DE69715075T2 - Verfahren zum epitaktischen Wachsen einer Halbleiterverbindung in der Dampffase - Google Patents
Verfahren zum epitaktischen Wachsen einer Halbleiterverbindung in der DampffaseInfo
- Publication number
- DE69715075T2 DE69715075T2 DE69715075T DE69715075T DE69715075T2 DE 69715075 T2 DE69715075 T2 DE 69715075T2 DE 69715075 T DE69715075 T DE 69715075T DE 69715075 T DE69715075 T DE 69715075T DE 69715075 T2 DE69715075 T2 DE 69715075T2
- Authority
- DE
- Germany
- Prior art keywords
- vapor phase
- semiconductor compound
- epitaxially growing
- epitaxially
- growing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2054—Methods of obtaining the confinement
- H01S5/2077—Methods of obtaining the confinement using lateral bandgap control during growth, e.g. selective growth, mask induced
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
- H01S3/2308—Amplifier arrangements, e.g. MOPA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0213—Sapphire, quartz or diamond based substrates
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6776296 | 1996-03-25 | ||
JP8757097A JP3879173B2 (ja) | 1996-03-25 | 1997-03-21 | 化合物半導体気相成長方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69715075D1 DE69715075D1 (de) | 2002-10-10 |
DE69715075T2 true DE69715075T2 (de) | 2003-01-23 |
Family
ID=26408975
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69715075T Expired - Lifetime DE69715075T2 (de) | 1996-03-25 | 1997-03-25 | Verfahren zum epitaktischen Wachsen einer Halbleiterverbindung in der Dampffase |
Country Status (6)
Country | Link |
---|---|
US (1) | US5970314A (de) |
EP (1) | EP0801156B1 (de) |
JP (1) | JP3879173B2 (de) |
KR (1) | KR100497262B1 (de) |
CN (1) | CN1097847C (de) |
DE (1) | DE69715075T2 (de) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10335700A (ja) * | 1997-06-04 | 1998-12-18 | Toshiba Corp | 半導体発光素子およびその製造方法 |
US6256331B1 (en) | 1997-08-08 | 2001-07-03 | Matsushita Electric Industrial Co., Ltd. | Semiconductor laser device, optical communication system using the same, and method for producing compound semiconductor |
CN1175473C (zh) * | 1997-10-30 | 2004-11-10 | 住友电气工业株式会社 | GaN单晶衬底及其制造方法 |
JP3349931B2 (ja) * | 1997-10-30 | 2002-11-25 | 松下電器産業株式会社 | 半導体レーザ装置の製造方法 |
US20110163323A1 (en) * | 1997-10-30 | 2011-07-07 | Sumitomo Electric Industires, Ltd. | GaN SINGLE CRYSTAL SUBSTRATE AND METHOD OF MAKING THE SAME |
TW398084B (en) * | 1998-06-05 | 2000-07-11 | Hewlett Packard Co | Multilayered indium-containing nitride buffer layer for nitride epitaxy |
CN1062917C (zh) * | 1998-08-12 | 2001-03-07 | 北京大学 | 铟镓氮单晶薄膜金属有机物气相外延生长技术 |
US6812053B1 (en) * | 1999-10-14 | 2004-11-02 | Cree, Inc. | Single step pendeo- and lateral epitaxial overgrowth of Group III-nitride epitaxial layers with Group III-nitride buffer layer and resulting structures |
KR100595177B1 (ko) * | 2000-02-10 | 2006-07-03 | 엘지전자 주식회사 | 질화물 발광소자 제조방법 |
AU2002219966A1 (en) | 2000-11-30 | 2002-06-11 | North Carolina State University | Methods and apparatus for producing m'n based materials |
AU2002235146A1 (en) | 2000-11-30 | 2002-06-11 | North Carolina State University | Non-thermionic sputter material transport device, methods of use, and materials produced thereby |
US6599362B2 (en) | 2001-01-03 | 2003-07-29 | Sandia Corporation | Cantilever epitaxial process |
US6576932B2 (en) | 2001-03-01 | 2003-06-10 | Lumileds Lighting, U.S., Llc | Increasing the brightness of III-nitride light emitting devices |
