東芝 |
ディスク記憶装置及び同装置におけるサーボセクタアドレスエラー検出方法
|
US6597526B1
(en)
|
1998-08-14 |
2003-07-22 |
Overland Storage, Inc. |
Magnetic tape drive apparatus including a variable rate encoder
|
US6968493B1
(en)
*
|
1999-09-14 |
2005-11-22 |
Maxtor Corporation |
Randomizer systems for producing multiple-symbol randomizing sequences
|
US6714144B1
(en)
|
2000-10-23 |
2004-03-30 |
Cirrus Logic, Inc. |
Data randomization in a data storage system
|
US6384747B1
(en)
|
2000-10-23 |
2002-05-07 |
Cirrus Logic, Inc. |
Data encoding to provide run-length control in a data storage system
|
US7228480B1
(en)
*
|
2001-12-11 |
2007-06-05 |
Maxtor Corporation |
Rate-1 coding for increasing timing information in recording data
|
US7158058B1
(en)
|
2002-12-09 |
2007-01-02 |
Marvell International Ltd. |
Method and apparatus for generating a seed set in a data dependent seed selector
|
JP4135497B2
(ja)
|
2002-12-26 |
2008-08-20 |
株式会社日立製作所 |
データ再生方法及びデータ再生装置
|
US7284184B2
(en)
*
|
2003-01-30 |
2007-10-16 |
International Business Machines Corporation |
Forward error correction scheme compatible with the bit error spreading of a scrambler
|
US7810012B1
(en)
*
|
2003-08-06 |
2010-10-05 |
Oracle America, Inc. |
Format for randomized data block in a storage device
|
JP4571523B2
(ja)
*
|
2005-03-04 |
2010-10-27 |
ルネサスエレクトロニクス株式会社 |
スクランブル回路、エンコード装置、エンコード方法及び記録装置
|
US7478220B2
(en)
*
|
2005-06-23 |
2009-01-13 |
International Business Machines Corporation |
Method, apparatus, and product for prohibiting unauthorized access of data stored on storage drives
|
US7440224B2
(en)
*
|
2006-01-23 |
2008-10-21 |
Toshiba Corporation |
Disk drive servo
|
US7721049B2
(en)
*
|
2006-03-27 |
2010-05-18 |
Kabuhsiki Kaisha Toshiba |
Disk drive write method
|
US7697326B2
(en)
|
2006-05-12 |
2010-04-13 |
Anobit Technologies Ltd. |
Reducing programming error in memory devices
|
WO2007132456A2
(en)
|
2006-05-12 |
2007-11-22 |
Anobit Technologies Ltd. |
Memory device with adaptive capacity
|
CN103280239B
(zh)
*
|
2006-05-12 |
2016-04-06 |
苹果公司 |
存储设备中的失真估计和消除
|
KR101202537B1
(ko)
|
2006-05-12 |
2012-11-19 |
애플 인크. |
메모리 디바이스를 위한 결합된 왜곡 추정 및 에러 보정 코딩
|
US7468859B2
(en)
*
|
2006-05-31 |
2008-12-23 |
Kabushiki Kaisha Toshiba |
Voice coil motor effective resistance determination
|
US7436616B2
(en)
*
|
2006-05-31 |
2008-10-14 |
Toshiba Corporation |
Current pulsing for unloading
|
US7457066B2
(en)
*
|
2006-05-31 |
2008-11-25 |
Kabushiki Kiasha Toshiba |
Method and apparatus for phase-shift null-burst-pattern
|
US20070279790A1
(en)
*
|
2006-05-31 |
2007-12-06 |
Tanner Brian K |
Adjustable output voltage regulator for disk drive
|
US20070279788A1
(en)
*
|
2006-05-31 |
2007-12-06 |
Toshiba America Information Systems, Inc. |
Method and apparatus to perform defect scanning
|
US20070279781A1
(en)
*
|
2006-05-31 |
2007-12-06 |
Toshiba America Information Systems, Inc. |
Channel training method and apparatus
|
US7453660B2
(en)
*
|
2006-05-31 |
2008-11-18 |
Kabushiki Kaisha Toshiba |
Shock feed forward adaptive filters
|
WO2008026203A2
(en)
*
|
2006-08-27 |
2008-03-06 |
Anobit Technologies |
Estimation of non-linear distortion in memory devices
|
US7885112B2
(en)
*
|
2007-09-07 |
2011-02-08 |
Sandisk Corporation |
Nonvolatile memory and method for on-chip pseudo-randomization of data within a page and between pages
|
US7734861B2
(en)
*
|
2006-09-08 |
2010-06-08 |
Sandisk Corporation |
Pseudo random and command driven bit compensation for the cycling effects in flash memory
|
US7606966B2
(en)
*
|
2006-09-08 |
2009-10-20 |
Sandisk Corporation |
Methods in a pseudo random and command driven bit compensation for the cycling effects in flash memory
|
CN101601094B
(zh)
*
|
2006-10-30 |
2013-03-27 |
苹果公司 |
使用多个门限读取存储单元的方法
|
WO2008053472A2
(en)
*
|
2006-10-30 |
2008-05-08 |
Anobit Technologies Ltd. |
Reading memory cells using multiple thresholds
|
US7924648B2
(en)
*
|
2006-11-28 |
2011-04-12 |
Anobit Technologies Ltd. |
Memory power and performance management
|
US7706182B2
(en)
*
|
2006-12-03 |
2010-04-27 |
Anobit Technologies Ltd. |
Adaptive programming of analog memory cells using statistical characteristics
|
US8151163B2
(en)
|
2006-12-03 |
2012-04-03 |
Anobit Technologies Ltd. |
Automatic defect management in memory devices
|
US7900102B2
(en)
|
2006-12-17 |
2011-03-01 |
Anobit Technologies Ltd. |
High-speed programming of memory devices
|
US8127200B2
(en)
*
|
2006-12-24 |
2012-02-28 |
Sandisk Il Ltd. |
Flash memory device and system with randomizing for suppressing errors
|
US8370561B2
(en)
*
|
2006-12-24 |
2013-02-05 |
Sandisk Il Ltd. |
Randomizing for suppressing errors in a flash memory
|
US8151166B2
(en)
|
2007-01-24 |
2012-04-03 |
Anobit Technologies Ltd. |
Reduction of back pattern dependency effects in memory devices
|
US7751240B2
(en)
*
|
2007-01-24 |
2010-07-06 |
Anobit Technologies Ltd. |
Memory device with negative thresholds
|
CN101715595A
(zh)
*
|
2007-03-12 |
2010-05-26 |
爱诺彼得技术有限责任公司 |
存储器单元读取阈的自适应估计
|
US8001320B2
(en)
|
2007-04-22 |
2011-08-16 |
Anobit Technologies Ltd. |
Command interface for memory devices
|
WO2008139441A2
(en)
|
2007-05-12 |
2008-11-20 |
Anobit Technologies Ltd. |
Memory device with internal signal processing unit
|
US8234545B2
(en)
|
2007-05-12 |
2012-07-31 |
Apple Inc. |
Data storage with incremental redundancy
|
US7925936B1
(en)
|
2007-07-13 |
2011-04-12 |
Anobit Technologies Ltd. |
Memory device with non-uniform programming levels
|
US8259497B2
(en)
*
|
2007-08-06 |
2012-09-04 |
Apple Inc. |
Programming schemes for multi-level analog memory cells
|
US8174905B2
(en)
*
|
2007-09-19 |
2012-05-08 |
Anobit Technologies Ltd. |
Programming orders for reducing distortion in arrays of multi-level analog memory cells
|
US7773413B2
(en)
*
|
2007-10-08 |
2010-08-10 |
Anobit Technologies Ltd. |
Reliable data storage in analog memory cells in the presence of temperature variations
|
US8000141B1
(en)
|
2007-10-19 |
2011-08-16 |
Anobit Technologies Ltd. |
Compensation for voltage drifts in analog memory cells
|
WO2009050703A2
(en)
*
|
2007-10-19 |
2009-04-23 |
Anobit Technologies |
Data storage in analog memory cell arrays having erase failures
|
US8068360B2
(en)
|
2007-10-19 |
2011-11-29 |
Anobit Technologies Ltd. |
Reading analog memory cells using built-in multi-threshold commands
|
WO2009063450A2
(en)
*
|
2007-11-13 |
2009-05-22 |
Anobit Technologies |
Optimized selection of memory units in multi-unit memory devices
|
US8225181B2
(en)
*
|
2007-11-30 |
2012-07-17 |
Apple Inc. |
Efficient re-read operations from memory devices
|
US8131920B2
(en)
*
|
2007-12-06 |
2012-03-06 |
Hitachi Global Storage Technologies, Netherlands B.V. |
Method and system for dynamically allocating read and write sequence randomizer
|
US8209588B2
(en)
|
2007-12-12 |
2012-06-26 |
Anobit Technologies Ltd. |
Efficient interference cancellation in analog memory cell arrays
|
US8456905B2
(en)
*
|
2007-12-16 |
2013-06-04 |
Apple Inc. |
Efficient data storage in multi-plane memory devices
|
US8085586B2
(en)
*
|
2007-12-27 |
2011-12-27 |
Anobit Technologies Ltd. |
Wear level estimation in analog memory cells
|
US8156398B2
(en)
|
2008-02-05 |
2012-04-10 |
Anobit Technologies Ltd. |
Parameter estimation based on error correction code parity check equations
|
US7924587B2
(en)
|
2008-02-21 |
2011-04-12 |
Anobit Technologies Ltd. |
Programming of analog memory cells using a single programming pulse per state transition
|
US7864573B2
(en)
*
|
2008-02-24 |
2011-01-04 |
Anobit Technologies Ltd. |
Programming analog memory cells for reduced variance after retention
|
US8230300B2
(en)
|
2008-03-07 |
2012-07-24 |
Apple Inc. |
Efficient readout from analog memory cells using data compression
|
US8400858B2
(en)
|
2008-03-18 |
2013-03-19 |
Apple Inc. |
Memory device with reduced sense time readout
|
US8059457B2
(en)
|
2008-03-18 |
2011-11-15 |
Anobit Technologies Ltd. |
Memory device with multiple-accuracy read commands
|
US7924613B1
(en)
*
|
2008-08-05 |
2011-04-12 |
Anobit Technologies Ltd. |
Data storage in analog memory cells with protection against programming interruption
|
US8498151B1
(en)
|
2008-08-05 |
2013-07-30 |
Apple Inc. |
Data storage in analog memory cells using modified pass voltages
|
US8949684B1
(en)
|
2008-09-02 |
2015-02-03 |
Apple Inc. |
Segmented data storage
|
US8169825B1
(en)
|
2008-09-02 |
2012-05-01 |
Anobit Technologies Ltd. |
Reliable data storage in analog memory cells subjected to long retention periods
|
US8910009B1
(en)
*
|
2008-09-08 |
2014-12-09 |
Marvell International Ltd. |
Method and apparatus for enhancing error detection in data transmission
|
US8482978B1
(en)
|
2008-09-14 |
2013-07-09 |
Apple Inc. |
Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
|
US8000135B1
(en)
|
2008-09-14 |
2011-08-16 |
Anobit Technologies Ltd. |
Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
|
KR101554159B1
(ko)
*
|
2008-10-08 |
2015-09-21 |
삼성전자주식회사 |
데이터 저장 장치 및 이를 포함하는 데이터 저장 시스템
|
US8239734B1
(en)
|
2008-10-15 |
2012-08-07 |
Apple Inc. |
Efficient data storage in storage device arrays
|
US8261159B1
(en)
|
2008-10-30 |
2012-09-04 |
Apple, Inc. |
Data scrambling schemes for memory devices
|
US8208304B2
(en)
*
|
2008-11-16 |
2012-06-26 |
Anobit Technologies Ltd. |
Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N
|
US8248831B2
(en)
*
|
2008-12-31 |
2012-08-21 |
Apple Inc. |
Rejuvenation of analog memory cells
|
US8397131B1
(en)
|
2008-12-31 |
2013-03-12 |
Apple Inc. |
Efficient readout schemes for analog memory cell devices
|
US8924661B1
(en)
|
2009-01-18 |
2014-12-30 |
Apple Inc. |
Memory system including a controller and processors associated with memory devices
|
KR101519626B1
(ko)
*
|
2009-02-27 |
2015-05-14 |
삼성전자주식회사 |
반도체 메모리 장치 및 그것의 데이터 처리 방법
|
US8228701B2
(en)
|
2009-03-01 |
2012-07-24 |
Apple Inc. |
Selective activation of programming schemes in analog memory cell arrays
|
US8832354B2
(en)
*
|
2009-03-25 |
2014-09-09 |
Apple Inc. |
Use of host system resources by memory controller
|
US8259506B1
(en)
|
2009-03-25 |
2012-09-04 |
Apple Inc. |
Database of memory read thresholds
|
US8238157B1
(en)
|
2009-04-12 |
2012-08-07 |
Apple Inc. |
Selective re-programming of analog memory cells
|
US8479080B1
(en)
|
2009-07-12 |
2013-07-02 |
Apple Inc. |
Adaptive over-provisioning in memory systems
|
US8495465B1
(en)
|
2009-10-15 |
2013-07-23 |
Apple Inc. |
Error correction coding over multiple memory pages
|
US8677054B1
(en)
|
2009-12-16 |
2014-03-18 |
Apple Inc. |
Memory management schemes for non-volatile memory devices
|
US8694814B1
(en)
|
2010-01-10 |
2014-04-08 |
Apple Inc. |
Reuse of host hibernation storage space by memory controller
|
US8677203B1
(en)
|
2010-01-11 |
2014-03-18 |
Apple Inc. |
Redundant data storage schemes for multi-die memory systems
|
US8694853B1
(en)
|
2010-05-04 |
2014-04-08 |
Apple Inc. |
Read commands for reading interfering memory cells
|
KR101678407B1
(ko)
*
|
2010-05-10 |
2016-11-23 |
삼성전자주식회사 |
데이터 저장 장치 및 그것의 프로그램 방법
|
US8572423B1
(en)
|
2010-06-22 |
2013-10-29 |
Apple Inc. |
Reducing peak current in memory systems
|
US8595591B1
(en)
|
2010-07-11 |
2013-11-26 |
Apple Inc. |
Interference-aware assignment of programming levels in analog memory cells
|
US9104580B1
(en)
|
2010-07-27 |
2015-08-11 |
Apple Inc. |
Cache memory for hybrid disk drives
|
US8645794B1
(en)
|
2010-07-31 |
2014-02-04 |
Apple Inc. |
Data storage in analog memory cells using a non-integer number of bits per cell
|
US8856475B1
(en)
|
2010-08-01 |
2014-10-07 |
Apple Inc. |
Efficient selection of memory blocks for compaction
|
US8493781B1
(en)
|
2010-08-12 |
2013-07-23 |
Apple Inc. |
Interference mitigation using individual word line erasure operations
|
US8694854B1
(en)
|
2010-08-17 |
2014-04-08 |
Apple Inc. |
Read threshold setting based on soft readout statistics
|
US9021181B1
(en)
|
2010-09-27 |
2015-04-28 |
Apple Inc. |
Memory management for unifying memory cell conditions by using maximum time intervals
|
US8843693B2
(en)
|
2011-05-17 |
2014-09-23 |
SanDisk Technologies, Inc. |
Non-volatile memory and method with improved data scrambling
|
US11515897B2
(en)
|
2015-05-29 |
2022-11-29 |
SK Hynix Inc. |
Data storage device
|
KR102285940B1
(ko)
*
|
2015-05-29 |
2021-08-05 |
에스케이하이닉스 주식회사 |
데이터 처리 회로, 데이터 처리 회로를 포함하는 데이터 저장 장치 및 그것의 동작 방법
|
US10396827B2
(en)
|
2015-09-25 |
2019-08-27 |
SK Hynix Inc. |
Data storage device
|
US11177835B2
(en)
|
2015-09-25 |
2021-11-16 |
SK Hynix Inc. |
Data storage device
|
US11611359B2
(en)
*
|
2015-05-29 |
2023-03-21 |
SK Hynix Inc. |
Data storage device
|
US11556416B2
(en)
|
2021-05-05 |
2023-01-17 |
Apple Inc. |
Controlling memory readout reliability and throughput by adjusting distance between read thresholds
|
US11847342B2
(en)
|
2021-07-28 |
2023-12-19 |
Apple Inc. |
Efficient transfer of hard data and confidence levels in reading a nonvolatile memory
|