DE69229389T2 - Testsystem für Schaltkreise - Google Patents

Testsystem für Schaltkreise

Info

Publication number
DE69229389T2
DE69229389T2 DE69229389T DE69229389T DE69229389T2 DE 69229389 T2 DE69229389 T2 DE 69229389T2 DE 69229389 T DE69229389 T DE 69229389T DE 69229389 T DE69229389 T DE 69229389T DE 69229389 T2 DE69229389 T2 DE 69229389T2
Authority
DE
Germany
Prior art keywords
test system
circuit test
circuit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69229389T
Other languages
English (en)
Other versions
DE69229389D1 (de
Inventor
Alex Loopik
David Crook
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE69229389D1 publication Critical patent/DE69229389D1/de
Publication of DE69229389T2 publication Critical patent/DE69229389T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S706/00—Data processing: artificial intelligence
    • Y10S706/902—Application using ai with detail of the ai system
    • Y10S706/919—Designing, planning, programming, CAD, CASE
DE69229389T 1992-02-25 1992-02-25 Testsystem für Schaltkreise Expired - Fee Related DE69229389T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP92301573A EP0557628B1 (de) 1992-02-25 1992-02-25 Testsystem für Schaltkreise

Publications (2)

Publication Number Publication Date
DE69229389D1 DE69229389D1 (de) 1999-07-15
DE69229389T2 true DE69229389T2 (de) 1999-10-07

Family

ID=8211281

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69229389T Expired - Fee Related DE69229389T2 (de) 1992-02-25 1992-02-25 Testsystem für Schaltkreise

Country Status (3)

Country Link
US (1) US5381417A (de)
EP (1) EP0557628B1 (de)
DE (1) DE69229389T2 (de)

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EP0646802B1 (de) * 1993-09-20 1999-08-11 Hewlett-Packard GmbH Testapparat mit grosser Kapazität
DE4335841C1 (de) * 1993-10-20 1995-06-01 Siemens Nixdorf Inf Syst Vakuumadapter
US6338148B1 (en) 1993-11-10 2002-01-08 Compaq Computer Corporation Real-time test controller
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US5931877A (en) * 1996-05-30 1999-08-03 Raytheon Company Advanced maintenance system for aircraft and military weapons
US5978501A (en) * 1997-01-03 1999-11-02 International Business Machines Corporation Adaptive inspection method and system
FR2764072B1 (fr) * 1997-05-30 1999-09-17 Sextant Avionique Procede et dispositif de test pour equipements electroniques
US5935264A (en) * 1997-06-10 1999-08-10 Micron Technology, Inc. Method and apparatus for determining a set of tests for integrated circuit testing
KR100299716B1 (ko) * 1997-07-24 2001-09-06 가야시마 고조 Ic시험장치및방법
US6047389A (en) * 1997-09-30 2000-04-04 Alcatel Usa Sourcing, L.P. Testing of a software application residing on a hardware component
US6732053B1 (en) * 1998-09-30 2004-05-04 Intel Corporation Method and apparatus for controlling a test cell
US6334100B1 (en) * 1998-10-09 2001-12-25 Agilent Technologies, Inc. Method and apparatus for electronic circuit model correction
US6067262A (en) * 1998-12-11 2000-05-23 Lsi Logic Corporation Redundancy analysis for embedded memories with built-in self test and built-in self repair
US6367042B1 (en) 1998-12-11 2002-04-02 Lsi Logic Corporation Testing methodology for embedded memories using built-in self repair and identification circuitry
US6651202B1 (en) 1999-01-26 2003-11-18 Lsi Logic Corporation Built-in self repair circuitry utilizing permanent record of defects
US6505145B1 (en) * 1999-02-22 2003-01-07 Northeast Equipment Inc. Apparatus and method for monitoring and maintaining plant equipment
US6591402B1 (en) 1999-03-19 2003-07-08 Moscape, Inc. System and method for performing assertion-based analysis of circuit designs
JP2002043200A (ja) * 2000-07-24 2002-02-08 Mitsubishi Electric Corp 異常原因検出装置及び異常原因検出方法
GB2379752A (en) * 2001-06-05 2003-03-19 Abb Ab Root cause analysis under conditions of uncertainty
US6546527B1 (en) * 2001-11-14 2003-04-08 Henry Davis, Jr. Method and apparatus for automated worst case designing and analyzing a circuit
DE10241141B4 (de) * 2002-09-05 2015-07-16 Infineon Technologies Ag Halbleiter-Bauelement-Test-Verfahren für ein Halbleiter-Bauelement-Test-System mit reduzierter Anzahl an Test-Kanälen
US7109728B2 (en) * 2003-02-25 2006-09-19 Agilent Technologies, Inc. Probe based information storage for probes used for opens detection in in-circuit testing
US6901336B2 (en) * 2003-03-31 2005-05-31 Agilent Technologies, Inc. Method and apparatus for supplying power, and channeling analog measurement and communication signals over single pair of wires
JP2007519892A (ja) * 2003-06-11 2007-07-19 アジレント・テクノロジーズ・インク 複数のテストフィクスチャを使用するときのテストシステム校正の補正および装置測定値の変換
US7170394B2 (en) * 2003-07-31 2007-01-30 Agilent Technologies, Inc. Remote current sensing and communication over single pair of power feed wires
US6930494B2 (en) * 2003-08-29 2005-08-16 Agilent Technologies, Inc. Capacitive probe assembly with flex circuit
US6998849B2 (en) * 2003-09-27 2006-02-14 Agilent Technologies, Inc. Capacitive sensor measurement method for discrete time sampled system for in-circuit test
US7224169B2 (en) 2004-11-02 2007-05-29 Agilent Technologies, Inc. Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections
US7447966B2 (en) * 2005-01-05 2008-11-04 Hewlett-Packard Development Company Hardware verification scripting
US7321885B2 (en) * 2005-07-18 2008-01-22 Agilent Technologies, Inc. Product framework for managing test systems, supporting customer relationships management and protecting intellectual knowledge in a manufacturing testing environment
US9182425B2 (en) * 2012-05-21 2015-11-10 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Probe supporting and aligning apparatus
CN102819689B (zh) * 2012-08-29 2016-02-17 工业和信息化部电子第五研究所 多芯片组件的可靠性预测方法
JP6520356B2 (ja) * 2015-04-28 2019-05-29 新東工業株式会社 検査装置および検査方法
WO2017142530A1 (en) 2016-02-17 2017-08-24 Entit Software Llc Environment simulations
CN106980081B (zh) * 2017-03-30 2023-03-28 苏州欧康诺电子科技股份有限公司 自动在线式板卡静态测试系统及其测试方法
US11811588B2 (en) * 2020-04-22 2023-11-07 Samsung Electronics Co., Ltd. Configuration management and analytics in cellular networks
US11269711B2 (en) 2020-07-14 2022-03-08 Juniper Networks, Inc. Failure impact analysis of network events
US11888679B2 (en) * 2020-09-25 2024-01-30 Juniper Networks, Inc. Hypothesis driven diagnosis of network systems
CN113934194A (zh) * 2021-09-26 2022-01-14 超恩智能科技(苏州)有限公司 一种工控机dio接口的测试装置及其测试方法

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UST924006I4 (en) * 1973-10-03 1974-07-02 Functional test method for asynchronous sequential circuits
US4168796A (en) * 1978-04-13 1979-09-25 Ncr Corporation Tester with driver/sensor circuit having programmable termination devices
US4194113A (en) * 1978-04-13 1980-03-18 Ncr Corporation Method and apparatus for isolating faults in a logic circuit
DE3022279A1 (de) * 1979-06-23 1981-01-08 Membrain Ltd Verfahren und einrichtung zur lokalisierung eines fehlers in einem elektronischen schaltkreis
US4454585A (en) * 1981-05-28 1984-06-12 Ele John H Printed wiring board inspection, work logging and information system
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing
US4857833A (en) * 1987-08-27 1989-08-15 Teradyne, Inc. Diagnosis of faults on circuit board
US5010522A (en) * 1988-12-05 1991-04-23 Texas Instruments Incorporated Integrated-circuit configuration having fast local access time
US5157668A (en) * 1989-07-05 1992-10-20 Applied Diagnostics, Inc. Method and apparatus for locating faults in electronic units
US5001714A (en) * 1989-11-07 1991-03-19 Array Analysis, Inc. Unpredictable fault detection using adaptive inference testing techniques
US5293323A (en) * 1991-10-24 1994-03-08 General Electric Company Method for fault diagnosis by assessment of confidence measure

Also Published As

Publication number Publication date
EP0557628B1 (de) 1999-06-09
EP0557628A1 (de) 1993-09-01
DE69229389D1 (de) 1999-07-15
US5381417A (en) 1995-01-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8339 Ceased/non-payment of the annual fee