DE69230300T2 - Informationsaufzeichnungs-/Wiedergabegerät und Methode zur Informationsaufzeichnung oder /-wiedergabe auf oder von einem Aufzeichnungsmedium mittels Sondenelektroden - Google Patents

Informationsaufzeichnungs-/Wiedergabegerät und Methode zur Informationsaufzeichnung oder /-wiedergabe auf oder von einem Aufzeichnungsmedium mittels Sondenelektroden

Info

Publication number
DE69230300T2
DE69230300T2 DE69230300T DE69230300T DE69230300T2 DE 69230300 T2 DE69230300 T2 DE 69230300T2 DE 69230300 T DE69230300 T DE 69230300T DE 69230300 T DE69230300 T DE 69230300T DE 69230300 T2 DE69230300 T2 DE 69230300T2
Authority
DE
Germany
Prior art keywords
information
recording medium
probe electrodes
information recording
reproduction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69230300T
Other languages
English (en)
Other versions
DE69230300D1 (de
Inventor
Katsunori Hatanaka
Kunihiro Sakai
Takahiro Oguchi
Akihiko Yamano
Shunichi Shido
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of DE69230300D1 publication Critical patent/DE69230300D1/de
Application granted granted Critical
Publication of DE69230300T2 publication Critical patent/DE69230300T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1833—Error detection or correction; Testing, e.g. of drop-outs by adding special lists or symbols to the coded information
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/13—Linear codes
    • H03M13/15—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
    • H03M13/151—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/874—Probe tip array
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943—Information storage or retrieval using nanostructure
    • Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument
DE69230300T 1991-06-05 1992-05-26 Informationsaufzeichnungs-/Wiedergabegerät und Methode zur Informationsaufzeichnung oder /-wiedergabe auf oder von einem Aufzeichnungsmedium mittels Sondenelektroden Expired - Fee Related DE69230300T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03134211A JP3126409B2 (ja) 1991-06-05 1991-06-05 情報記録再生方法

Publications (2)

Publication Number Publication Date
DE69230300D1 DE69230300D1 (de) 1999-12-23
DE69230300T2 true DE69230300T2 (de) 2000-06-08

Family

ID=15123024

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69230300T Expired - Fee Related DE69230300T2 (de) 1991-06-05 1992-05-26 Informationsaufzeichnungs-/Wiedergabegerät und Methode zur Informationsaufzeichnung oder /-wiedergabe auf oder von einem Aufzeichnungsmedium mittels Sondenelektroden

Country Status (6)

Country Link
US (1) US5394388A (de)
EP (1) EP0517074B1 (de)
JP (1) JP3126409B2 (de)
AT (1) ATE186792T1 (de)
CA (1) CA2069452C (de)
DE (1) DE69230300T2 (de)

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JP3135779B2 (ja) * 1994-03-18 2001-02-19 キヤノン株式会社 情報処理装置
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US7260051B1 (en) * 1998-12-18 2007-08-21 Nanochip, Inc. Molecular memory medium and molecular memory integrated circuit
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US7233517B2 (en) * 2002-10-15 2007-06-19 Nanochip, Inc. Atomic probes and media for high density data storage
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US20050243592A1 (en) * 2004-04-16 2005-11-03 Rust Thomas F High density data storage device having eraseable bit cells
US7471615B2 (en) * 2004-07-30 2008-12-30 Hewlett-Packard Development Company, L.P. Storage device having information to identify defective storage region
US20060291271A1 (en) * 2005-06-24 2006-12-28 Nanochip, Inc. High density data storage devices having servo indicia formed in a patterned media
US20070008867A1 (en) * 2005-07-08 2007-01-11 Nanochip, Inc. High density data storage devices with a lubricant layer comprised of a field of polymer chains
US20070008865A1 (en) * 2005-07-08 2007-01-11 Nanochip, Inc. High density data storage devices with polarity-dependent memory switching media
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US20080001075A1 (en) * 2006-06-15 2008-01-03 Nanochip, Inc. Memory stage for a probe storage device
US20070121477A1 (en) * 2006-06-15 2007-05-31 Nanochip, Inc. Cantilever with control of vertical and lateral position of contact probe tip
US20070290282A1 (en) * 2006-06-15 2007-12-20 Nanochip, Inc. Bonded chip assembly with a micro-mover for microelectromechanical systems
US20080074984A1 (en) * 2006-09-21 2008-03-27 Nanochip, Inc. Architecture for a Memory Device
US20080074792A1 (en) * 2006-09-21 2008-03-27 Nanochip, Inc. Control scheme for a memory device
US20080174918A1 (en) * 2007-01-19 2008-07-24 Nanochip, Inc. Method and system for writing and reading a charge-trap media with a probe tip
JP4538087B2 (ja) * 2007-02-27 2010-09-08 パイオニア株式会社 情報記録再生装置及び方法
US20100110849A1 (en) * 2007-03-19 2010-05-06 Pioneer Corporation Information recording/reproducing device and method
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US20100039919A1 (en) * 2008-08-15 2010-02-18 Nanochip, Inc. Cantilever Structure for Use in Seek-and-Scan Probe Storage
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Also Published As

Publication number Publication date
DE69230300D1 (de) 1999-12-23
EP0517074B1 (de) 1999-11-17
EP0517074A3 (de) 1995-02-15
ATE186792T1 (de) 1999-12-15
JP3126409B2 (ja) 2001-01-22
CA2069452A1 (en) 1992-12-06
EP0517074A2 (de) 1992-12-09
US5394388A (en) 1995-02-28
JPH04358337A (ja) 1992-12-11
CA2069452C (en) 1998-02-03

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee