DE69712213D1 - Polierkissen konturenanzeiger für mechanisches oder chemisch-mechanisches polieren - Google Patents
Polierkissen konturenanzeiger für mechanisches oder chemisch-mechanisches polierenInfo
- Publication number
- DE69712213D1 DE69712213D1 DE69712213T DE69712213T DE69712213D1 DE 69712213 D1 DE69712213 D1 DE 69712213D1 DE 69712213 T DE69712213 T DE 69712213T DE 69712213 T DE69712213 T DE 69712213T DE 69712213 D1 DE69712213 D1 DE 69712213D1
- Authority
- DE
- Germany
- Prior art keywords
- polishing
- mechanical
- contour indicator
- planarizing surface
- contour
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/727,021 US5736427A (en) | 1996-10-08 | 1996-10-08 | Polishing pad contour indicator for mechanical or chemical-mechanical planarization |
PCT/US1997/017799 WO1998015384A1 (en) | 1996-10-08 | 1997-10-03 | Polishing pad contour indicator for mechanical or chemical-mechanical planarization |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69712213D1 true DE69712213D1 (de) | 2002-05-29 |
DE69712213T2 DE69712213T2 (de) | 2002-11-14 |
Family
ID=24921008
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69712213T Expired - Lifetime DE69712213T2 (de) | 1996-10-08 | 1997-10-03 | Polierkissen konturenanzeiger für mechanisches oder chemisch-mechanisches polieren |
Country Status (7)
Country | Link |
---|---|
US (1) | US5736427A (de) |
EP (1) | EP0930955B1 (de) |
KR (1) | KR100445818B1 (de) |
AT (1) | ATE216645T1 (de) |
AU (1) | AU4743297A (de) |
DE (1) | DE69712213T2 (de) |
WO (1) | WO1998015384A1 (de) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6075606A (en) | 1996-02-16 | 2000-06-13 | Doan; Trung T. | Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers and other microelectronic substrates |
US6090475A (en) * | 1996-05-24 | 2000-07-18 | Micron Technology Inc. | Polishing pad, methods of manufacturing and use |
JPH09321001A (ja) * | 1996-05-31 | 1997-12-12 | Komatsu Electron Metals Co Ltd | 半導体ウェハの研磨方法 |
JPH10217149A (ja) * | 1997-02-05 | 1998-08-18 | Ebara Corp | ターンテーブル用クロスの剥離治具 |
US6117777A (en) * | 1997-07-30 | 2000-09-12 | Chartered Semiconductor Manufacturing Co. | Chemical mechanical polish (CMP) endpoint detection by colorimetry |
US5951370A (en) * | 1997-10-02 | 1999-09-14 | Speedfam-Ipec Corp. | Method and apparatus for monitoring and controlling the flatness of a polishing pad |
JP2000011327A (ja) * | 1998-06-29 | 2000-01-14 | Fujitsu Ltd | 薄膜ヘッドスライダの加工方法及び加工装置 |
CN1076253C (zh) * | 1998-10-23 | 2001-12-19 | 联华电子股份有限公司 | 化学机械研磨垫 |
GB2345657B (en) * | 1999-01-13 | 2001-08-15 | United Microelectronics Corp | Lifetime self-indicated polishing pad |
NL1011163C2 (nl) * | 1999-01-28 | 2000-07-31 | United Microelectronics Corp | Polijstvlak met zelf-indicatie van de levensduur. |
US6383934B1 (en) | 1999-09-02 | 2002-05-07 | Micron Technology, Inc. | Method and apparatus for chemical-mechanical planarization of microelectronic substrates with selected planarizing liquids |
US6306768B1 (en) | 1999-11-17 | 2001-10-23 | Micron Technology, Inc. | Method for planarizing microelectronic substrates having apertures |
US6705930B2 (en) * | 2000-01-28 | 2004-03-16 | Lam Research Corporation | System and method for polishing and planarizing semiconductor wafers using reduced surface area polishing pads and variable partial pad-wafer overlapping techniques |
US6340326B1 (en) | 2000-01-28 | 2002-01-22 | Lam Research Corporation | System and method for controlled polishing and planarization of semiconductor wafers |
US6498101B1 (en) | 2000-02-28 | 2002-12-24 | Micron Technology, Inc. | Planarizing pads, planarizing machines and methods for making and using planarizing pads in mechanical and chemical-mechanical planarization of microelectronic device substrate assemblies |
US6313038B1 (en) | 2000-04-26 | 2001-11-06 | Micron Technology, Inc. | Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates |
US6612901B1 (en) * | 2000-06-07 | 2003-09-02 | Micron Technology, Inc. | Apparatus for in-situ optical endpointing of web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies |
US6520834B1 (en) * | 2000-08-09 | 2003-02-18 | Micron Technology, Inc. | Methods and apparatuses for analyzing and controlling performance parameters in mechanical and chemical-mechanical planarization of microelectronic substrates |
US6736869B1 (en) | 2000-08-28 | 2004-05-18 | Micron Technology, Inc. | Method for forming a planarizing pad for planarization of microelectronic substrates |
US6838382B1 (en) | 2000-08-28 | 2005-01-04 | Micron Technology, Inc. | Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates |
US6609947B1 (en) * | 2000-08-30 | 2003-08-26 | Micron Technology, Inc. | Planarizing machines and control systems for mechanical and/or chemical-mechanical planarization of micro electronic substrates |
US6592443B1 (en) * | 2000-08-30 | 2003-07-15 | Micron Technology, Inc. | Method and apparatus for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates |
US6652764B1 (en) | 2000-08-31 | 2003-11-25 | Micron Technology, Inc. | Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates |
US6623329B1 (en) | 2000-08-31 | 2003-09-23 | Micron Technology, Inc. | Method and apparatus for supporting a microelectronic substrate relative to a planarization pad |
US6514858B1 (en) * | 2001-04-09 | 2003-02-04 | Advanced Micro Devices, Inc. | Test structure for providing depth of polish feedback |
WO2003011517A1 (en) * | 2001-08-01 | 2003-02-13 | Entegris, Inc. | Wafer carrier wear indicator |
US6866566B2 (en) * | 2001-08-24 | 2005-03-15 | Micron Technology, Inc. | Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces |
US6722943B2 (en) * | 2001-08-24 | 2004-04-20 | Micron Technology, Inc. | Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces |
US6666749B2 (en) | 2001-08-30 | 2003-12-23 | Micron Technology, Inc. | Apparatus and method for enhanced processing of microelectronic workpieces |
JP3793810B2 (ja) * | 2002-07-09 | 2006-07-05 | 独立行政法人国立高等専門学校機構 | 研削工具の砥面状態検査方法 |
US7341502B2 (en) * | 2002-07-18 | 2008-03-11 | Micron Technology, Inc. | Methods and systems for planarizing workpieces, e.g., microelectronic workpieces |
US7235488B2 (en) * | 2002-08-28 | 2007-06-26 | Micron Technology, Inc. | In-situ chemical-mechanical planarization pad metrology using ultrasonic imaging |
US6884152B2 (en) * | 2003-02-11 | 2005-04-26 | Micron Technology, Inc. | Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces |
US7442113B2 (en) * | 2003-04-23 | 2008-10-28 | Lsi Corporation | Visual wear confirmation polishing pad |
US6935929B2 (en) | 2003-04-28 | 2005-08-30 | Micron Technology, Inc. | Polishing machines including under-pads and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces |
GB2402641B (en) * | 2003-06-12 | 2005-05-25 | Bosch Gmbh Robert | Sanding plate for a motor-driven hand-held sanding tool |
