DE69322904D1 - Prüfstation mit integrierter Umgebungskontroleinrichtung - Google Patents

Prüfstation mit integrierter Umgebungskontroleinrichtung

Info

Publication number
DE69322904D1
DE69322904D1 DE69322904T DE69322904T DE69322904D1 DE 69322904 D1 DE69322904 D1 DE 69322904D1 DE 69322904 T DE69322904 T DE 69322904T DE 69322904 T DE69322904 T DE 69322904T DE 69322904 D1 DE69322904 D1 DE 69322904D1
Authority
DE
Germany
Prior art keywords
control device
environmental control
test station
integrated environmental
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69322904T
Other languages
English (en)
Other versions
DE69322904T2 (de
DE69322904T3 (de
Inventor
Warren K Harwood
Martin J Koxxy
Paul A Tervo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FormFactor Beaverton Inc
Original Assignee
Cascade Microtech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=25397826&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69322904(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Cascade Microtech Inc filed Critical Cascade Microtech Inc
Publication of DE69322904D1 publication Critical patent/DE69322904D1/de
Publication of DE69322904T2 publication Critical patent/DE69322904T2/de
Application granted granted Critical
Publication of DE69322904T3 publication Critical patent/DE69322904T3/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
DE69322904T 1992-05-29 1993-05-20 Prüfstation mit integrierter Umgebungskontroleinrichtung Expired - Lifetime DE69322904T3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US891232 1992-05-29
US07/891,232 US5266889A (en) 1992-05-29 1992-05-29 Wafer probe station with integrated environment control enclosure

Publications (3)

Publication Number Publication Date
DE69322904D1 true DE69322904D1 (de) 1999-02-18
DE69322904T2 DE69322904T2 (de) 1999-05-27
DE69322904T3 DE69322904T3 (de) 2004-08-19

Family

ID=25397826

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69322904T Expired - Lifetime DE69322904T3 (de) 1992-05-29 1993-05-20 Prüfstation mit integrierter Umgebungskontroleinrichtung

Country Status (4)

Country Link
US (1) US5266889A (de)
EP (1) EP0573183B2 (de)
JP (1) JP3251098B2 (de)
DE (1) DE69322904T3 (de)

Families Citing this family (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5476211A (en) * 1993-11-16 1995-12-19 Form Factor, Inc. Method of manufacturing electrical contacts, using a sacrificial member
US5829128A (en) * 1993-11-16 1998-11-03 Formfactor, Inc. Method of mounting resilient contact structures to semiconductor devices
US5345170A (en) * 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6313649B2 (en) * 1992-06-11 2001-11-06 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US6380751B2 (en) * 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
JPH0653299A (ja) * 1992-07-31 1994-02-25 Tokyo Electron Yamanashi Kk バーンイン装置
US20020053734A1 (en) 1993-11-16 2002-05-09 Formfactor, Inc. Probe card assembly and kit, and methods of making same
US5611946A (en) * 1994-02-18 1997-03-18 New Wave Research Multi-wavelength laser system, probe station and laser cutter system using the same
DE9408512U1 (de) * 1994-05-24 1995-09-21 Hoeflschweiger Nikolaus Teststation
US5835997A (en) * 1995-03-28 1998-11-10 University Of South Florida Wafer shielding chamber for probe station
US5561377A (en) * 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US5610529A (en) * 1995-04-28 1997-03-11 Cascade Microtech, Inc. Probe station having conductive coating added to thermal chuck insulator
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
DE19638816B4 (de) * 1996-09-20 2009-04-30 Karl Suss Dresden Gmbh Tester für Halbleiteranordnungen mit einer mehrere voneinander isolierte Teile aufweisenden Spannvorrichtung
US5783835A (en) * 1997-03-17 1998-07-21 Probing Solutions, Incorporated Probing with backside emission microscopy
US5963027A (en) * 1997-06-06 1999-10-05 Cascade Microtech, Inc. Probe station having environment control chambers with orthogonally flexible lateral wall assembly
US6002263A (en) * 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6573702B2 (en) 1997-09-12 2003-06-03 New Wave Research Method and apparatus for cleaning electronic test contacts
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) * 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6700397B2 (en) * 2000-07-13 2004-03-02 The Micromanipulator Company, Inc. Triaxial probe assembly
US6424141B1 (en) 2000-07-13 2002-07-23 The Micromanipulator Company, Inc. Wafer probe station
US6965226B2 (en) * 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
AU2002327490A1 (en) 2001-08-21 2003-06-30 Cascade Microtech, Inc. Membrane probing system
US6836135B2 (en) * 2001-08-31 2004-12-28 Cascade Microtech, Inc. Optical testing device
US6951846B2 (en) * 2002-03-07 2005-10-04 The United States Of America As Represented By The Secretary Of The Army Artemisinins with improved stability and bioavailability for therapeutic drug development and application
US7046025B2 (en) * 2002-10-02 2006-05-16 Suss Microtec Testsystems Gmbh Test apparatus for testing substrates at low temperatures
US6861856B2 (en) * 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
WO2004066608A2 (en) * 2003-01-21 2004-08-05 Sharp Laboratories Of America, Inc. Image compression using a color visual model
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7026806B2 (en) * 2003-06-30 2006-04-11 International Business Machines Corporation Apparatus for preventing cross talk and interference in semiconductor devices during test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
JP4142553B2 (ja) * 2003-10-31 2008-09-03 東京エレクトロン株式会社 被処理体を載置するための載置台
JP2005156253A (ja) 2003-11-21 2005-06-16 Agilent Technol Inc 表示パネル試験用プローバ及び試験装置
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7330041B2 (en) * 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7034563B1 (en) * 2005-01-26 2006-04-25 Ahbee 2, L.P., A California Limited Partnership Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self aligning electrodes
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
JP2006258490A (ja) * 2005-03-15 2006-09-28 Agilent Technol Inc テストシステム及びその接続箱
US20070294047A1 (en) * 2005-06-11 2007-12-20 Leonard Hayden Calibration system
US20070257686A1 (en) * 2006-05-01 2007-11-08 Oscar Beijert Integrated circuit probe card analyzer
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
WO2012029130A1 (ja) * 2010-08-31 2012-03-08 株式会社アドバンテスト ウェハトレイ、半導体ウェハ試験装置、及び半導体ウェハの試験方法
US20130014983A1 (en) * 2011-07-14 2013-01-17 Texas Instruments Incorporated Device contactor with integrated rf shield
CN103543298B (zh) * 2012-07-13 2016-03-23 旺矽科技股份有限公司 探针固持结构及其光学检测装置
US9784763B1 (en) 2016-04-08 2017-10-10 Cascade Microtech, Inc. Shielded probe systems with controlled testing environments
US10698002B2 (en) 2017-10-02 2020-06-30 Formfactor Beaverton, Inc. Probe systems for testing a device under test
CN113495178A (zh) * 2020-04-07 2021-10-12 迪科特测试科技(苏州)有限公司 用于探测系统的屏蔽

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3333274A (en) * 1965-04-21 1967-07-25 Micro Tech Mfg Inc Testing device
US3710251A (en) * 1971-04-07 1973-01-09 Collins Radio Co Microelectric heat exchanger pedestal
US4115736A (en) * 1977-03-09 1978-09-19 The United States Of America As Represented By The Secretary Of The Air Force Probe station
JPS5953659B2 (ja) * 1980-04-11 1984-12-26 株式会社日立製作所 真空室中回転体の往復動機構
US5077523A (en) * 1989-11-03 1991-12-31 John H. Blanz Company, Inc. Cryogenic probe station having movable chuck accomodating variable thickness probe cards

Also Published As

Publication number Publication date
JPH0653297A (ja) 1994-02-25
JP3251098B2 (ja) 2002-01-28
EP0573183B1 (de) 1999-01-07
DE69322904T2 (de) 1999-05-27
US5266889A (en) 1993-11-30
EP0573183B2 (de) 2004-03-03
DE69322904T3 (de) 2004-08-19
EP0573183A1 (de) 1993-12-08

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8366 Restricted maintained after opposition proceedings
8328 Change in the person/name/address of the agent

Representative=s name: ZEITLER, VOLPERT, KANDLBINDER, 80539 MUENCHEN