DE69229692T2 - Verfahren zum Erfassen eines Pulssignals in einem Schaltkreis mittels eines passiven Tastkopf mit grosser Bandbreite - Google Patents

Verfahren zum Erfassen eines Pulssignals in einem Schaltkreis mittels eines passiven Tastkopf mit grosser Bandbreite

Info

Publication number
DE69229692T2
DE69229692T2 DE69229692T DE69229692T DE69229692T2 DE 69229692 T2 DE69229692 T2 DE 69229692T2 DE 69229692 T DE69229692 T DE 69229692T DE 69229692 T DE69229692 T DE 69229692T DE 69229692 T2 DE69229692 T2 DE 69229692T2
Authority
DE
Germany
Prior art keywords
detecting
circuit
pulse signal
large bandwidth
passive probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69229692T
Other languages
English (en)
Other versions
DE69229692D1 (de
Inventor
Thomas J Zamborelli
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69229692D1 publication Critical patent/DE69229692D1/de
Application granted granted Critical
Publication of DE69229692T2 publication Critical patent/DE69229692T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
DE69229692T 1991-04-24 1992-04-06 Verfahren zum Erfassen eines Pulssignals in einem Schaltkreis mittels eines passiven Tastkopf mit grosser Bandbreite Expired - Fee Related DE69229692T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/690,752 US5172051A (en) 1991-04-24 1991-04-24 Wide bandwidth passive probe

Publications (2)

Publication Number Publication Date
DE69229692D1 DE69229692D1 (de) 1999-09-09
DE69229692T2 true DE69229692T2 (de) 1999-12-02

Family

ID=24773812

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69229692T Expired - Fee Related DE69229692T2 (de) 1991-04-24 1992-04-06 Verfahren zum Erfassen eines Pulssignals in einem Schaltkreis mittels eines passiven Tastkopf mit grosser Bandbreite

Country Status (4)

Country Link
US (1) US5172051A (de)
EP (1) EP0513992B1 (de)
JP (1) JPH05149972A (de)
DE (1) DE69229692T2 (de)

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CN103884881A (zh) * 2012-12-21 2014-06-25 北京普源精电科技有限公司 一种具有适配器的多通道信号获取探头

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US7230411B2 (en) * 2004-12-28 2007-06-12 S&C Electric Co. Voltage sensing apparatus for medium-voltage electrical power distribution systems
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US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
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US20070057682A1 (en) * 2005-09-15 2007-03-15 Mctigue Michael T Signal probe and probe assembly
JP4819514B2 (ja) * 2006-01-26 2011-11-24 株式会社ニューフレアテクノロジー Ｄａｃセトリング特性評価方法、ｄａｃセトリング特性評価装置及び電子線描画装置
US7323892B1 (en) * 2006-06-07 2008-01-29 Agilent Technologies, Inc. Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
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JP4936125B2 (ja) * 2007-04-12 2012-05-23 横河電機株式会社 プローブ
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US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US8098076B2 (en) * 2009-04-01 2012-01-17 Formfactor, Inc. Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test
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US20110074441A1 (en) * 2009-09-30 2011-03-31 Tektronix, Inc. Low Capacitance Signal Acquisition System
US8456173B2 (en) * 2009-09-30 2013-06-04 Tektronix, Inc. Signal acquisition system having probe cable termination in a signal processing instrument
US8564308B2 (en) * 2009-09-30 2013-10-22 Tektronix, Inc. Signal acquisition system having reduced probe loading of a device under test
US8436624B2 (en) * 2009-09-30 2013-05-07 Tektronix, Inc. Signal acquisition system having reduced probe loading of a device under test
CN103185821B (zh) * 2011-12-29 2017-04-19 北京普源精电科技有限公司 一种具有前端衰减功能的数字示波器
US9880198B2 (en) * 2013-02-11 2018-01-30 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. High bandwidth signal probe tip
US9673773B2 (en) * 2015-06-23 2017-06-06 Qualcomm Incorporated Signal interconnect with high pass filter
US11035881B2 (en) * 2017-04-21 2021-06-15 Rohde & Schwarz Gmbh & Co. Kg Probe, measuring system as well as test setup
US11287447B2 (en) * 2017-06-26 2022-03-29 Rohde & Schwarz Gmbh & Co. Kg Measurement input circuit and measurement device
JP1622970S (de) * 2018-02-02 2019-01-28
JP1622968S (de) * 2018-02-02 2019-01-28
JP1623279S (de) * 2018-02-02 2019-01-28
JP1626667S (de) * 2018-02-02 2019-03-18
JP1626668S (de) * 2018-02-02 2019-03-18
JP1622969S (de) * 2018-02-02 2019-01-28
JP1623280S (de) * 2018-02-02 2019-01-28
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
US11650227B2 (en) * 2020-01-06 2023-05-16 Xcerra Corporation System and method for attenuating and/or terminating RF circuit
TWI749462B (zh) * 2020-02-11 2021-12-11 創意電子股份有限公司 電壓模式信號收發裝置以及其電壓模式信號發射器
US11705611B2 (en) * 2021-05-20 2023-07-18 Ryan Letcher High-frequency coaxial attenuator

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103884881A (zh) * 2012-12-21 2014-06-25 北京普源精电科技有限公司 一种具有适配器的多通道信号获取探头
CN103884881B (zh) * 2012-12-21 2018-04-24 北京普源精电科技有限公司 一种具有适配器的多通道信号获取探头

Also Published As

Publication number Publication date
JPH05149972A (ja) 1993-06-15
EP0513992A1 (de) 1992-11-19
DE69229692D1 (de) 1999-09-09
US5172051A (en) 1992-12-15
EP0513992B1 (de) 1999-08-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8339 Ceased/non-payment of the annual fee