DE69220715T2 - Eingebaute Selbsttestschaltung - Google Patents

Eingebaute Selbsttestschaltung

Info

Publication number
DE69220715T2
DE69220715T2 DE69220715T DE69220715T DE69220715T2 DE 69220715 T2 DE69220715 T2 DE 69220715T2 DE 69220715 T DE69220715 T DE 69220715T DE 69220715 T DE69220715 T DE 69220715T DE 69220715 T2 DE69220715 T2 DE 69220715T2
Authority
DE
Germany
Prior art keywords
built
self
test circuit
test
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69220715T
Other languages
English (en)
Other versions
DE69220715D1 (de
Inventor
Kenneth David Mozingo
Charles Eugene Stroud
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Corp filed Critical AT&T Corp
Publication of DE69220715D1 publication Critical patent/DE69220715D1/de
Application granted granted Critical
Publication of DE69220715T2 publication Critical patent/DE69220715T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31716—Testing of input or output with loop-back
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/83—Indexing scheme relating to error detection, to error correction, and to monitoring the solution involving signatures
DE69220715T 1991-04-25 1992-04-14 Eingebaute Selbsttestschaltung Expired - Fee Related DE69220715T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/693,114 US5230000A (en) 1991-04-25 1991-04-25 Built-in self-test (bist) circuit

Publications (2)

Publication Number Publication Date
DE69220715D1 DE69220715D1 (de) 1997-08-14
DE69220715T2 true DE69220715T2 (de) 1998-01-29

Family

ID=24783368

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69220715T Expired - Fee Related DE69220715T2 (de) 1991-04-25 1992-04-14 Eingebaute Selbsttestschaltung

Country Status (4)

Country Link
US (1) US5230000A (de)
EP (1) EP0510862B1 (de)
JP (1) JP2504892B2 (de)
DE (1) DE69220715T2 (de)

Families Citing this family (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2670299B1 (fr) * 1990-12-07 1993-01-22 Thomson Composants Militaires Circuit integre avec controleur de test peripherique.
US5309447A (en) * 1991-06-03 1994-05-03 At&T Bell Laboratories Space compression technique for pseudo-exhaustive self-testing of digital electronic circuits
US5528610A (en) * 1992-04-30 1996-06-18 Hughes Aircraft Company Boundary test cell with self masking capability
US5617531A (en) * 1993-11-02 1997-04-01 Motorola, Inc. Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor
US5568492A (en) * 1994-06-06 1996-10-22 Motorola, Inc. Circuit and method of JTAG testing multichip modules
US5592493A (en) * 1994-09-13 1997-01-07 Motorola Inc. Serial scan chain architecture for a data processing system and method of operation
US5802073A (en) * 1994-09-23 1998-09-01 Vlsi Technology, Inc. Built-in self test functional system block for UTOPIA interface
US5748497A (en) * 1994-10-31 1998-05-05 Texas Instruments Incorporated System and method for improving fault coverage of an electric circuit
US5592077A (en) * 1995-02-13 1997-01-07 Cirrus Logic, Inc. Circuits, systems and methods for testing ASIC and RAM memory devices
US5737340A (en) * 1996-07-01 1998-04-07 Mentor Graphics Corporation Multi-phase test point insertion for built-in self test of integrated circuits
US5701308A (en) * 1996-10-29 1997-12-23 Lockheed Martin Corporation Fast bist architecture with flexible standard interface
SE512916C2 (sv) * 1998-07-16 2000-06-05 Ericsson Telefon Ab L M Metod och anordning för feldetektering i digitalt system
DE19832307C2 (de) * 1998-07-17 2000-09-21 Siemens Ag Integrierte Schaltung mit einer Selbsttesteinrichtung
US6181004B1 (en) 1999-01-22 2001-01-30 Jerry D. Koontz Digital signal processing assembly and test method
US6624405B1 (en) * 1999-04-19 2003-09-23 Capella Microsystems, Inc. BIST for testing a current-voltage conversion amplifier
US6229465B1 (en) 1999-04-30 2001-05-08 International Business Machines Corporation Built in self test method and structure for analog to digital converter
KR100364755B1 (ko) * 1999-12-20 2002-12-16 엘지전자 주식회사 칩 테스트 장치
US8103496B1 (en) 2000-10-26 2012-01-24 Cypress Semicondutor Corporation Breakpoint control in an in-circuit emulation system
US8176296B2 (en) 2000-10-26 2012-05-08 Cypress Semiconductor Corporation Programmable microcontroller architecture
US8160864B1 (en) 2000-10-26 2012-04-17 Cypress Semiconductor Corporation In-circuit emulator and pod synchronized boot
US7765095B1 (en) 2000-10-26 2010-07-27 Cypress Semiconductor Corporation Conditional branching in an in-circuit emulation system
US8149048B1 (en) 2000-10-26 2012-04-03 Cypress Semiconductor Corporation Apparatus and method for programmable power management in a programmable analog circuit block
US6724220B1 (en) 2000-10-26 2004-04-20 Cyress Semiconductor Corporation Programmable microcontroller architecture (mixed analog/digital)
US7127630B1 (en) * 2000-10-26 2006-10-24 Cypress Semiconductor Corp. Method for entering circuit test mode
US7406674B1 (en) 2001-10-24 2008-07-29 Cypress Semiconductor Corporation Method and apparatus for generating microcontroller configuration information
US8078970B1 (en) 2001-11-09 2011-12-13 Cypress Semiconductor Corporation Graphical user interface with user-selectable list-box
US8042093B1 (en) 2001-11-15 2011-10-18 Cypress Semiconductor Corporation System providing automatic source code generation for personalization and parameterization of user modules
US7770113B1 (en) 2001-11-19 2010-08-03 Cypress Semiconductor Corporation System and method for dynamically generating a configuration datasheet
US7774190B1 (en) 2001-11-19 2010-08-10 Cypress Semiconductor Corporation Sleep and stall in an in-circuit emulation system
US6971004B1 (en) 2001-11-19 2005-11-29 Cypress Semiconductor Corp. System and method of dynamically reconfiguring a programmable integrated circuit
US8069405B1 (en) 2001-11-19 2011-11-29 Cypress Semiconductor Corporation User interface for efficiently browsing an electronic document using data-driven tabs
US7844437B1 (en) 2001-11-19 2010-11-30 Cypress Semiconductor Corporation System and method for performing next placements and pruning of disallowed placements for programming an integrated circuit
US8103497B1 (en) 2002-03-28 2012-01-24 Cypress Semiconductor Corporation External interface for event architecture
US7308608B1 (en) 2002-05-01 2007-12-11 Cypress Semiconductor Corporation Reconfigurable testing system and method
US7761845B1 (en) 2002-09-09 2010-07-20 Cypress Semiconductor Corporation Method for parameterizing a user module
DE10338922B4 (de) * 2003-08-20 2016-07-14 Infineon Technologies Ag Elektrische Diagnoseschaltung sowie Verfahren zum Testen und/oder zur Diagnose einer integrierten Schaltung
US7295049B1 (en) 2004-03-25 2007-11-13 Cypress Semiconductor Corporation Method and circuit for rapid alignment of signals
US8286125B2 (en) 2004-08-13 2012-10-09 Cypress Semiconductor Corporation Model for a hardware device-independent method of defining embedded firmware for programmable systems
US8069436B2 (en) 2004-08-13 2011-11-29 Cypress Semiconductor Corporation Providing hardware independence to automate code generation of processing device firmware
US7332976B1 (en) 2005-02-04 2008-02-19 Cypress Semiconductor Corporation Poly-phase frequency synthesis oscillator
US7400183B1 (en) 2005-05-05 2008-07-15 Cypress Semiconductor Corporation Voltage controlled oscillator delay cell and method
US8089461B2 (en) 2005-06-23 2012-01-03 Cypress Semiconductor Corporation Touch wake for electronic devices
DE102005047159A1 (de) * 2005-09-30 2007-04-12 Infineon Technologies Ag Testsystem zum Testen einer integrierten Hochgeschwindigkeitslogikschaltung und Testverfahren hierfür
US8085067B1 (en) 2005-12-21 2011-12-27 Cypress Semiconductor Corporation Differential-to-single ended signal converter circuit and method
US8067948B2 (en) 2006-03-27 2011-11-29 Cypress Semiconductor Corporation Input/output multiplexer bus
US8026739B2 (en) 2007-04-17 2011-09-27 Cypress Semiconductor Corporation System level interconnect with programmable switching
US8092083B2 (en) 2007-04-17 2012-01-10 Cypress Semiconductor Corporation Temperature sensor with digital bandgap
US8130025B2 (en) 2007-04-17 2012-03-06 Cypress Semiconductor Corporation Numerical band gap
US7737724B2 (en) 2007-04-17 2010-06-15 Cypress Semiconductor Corporation Universal digital block interconnection and channel routing
US8040266B2 (en) 2007-04-17 2011-10-18 Cypress Semiconductor Corporation Programmable sigma-delta analog-to-digital converter
US9564902B2 (en) 2007-04-17 2017-02-07 Cypress Semiconductor Corporation Dynamically configurable and re-configurable data path
US8516025B2 (en) 2007-04-17 2013-08-20 Cypress Semiconductor Corporation Clock driven dynamic datapath chaining
KR100927948B1 (ko) 2007-04-23 2009-11-23 주식회사 유엠하이텍 용가재홈이 구비된 열교환기용 헤더파이프
US8266575B1 (en) 2007-04-25 2012-09-11 Cypress Semiconductor Corporation Systems and methods for dynamically reconfiguring a programmable system on a chip
US9720805B1 (en) 2007-04-25 2017-08-01 Cypress Semiconductor Corporation System and method for controlling a target device
US8065653B1 (en) 2007-04-25 2011-11-22 Cypress Semiconductor Corporation Configuration of programmable IC design elements
US8049569B1 (en) 2007-09-05 2011-11-01 Cypress Semiconductor Corporation Circuit and method for improving the accuracy of a crystal-less oscillator having dual-frequency modes
US9448964B2 (en) 2009-05-04 2016-09-20 Cypress Semiconductor Corporation Autonomous control in a programmable system
JP2011075460A (ja) * 2009-09-30 2011-04-14 Toshiba Corp 半導体集積回路
US8819507B2 (en) * 2010-05-10 2014-08-26 Raytheon Company Field programmable gate arrays with built-in self test mechanisms
DE102013214577A1 (de) * 2013-07-25 2015-01-29 Continental Automotive Gmbh überwachung und Diagnose eines Steuergerätes

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4039813A (en) * 1976-04-07 1977-08-02 Sperry Rand Corporation Apparatus and method for diagnosing digital data devices
US4498172A (en) * 1982-07-26 1985-02-05 General Electric Company System for polynomial division self-testing of digital networks
US4513418A (en) * 1982-11-08 1985-04-23 International Business Machines Corporation Simultaneous self-testing system
US4551838A (en) * 1983-06-20 1985-11-05 At&T Bell Laboratories Self-testing digital circuits
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
GB8432458D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
GB8501143D0 (en) * 1985-01-17 1985-02-20 Plessey Co Plc Integrated circuits
EP0196171B1 (de) * 1985-03-23 1991-11-06 International Computers Limited Integrierte digitale Schaltungen
US4768196A (en) * 1986-10-28 1988-08-30 Silc Technologies, Inc. Programmable logic array
DE3639577A1 (de) * 1986-11-20 1988-05-26 Siemens Ag Logikbaustein zur erzeugung von ungleich verteilten zufallsmustern fuer integrierte schaltungen
GB2218816B (en) * 1988-05-19 1992-07-29 Plessey Co Plc Improvements in and relating to methods of testing integrated circuits
US5084874A (en) * 1988-09-07 1992-01-28 Texas Instruments Incorporated Enhanced test circuit
US4918378A (en) * 1989-06-12 1990-04-17 Unisys Corporation Method and circuitry for enabling internal test operations in a VLSI chip
US5138619A (en) * 1990-02-15 1992-08-11 National Semiconductor Corporation Built-in self test for integrated circuit memory

Also Published As

Publication number Publication date
US5230000A (en) 1993-07-20
EP0510862A1 (de) 1992-10-28
DE69220715D1 (de) 1997-08-14
JP2504892B2 (ja) 1996-06-05
JPH05107320A (ja) 1993-04-27
EP0510862B1 (de) 1997-07-09

Similar Documents

Publication Publication Date Title
DE69220715D1 (de) Eingebaute Selbsttestschaltung
DE69225537D1 (de) Integrierte Speicherschaltung
DE69024638T2 (de) Aktivierungsschaltung
DE69131531T2 (de) Integrierschaltung
DE69119152T2 (de) Schaltungsanordnung
DE69206651T2 (de) Schaltungsanordnung
DE69213986T2 (de) Schaltungsanordnung
DE69216663D1 (de) Schaltkreis
DE69223886T2 (de) Analogspeicher-Schaltkreis
DE69317944D1 (de) Integrierte Speicherschaltung
DE69128002T2 (de) Detektor-Schaltkreis
DE69029468D1 (de) Integrierte Schaltungsanordnung
DE69220456T2 (de) Schaltungsanordnung
DE69129739T2 (de) Speicherschaltung
DE69215184D1 (de) Integrierte Schaltung
KR930003789U (ko) 신호선택회로
DE59010443D1 (de) Integrierte Schaltungsanordnung
KR920020384U (ko) 분주회로
DE69119363D1 (de) Halteschaltung
ATA154388A (de) Integrierte schaltungsanordnung
KR920010011U (ko) 센스 선택회로
FI924266A (fi) Kopplingsanordning
KR920015535U (ko) 바이호닉 회로
KR930007772U (ko) 신호 선택 회로
KR910020871U (ko) 블랭크-스킵회로

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee