DE69026987D1 - Dynamischer Speicher mit einer Auffrischungssteuerschaltung - Google Patents

Dynamischer Speicher mit einer Auffrischungssteuerschaltung

Info

Publication number
DE69026987D1
DE69026987D1 DE69026987T DE69026987T DE69026987D1 DE 69026987 D1 DE69026987 D1 DE 69026987D1 DE 69026987 T DE69026987 T DE 69026987T DE 69026987 T DE69026987 T DE 69026987T DE 69026987 D1 DE69026987 D1 DE 69026987D1
Authority
DE
Germany
Prior art keywords
control circuit
dynamic memory
refresh control
refresh
dynamic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69026987T
Other languages
English (en)
Other versions
DE69026987T2 (de
Inventor
Katsuji Hoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micron Memory Japan Ltd
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69026987D1 publication Critical patent/DE69026987D1/de
Publication of DE69026987T2 publication Critical patent/DE69026987T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4076Timing circuits
DE69026987T 1989-07-21 1990-07-20 Dynamischer Speicher mit einer Auffrischungssteuerschaltung Expired - Lifetime DE69026987T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1189440A JP2762589B2 (ja) 1989-07-21 1989-07-21 半導体メモリ回路

Publications (2)

Publication Number Publication Date
DE69026987D1 true DE69026987D1 (de) 1996-06-20
DE69026987T2 DE69026987T2 (de) 1996-10-31

Family

ID=16241286

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69026987T Expired - Lifetime DE69026987T2 (de) 1989-07-21 1990-07-20 Dynamischer Speicher mit einer Auffrischungssteuerschaltung

Country Status (4)

Country Link
US (1) US5150329A (de)
EP (1) EP0409274B1 (de)
JP (1) JP2762589B2 (de)
DE (1) DE69026987T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3018498B2 (ja) * 1990-11-30 2000-03-13 日本電気株式会社 半導体記憶装置
US5249152A (en) * 1991-06-20 1993-09-28 Unisys Corporation Bookkeeping memory
KR940009250B1 (ko) * 1991-12-18 1994-10-01 삼성전자 주식회사 복수개의 동작전압에 대응하는 리프레쉬 타이머
JP2982928B2 (ja) * 1992-04-01 1999-11-29 三菱電機株式会社 半導体記憶装置
JP3297124B2 (ja) * 1993-02-24 2002-07-02 三菱電機株式会社 ダイナミック型半導体記憶装置
US6209071B1 (en) * 1996-05-07 2001-03-27 Rambus Inc. Asynchronous request/synchronous data dynamic random access memory
WO1999019874A1 (en) 1997-10-10 1999-04-22 Rambus Incorporated Power control system for synchronous memory device
US6334167B1 (en) 1998-08-31 2001-12-25 International Business Machines Corporation System and method for memory self-timed refresh for reduced power consumption
JP3992449B2 (ja) * 2001-03-29 2007-10-17 富士通株式会社 半導体記憶装置
DE102004059671B4 (de) * 2004-12-10 2007-03-22 Infineon Technologies Ag Verfahren zum Aktivieren von Wortleitungen bei einem Wiederauffrischungszyklus und elektronische Speichervorrichtung zur Durchführung des Verfahrens

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3737879A (en) * 1972-01-05 1973-06-05 Mos Technology Inc Self-refreshing memory
JPS55105891A (en) * 1979-01-30 1980-08-13 Sharp Corp Refresh system for dynamic memory
US4412314A (en) * 1980-06-02 1983-10-25 Mostek Corporation Semiconductor memory for use in conjunction with error detection and correction circuit
JPS5873096A (ja) * 1981-10-27 1983-05-02 Nec Corp 半導体メモリ
JPS6079593A (ja) * 1983-10-07 1985-05-07 Hitachi Ltd 半導体集積回路システム
US4653030B1 (en) * 1984-08-31 1997-08-26 Texas Instruments Inc Self refresh circuitry for dynamic memory

Also Published As

Publication number Publication date
DE69026987T2 (de) 1996-10-31
JP2762589B2 (ja) 1998-06-04
EP0409274B1 (de) 1996-05-15
EP0409274A3 (en) 1991-11-13
US5150329A (en) 1992-09-22
EP0409274A2 (de) 1991-01-23
JPH0354793A (ja) 1991-03-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC CORP., TOKIO/TOKYO, JP

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8327 Change in the person/name/address of the patent owner

Owner name: ELPIDA MEMORY, INC., TOKYO, JP