US7030603B2 (en) * | 2003-08-21 | 2006-04-18 | Micron Technology, Inc. | Apparatuses and methods for monitoring rotation of a conductive microfeature workpiece |
US7066792B2 (en) * | 2004-08-06 | 2006-06-27 | Micron Technology, Inc. | Shaped polishing pads for beveling microfeature workpiece edges, and associate system and methods |
US7264539B2 (en) | 2005-07-13 | 2007-09-04 | Micron Technology, Inc. | Systems and methods for removing microfeature workpiece surface defects |
US7294049B2 (en) * | 2005-09-01 | 2007-11-13 | Micron Technology, Inc. | Method and apparatus for removing material from microfeature workpieces |
US7849281B2 (en) * | 2006-04-03 | 2010-12-07 | Emc Corporation | Method and system for implementing hierarchical permission maps in a layered volume graph |
US8118644B2 (en) * | 2008-10-16 | 2012-02-21 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad having integral identification feature |
US20120115398A1 (en) * | 2010-11-09 | 2012-05-10 | James Bopp | Chemical-mechanical polishing wafer and method of use |
GB2537161B (en) * | 2015-04-10 | 2019-06-19 | Reckitt Benckiser Brands Ltd | Novel material |
CN106853610B (zh) * | 2015-12-08 | 2019-11-01 | 中芯国际集成电路制造(北京)有限公司 | 抛光垫及其监测方法和监测系统 |
CN108608317A (zh) * | 2018-05-23 | 2018-10-02 | 长江存储科技有限责任公司 | 研磨垫及研磨垫使用寿命监测方法 |
EP3616840A1 (de) * | 2018-09-03 | 2020-03-04 | 3M Innovative Properties Company | Schleifartikel |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4019289A (en) * | 1976-02-23 | 1977-04-26 | Clayton Paul Korver | Replaceable lens surfacing pad with integral wear indicating pattern |
EP0054368B1 (de) * | 1980-11-28 | 1986-05-21 | Thomas Hunter Limited | Polierkissen |
SE450352B (sv) * | 1985-11-07 | 1987-06-22 | Santrade Ltd | Sker med indikering av forslitning |
US4793895A (en) * | 1988-01-25 | 1988-12-27 | Ibm Corporation | In situ conductivity monitoring technique for chemical/mechanical planarization endpoint detection |
US5081421A (en) * | 1990-05-01 | 1992-01-14 | At&T Bell Laboratories | In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection |
US5433650A (en) * | 1993-05-03 | 1995-07-18 | Motorola, Inc. | Method for polishing a substrate |
US5635083A (en) * | 1993-08-06 | 1997-06-03 | Intel Corporation | Method and apparatus for chemical-mechanical polishing using pneumatic pressure applied to the backside of a substrate |
DE4424203C2 (de) * | 1994-07-09 | 1996-05-09 | Wernicke & Co Gmbh | Schleifscheibe zum Schleifen des Randes von Brillengläsern |
-
1996
- 1996-10-08 US US08/727,021 patent/US5736427A/en not_active Expired - Lifetime
-
1997
- 1997-10-03 KR KR10-1999-7003036A patent/KR100445818B1/ko not_active IP Right Cessation
- 1997-10-03 AT AT97909938T patent/ATE216645T1/de not_active IP Right Cessation
- 1997-10-03 WO PCT/US1997/017799 patent/WO1998015384A1/en active IP Right Grant
- 1997-10-03 DE DE69712213T patent/DE69712213T2/de not_active Expired - Lifetime
- 1997-10-03 EP EP97909938A patent/EP0930955B1/de not_active Expired - Lifetime
- 1997-10-03 AU AU47432/97A patent/AU4743297A/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
ATE216645T1 (de) | 2002-05-15 |
EP0930955B1 (de) | 2002-04-24 |
DE69712213T2 (de) | 2002-11-14 |
WO1998015384A1 (en) | 1998-04-16 |
EP0930955A1 (de) | 1999-07-28 |
KR100445818B1 (ko) | 2004-08-30 |
US5736427A (en) | 1998-04-07 |
AU4743297A (en) | 1998-05-05 |
KR20000048984A (ko) | 2000-07-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |