DE69229389T2 - Testsystem für Schaltkreise - Google Patents
Testsystem für SchaltkreiseInfo
- Publication number
- DE69229389T2 DE69229389T2 DE69229389T DE69229389T DE69229389T2 DE 69229389 T2 DE69229389 T2 DE 69229389T2 DE 69229389 T DE69229389 T DE 69229389T DE 69229389 T DE69229389 T DE 69229389T DE 69229389 T2 DE69229389 T2 DE 69229389T2
- Authority
- DE
- Germany
- Prior art keywords
- test system
- circuit test
- circuit
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S706/00—Data processing: artificial intelligence
- Y10S706/902—Application using ai with detail of the ai system
- Y10S706/919—Designing, planning, programming, CAD, CASE
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP92301573A EP0557628B1 (de) | 1992-02-25 | 1992-02-25 | Testsystem für Schaltkreise |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69229389D1 DE69229389D1 (de) | 1999-07-15 |
DE69229389T2 true DE69229389T2 (de) | 1999-10-07 |
Family
ID=8211281
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69229389T Expired - Fee Related DE69229389T2 (de) | 1992-02-25 | 1992-02-25 | Testsystem für Schaltkreise |
Country Status (3)
Country | Link |
---|---|
US (1) | US5381417A (de) |
EP (1) | EP0557628B1 (de) |
DE (1) | DE69229389T2 (de) |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69326004T2 (de) * | 1993-09-20 | 1999-11-25 | Hewlett Packard Gmbh | Testapparat mit grosser Kapazität |
DE4335841C1 (de) * | 1993-10-20 | 1995-06-01 | Siemens Nixdorf Inf Syst | Vakuumadapter |
US6338148B1 (en) | 1993-11-10 | 2002-01-08 | Compaq Computer Corporation | Real-time test controller |
US5808919A (en) * | 1993-11-23 | 1998-09-15 | Hewlett-Packard Company | Diagnostic system |
WO1997016740A1 (en) * | 1995-11-02 | 1997-05-09 | Genrad, Inc. | System and method of accounting for defect detection in a testing system |
US5931877A (en) * | 1996-05-30 | 1999-08-03 | Raytheon Company | Advanced maintenance system for aircraft and military weapons |
US5978501A (en) * | 1997-01-03 | 1999-11-02 | International Business Machines Corporation | Adaptive inspection method and system |
FR2764072B1 (fr) * | 1997-05-30 | 1999-09-17 | Sextant Avionique | Procede et dispositif de test pour equipements electroniques |
US5935264A (en) * | 1997-06-10 | 1999-08-10 | Micron Technology, Inc. | Method and apparatus for determining a set of tests for integrated circuit testing |
KR100299716B1 (ko) * | 1997-07-24 | 2001-09-06 | 가야시마 고조 | Ic시험장치및방법 |
US6047389A (en) * | 1997-09-30 | 2000-04-04 | Alcatel Usa Sourcing, L.P. | Testing of a software application residing on a hardware component |
US6732053B1 (en) * | 1998-09-30 | 2004-05-04 | Intel Corporation | Method and apparatus for controlling a test cell |
US6334100B1 (en) * | 1998-10-09 | 2001-12-25 | Agilent Technologies, Inc. | Method and apparatus for electronic circuit model correction |
US6067262A (en) * | 1998-12-11 | 2000-05-23 | Lsi Logic Corporation | Redundancy analysis for embedded memories with built-in self test and built-in self repair |
US6367042B1 (en) | 1998-12-11 | 2002-04-02 | Lsi Logic Corporation | Testing methodology for embedded memories using built-in self repair and identification circuitry |
US6651202B1 (en) | 1999-01-26 | 2003-11-18 | Lsi Logic Corporation | Built-in self repair circuitry utilizing permanent record of defects |
US6505145B1 (en) * | 1999-02-22 | 2003-01-07 | Northeast Equipment Inc. | Apparatus and method for monitoring and maintaining plant equipment |
WO2000057317A1 (en) * | 1999-03-19 | 2000-09-28 | Moscape, Inc. | System and method for performing assertion-based analysis of circuit designs |
JP2002043200A (ja) * | 2000-07-24 | 2002-02-08 | Mitsubishi Electric Corp | 異常原因検出装置及び異常原因検出方法 |
GB2379752A (en) | 2001-06-05 | 2003-03-19 | Abb Ab | Root cause analysis under conditions of uncertainty |
US6546527B1 (en) * | 2001-11-14 | 2003-04-08 | Henry Davis, Jr. | Method and apparatus for automated worst case designing and analyzing a circuit |
DE10241141B4 (de) * | 2002-09-05 | 2015-07-16 | Infineon Technologies Ag | Halbleiter-Bauelement-Test-Verfahren für ein Halbleiter-Bauelement-Test-System mit reduzierter Anzahl an Test-Kanälen |
US7109728B2 (en) * | 2003-02-25 | 2006-09-19 | Agilent Technologies, Inc. | Probe based information storage for probes used for opens detection in in-circuit testing |
US6901336B2 (en) * | 2003-03-31 | 2005-05-31 | Agilent Technologies, Inc. | Method and apparatus for supplying power, and channeling analog measurement and communication signals over single pair of wires |
WO2004111768A2 (en) * | 2003-06-11 | 2004-12-23 | Agilent Technologies, Inc. | Correcting test system calibration and transforming device measurements when using multiple test fixtures |
US7170394B2 (en) * | 2003-07-31 | 2007-01-30 | Agilent Technologies, Inc. | Remote current sensing and communication over single pair of power feed wires |
US6930494B2 (en) * | 2003-08-29 | 2005-08-16 | Agilent Technologies, Inc. | Capacitive probe assembly with flex circuit |
US6998849B2 (en) * | 2003-09-27 | 2006-02-14 | Agilent Technologies, Inc. | Capacitive sensor measurement method for discrete time sampled system for in-circuit test |
US7224169B2 (en) | 2004-11-02 | 2007-05-29 | Agilent Technologies, Inc. | Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections |
US7447966B2 (en) * | 2005-01-05 | 2008-11-04 | Hewlett-Packard Development Company | Hardware verification scripting |
US7321885B2 (en) * | 2005-07-18 | 2008-01-22 | Agilent Technologies, Inc. | Product framework for managing test systems, supporting customer relationships management and protecting intellectual knowledge in a manufacturing testing environment |
US9182425B2 (en) | 2012-05-21 | 2015-11-10 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Probe supporting and aligning apparatus |
CN102819689B (zh) * | 2012-08-29 | 2016-02-17 | 工业和信息化部电子第五研究所 | 多芯片组件的可靠性预测方法 |
JP6520356B2 (ja) * | 2015-04-28 | 2019-05-29 | 新東工業株式会社 | 検査装置および検査方法 |
WO2017142530A1 (en) | 2016-02-17 | 2017-08-24 | Entit Software Llc | Environment simulations |
CN106980081B (zh) * | 2017-03-30 | 2023-03-28 | 苏州欧康诺电子科技股份有限公司 | 自动在线式板卡静态测试系统及其测试方法 |
US11811588B2 (en) * | 2020-04-22 | 2023-11-07 | Samsung Electronics Co., Ltd. | Configuration management and analytics in cellular networks |
US11269711B2 (en) | 2020-07-14 | 2022-03-08 | Juniper Networks, Inc. | Failure impact analysis of network events |
US11888679B2 (en) * | 2020-09-25 | 2024-01-30 | Juniper Networks, Inc. | Hypothesis driven diagnosis of network systems |
CN113934194A (zh) * | 2021-09-26 | 2022-01-14 | 超恩智能科技(苏州)有限公司 | 一种工控机dio接口的测试装置及其测试方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
UST930005I4 (en) * | 1972-06-21 | 1975-01-07 | Total state condition | |
UST924006I4 (en) * | 1973-10-03 | 1974-07-02 | Functional test method for asynchronous sequential circuits | |
US4194113A (en) * | 1978-04-13 | 1980-03-18 | Ncr Corporation | Method and apparatus for isolating faults in a logic circuit |
US4168796A (en) * | 1978-04-13 | 1979-09-25 | Ncr Corporation | Tester with driver/sensor circuit having programmable termination devices |
DE3022279A1 (de) * | 1979-06-23 | 1981-01-08 | Membrain Ltd | Verfahren und einrichtung zur lokalisierung eines fehlers in einem elektronischen schaltkreis |
US4454585A (en) * | 1981-05-28 | 1984-06-12 | Ele John H | Printed wiring board inspection, work logging and information system |
US4709366A (en) * | 1985-07-29 | 1987-11-24 | John Fluke Mfg. Co., Inc. | Computer assisted fault isolation in circuit board testing |
US4857833A (en) * | 1987-08-27 | 1989-08-15 | Teradyne, Inc. | Diagnosis of faults on circuit board |
US5010522A (en) * | 1988-12-05 | 1991-04-23 | Texas Instruments Incorporated | Integrated-circuit configuration having fast local access time |
US5157668A (en) * | 1989-07-05 | 1992-10-20 | Applied Diagnostics, Inc. | Method and apparatus for locating faults in electronic units |
US5001714A (en) * | 1989-11-07 | 1991-03-19 | Array Analysis, Inc. | Unpredictable fault detection using adaptive inference testing techniques |
US5293323A (en) * | 1991-10-24 | 1994-03-08 | General Electric Company | Method for fault diagnosis by assessment of confidence measure |
-
1992
- 1992-02-25 EP EP92301573A patent/EP0557628B1/de not_active Expired - Lifetime
- 1992-02-25 DE DE69229389T patent/DE69229389T2/de not_active Expired - Fee Related
-
1993
- 1993-01-25 US US08/008,472 patent/US5381417A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0557628B1 (de) | 1999-06-09 |
DE69229389D1 (de) | 1999-07-15 |
US5381417A (en) | 1995-01-10 |
EP0557628A1 (de) | 1993-09-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69229389T2 (de) | Testsystem für Schaltkreise | |
DE69434243D1 (de) | Synchronisierung-Demodulation-Schaltung für OFDM | |
NO931835D0 (no) | Ikke-destruktivt testsystem | |
DE69420500T2 (de) | Messsystem | |
DE69427945T2 (de) | Inspektionseinrichtung für Steckverbinder | |
NO955228D0 (no) | Fjernmålesystem | |
DE69209169D1 (de) | Verbindungstechnik für integrierte Schaltung | |
DE69412825T2 (de) | Elektrisches bohrlochmessungssystem | |
DE69206848D1 (de) | Verbindungsanordnung für Prüfeinrichtung | |
DE69301294T2 (de) | Verbindungsvorrichtung für Baugruppen | |
DE69027387T2 (de) | Schaltungssystem für anwendungsdienst | |
DE59008557D1 (de) | Schaltungsanordnung für Anzeigevorrichtung. | |
DE69625837D1 (de) | Einrichtung für Leiterplattenzusammenbau | |
DE69404570D1 (de) | Kurzschlussdetektor für Messwertaufnehmer | |
DE69616464D1 (de) | Elektronisches prüfbares System | |
DE59406005D1 (de) | Leiteranschlussvorrichtung für Schwachstromanlagen | |
DE69127149D1 (de) | Schaltungsprüf-Verfahren | |
DE69308076T2 (de) | Montagevorrichtung für Anschlussleiste | |
DE69404689D1 (de) | Anzeiger für ein elektrisches Gerät | |
FI931411A (fi) | Testningsapparat foer bromssystem | |
DE69329006D1 (de) | Zündschaltung für Prüfabschlusseinheiten | |
DE69429367D1 (de) | Elektronisches gerät für reflexotherapie | |
DE69424335T2 (de) | Messsystem | |
DE69302684T2 (de) | Testvorrichtung | |
KR940016883U (ko) | 테스터 이상감지회로 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
8339 | Ceased/non-payment of the annual fee |