DE69631658D1 - Verfahren und gerät zur prüfung einer megazelle in einem asic unter verwendung von jtag - Google Patents

Verfahren und gerät zur prüfung einer megazelle in einem asic unter verwendung von jtag

Info

Publication number
DE69631658D1
DE69631658D1 DE69631658T DE69631658T DE69631658D1 DE 69631658 D1 DE69631658 D1 DE 69631658D1 DE 69631658 T DE69631658 T DE 69631658T DE 69631658 T DE69631658 T DE 69631658T DE 69631658 D1 DE69631658 D1 DE 69631658D1
Authority
DE
Germany
Prior art keywords
test
megacell
circuitry
jtag
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69631658T
Other languages
English (en)
Other versions
DE69631658T2 (de
Inventor
L Mote
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of DE69631658D1 publication Critical patent/DE69631658D1/de
Application granted granted Critical
Publication of DE69631658T2 publication Critical patent/DE69631658T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
DE69631658T 1995-06-07 1996-06-06 Verfahren und gerät zur prüfung einer megazelle in einem asic unter verwendung von jtag Expired - Lifetime DE69631658T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US48048395A 1995-06-07 1995-06-07
US480483 1995-06-07
US52839795A 1995-09-14 1995-09-14
US528397 1995-09-14
PCT/US1996/008577 WO1996041206A1 (en) 1995-06-07 1996-06-06 Method and apparatus for testing a megacell in an asic using jtag

Publications (2)

Publication Number Publication Date
DE69631658D1 true DE69631658D1 (de) 2004-04-01
DE69631658T2 DE69631658T2 (de) 2004-12-16

Family

ID=27046602

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69631658T Expired - Lifetime DE69631658T2 (de) 1995-06-07 1996-06-06 Verfahren und gerät zur prüfung einer megazelle in einem asic unter verwendung von jtag

Country Status (10)

Country Link
US (1) US5805609A (de)
EP (1) EP0834081B1 (de)
JP (1) JP3698166B2 (de)
KR (1) KR100248258B1 (de)
CN (1) CN1089441C (de)
AU (1) AU6251896A (de)
DE (1) DE69631658T2 (de)
IL (2) IL120927A (de)
TW (1) TW297096B (de)
WO (2) WO1996041205A1 (de)

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CN100365423C (zh) * 2004-10-20 2008-01-30 华为技术有限公司 一种jtag链自动连接系统及其实现方法
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FR2888433A1 (fr) * 2005-07-05 2007-01-12 St Microelectronics Sa Protection d'une quantite numerique contenue dans un circuit integre comportant une interface jtag
US7274203B2 (en) * 2005-10-25 2007-09-25 Freescale Semiconductor, Inc. Design-for-test circuit for low pin count devices
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US8327454B2 (en) * 2006-11-14 2012-12-04 Sandisk Technologies Inc. Method for allowing multiple users to access preview content
US20080114772A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Method for connecting to a network location associated with content
US20080114693A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Method for allowing content protected by a first DRM system to be accessed by a second DRM system
US8079071B2 (en) * 2006-11-14 2011-12-13 SanDisk Technologies, Inc. Methods for accessing content based on a session ticket
US8763110B2 (en) * 2006-11-14 2014-06-24 Sandisk Technologies Inc. Apparatuses for binding content to a separate memory device
US20080112562A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Methods for linking content with license
CN101102566B (zh) * 2007-06-25 2010-12-08 中兴通讯股份有限公司 一种手机jtag调试接口信号设计方法及其调试方法
US7657805B2 (en) * 2007-07-02 2010-02-02 Sun Microsystems, Inc. Integrated circuit with blocking pin to coordinate entry into test mode
US8051338B2 (en) * 2007-07-19 2011-11-01 Cray Inc. Inter-asic data transport using link control block manager
US7902865B1 (en) 2007-11-15 2011-03-08 Lattice Semiconductor Corporation Compression and decompression of configuration data using repeated data frames
US8621125B2 (en) * 2009-10-13 2013-12-31 Intellitech Corporation System and method of sending and receiving data and commands using the TCK and TMS of IEEE 1149.1
CN102236066B (zh) * 2010-04-22 2015-07-01 上海华虹集成电路有限责任公司 实现芯片功能故障快速调试定位的方法及调试电路
CN103097902B (zh) * 2010-07-29 2015-12-09 德克萨斯仪器股份有限公司 改进全速测试访问端口操作
US8694844B2 (en) 2010-07-29 2014-04-08 Texas Instruments Incorporated AT speed TAP with dual port router and command circuit
CN102778645B (zh) * 2011-05-09 2014-09-17 京微雅格（北京）科技有限公司 一种jtag主控制器及其实现方法
CN104899123B (zh) * 2015-04-24 2017-06-06 英业达科技有限公司 一种主板上dimm插槽的地址设置信号的连接测试装置与方法
KR20160139496A (ko) * 2015-05-27 2016-12-07 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
CN108957283B (zh) * 2017-05-19 2021-08-03 龙芯中科技术股份有限公司 辐照实验板、监控终端、asic芯片辐照实验系统
CN107843828A (zh) * 2017-10-26 2018-03-27 电子科技大学 一种基于fpga的数字电路边界扫描控制系统
CN109917277B (zh) * 2019-05-16 2019-08-23 上海燧原智能科技有限公司 虚拟测试方法、装置、设备及存储介质
US10746798B1 (en) 2019-05-31 2020-08-18 Nvidia Corp. Field adaptable in-system test mechanisms
US11204849B2 (en) * 2020-03-13 2021-12-21 Nvidia Corporation Leveraging low power states for fault testing of processing cores at runtime
CN113938125B (zh) * 2021-10-19 2023-02-24 浙江大学 多通道可配置可测试与修调的数字信号隔离器

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Also Published As

Publication number Publication date
WO1996041205A1 (en) 1996-12-19
WO1996041206A1 (en) 1996-12-19
DE69631658T2 (de) 2004-12-16
AU6251896A (en) 1996-12-30
KR100248258B1 (ko) 2000-03-15
CN1089441C (zh) 2002-08-21
JPH11506833A (ja) 1999-06-15
KR19990022049A (ko) 1999-03-25
IL120927A (en) 2000-06-01
EP0834081B1 (de) 2004-02-25
CN1187244A (zh) 1998-07-08
EP0834081A1 (de) 1998-04-08
TW297096B (de) 1997-02-01
JP3698166B2 (ja) 2005-09-21
US5805609A (en) 1998-09-08
EP0834081A4 (de) 1999-03-24
IL120927A0 (en) 1997-09-30

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