DE69326765T2 - Atmosphärendruck-ionenschnittstelle für einen massenspektrometer - Google Patents
Atmosphärendruck-ionenschnittstelle für einen massenspektrometerInfo
- Publication number
- DE69326765T2 DE69326765T2 DE69326765T DE69326765T DE69326765T2 DE 69326765 T2 DE69326765 T2 DE 69326765T2 DE 69326765 T DE69326765 T DE 69326765T DE 69326765 T DE69326765 T DE 69326765T DE 69326765 T2 DE69326765 T2 DE 69326765T2
- Authority
- DE
- Germany
- Prior art keywords
- analyzer
- atmospheric pressure
- mass spectrometer
- mass analyzer
- pressure ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G01N30/724—Nebulising, aerosol formation or ionisation
- G01N30/7266—Nebulising, aerosol formation or ionisation by electric field, e.g. electrospray
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
- H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G01N30/724—Nebulising, aerosol formation or ionisation
- G01N30/7246—Nebulising, aerosol formation or ionisation by pneumatic means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G01N30/7273—Desolvation chambers
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US88969392A | 1992-05-29 | 1992-05-29 | |
US08/009,063 US5352892A (en) | 1992-05-29 | 1993-01-26 | Atmospheric pressure ion interface for a mass analyzer |
PCT/US1993/004903 WO1993024209A1 (en) | 1992-05-29 | 1993-05-28 | Atmospheric pressure ion interface for a mass analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69326765D1 DE69326765D1 (de) | 1999-11-18 |
DE69326765T2 true DE69326765T2 (de) | 2000-03-02 |
Family
ID=26678999
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69326765T Expired - Fee Related DE69326765T2 (de) | 1992-05-29 | 1993-05-28 | Atmosphärendruck-ionenschnittstelle für einen massenspektrometer |
Country Status (6)
Country | Link |
---|---|
US (1) | US5352892A (de) |
EP (1) | EP0644796B1 (de) |
JP (1) | JPH07507418A (de) |
AT (1) | ATE185495T1 (de) |
DE (1) | DE69326765T2 (de) |
WO (1) | WO1993024209A1 (de) |
Families Citing this family (61)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3087548B2 (ja) * | 1993-12-09 | 2000-09-11 | 株式会社日立製作所 | 液体クロマトグラフ結合型質量分析装置 |
JP3385707B2 (ja) * | 1994-03-17 | 2003-03-10 | 株式会社日立製作所 | 質量分析装置 |
DE4415480C2 (de) * | 1994-05-02 | 1999-09-02 | Bruker Daltonik Gmbh | Vorrichtung und Verfahren zur massenspektrometrischen Untersuchung von Substanzgemischen durch Kopplung kapillarelektrophoretischer Separation (CE) mit Elektrospray-Ionisierung (ESI) |
JP3415682B2 (ja) | 1994-08-10 | 2003-06-09 | 株式会社日立製作所 | キャピラリー電気泳動・質量分析計 |
US5587582A (en) * | 1995-05-19 | 1996-12-24 | Cornell Research Foundation, Inc. | Self-aligning liquid junction |
DE19523860A1 (de) * | 1995-06-30 | 1997-01-02 | Bruker Franzen Analytik Gmbh | Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung |
GB9525507D0 (en) * | 1995-12-14 | 1996-02-14 | Fisons Plc | Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source |
DE19655304B8 (de) * | 1995-12-14 | 2007-05-31 | Micromass Uk Ltd. | Massenspektrometer und Verfahren zur Massenspektrometrie |
US5672868A (en) * | 1996-02-16 | 1997-09-30 | Varian Associates, Inc. | Mass spectrometer system and method for transporting and analyzing ions |
JP3424431B2 (ja) * | 1996-03-29 | 2003-07-07 | 株式会社日立製作所 | 質量分析装置 |
US5986259A (en) * | 1996-04-23 | 1999-11-16 | Hitachi, Ltd. | Mass spectrometer |
US5750993A (en) * | 1996-05-09 | 1998-05-12 | Finnigan Corporation | Method of reducing noise in an ion trap mass spectrometer coupled to an atmospheric pressure ionization source |
US5729014A (en) * | 1996-07-11 | 1998-03-17 | Varian Associates, Inc. | Method for injection of externally produced ions into a quadrupole ion trap |
ATE488025T1 (de) * | 1996-09-10 | 2010-11-15 | Perkinelmer Health Sci Inc | Atmosphärendruckionenquelle |
JP3648906B2 (ja) * | 1997-02-14 | 2005-05-18 | 株式会社日立製作所 | イオントラップ質量分析計を用いた分析装置 |
US6069355A (en) * | 1998-05-14 | 2000-05-30 | Varian, Inc. | Ion trap mass pectrometer with electrospray ionization |
GB9820210D0 (en) | 1998-09-16 | 1998-11-11 | Vg Elemental Limited | Means for removing unwanted ions from an ion transport system and mass spectrometer |
US6753521B1 (en) * | 2000-02-18 | 2004-06-22 | Bruker Daltonics, Inc. | Method and apparatus for a nanoelectrosprayer for use in mass spectrometry |
US6777672B1 (en) * | 2000-02-18 | 2004-08-17 | Bruker Daltonics, Inc. | Method and apparatus for a multiple part capillary device for use in mass spectrometry |
US6570153B1 (en) * | 2000-10-18 | 2003-05-27 | Agilent Technologies, Inc. | Tandem mass spectrometry using a single quadrupole mass analyzer |
EP1330829B1 (de) | 2000-10-23 | 2009-08-26 | Simon Fraser University | Verfahren und vorrichtung zur erzeugung eines diskreten teilchens |
US6593569B2 (en) * | 2001-02-08 | 2003-07-15 | Thermo Finnigan Llc | Collisional gas delivery apparatus and method |
US6745449B2 (en) * | 2001-11-06 | 2004-06-08 | Raytheon Company | Method and apparatus for making a lid with an optically transmissive window |
GB0210930D0 (en) | 2002-05-13 | 2002-06-19 | Thermo Electron Corp | Improved mass spectrometer and mass filters therefor |
JP5073168B2 (ja) * | 2002-05-31 | 2012-11-14 | ウオーターズ・テクノロジーズ・コーポレイシヨン | 質量分析計用の高速組合せマルチモードイオン源 |
DE10242622A1 (de) * | 2002-09-13 | 2004-04-01 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Flüssigkeitsfalle zum Auffangen von Flüssigkeiten in einer Vakuumeinrichtung |
AU2003263537A1 (en) * | 2002-10-10 | 2004-05-04 | Universita' Degli Studi Di Milano | Ionization source for mass spectrometry analysis |
WO2004057638A2 (en) * | 2002-12-18 | 2004-07-08 | Brigham Young University | Method and apparatus for aerodynamic ion focusing |
CA2470452C (en) | 2003-06-09 | 2017-10-03 | Ionics Mass Spectrometry Group, Inc. | Mass spectrometer interface |
US7385186B2 (en) * | 2005-05-13 | 2008-06-10 | Applera Corporation | Methods of operating ion optics for mass spectrometry |
WO2006127803A2 (en) * | 2005-05-23 | 2006-11-30 | Tsi Incorporated | Instruments for measuring nanoparticle exposure |
GB2443110A (en) * | 2005-05-23 | 2008-04-23 | Tsi Inc | Instruments for measuring nanoparticle exposure |
US7700913B2 (en) * | 2006-03-03 | 2010-04-20 | Ionsense, Inc. | Sampling system for use with surface ionization spectroscopy |
US8026477B2 (en) * | 2006-03-03 | 2011-09-27 | Ionsense, Inc. | Sampling system for use with surface ionization spectroscopy |
JP2009539115A (ja) * | 2006-05-26 | 2009-11-12 | イオンセンス インコーポレイテッド | 表面イオン化技術で用いるための可撓性開放管採取システム |
US8440965B2 (en) | 2006-10-13 | 2013-05-14 | Ionsense, Inc. | Sampling system for use with surface ionization spectroscopy |
WO2008046111A2 (en) * | 2006-10-13 | 2008-04-17 | Ionsense, Inc. | A sampling system for containment and transfer of ions into a spectroscopy system |
TWI320395B (en) * | 2007-02-09 | 2010-02-11 | Primax Electronics Ltd | An automatic duplex document feeder with a function of releasing paper jam |
US7868289B2 (en) * | 2007-04-30 | 2011-01-11 | Ionics Mass Spectrometry Group Inc. | Mass spectrometer ion guide providing axial field, and method |
US7595487B2 (en) | 2007-08-24 | 2009-09-29 | Georgia Tech Research Corporation | Confining/focusing vortex flow transmission structure, mass spectrometry systems, and methods of transmitting particles, droplets, and ions |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US8338779B2 (en) * | 2008-02-27 | 2012-12-25 | Thermo Finnigan Llc | Optimization of excitation voltage amplitude for collision induced dissociation of ions in an ion trap |
US8039795B2 (en) * | 2008-04-04 | 2011-10-18 | Agilent Technologies, Inc. | Ion sources for improved ionization |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
US20100078553A1 (en) * | 2008-09-30 | 2010-04-01 | Advion Biosciences, Inc. | Atmospheric pressure ionization (api) interface structures for a mass spectrometer |
US20100154568A1 (en) * | 2008-11-19 | 2010-06-24 | Roth Michael J | Analytical Instruments, Assemblies, and Methods |
US8207497B2 (en) | 2009-05-08 | 2012-06-26 | Ionsense, Inc. | Sampling of confined spaces |
WO2011161788A1 (ja) * | 2010-06-24 | 2011-12-29 | 株式会社島津製作所 | 大気圧イオン化質量分析装置 |
US8822949B2 (en) | 2011-02-05 | 2014-09-02 | Ionsense Inc. | Apparatus and method for thermal assisted desorption ionization systems |
US8901488B1 (en) | 2011-04-18 | 2014-12-02 | Ionsense, Inc. | Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system |
EP4181170A1 (de) | 2013-09-20 | 2023-05-17 | Micromass UK Limited | Ioneneinlassanordnung |
CN104752148B (zh) * | 2013-12-30 | 2017-10-10 | 同方威视技术股份有限公司 | 电晕放电组件、离子迁移谱仪、利用电晕放电组件进行电晕放电的方法 |
EP3146322A1 (de) * | 2014-05-22 | 2017-03-29 | W. Henry Benner | Instrumente zur messung der ionengrössenverteilung und -konzentration |
US9337007B2 (en) | 2014-06-15 | 2016-05-10 | Ionsense, Inc. | Apparatus and method for generating chemical signatures using differential desorption |
US9899196B1 (en) | 2016-01-12 | 2018-02-20 | Jeol Usa, Inc. | Dopant-assisted direct analysis in real time mass spectrometry |
CN107543859B (zh) * | 2017-03-22 | 2020-04-07 | 中国检验检疫科学研究院 | 一种玩具中4种初级芳香胺的快速筛查方法 |
US10636640B2 (en) | 2017-07-06 | 2020-04-28 | Ionsense, Inc. | Apparatus and method for chemical phase sampling analysis |
WO2019231859A1 (en) | 2018-06-01 | 2019-12-05 | Ionsense Inc. | Apparatus and method for reducing matrix effects when ionizing a sample |
JP2022553600A (ja) | 2019-10-28 | 2022-12-26 | イオンセンス インコーポレイテッド | 拍動流大気リアルタイムイオン化 |
US11913861B2 (en) | 2020-05-26 | 2024-02-27 | Bruker Scientific Llc | Electrostatic loading of powder samples for ionization |
CN113686799A (zh) * | 2021-09-14 | 2021-11-23 | 西安乐析医疗科技有限公司 | 一种同时测定平衡盐溶液中钾和钠含量的测定方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4023398A (en) * | 1975-03-03 | 1977-05-17 | John Barry French | Apparatus for analyzing trace components |
US4209696A (en) * | 1977-09-21 | 1980-06-24 | Fite Wade L | Methods and apparatus for mass spectrometric analysis of constituents in liquids |
US4885076A (en) * | 1987-04-06 | 1989-12-05 | Battelle Memorial Institute | Combined electrophoresis-electrospray interface and method |
JP2753265B2 (ja) * | 1988-06-10 | 1998-05-18 | 株式会社日立製作所 | プラズマイオン化質量分析計 |
-
1993
- 1993-01-26 US US08/009,063 patent/US5352892A/en not_active Expired - Fee Related
- 1993-05-28 JP JP6500686A patent/JPH07507418A/ja active Pending
- 1993-05-28 EP EP93914099A patent/EP0644796B1/de not_active Expired - Lifetime
- 1993-05-28 WO PCT/US1993/004903 patent/WO1993024209A1/en active IP Right Grant
- 1993-05-28 DE DE69326765T patent/DE69326765T2/de not_active Expired - Fee Related
- 1993-05-28 AT AT93914099T patent/ATE185495T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPH07507418A (ja) | 1995-08-10 |
EP0644796A1 (de) | 1995-03-29 |
WO1993024209A1 (en) | 1993-12-09 |
DE69326765D1 (de) | 1999-11-18 |
US5352892A (en) | 1994-10-04 |
ATE185495T1 (de) | 1999-10-15 |
EP0644796A4 (de) | 1997-04-09 |
EP0644796B1 (de) | 1999-10-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |