DE69632464D1 - Messgerät und Messverfahren für die Einstellung von Prüfungs-/Messparametern - Google Patents

Messgerät und Messverfahren für die Einstellung von Prüfungs-/Messparametern

Info

Publication number
DE69632464D1
DE69632464D1 DE69632464T DE69632464T DE69632464D1 DE 69632464 D1 DE69632464 D1 DE 69632464D1 DE 69632464 T DE69632464 T DE 69632464T DE 69632464 T DE69632464 T DE 69632464T DE 69632464 D1 DE69632464 D1 DE 69632464D1
Authority
DE
Germany
Prior art keywords
test
setting
measurement parameters
measuring device
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69632464T
Other languages
English (en)
Other versions
DE69632464T2 (de
Inventor
Peter Thoma
Alf Clement
Juergen Sang
Peter Hoffmann
Robert Jahn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE69632464D1 publication Critical patent/DE69632464D1/de
Application granted granted Critical
Publication of DE69632464T2 publication Critical patent/DE69632464T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • User Interface Of Digital Computer (AREA)
  • Indicating Measured Values (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE69632464T 1996-06-21 1996-06-21 Messgerät und Messverfahren für die Einstellung von Prüfungs-/Messparametern Expired - Fee Related DE69632464T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96110044A EP0829729B1 (de) 1996-06-21 1996-06-21 Messgerät und Messverfahren für die Einstellung von Prüfungs-/Messparametern

Publications (2)

Publication Number Publication Date
DE69632464D1 true DE69632464D1 (de) 2004-06-17
DE69632464T2 DE69632464T2 (de) 2005-05-12

Family

ID=8222916

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69632464T Expired - Fee Related DE69632464T2 (de) 1996-06-21 1996-06-21 Messgerät und Messverfahren für die Einstellung von Prüfungs-/Messparametern
DE29612698U Expired - Lifetime DE29612698U1 (de) 1996-06-21 1996-07-23 Messvorrichtung und Anordnung zum Einstellen von Prüf-/Messparametern

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE29612698U Expired - Lifetime DE29612698U1 (de) 1996-06-21 1996-07-23 Messvorrichtung und Anordnung zum Einstellen von Prüf-/Messparametern

Country Status (4)

Country Link
US (1) US5801953A (de)
EP (1) EP0829729B1 (de)
JP (1) JPH10185959A (de)
DE (2) DE69632464T2 (de)

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US6269482B1 (en) * 1997-07-14 2001-07-31 Altinex, Inc. Methods of testing electrical signals and compensating for degradation
US5912667A (en) * 1997-09-10 1999-06-15 Primax Electronics Ltd. Cursor control system for controlling a pop-up menu
US6606082B1 (en) * 1998-11-12 2003-08-12 Microsoft Corporation Navigation graphical interface for small screen devices
US6934916B1 (en) * 1999-01-20 2005-08-23 Hewlett-Packard Development Company, L.P. Method and apparatus for improving a progress monitor during a long computer process
JP2000250697A (ja) * 1999-03-03 2000-09-14 Yazaki Corp 多機能スイッチ装置における操作ボタンの機能表示方法及び多機能スイッチ装置
JP3664914B2 (ja) 1999-07-12 2005-06-29 アンリツ株式会社 光パルス試験システム
JP2001021451A (ja) * 1999-07-12 2001-01-26 Anritsu Corp 光パルス試験器
US20040015309A1 (en) * 2000-12-04 2004-01-22 Swisher Douglas S. Systems and methods for OTDR tracing and mapping
DE10106959C1 (de) * 2001-02-15 2002-10-10 Agilent Technologies Inc Gerät zum Messen und/oder Prüfen von Komponenten optischer und/oder elektrischer Netze und eine Lifteinrichtung hierfür
US6686745B2 (en) 2001-07-20 2004-02-03 Shell Oil Company Apparatus and method for electrical testing of electrically heated pipe-in-pipe pipeline
US6814146B2 (en) * 2001-07-20 2004-11-09 Shell Oil Company Annulus for electrically heated pipe-in-pipe subsea pipeline
US6739803B2 (en) 2001-07-20 2004-05-25 Shell Oil Company Method of installation of electrically heated pipe-in-pipe subsea pipeline
US6714018B2 (en) 2001-07-20 2004-03-30 Shell Oil Company Method of commissioning and operating an electrically heated pipe-in-pipe subsea pipeline
US6688900B2 (en) 2002-06-25 2004-02-10 Shell Oil Company Insulating joint for electrically heated pipeline
US6937030B2 (en) * 2002-11-08 2005-08-30 Shell Oil Company Testing electrical integrity of electrically heated subsea pipelines
US6859041B2 (en) 2002-11-26 2005-02-22 Honeywell International, Inc. Methods for locating faults in aircraft branch conductors and determining the distance to the faults
JP5072194B2 (ja) * 2004-05-14 2012-11-14 キヤノン株式会社 情報処理装置および情報処理方法ならびに記憶媒体、プログラム
WO2007052665A1 (ja) * 2005-11-04 2007-05-10 Anritsu Corporation オプチカルタイムドメインリフレクトメータ及びそれを用いる光ファイバ測定方法及び光ファイバ測定システム
US7227345B1 (en) 2006-07-13 2007-06-05 International Business Machines Corporation Fibre Channel Cable Locator
JP4930090B2 (ja) * 2007-02-16 2012-05-09 横河電機株式会社 波形測定装置
TW200933439A (en) * 2008-01-31 2009-08-01 Compal Electronics Inc Method and apparatus for controlling functionalities of computer system
US8127151B2 (en) 2009-10-13 2012-02-28 Lockheed Martin Corporation Hardware-based key generation and recovery
US8375316B2 (en) * 2009-12-31 2013-02-12 Verizon Patent And Licensing Inc. Navigational transparent overlay
EP2782269A4 (de) * 2011-12-12 2014-12-17 Huawei Tech Co Ltd Schaltung zur modulation eines optischen zeitbereichsreflektometer-testsignals sowie system und vorrichtung für ein passives optisches netzwerk
US9714956B2 (en) * 2012-12-13 2017-07-25 Tektronix, Inc. Test and measurement instrument user interface with move mode
US9360392B2 (en) * 2013-06-28 2016-06-07 Corning Cable Systems Llc Calibration of optical time domain reflectometry optical loss measurement in optical fibers having potentially dissimilar light backscattering efficiencies
JP2016057119A (ja) * 2014-09-08 2016-04-21 横河電機株式会社 光パルス試験器
US11428604B2 (en) * 2019-12-06 2022-08-30 Christine Pons Compact optical time domain reflectometer with integrated time delay fiber waveguide

Family Cites Families (17)

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Publication number Priority date Publication date Assignee Title
US4497575A (en) * 1982-11-01 1985-02-05 Tektronix, Inc. Optical fiber test instrument calibrator
US4812996A (en) * 1986-11-26 1989-03-14 Tektronix, Inc. Signal viewing instrumentation control system
US4996654A (en) * 1988-12-22 1991-02-26 Tektronix, Inc. Method of displaying acquired data
CA2014655A1 (en) * 1989-09-08 1991-03-08 Richard L. Nungester Simplified interface and method of operation for multi-function apparatus
DE69120491T2 (de) * 1990-09-18 1996-11-14 Fujitsu Ltd Cursorverschiebungssteuerungsgerät für eine Rechneranzeige
US5321420A (en) * 1991-04-26 1994-06-14 Motorola, Inc. Operator interface for an electronic measurement system
US5129722A (en) * 1991-05-16 1992-07-14 Tektronix, Inc. Expansion windowing system for a measurement test instrument
US5134377A (en) * 1991-06-04 1992-07-28 W. L. Gore & Associates, Inc. TDR system and method for detecting leakage of a liquid
US5381524B2 (en) * 1991-11-12 1997-07-08 Chronology Corp Automated development of timing diagrams for electrical circuits
US5315365A (en) * 1992-06-17 1994-05-24 Laser Precision Corp. Macrobend splice loss tester for fiber optic splices with silicon gel cushion on optical coupling blocks
US5592606A (en) * 1993-07-30 1997-01-07 Myers; Allen Method and apparatus for storage and display of hierarchally organized data
US5479610A (en) * 1993-11-01 1995-12-26 Northrop Grumman Corporation System interface fault isolator test set
US5515301A (en) * 1994-06-29 1996-05-07 General Electric Company Real-time visualization system for multiple time-sampled signals
CA2155693C (en) * 1994-08-25 1999-12-14 Daniel A. Fishman Performance monitoring and fault location in optical transmission systems
US5517105A (en) * 1994-10-25 1996-05-14 Tektronix, Inc. Dual linked zoom boxes for instrument display
US5608328A (en) * 1994-11-18 1997-03-04 Radar Engineers Method and apparatus for pin-pointing faults in electric power lines
US5528356A (en) * 1995-03-20 1996-06-18 Tektronix, Inc. Apparatus and method for displaying multiple sample spacing waveform segments

Also Published As

Publication number Publication date
EP0829729B1 (de) 2004-05-12
EP0829729A1 (de) 1998-03-18
DE29612698U1 (de) 1996-09-12
DE69632464T2 (de) 2005-05-12
JPH10185959A (ja) 1998-07-14
US5801953A (en) 1998-09-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee