DE69132457T2 - Vorrichtung und Methode zum Laden von Werkstücken in einem Verarbeitungssystem - Google Patents

Vorrichtung und Methode zum Laden von Werkstücken in einem Verarbeitungssystem

Info

Publication number
DE69132457T2
DE69132457T2 DE69132457T DE69132457T DE69132457T2 DE 69132457 T2 DE69132457 T2 DE 69132457T2 DE 69132457 T DE69132457 T DE 69132457T DE 69132457 T DE69132457 T DE 69132457T DE 69132457 T2 DE69132457 T2 DE 69132457T2
Authority
DE
Germany
Prior art keywords
processing system
loading workpieces
workpieces
loading
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69132457T
Other languages
English (en)
Other versions
DE69132457D1 (de
Inventor
Masato M Toshima
Phil M Salzman
Steven C Murdoch
Cheng Wang
Mark A Stenholm
James Howard
Leonard Hall
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=24035085&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69132457(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of DE69132457D1 publication Critical patent/DE69132457D1/de
Publication of DE69132457T2 publication Critical patent/DE69132457T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67201Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67766Mechanical parts of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67772Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/137Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/139Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/14Wafer cassette transporting
DE69132457T 1990-04-19 1991-04-18 Vorrichtung und Methode zum Laden von Werkstücken in einem Verarbeitungssystem Expired - Fee Related DE69132457T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/511,481 US5186594A (en) 1990-04-19 1990-04-19 Dual cassette load lock

Publications (2)

Publication Number Publication Date
DE69132457D1 DE69132457D1 (de) 2000-12-07
DE69132457T2 true DE69132457T2 (de) 2001-05-31

Family

ID=24035085

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69132457T Expired - Fee Related DE69132457T2 (de) 1990-04-19 1991-04-18 Vorrichtung und Methode zum Laden von Werkstücken in einem Verarbeitungssystem

Country Status (5)

Country Link
US (7) US5186594A (de)
EP (1) EP0452939B1 (de)
JP (1) JP3088123B2 (de)
KR (1) KR100272890B1 (de)
DE (1) DE69132457T2 (de)

Families Citing this family (148)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5186594A (en) * 1990-04-19 1993-02-16 Applied Materials, Inc. Dual cassette load lock
KR0162102B1 (ko) * 1991-05-29 1999-02-01 이노우에 아키라 반도체 제조장치
JP2598353B2 (ja) * 1991-12-04 1997-04-09 アネルバ株式会社 基板処理装置、基板搬送装置及び基板交換方法
JP2751975B2 (ja) * 1991-12-20 1998-05-18 株式会社日立製作所 半導体処理装置のロードロック室
US5372836A (en) * 1992-03-27 1994-12-13 Tokyo Electron Limited Method of forming polycrystalling silicon film in process of manufacturing LCD
US5395198A (en) * 1992-06-19 1995-03-07 International Business Machines Corporation Vacuum loading chuck and fixture for flexible printed circuit panels
US5534072A (en) * 1992-06-24 1996-07-09 Anelva Corporation Integrated module multi-chamber CVD processing system and its method for processing subtrates
US5482607A (en) * 1992-09-21 1996-01-09 Nissin Electric Co., Ltd. Film forming apparatus
CN1088002A (zh) * 1992-11-16 1994-06-15 东京电子株式会社 制造液晶显示器基板及评价半导体晶体的方法与装置
US5387067A (en) * 1993-01-14 1995-02-07 Applied Materials, Inc. Direct load/unload semiconductor wafer cassette apparatus and transfer system
KR100261532B1 (ko) * 1993-03-14 2000-07-15 야마시타 히데나리 피처리체 반송장치를 가지는 멀티챔버 시스템
US5527390A (en) * 1993-03-19 1996-06-18 Tokyo Electron Kabushiki Treatment system including a plurality of treatment apparatus
US5478455A (en) * 1993-09-17 1995-12-26 Varian Associates, Inc. Method for controlling a collimated sputtering source
AU2368495A (en) * 1994-04-28 1995-11-29 Semitool, Incorporated Semiconductor processing system with wafer container docking and loading station
US6447232B1 (en) 1994-04-28 2002-09-10 Semitool, Inc. Semiconductor wafer processing apparatus having improved wafer input/output handling system
US6833035B1 (en) 1994-04-28 2004-12-21 Semitool, Inc. Semiconductor processing system with wafer container docking and loading station
US5544421A (en) * 1994-04-28 1996-08-13 Semitool, Inc. Semiconductor wafer processing system
US5664337A (en) * 1996-03-26 1997-09-09 Semitool, Inc. Automated semiconductor processing systems
US6712577B2 (en) * 1994-04-28 2004-03-30 Semitool, Inc. Automated semiconductor processing system
US5538385A (en) * 1994-06-24 1996-07-23 Kensington Laboratories, Inc. Specimen carrier holder and method of operating it
US5486080A (en) * 1994-06-30 1996-01-23 Diamond Semiconductor Group, Inc. High speed movement of workpieces in vacuum processing
US5522955A (en) * 1994-07-07 1996-06-04 Brodd; Ralph J. Process and apparatus for producing thin lithium coatings on electrically conductive foil for use in solid state rechargeable electrochemical cells
US5525024A (en) * 1994-08-17 1996-06-11 Applied Materials, Inc. Cassette loader having compound translational motion
US5563095A (en) * 1994-12-01 1996-10-08 Frey; Jeffrey Method for manufacturing semiconductor devices
ATE275759T1 (de) * 1995-03-28 2004-09-15 Brooks Automation Gmbh Be- und entladestation für halbleiterbearbeitungsanlagen
DE19542646C2 (de) * 1995-03-28 2003-04-30 Brooks Automation Gmbh Be- und Entladestation für Halbleiterbearbeitungsanlagen
US6555394B2 (en) 1995-11-28 2003-04-29 Samsung Electronics Co., Ltd. Methods of fabricating capacitors including Ta2O5 layers in a chamber including changing a Ta2O5 layer to heater separation or chamber pressure
KR0165484B1 (ko) * 1995-11-28 1999-02-01 김광호 탄탈륨산화막 증착 형성방법 및 그 장치
US6723174B2 (en) 1996-03-26 2004-04-20 Semitool, Inc. Automated semiconductor processing system
US6942738B1 (en) 1996-07-15 2005-09-13 Semitool, Inc. Automated semiconductor processing system
US6279724B1 (en) 1997-12-19 2001-08-28 Semitoll Inc. Automated semiconductor processing system
US6105534A (en) * 1996-05-31 2000-08-22 Ipec Precision, Inc. Apparatus for plasma jet treatment of substrates
US6091498A (en) * 1996-07-15 2000-07-18 Semitool, Inc. Semiconductor processing apparatus having lift and tilt mechanism
US6645355B2 (en) 1996-07-15 2003-11-11 Semitool, Inc. Semiconductor processing apparatus having lift and tilt mechanism
US6203582B1 (en) 1996-07-15 2001-03-20 Semitool, Inc. Modular semiconductor workpiece processing tool
US6672820B1 (en) 1996-07-15 2004-01-06 Semitool, Inc. Semiconductor processing apparatus having linear conveyer system
TW331550B (en) * 1996-08-14 1998-05-11 Tokyo Electron Co Ltd The cassette receiving room
TW344847B (en) * 1996-08-29 1998-11-11 Tokyo Electron Co Ltd Substrate treatment system, substrate transfer system, and substrate transfer method
JPH10107122A (ja) * 1996-10-01 1998-04-24 Tokyo Electron Ltd 被処理基板カセットの搬入装置
JPH10139159A (ja) * 1996-11-13 1998-05-26 Tokyo Electron Ltd カセットチャンバ及びカセット搬入搬出機構
US5961269A (en) 1996-11-18 1999-10-05 Applied Materials, Inc. Three chamber load lock apparatus
US5905302A (en) * 1996-11-18 1999-05-18 Applied Materials, Inc. Loadlock cassette with wafer support rails
JPH10147432A (ja) * 1996-11-20 1998-06-02 Tokyo Electron Ltd カセットチャンバ
US6068668A (en) * 1997-03-31 2000-05-30 Motorola, Inc. Process for forming a semiconductor device
TW539918B (en) 1997-05-27 2003-07-01 Tokyo Electron Ltd Removal of photoresist and photoresist residue from semiconductors using supercritical carbon dioxide process
US5837059A (en) * 1997-07-11 1998-11-17 Brooks Automation, Inc. Automatic positive pressure seal access door
US6152680A (en) * 1997-08-26 2000-11-28 Daitron, Inc. Wafer cassette rotation mechanism
US6106213A (en) * 1998-02-27 2000-08-22 Pri Automation, Inc. Automated door assembly for use in semiconductor wafer manufacturing
TW593731B (en) * 1998-03-20 2004-06-21 Semitool Inc Apparatus for applying a metal structure to a workpiece
US6565729B2 (en) * 1998-03-20 2003-05-20 Semitool, Inc. Method for electrochemically depositing metal on a semiconductor workpiece
US6375746B1 (en) 1998-07-10 2002-04-23 Novellus Systems, Inc. Wafer processing architecture including load locks
US6431807B1 (en) 1998-07-10 2002-08-13 Novellus Systems, Inc. Wafer processing architecture including single-wafer load lock with cooling unit
US6497801B1 (en) * 1998-07-10 2002-12-24 Semitool Inc Electroplating apparatus with segmented anode array
US6350321B1 (en) * 1998-12-08 2002-02-26 International Business Machines Corporation UHV horizontal hot wall cluster CVD/growth design
US7077159B1 (en) * 1998-12-23 2006-07-18 Applied Materials, Inc. Processing apparatus having integrated pumping system
US6358128B1 (en) * 1999-03-05 2002-03-19 Ebara Corporation Polishing apparatus
US6042324A (en) * 1999-03-26 2000-03-28 Asm America, Inc. Multi-stage single-drive FOUP door system
US20030038035A1 (en) * 2001-05-30 2003-02-27 Wilson Gregory J. Methods and systems for controlling current in electrochemical processing of microelectronic workpieces
US6916412B2 (en) * 1999-04-13 2005-07-12 Semitool, Inc. Adaptable electrochemical processing chamber
US7585398B2 (en) * 1999-04-13 2009-09-08 Semitool, Inc. Chambers, systems, and methods for electrochemically processing microfeature workpieces
US7189318B2 (en) * 1999-04-13 2007-03-13 Semitool, Inc. Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US7020537B2 (en) * 1999-04-13 2006-03-28 Semitool, Inc. Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US6368475B1 (en) * 2000-03-21 2002-04-09 Semitool, Inc. Apparatus for electrochemically processing a microelectronic workpiece
US7264698B2 (en) * 1999-04-13 2007-09-04 Semitool, Inc. Apparatus and methods for electrochemical processing of microelectronic workpieces
KR100695660B1 (ko) * 1999-04-13 2007-03-19 세미툴 인코포레이티드 개선된 처리 유체 유동을 갖는 처리 챔버를 구비하는가공편 프로세서
US7160421B2 (en) * 1999-04-13 2007-01-09 Semitool, Inc. Turning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US7438788B2 (en) * 1999-04-13 2008-10-21 Semitool, Inc. Apparatus and methods for electrochemical processing of microelectronic workpieces
US6763281B2 (en) 1999-04-19 2004-07-13 Applied Materials, Inc Apparatus for alignment of automated workpiece handling systems
TW469483B (en) * 1999-04-19 2001-12-21 Applied Materials Inc Method and apparatus for aligning a cassette
US6612797B1 (en) * 1999-05-18 2003-09-02 Asyst Technologies, Inc. Cassette buffering within a minienvironment
AU6763000A (en) * 1999-08-11 2001-03-05 Multilevel Metals, Inc. Load lock system for foups
US6318384B1 (en) * 1999-09-24 2001-11-20 Applied Materials, Inc. Self cleaning method of forming deep trenches in silicon substrates
US8348583B2 (en) * 1999-10-19 2013-01-08 Rorze Corporation Container and loader for substrate
US6748960B1 (en) * 1999-11-02 2004-06-15 Tokyo Electron Limited Apparatus for supercritical processing of multiple workpieces
JP4621400B2 (ja) 1999-11-02 2011-01-26 東京エレクトロン株式会社 半導体基板処理装置
US20020011203A1 (en) * 2000-01-03 2002-01-31 Skion Corporation Multi wafer introduction/single wafer conveyor mode processing system and method of processing wafers using the same
EP1126508A3 (de) * 2000-02-16 2005-03-30 Applied Materials, Inc. Behandlungseinrichtung mit einem integrierten Pumpsystem
US20050183959A1 (en) * 2000-04-13 2005-08-25 Wilson Gregory J. Tuning electrodes used in a reactor for electrochemically processing a microelectric workpiece
AU2001259504A1 (en) * 2000-05-24 2001-12-03 Semitool, Inc. Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US6977014B1 (en) 2000-06-02 2005-12-20 Novellus Systems, Inc. Architecture for high throughput semiconductor processing applications
US6364593B1 (en) * 2000-06-06 2002-04-02 Brooks Automation Material transport system
US6860965B1 (en) 2000-06-23 2005-03-01 Novellus Systems, Inc. High throughput architecture for semiconductor processing
AU2001268656A1 (en) 2000-07-07 2002-01-21 Semitool, Inc. Automated processing system
AU2001273666A1 (en) * 2000-07-07 2002-01-21 Applied Materials, Inc. Automatic door opener
KR100750018B1 (ko) * 2000-07-26 2007-08-16 동경 엘렉트론 주식회사 반도체 기판의 처리를 위한 고압 챔버 및 반도체 기판의고압 처리를 위한 장치
US6632068B2 (en) * 2000-09-27 2003-10-14 Asm International N.V. Wafer handling system
US7001468B1 (en) 2002-02-15 2006-02-21 Tokyo Electron Limited Pressure energized pressure vessel opening and closing device and method of providing therefor
US7387868B2 (en) 2002-03-04 2008-06-17 Tokyo Electron Limited Treatment of a dielectric layer using supercritical CO2
US20030194673A1 (en) * 2002-04-15 2003-10-16 Yoo Woo Sik Batch furnace isolation gate
US7114903B2 (en) * 2002-07-16 2006-10-03 Semitool, Inc. Apparatuses and method for transferring and/or pre-processing microelectronic workpieces
US6869263B2 (en) 2002-07-22 2005-03-22 Brooks Automation, Inc. Substrate loading and unloading station with buffer
US7677859B2 (en) 2002-07-22 2010-03-16 Brooks Automation, Inc. Substrate loading and uploading station with buffer
DE10238165B3 (de) * 2002-08-15 2004-03-25 Hans-Heinz Helge Langgestrecktes Rolladenprofil aus Kunststoff oder Metall für Schwimmbadabdeckungen
US20040108212A1 (en) * 2002-12-06 2004-06-10 Lyndon Graham Apparatus and methods for transferring heat during chemical processing of microelectronic workpieces
US7021635B2 (en) * 2003-02-06 2006-04-04 Tokyo Electron Limited Vacuum chuck utilizing sintered material and method of providing thereof
US7225820B2 (en) * 2003-02-10 2007-06-05 Tokyo Electron Limited High-pressure processing chamber for a semiconductor wafer
US7077917B2 (en) 2003-02-10 2006-07-18 Tokyo Electric Limited High-pressure processing chamber for a semiconductor wafer
US6748293B1 (en) 2003-03-24 2004-06-08 Varian Semiconductor Equipment Associates, Inc. Methods and apparatus for high speed object handling
US7270137B2 (en) 2003-04-28 2007-09-18 Tokyo Electron Limited Apparatus and method of securing a workpiece during high-pressure processing
US7163380B2 (en) 2003-07-29 2007-01-16 Tokyo Electron Limited Control of fluid flow in the processing of an object with a fluid
US20050035514A1 (en) * 2003-08-11 2005-02-17 Supercritical Systems, Inc. Vacuum chuck apparatus and method for holding a wafer during high pressure processing
US20050067002A1 (en) * 2003-09-25 2005-03-31 Supercritical Systems, Inc. Processing chamber including a circulation loop integrally formed in a chamber housing
US7186093B2 (en) * 2004-10-05 2007-03-06 Tokyo Electron Limited Method and apparatus for cooling motor bearings of a high pressure pump
US7500822B2 (en) * 2004-04-09 2009-03-10 Edwards Vacuum, Inc. Combined vacuum pump load-lock assembly
US7611319B2 (en) 2004-06-16 2009-11-03 Applied Materials, Inc. Methods and apparatus for identifying small lot size substrate carriers
US7250374B2 (en) * 2004-06-30 2007-07-31 Tokyo Electron Limited System and method for processing a substrate using supercritical carbon dioxide processing
TWI390102B (zh) * 2004-08-13 2013-03-21 Oc Oerlikon Balzers Ag 真空閘
US7307019B2 (en) * 2004-09-29 2007-12-11 Tokyo Electron Limited Method for supercritical carbon dioxide processing of fluoro-carbon films
US20060065189A1 (en) * 2004-09-30 2006-03-30 Darko Babic Method and system for homogenization of supercritical fluid in a high pressure processing system
US20060065288A1 (en) * 2004-09-30 2006-03-30 Darko Babic Supercritical fluid processing system having a coating on internal members and a method of using
US20060102204A1 (en) * 2004-11-12 2006-05-18 Tokyo Electron Limited Method for removing a residue from a substrate using supercritical carbon dioxide processing
US20060102590A1 (en) * 2004-11-12 2006-05-18 Tokyo Electron Limited Method for treating a substrate with a high pressure fluid using a preoxide-based process chemistry
US7491036B2 (en) * 2004-11-12 2009-02-17 Tokyo Electron Limited Method and system for cooling a pump
US20060102591A1 (en) * 2004-11-12 2006-05-18 Tokyo Electron Limited Method and system for treating a substrate using a supercritical fluid
US20060102208A1 (en) * 2004-11-12 2006-05-18 Tokyo Electron Limited System for removing a residue from a substrate using supercritical carbon dioxide processing
US20060130966A1 (en) * 2004-12-20 2006-06-22 Darko Babic Method and system for flowing a supercritical fluid in a high pressure processing system
US20060134332A1 (en) * 2004-12-22 2006-06-22 Darko Babic Precompressed coating of internal members in a supercritical fluid processing system
US7140393B2 (en) * 2004-12-22 2006-11-28 Tokyo Electron Limited Non-contact shuttle valve for flow diversion in high pressure systems
US20060135047A1 (en) * 2004-12-22 2006-06-22 Alexei Sheydayi Method and apparatus for clamping a substrate in a high pressure processing system
US7434590B2 (en) * 2004-12-22 2008-10-14 Tokyo Electron Limited Method and apparatus for clamping a substrate in a high pressure processing system
US20060180572A1 (en) * 2005-02-15 2006-08-17 Tokyo Electron Limited Removal of post etch residue for a substrate with open metal surfaces
US20060180174A1 (en) * 2005-02-15 2006-08-17 Tokyo Electron Limited Method and system for treating a substrate with a high pressure fluid using a peroxide-based process chemistry in conjunction with an initiator
US7435447B2 (en) * 2005-02-15 2008-10-14 Tokyo Electron Limited Method and system for determining flow conditions in a high pressure processing system
US7291565B2 (en) * 2005-02-15 2007-11-06 Tokyo Electron Limited Method and system for treating a substrate with a high pressure fluid using fluorosilicic acid
US7767145B2 (en) 2005-03-28 2010-08-03 Toyko Electron Limited High pressure fourier transform infrared cell
US7380984B2 (en) * 2005-03-28 2008-06-03 Tokyo Electron Limited Process flow thermocouple
US20060225772A1 (en) * 2005-03-29 2006-10-12 Jones William D Controlled pressure differential in a high-pressure processing chamber
US20060226117A1 (en) * 2005-03-29 2006-10-12 Bertram Ronald T Phase change based heating element system and method
US7494107B2 (en) 2005-03-30 2009-02-24 Supercritical Systems, Inc. Gate valve for plus-atmospheric pressure semiconductor process vessels
US20060255012A1 (en) * 2005-05-10 2006-11-16 Gunilla Jacobson Removal of particles from substrate surfaces using supercritical processing
US7789971B2 (en) * 2005-05-13 2010-09-07 Tokyo Electron Limited Treatment of substrate using functionalizing agent in supercritical carbon dioxide
US7524383B2 (en) * 2005-05-25 2009-04-28 Tokyo Electron Limited Method and system for passivating a processing chamber
US20070012337A1 (en) * 2005-07-15 2007-01-18 Tokyo Electron Limited In-line metrology for supercritical fluid processing
WO2007061604A2 (en) * 2005-11-21 2007-05-31 Applied Materials, Inc. Apparatus and methods for a substrate carrier having an inflatable seal
KR100909494B1 (ko) * 2006-05-11 2009-07-27 도쿄엘렉트론가부시키가이샤 처리장치
KR101659733B1 (ko) * 2009-12-28 2016-09-26 주식회사 테스 기판 처리 장치
US20120288355A1 (en) * 2011-05-11 2012-11-15 Ming-Teng Hsieh Method for storing wafers
JP6106176B2 (ja) * 2011-09-14 2017-03-29 ブルックス オートメーション インコーポレイテッド ロードステーション
DE102011113563A1 (de) * 2011-09-19 2013-03-21 Oerlikon Trading Ag, Trübbach Karussellschlitten für Vakuumbehandlungsanlage
US9997384B2 (en) * 2011-12-01 2018-06-12 Taiwan Semiconductor Manufacturing Company, Ltd. Methods for transporting wafers between wafer holders and chambers
US9530675B2 (en) 2012-09-19 2016-12-27 Stmicroelectronics Pte Ltd Wafer handling station including cassette members with lateral wafer confining brackets and associated methods
US10115616B2 (en) 2013-07-18 2018-10-30 Applied Materials, Inc. Carrier adapter insert apparatus and carrier adapter insert detection methods
KR102234464B1 (ko) 2013-08-12 2021-03-30 어플라이드 머티어리얼스, 인코포레이티드 팩토리 인터페이스 환경 제어들을 갖는 기판 프로세싱 시스템들, 장치, 및 방법들
KR20210080633A (ko) 2014-11-25 2021-06-30 어플라이드 머티어리얼스, 인코포레이티드 기판 캐리어 및 퍼지 챔버 환경 제어들을 이용하는 기판 프로세싱 시스템들, 장치, 및 방법들
KR20180045316A (ko) * 2016-10-25 2018-05-04 삼성전자주식회사 설비 전방 단부 모듈 및 이를 포함하는 반도체 제조 장치
CN108538692B (zh) * 2017-03-02 2020-06-19 北京北方华创微电子装备有限公司 升降门装置和晶片传输系统
DE102018102762B3 (de) * 2018-02-07 2019-08-01 Uwe Beier Ladeschleuse für einen Substratbehälter, Vorrichtung mit einer Ladeschleuse und Verfahren zum Betrieb einer Ladeschleuse
SG11202108920SA (en) 2019-02-19 2021-09-29 Veeco Instr Inc Automated batch production thin film deposition systems and methods of using the same

Family Cites Families (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2224479A (en) * 1939-06-22 1940-12-10 Marion S Jones Ice handling apparatus
US3656454A (en) * 1970-11-23 1972-04-18 Air Reduction Vacuum coating apparatus
US3749383A (en) * 1971-04-29 1973-07-31 Rca Corp Apparatus for processing semiconductor devices
JPS5730341A (en) * 1980-07-30 1982-02-18 Anelva Corp Substrate processing device
EP0068060A1 (de) * 1981-06-25 1983-01-05 S.A.R.L. Commodore International Befehlsorgan zum Öffnen und Schliessen dichter Türen, insbesondere von Autoklaven
DE3224803A1 (de) * 1982-07-02 1984-01-05 Heckmann, Klaus, Prof. Dr., 8400 Regensburg Verfahren zur selektiven trennung des plutoniums von uran und anderen metallen
US4448149A (en) * 1982-10-12 1984-05-15 International Business Machines Corporation Apparatus for removably mounting and supplying mechanical and electrical energy to a vacuum chamber substrate holder
JPS59191342A (ja) * 1983-04-15 1984-10-30 Hitachi Ltd 半導体製造装置
JPS59200433A (ja) * 1983-04-28 1984-11-13 Hitachi Electronics Eng Co Ltd Cvd装置の装填方法
JPS60109218A (ja) * 1983-11-18 1985-06-14 Hitachi Ltd 分子線エピタキシャル成長装置
GB8332394D0 (en) * 1983-12-05 1984-01-11 Pilkington Brothers Plc Coating apparatus
US4640223A (en) * 1984-07-24 1987-02-03 Dozier Alfred R Chemical vapor deposition reactor
US4636128A (en) * 1984-08-30 1987-01-13 Texas Instruments Incorporated Semiconductor slice cassette transport unit
US4668365A (en) * 1984-10-25 1987-05-26 Applied Materials, Inc. Apparatus and method for magnetron-enhanced plasma-assisted chemical vapor deposition
FR2573908B1 (fr) * 1984-11-26 1986-12-26 Cogema Dispositif de transfert a double barriere etanche entre un conteneur et une enceinte de confinement
JPS61129881A (ja) 1984-11-28 1986-06-17 Sanyo Electric Co Ltd 光起電力装置
JPS61282224A (ja) * 1985-06-04 1986-12-12 Mitsubishi Electric Corp 搬送装置の出し入れ口装置
JPS61291032A (ja) * 1985-06-17 1986-12-20 Fujitsu Ltd 真空装置
JPS6215479A (ja) * 1985-07-15 1987-01-23 Komatsu Ltd オ−トトラツキング測距装置
US4765767A (en) * 1985-08-01 1988-08-23 Bic Corporation Snap-on clip for elongated instruments
US4776744A (en) * 1985-09-09 1988-10-11 Applied Materials, Inc. Systems and methods for wafer handling in semiconductor process equipment
US4966519A (en) * 1985-10-24 1990-10-30 Texas Instruments Incorporated Integrated circuit processing system
JPS62139340A (ja) * 1985-12-13 1987-06-23 Hitachi Ltd ウエ−ハ搬送装置
JPS62154749A (ja) * 1985-12-27 1987-07-09 Hitachi Ltd 処理装置
US4764076A (en) * 1986-04-17 1988-08-16 Varian Associates, Inc. Valve incorporating wafer handling arm
US4715921A (en) * 1986-10-24 1987-12-29 General Signal Corporation Quad processor
KR950012969B1 (ko) * 1986-04-28 1995-10-24 배리언 어소시에이츠 인코포레이티드 모듀울 반도체 웨이퍼 운반 및 처리 시스템
JPS62282224A (ja) 1986-05-30 1987-12-08 Tokyo Keiki Co Ltd 回転検出装置
JPS62290616A (ja) * 1986-06-05 1987-12-17 Tokyo Electron Ltd ウエハ搬送機構
US4747577A (en) * 1986-07-23 1988-05-31 The Boc Group, Inc. Gate valve with magnetic closure for use with vacuum equipment
DE3637880C2 (de) * 1986-11-06 1994-09-01 Meissner & Wurst Transportierbares Behältnis zur Handhabung von Halbleiterelementen während ihrer Herstellung sowie Verfahren zur partikelfreien Übergabe von Produkten
FR2620049B2 (fr) * 1986-11-28 1989-11-24 Commissariat Energie Atomique Procede de traitement, stockage et/ou transfert d'un objet dans une atmosphere de haute proprete, et conteneur pour la mise en oeuvre de ce procede
US4721282A (en) * 1986-12-16 1988-01-26 Lam Research Corporation Vacuum chamber gate valve
US4951601A (en) * 1986-12-19 1990-08-28 Applied Materials, Inc. Multi-chamber integrated process system
DE3704505A1 (de) * 1987-02-13 1988-08-25 Leybold Ag Einlegegeraet fuer vakuumanlagen
US4891488A (en) * 1987-07-16 1990-01-02 Texas Instruments Incorporated Processing apparatus and method
JPH01186621A (ja) * 1987-07-16 1989-07-26 Texas Instr Inc <Ti> 処理装置及び方法
DE3827343A1 (de) * 1988-08-12 1990-02-15 Leybold Ag Vorrichtung nach dem karussel-prinzip zum beschichten von substraten
US4851101A (en) * 1987-09-18 1989-07-25 Varian Associates, Inc. Sputter module for modular wafer processing machine
US4832527A (en) * 1987-09-29 1989-05-23 Bachmann Company, Inc. Vertically reciprocable gates for the control of a liquid media
US4859137A (en) * 1987-10-21 1989-08-22 Asyst Technologies Apparatus for transporting a holder between a port opening of a standardized mechanical interface system and a loading and unloading station
JP2505011B2 (ja) * 1987-12-23 1996-06-05 松下電工株式会社 回路遮断器の電磁装置
JP2539472B2 (ja) 1987-12-23 1996-10-02 株式会社日立製作所 被処理物収納部支持機構
JPH01212755A (ja) * 1988-02-18 1989-08-25 Nissin Electric Co Ltd イオン処理装置
JPH01253237A (ja) * 1988-03-31 1989-10-09 Anelva Corp 真空処理装置
JP2628335B2 (ja) * 1988-03-31 1997-07-09 テル・バリアン株式会社 マルチチャンバ型cvd装置
DE58909880D1 (de) * 1988-05-24 2001-12-20 Unaxis Balzers Ag Vakuumanlage
US5064337A (en) * 1988-07-19 1991-11-12 Tokyo Electron Limited Handling apparatus for transferring carriers and a method of transferring carriers
JPH0237742A (ja) * 1988-07-28 1990-02-07 Nec Corp 半導体装置の製造装置
US5002255A (en) * 1989-03-03 1991-03-26 Irie Koken Kabushiki Kaisha Non-sliding gate valve for high vacuum use
US5186594A (en) * 1990-04-19 1993-02-16 Applied Materials, Inc. Dual cassette load lock
KR960002534A (ko) * 1994-06-07 1996-01-26 이노우에 아키라 감압·상압 처리장치
US6106213A (en) * 1998-02-27 2000-08-22 Pri Automation, Inc. Automated door assembly for use in semiconductor wafer manufacturing
AU2001273666A1 (en) * 2000-07-07 2002-01-21 Applied Materials, Inc. Automatic door opener
US6799394B2 (en) * 2002-01-18 2004-10-05 Shen Tsung-Lin Apparatus for sealing a vacuum chamber