US6645885B2 (en) * | 2001-09-27 | 2003-11-11 | The National University Of Singapore | Forming indium nitride (InN) and indium gallium nitride (InGaN) quantum dots grown by metal-organic-vapor-phase-epitaxy (MOCVD) |
JP4532846B2 (ja) * | 2003-05-07 | 2010-08-25 | キヤノン株式会社 | 半導体基板の製造方法 |
KR100586975B1 (ko) * | 2004-06-30 | 2006-06-08 | 삼성전기주식회사 | 질화물 반도체 소자 및 제조방법 |
FR2904008B1 (fr) * | 2006-07-18 | 2009-12-04 | Centre Nat Rech Scient | NOUVEAU PROCEDE POUR LA CROISSANCE DE NITRURES D'ELEMENTS DU GROUPE IIIb. |
US20090320746A1 (en) * | 2007-01-31 | 2009-12-31 | Sumitomo Chemical Company, Limited | Method for producing group iii-v compound semiconductor |
CN102422391B (zh) * | 2009-11-12 | 2013-11-27 | 松下电器产业株式会社 | 氮化物半导体元件的制造方法 |
CN103840044B (zh) * | 2012-11-27 | 2016-10-26 | 比亚迪股份有限公司 | 外延片量子阱结构的制备方法 |
CN103078016A (zh) * | 2012-12-29 | 2013-05-01 | 光达光电设备科技(嘉兴)有限公司 | Led外延片沉积方法和led外延片沉积设备 |
ITUA20161691A1 (it) * | 2016-03-15 | 2017-09-15 | Univ Degli Studi Di Milano Bicocca | Metodo per la produzione di elettrodi per dispositivi elettrochimici |
CN114717535B (zh) * | 2022-03-21 | 2023-07-14 | 太原理工大学 | 一种在硅衬底上制备纤锌矿InGaN纳米棒的方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5422276B2 (de) * | 1973-03-19 | 1979-08-06 | ||
JPS51126036A (en) * | 1974-07-23 | 1976-11-02 | Fujitsu Ltd | Semi-conductor crystal growth method |
JPS58167766A (ja) * | 1982-03-30 | 1983-10-04 | Agency Of Ind Science & Technol | 化学蒸着装置 |
JPS6291495A (ja) * | 1985-10-15 | 1987-04-25 | Nec Corp | 半導体薄膜気相成長法 |
US5012158A (en) * | 1986-07-25 | 1991-04-30 | National Research Institute For Metals | Plasma CVD apparatus |
IT1225612B (it) * | 1988-07-29 | 1990-11-22 | Sgs Thomson Microelectronics | Processo di fabbricazione di dispositivi integrati cmos con lunghezza di gate ridotta e transistori a canale superficiale |
US5334277A (en) * | 1990-10-25 | 1994-08-02 | Nichia Kagaky Kogyo K.K. | Method of vapor-growing semiconductor crystal and apparatus for vapor-growing the same |
CA2120610C (en) * | 1992-08-07 | 1999-03-02 | Hideaki Imai | Nitride based semiconductor device and manufacture thereof |
JP3274907B2 (ja) * | 1992-11-20 | 2002-04-15 | 日亜化学工業株式会社 | 窒化インジウムガリウム化合物半導体の成長方法 |
US5656832A (en) * | 1994-03-09 | 1997-08-12 | Kabushiki Kaisha Toshiba | Semiconductor heterojunction device with ALN buffer layer of 3nm-10nm average film thickness |
US5661074A (en) * | 1995-02-03 | 1997-08-26 | Advanced Technology Materials, Inc. | High brightness electroluminescent device emitting in the green to ultraviolet spectrum and method of making the same |
-
1997
- 1997-03-21 JP JP8757097A patent/JP3879173B2/ja not_active Expired - Fee Related
- 1997-03-24 US US08/823,237 patent/US5970314A/en not_active Expired - Fee Related
- 1997-03-25 KR KR1019970010253A patent/KR100497262B1/ko not_active IP Right Cessation
- 1997-03-25 EP EP97302033A patent/EP0801156B1/de not_active Expired - Lifetime
- 1997-03-25 DE DE69715075T patent/DE69715075T2/de not_active Expired - Lifetime
- 1997-03-25 CN CN97104545A patent/CN1097847C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR100497262B1 (ko) | 2005-09-28 |
EP0801156B1 (de) | 2002-09-04 |
CN1164759A (zh) | 1997-11-12 |
EP0801156A3 (de) | 1998-05-27 |
CN1097847C (zh) | 2003-01-01 |
JP3879173B2 (ja) | 2007-02-07 |
DE69715075D1 (de) | 2002-10-10 |
EP0801156A2 (de) | 1997-10-15 |
JPH09315899A (ja) | 1997-12-09 |
US5970314A (en) | 1999-10-19 |
KR970068061A (ko) | 1997-10-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |