DE69636335D1 - Integrierte Schaltungspackung und Verfahren zu ihrem Zusammenbau - Google Patents
Integrierte Schaltungspackung und Verfahren zu ihrem ZusammenbauInfo
- Publication number
- DE69636335D1 DE69636335D1 DE69636335T DE69636335T DE69636335D1 DE 69636335 D1 DE69636335 D1 DE 69636335D1 DE 69636335 T DE69636335 T DE 69636335T DE 69636335 T DE69636335 T DE 69636335T DE 69636335 D1 DE69636335 D1 DE 69636335D1
- Authority
- DE
- Germany
- Prior art keywords
- assembly
- integrated circuit
- circuit package
- package
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
- H01L25/167—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01027—Cobalt [Co]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01057—Lanthanum [La]
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15313—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a land array, e.g. LGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15787—Ceramics, e.g. crystalline carbides, nitrides or oxides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
- H01L33/486—Containers adapted for surface mounting
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22529795 | 1995-09-01 | ||
JP22529695 | 1995-09-01 | ||
JP22529695 | 1995-09-01 | ||
JP22529795 | 1995-09-01 | ||
JP22807996A JP3507251B2 (ja) | 1995-09-01 | 1996-08-29 | 光センサicパッケージおよびその組立方法 |
JP22807996 | 1996-08-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69636335D1 true DE69636335D1 (de) | 2006-08-24 |
DE69636335T2 DE69636335T2 (de) | 2007-08-09 |
Family
ID=27331024
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69636335T Expired - Lifetime DE69636335T2 (de) | 1995-09-01 | 1996-08-30 | Integrierte Schaltungspackung und Verfahren zu ihrem Zusammenbau |
Country Status (4)
Country | Link |
---|---|
US (1) | US6383835B1 (de) |
EP (1) | EP0790653B1 (de) |
JP (1) | JP3507251B2 (de) |
DE (1) | DE69636335T2 (de) |
Families Citing this family (86)
Publication number | Priority date | Publication date | Assignee | Title |
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JP4016454B2 (ja) * | 1997-07-18 | 2007-12-05 | 株式会社デンソー | 電子部品 |
US7041527B2 (en) * | 1997-07-29 | 2006-05-09 | Harvatek Corp. | Charge coupled device package |
JP3819574B2 (ja) * | 1997-12-25 | 2006-09-13 | 三洋電機株式会社 | 半導体装置の製造方法 |
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IL123207A0 (en) | 1998-02-06 | 1998-09-24 | Shellcase Ltd | Integrated circuit device |
KR100690917B1 (ko) * | 1998-02-10 | 2007-03-08 | 니폰샤신인사츠가부시키가이샤 | 반도체 모듈용 기체시트의 제조방법 |
JP3553405B2 (ja) * | 1999-03-03 | 2004-08-11 | ローム株式会社 | チップ型電子部品 |
DE19962231A1 (de) * | 1999-12-22 | 2001-07-12 | Infineon Technologies Ag | Verfahren zur Herstellung mikromechanischer Strukturen |
US20010007475A1 (en) * | 2000-01-06 | 2001-07-12 | Asahi Kogaku Kogyo Kabushiki Kaisha | Image pickup device and its mounting structure for an optical low-pass filter |
JP2001345485A (ja) * | 2000-06-02 | 2001-12-14 | Toyoda Gosei Co Ltd | 発光装置 |
JP2002094082A (ja) * | 2000-07-11 | 2002-03-29 | Seiko Epson Corp | 光素子及びその製造方法並びに電子機器 |
JP2002092575A (ja) * | 2000-09-19 | 2002-03-29 | Mitsubishi Electric Corp | 小型カードとその製造方法 |
US6534799B1 (en) * | 2000-10-03 | 2003-03-18 | Harvatek Corp. | Surface mount light emitting diode package |
JP2002141248A (ja) * | 2000-11-02 | 2002-05-17 | Murata Mfg Co Ltd | セラミック電子部品およびその製造方法 |
KR20020045768A (ko) * | 2000-12-11 | 2002-06-20 | 윤종광 | 차폐 기능을 갖는 멀티플 라인 그리드 |
EP1220390A1 (de) * | 2000-12-28 | 2002-07-03 | Corning O.T.I. S.p.A. | Preiswerte optische Bank mit hoher thermischer Konduktivität |
TW473951B (en) * | 2001-01-17 | 2002-01-21 | Siliconware Precision Industries Co Ltd | Non-leaded quad flat image sensor package |
KR100396551B1 (ko) * | 2001-02-03 | 2003-09-03 | 삼성전자주식회사 | 웨이퍼 레벨 허메틱 실링 방법 |
US6737740B2 (en) * | 2001-02-08 | 2004-05-18 | Micron Technology, Inc. | High performance silicon contact for flip chip |
US20030205828A9 (en) * | 2001-04-05 | 2003-11-06 | Larry Kinsman | Circuit substrates, semiconductor packages, and ball grid arrays |
JP3675364B2 (ja) * | 2001-05-30 | 2005-07-27 | ソニー株式会社 | 半導体装置用基板その製造方法および半導体装置 |
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JP2003124480A (ja) * | 2001-08-08 | 2003-04-25 | Hosiden Corp | 光コネクタ及び光素子 |
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JP2003100980A (ja) * | 2001-09-27 | 2003-04-04 | Hamamatsu Photonics Kk | 半導体装置及びその製造方法 |
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JP4068336B2 (ja) * | 2001-11-30 | 2008-03-26 | 株式会社東芝 | 半導体装置 |
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JP3898666B2 (ja) * | 2003-04-28 | 2007-03-28 | 松下電器産業株式会社 | 固体撮像装置およびその製造方法 |
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US7919787B2 (en) * | 2003-06-27 | 2011-04-05 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Semiconductor device with a light emitting semiconductor die |
US7256486B2 (en) * | 2003-06-27 | 2007-08-14 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Packaging device for semiconductor die, semiconductor device incorporating same and method of making same |
US7279355B2 (en) * | 2003-06-27 | 2007-10-09 | Avago Technologies Ecbuip (Singapore) Pte Ltd | Method for fabricating a packaging device for semiconductor die and semiconductor device incorporating same |
JP4405208B2 (ja) * | 2003-08-25 | 2010-01-27 | 株式会社ルネサステクノロジ | 固体撮像装置の製造方法 |
JP4106003B2 (ja) * | 2003-09-03 | 2008-06-25 | 松下電器産業株式会社 | 固体撮像装置の製造方法 |
JP4481135B2 (ja) * | 2003-10-06 | 2010-06-16 | 株式会社半導体エネルギー研究所 | 半導体装置及びその作製方法 |
EP1523043B1 (de) | 2003-10-06 | 2011-12-28 | Semiconductor Energy Laboratory Co., Ltd. | Optischer Sensor und dessen Herstellungsverfahren |
JP4516320B2 (ja) * | 2004-01-08 | 2010-08-04 | シチズン電子株式会社 | Led基板 |
US7253388B2 (en) * | 2004-04-23 | 2007-08-07 | Hymite A/S | Assembly with self-alignment features to position a cover on a substrate that supports a micro component |
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JP4852319B2 (ja) * | 2006-02-21 | 2012-01-11 | オンセミコンダクター・トレーディング・リミテッド | 回路基板及び半導体装置 |
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US8207589B2 (en) | 2007-02-15 | 2012-06-26 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and electronic device, and method for manufacturing photoelectric conversion device |
US7843060B2 (en) * | 2007-06-11 | 2010-11-30 | Cree, Inc. | Droop-free high output light emitting devices and methods of fabricating and operating same |
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TWI488329B (zh) * | 2008-05-15 | 2015-06-11 | Everlight Electronics Co Ltd | 線路基板與發光二極體封裝 |
CN102142423B (zh) * | 2008-05-16 | 2014-11-26 | 亿光电子工业股份有限公司 | 线路基板与发光二极管封装 |
JP4567073B2 (ja) * | 2008-05-20 | 2010-10-20 | 株式会社エレメント電子 | 回路基板の製造方法 |
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-
1996
- 1996-08-29 JP JP22807996A patent/JP3507251B2/ja not_active Expired - Fee Related
- 1996-08-30 EP EP96113927A patent/EP0790653B1/de not_active Expired - Lifetime
- 1996-08-30 US US08/707,046 patent/US6383835B1/en not_active Expired - Lifetime
- 1996-08-30 DE DE69636335T patent/DE69636335T2/de not_active Expired - Lifetime
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JP3507251B2 (ja) | 2004-03-15 |
JPH09129780A (ja) | 1997-05-16 |
EP0790653A3 (de) | 1998-04-15 |
EP0790653A2 (de) | 1997-08-20 |
DE69636335T2 (de) | 2007-08-09 |
EP0790653B1 (de) | 2006-07-12 |
US6383835B1 (en) | 2002-05-07 |
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