DE69508585T2 - Massenspektrometrische vorrichtung und verfahren zu matrix-unterstützten laserdesorptionsmessungen - Google Patents

Massenspektrometrische vorrichtung und verfahren zu matrix-unterstützten laserdesorptionsmessungen

Info

Publication number
DE69508585T2
DE69508585T2 DE69508585T DE69508585T DE69508585T2 DE 69508585 T2 DE69508585 T2 DE 69508585T2 DE 69508585 T DE69508585 T DE 69508585T DE 69508585 T DE69508585 T DE 69508585T DE 69508585 T2 DE69508585 T2 DE 69508585T2
Authority
DE
Germany
Prior art keywords
matrix
mass spectrometric
laser desorption
spectrometric device
desorption measurements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69508585T
Other languages
English (en)
Other versions
DE69508585D1 (de
Inventor
Marvin Vestal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Biosystems LLC
Original Assignee
Vestec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vestec Corp filed Critical Vestec Corp
Application granted granted Critical
Publication of DE69508585D1 publication Critical patent/DE69508585D1/de
Publication of DE69508585T2 publication Critical patent/DE69508585T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0413—Sample holders or containers for automated handling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/113332—Automated chemical analysis with conveyance of sample along a test line in a container or rack
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/24—Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
    • Y10T436/25875—Gaseous sample or with change of physical state
DE69508585T 1994-07-21 1995-07-07 Massenspektrometrische vorrichtung und verfahren zu matrix-unterstützten laserdesorptionsmessungen Expired - Lifetime DE69508585T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/278,405 US5498545A (en) 1994-07-21 1994-07-21 Mass spectrometer system and method for matrix-assisted laser desorption measurements
PCT/US1995/008434 WO1996003768A1 (en) 1994-07-21 1995-07-07 Mass spectrometer system and method for matrix-assisted laser desorption measurements

Publications (2)

Publication Number Publication Date
DE69508585D1 DE69508585D1 (de) 1999-04-29
DE69508585T2 true DE69508585T2 (de) 1999-11-18

Family

ID=23064852

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69508585T Expired - Lifetime DE69508585T2 (de) 1994-07-21 1995-07-07 Massenspektrometrische vorrichtung und verfahren zu matrix-unterstützten laserdesorptionsmessungen

Country Status (6)

Country Link
US (2) US5498545A (de)
EP (1) EP0771470B1 (de)
JP (1) JP3344724B2 (de)
AU (1) AU2960895A (de)
DE (1) DE69508585T2 (de)
WO (1) WO1996003768A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008035079B4 (de) 2007-08-27 2018-06-21 Jeol Ltd. Massenspektrometer mit MALDI-Ionenquelle

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EP0771470B1 (de) 1999-03-24
JPH10513546A (ja) 1998-12-22
WO1996003768A1 (en) 1996-02-08
US5498545A (en) 1996-03-12
EP0771470A1 (de) 1997-05-07

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