DE69026732T2 - Sonde - Google Patents
SondeInfo
- Publication number
- DE69026732T2 DE69026732T2 DE69026732T DE69026732T DE69026732T2 DE 69026732 T2 DE69026732 T2 DE 69026732T2 DE 69026732 T DE69026732 T DE 69026732T DE 69026732 T DE69026732 T DE 69026732T DE 69026732 T2 DE69026732 T2 DE 69026732T2
- Authority
- DE
- Germany
- Prior art keywords
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
- G01Q30/025—Optical microscopes coupled with SPM
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/02—Probe holders
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/861—Scanning tunneling probe
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3110489 | 1989-02-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69026732D1 DE69026732D1 (de) | 1996-06-05 |
DE69026732T2 true DE69026732T2 (de) | 1996-12-05 |
Family
ID=12322095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69026732T Expired - Fee Related DE69026732T2 (de) | 1989-02-13 | 1990-02-07 | Sonde |
Country Status (4)
Country | Link |
---|---|
US (1) | US5041783A (de) |
EP (1) | EP0383182B1 (de) |
JP (1) | JP2985153B2 (de) |
DE (1) | DE69026732T2 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5260824A (en) * | 1989-04-24 | 1993-11-09 | Olympus Optical Co., Ltd. | Atomic force microscope |
JP2815196B2 (ja) * | 1989-10-02 | 1998-10-27 | オリンパス光学工業株式会社 | 微細表面形状計測装置 |
JPH03218042A (ja) * | 1990-01-23 | 1991-09-25 | Toshiba Corp | 高周波用固定カード |
US5229607A (en) * | 1990-04-19 | 1993-07-20 | Hitachi, Ltd. | Combination apparatus having a scanning electron microscope therein |
KR0138752B1 (ko) * | 1990-09-03 | 1998-06-15 | 이노우에 아키라 | 프로우브 장치 |
DE4041027C1 (de) * | 1990-12-20 | 1992-06-25 | Siemens Nixdorf Informationssysteme Ag, 4790 Paderborn, De | |
US5283437A (en) * | 1990-12-21 | 1994-02-01 | International Business Machines Corporation | Pneumatically and electrostatically driven scanning tunneling microscope |
DE69023347T2 (de) * | 1990-12-21 | 1996-05-30 | Ibm | Integriertes Rastertunnelmikroskop mit pneumatischer und elektrostatischer Steuerung und Verfahren zum Herstellen desselben. |
US5157251A (en) * | 1991-03-13 | 1992-10-20 | Park Scientific Instruments | Scanning force microscope having aligning and adjusting means |
DE69226554T2 (de) * | 1991-03-15 | 1999-03-04 | Nikon Corp | Mikroskop bestehend aus Rastertunnelmikroskop kombiniert mit optischem Mikroskop |
DE69232905T2 (de) * | 1991-08-05 | 2003-08-21 | Koninkl Philips Electronics Nv | Elektrooptische Messanordnung zum Messen eines elektrischen Signals in einem elektronischen Bauteil |
JPH0540034A (ja) * | 1991-08-08 | 1993-02-19 | Nikon Corp | 複合型顕微鏡 |
US5267471A (en) * | 1992-04-30 | 1993-12-07 | Ibm Corporation | Double cantilever sensor for atomic force microscope |
US5260577A (en) * | 1992-11-09 | 1993-11-09 | International Business Machines Corp. | Sample carriage for scanning probe microscope |
US5426302A (en) * | 1993-04-28 | 1995-06-20 | Board Of Regents, University Of Texas | Optically guided macroscopic-scan-range/nanometer resolution probing system |
DE4314301C1 (de) * | 1993-04-30 | 1994-05-05 | Imm Inst Mikrotech | Abtastvorrichtung zur Untersuchung von Oberflächenstrukturen mit Auflösung im submicron-Bereich und Verfahren zu deren Herstellung |
JPH0798329A (ja) * | 1993-09-28 | 1995-04-11 | Hamamatsu Photonics Kk | E−oプローブ |
JP3003974B2 (ja) * | 1993-11-22 | 2000-01-31 | 富士通株式会社 | 電圧・変位検出プローブ及びこれを用いた電圧・変位測定装置 |
JPH0862229A (ja) * | 1994-08-22 | 1996-03-08 | Ryoden Semiconductor Syst Eng Kk | 薄膜膜質測定装置、薄膜膜質測定方法、及び半導体装置の製造方法 |
US5874668A (en) * | 1995-10-24 | 1999-02-23 | Arch Development Corporation | Atomic force microscope for biological specimens |
US5726454A (en) * | 1996-05-03 | 1998-03-10 | Taiwan Semiconductor Manufacturing Company, Ltd. | Tripod for polishing a sample and for viewing the sample under a microscope |
JP2005069972A (ja) * | 2003-08-27 | 2005-03-17 | Hitachi Kenki Fine Tech Co Ltd | 走査型プローブ顕微鏡の探針移動制御方法 |
US7348076B2 (en) | 2004-04-08 | 2008-03-25 | Saint-Gobain Ceramics & Plastics, Inc. | Single crystals and methods for fabricating same |
US7521784B2 (en) * | 2004-12-17 | 2009-04-21 | Hewlett-Packard Development Company, L.P. | System for coupling wire to semiconductor region |
US8020216B2 (en) * | 2005-05-10 | 2011-09-13 | The Regents Of The University Of California | Tapered probe structures and fabrication |
RS63843B1 (sr) * | 2013-08-06 | 2023-01-31 | Univ Basel | Držač uzorka za mas |
CN107132379B (zh) * | 2017-05-24 | 2019-10-22 | 中国科学院宁波材料技术与工程研究所 | 一种用于扫描探针显微镜的探针夹持装置 |
CN109406829B (zh) * | 2017-08-17 | 2021-02-19 | 中国科学院物理研究所 | 扫描探针显微镜的扫描头 |
US11047650B2 (en) | 2017-09-29 | 2021-06-29 | Saint-Gobain Ceramics & Plastics, Inc. | Transparent composite having a laminated structure |
US11372227B2 (en) | 2019-02-20 | 2022-06-28 | Raytheon Company | Microsection sample stabilizer |
CN115507900B (zh) * | 2022-11-11 | 2023-02-28 | 国网山东省电力公司荣成市供电公司 | 基于三向举升装置的隧道电缆盲区探测系统及探测方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH643397A5 (de) * | 1979-09-20 | 1984-05-30 | Ibm | Raster-tunnelmikroskop. |
US4709141A (en) * | 1986-01-09 | 1987-11-24 | Rockwell International Corporation | Non-destructive testing of cooled detector arrays |
US4857836A (en) * | 1987-06-09 | 1989-08-15 | Siemens Aktiengesellschaft | Mechanical probe for optical measurement of electrical signals |
US4851767A (en) * | 1988-01-15 | 1989-07-25 | International Business Machines Corporation | Detachable high-speed opto-electronic sampling probe |
US4891584A (en) * | 1988-03-21 | 1990-01-02 | Semitest, Inc. | Apparatus for making surface photovoltage measurements of a semiconductor |
US4914293A (en) * | 1988-03-04 | 1990-04-03 | Kabushiki Kaisha Toshiba | Microscope apparatus |
US4928058A (en) * | 1989-05-23 | 1990-05-22 | The University Of Rochester | Electro-optic signal measurement |
-
1990
- 1990-02-05 US US07/475,169 patent/US5041783A/en not_active Expired - Fee Related
- 1990-02-07 DE DE69026732T patent/DE69026732T2/de not_active Expired - Fee Related
- 1990-02-07 EP EP90102414A patent/EP0383182B1/de not_active Expired - Lifetime
- 1990-02-09 JP JP2028169A patent/JP2985153B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0383182A2 (de) | 1990-08-22 |
JP2985153B2 (ja) | 1999-11-29 |
JPH032503A (ja) | 1991-01-08 |
EP0383182B1 (de) | 1996-05-01 |
US5041783A (en) | 1991-08-20 |
EP0383182A3 (de) | 1991-05-29 |
DE69026732D1 (de) | 1996-06-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |