DE69123875T2 - Halbleiter-Speichereinrichtung mit auf parallelen Daten-Bits anwendbarer diagnostischer Einheit - Google Patents
Halbleiter-Speichereinrichtung mit auf parallelen Daten-Bits anwendbarer diagnostischer EinheitInfo
- Publication number
- DE69123875T2 DE69123875T2 DE69123875T DE69123875T DE69123875T2 DE 69123875 T2 DE69123875 T2 DE 69123875T2 DE 69123875 T DE69123875 T DE 69123875T DE 69123875 T DE69123875 T DE 69123875T DE 69123875 T2 DE69123875 T2 DE 69123875T2
- Authority
- DE
- Germany
- Prior art keywords
- memory device
- semiconductor memory
- data bits
- parallel data
- diagnostic unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/34—Accessing multiple bits simultaneously
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2084006A JP2953737B2 (ja) | 1990-03-30 | 1990-03-30 | 複数ビット並列テスト回路を具備する半導体メモリ |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69123875D1 DE69123875D1 (de) | 1997-02-13 |
DE69123875T2 true DE69123875T2 (de) | 1997-06-26 |
Family
ID=13818522
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69123875T Expired - Fee Related DE69123875T2 (de) | 1990-03-30 | 1991-03-25 | Halbleiter-Speichereinrichtung mit auf parallelen Daten-Bits anwendbarer diagnostischer Einheit |
Country Status (4)
Country | Link |
---|---|
US (1) | US5079747A (de) |
EP (1) | EP0455977B1 (de) |
JP (1) | JP2953737B2 (de) |
DE (1) | DE69123875T2 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2549209B2 (ja) * | 1991-01-23 | 1996-10-30 | 株式会社東芝 | 半導体記憶装置 |
KR950001293B1 (ko) * | 1992-04-22 | 1995-02-15 | 삼성전자주식회사 | 반도체 메모리칩의 병렬테스트 회로 |
US5377144A (en) * | 1993-07-27 | 1994-12-27 | Texas Instruments Inc. | Memory array reconfiguration for testing |
KR0168896B1 (ko) * | 1993-09-20 | 1999-02-01 | 세키자와 다다시 | 패리티에 의해 에러를 수정할 수 있는 반도체 메모리장치 |
US5655113A (en) * | 1994-07-05 | 1997-08-05 | Monolithic System Technology, Inc. | Resynchronization circuit for a memory system and method of operating same |
JPH08203278A (ja) * | 1995-01-25 | 1996-08-09 | Sony Corp | 半導体メモリ |
JP2746222B2 (ja) * | 1995-08-31 | 1998-05-06 | 日本電気株式会社 | 半導体記憶装置 |
JP4503142B2 (ja) * | 2000-06-14 | 2010-07-14 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
JP2004234770A (ja) * | 2003-01-31 | 2004-08-19 | Renesas Technology Corp | 半導体記憶装置とテスト方法 |
KR100639614B1 (ko) * | 2004-10-15 | 2006-10-30 | 주식회사 하이닉스반도체 | 뱅크 내 셀을 테스트하기 위한 데이터 출력 컴프레스 회로및 방법 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4287577A (en) * | 1979-09-27 | 1981-09-01 | Communications Satellite Corporation | Interleaved TDMA terrestrial interface buffer |
JP2523586B2 (ja) * | 1987-02-27 | 1996-08-14 | 株式会社日立製作所 | 半導体記憶装置 |
US4967394A (en) * | 1987-09-09 | 1990-10-30 | Kabushiki Kaisha Toshiba | Semiconductor memory device having a test cell array |
JPH02226589A (ja) * | 1989-02-27 | 1990-09-10 | Nec Corp | 半導体記憶装置 |
JPH0359899A (ja) * | 1989-07-27 | 1991-03-14 | Nec Corp | 半導体メモリ |
-
1990
- 1990-03-30 JP JP2084006A patent/JP2953737B2/ja not_active Expired - Fee Related
-
1991
- 1991-03-25 EP EP91104684A patent/EP0455977B1/de not_active Expired - Lifetime
- 1991-03-25 DE DE69123875T patent/DE69123875T2/de not_active Expired - Fee Related
- 1991-03-29 US US07/677,197 patent/US5079747A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0455977A2 (de) | 1991-11-13 |
JP2953737B2 (ja) | 1999-09-27 |
DE69123875D1 (de) | 1997-02-13 |
EP0455977A3 (de) | 1995-02-08 |
US5079747A (en) | 1992-01-07 |
EP0455977B1 (de) | 1997-01-02 |
JPH03283199A (ja) | 1991-12-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: NEC CORP., TOKIO/TOKYO, JP Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP |
|
8339 | Ceased/non-payment of the annual fee |