Also Published As

Publication number Publication date
US6454508B2 (en) 2002-09-24
KR910019145A (ko) 1991-11-30
US5769588A (en) 1998-06-23
US6454519B1 (en) 2002-09-24
US6599076B2 (en) 2003-07-29
KR100272890B1 (ko) 2000-12-01
DE69132457D1 (de) 2000-12-07
US20060245854A1 (en) 2006-11-02
JP3088123B2 (ja) 2000-09-18
EP0452939A1 (de) 1991-10-23
US5186594A (en) 1993-02-16
US20030002960A1 (en) 2003-01-02
US20010014266A1 (en) 2001-08-16
JPH04226048A (ja) 1992-08-14
EP0452939B1 (de) 2000-11-02
US20030002959A1 (en) 2003-01-02

Similar Documents

Publication Publication Date Title
DE69132457T2 (de) Vorrichtung und Methode zum Laden von Werkstücken in einem Verarbeitungssystem
DE69426615D1 (de) Vorrichtung und Verfahren zum Verarbeiten von Dokumenten
DE69124437D1 (de) Verfahren und Vorrichtung zum Umkehren von Byteordnung in einem Rechner
DE69421994T2 (de) Verfahren und Vorrichtung zum Mahlen von Stoffteilchen
DE69012393T2 (de) Verfahren und Vorrichtung zum Transport von Ionen in einem Trägergas.
DE69214003D1 (de) Verfahren und Vorrichtung zum Auflösen von Gasen in Flüssigkeiten
DE69208673D1 (de) Vorrichtung und verfahren zum lagern von produkten
DE69113180D1 (de) Vorrichtung und Verfahren zum Beladen von bogenförmigen Gegenständen.
DE59105995D1 (de) Handhabungsvorrichtung und Verfahren zum Handhaben von Werkstücken.
DE69232184D1 (de) Verfahren und Vorrichtung zum sequentiellen Austausch von Multimediendaten in einem Datenverarbeitungssystem
DE69009983D1 (de) Vorrichtung und Verfahren zum Handhaben von Waren.
ATA151289A (de) Verfahren und vorrichtung zum sortieren von holzspaenen
DE69011820D1 (de) Verfahren und Vorrichtung zum Handhaben von Artikeln.
ATA205991A (de) Verfahren und vorrichtung zum entfernen von staub- und schmutzpartikel
DE69232382T2 (de) Vorrichtung und Verfahren zum Fördern von Stäben in einem Regallager
DE69202043T2 (de) Verfahren und Vorrichtung zum Verarbeiten von Schlachttierkörpern.
ATA113488A (de) Verfahren und vorrichtung zum inaktivieren von in einem traegermedium enthaltenen viren
DE69326390T2 (de) Verfahren und Vorrichtung zum automatischen Einsammeln von zylindrischen Objekten
DE68909767D1 (de) System zum auffinden von freien partikeln in einem bauteilgehäuse und verfahren zum auffinden.
DE69324160D1 (de) Verfahren und vorrichtung zum bearbeiten von tierkörpern
ATA242991A (de) Verfahren und vorrichtung zum aufbereiten von filtern
DE3990331T1 (de) Verfahren und vorrichtung zum entfernen von gegenstaenden
DE420283T1 (de) Vorrichtung und verfahren zum laden von stueckguetern.
ATE69741T1 (de) Verfahren und vorrichtung zum vermahlen und separieren von korngut.
DE59401174D1 (de) Verfahren und Vorrichtung zum Absondern von kleinen Werkstücken

Legal Events

Date Code Title Description
8363 Opposition against the patent
8339 Ceased/non-payment of the annual fee