DE69725071D1 - Vorrichtung zur Detektion der Position - Google Patents

Vorrichtung zur Detektion der Position

Info

Publication number
DE69725071D1
DE69725071D1 DE69725071T DE69725071T DE69725071D1 DE 69725071 D1 DE69725071 D1 DE 69725071D1 DE 69725071 T DE69725071 T DE 69725071T DE 69725071 T DE69725071 T DE 69725071T DE 69725071 D1 DE69725071 D1 DE 69725071D1
Authority
DE
Germany
Prior art keywords
detection device
position detection
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69725071T
Other languages
English (en)
Other versions
DE69725071T2 (de
Inventor
Toshiaki Ueno
Takaaki Yagi
Mitsuchika Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Development Co LP
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69725071D1 publication Critical patent/DE69725071D1/de
Application granted granted Critical
Publication of DE69725071T2 publication Critical patent/DE69725071T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/14—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring distance or clearance between spaced objects or spaced apertures
DE69725071T 1996-07-22 1997-07-21 Vorrichtung zur Detektion der Position Expired - Fee Related DE69725071T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP19168796 1996-07-22
JP19168796A JPH1038508A (ja) 1996-07-22 1996-07-22 位置検出装置及び位置決め装置

Publications (2)

Publication Number Publication Date
DE69725071D1 true DE69725071D1 (de) 2003-10-30
DE69725071T2 DE69725071T2 (de) 2004-07-22

Family

ID=16278797

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69725071T Expired - Fee Related DE69725071T2 (de) 1996-07-22 1997-07-21 Vorrichtung zur Detektion der Position

Country Status (4)

Country Link
US (1) US5861754A (de)
EP (1) EP0821216B1 (de)
JP (1) JPH1038508A (de)
DE (1) DE69725071T2 (de)

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JP4124867B2 (ja) * 1998-07-14 2008-07-23 松下電器産業株式会社 変換装置
US7260051B1 (en) 1998-12-18 2007-08-21 Nanochip, Inc. Molecular memory medium and molecular memory integrated circuit
JP4014326B2 (ja) * 1999-02-18 2007-11-28 本田技研工業株式会社 静電容量式傾斜センサ
US6317011B1 (en) * 2000-03-09 2001-11-13 Avaya Technology Corp. Resonant capacitive coupler
JP2002031545A (ja) 2000-07-13 2002-01-31 Mitsutoyo Corp 相対変位検出ユニット
US20020138301A1 (en) * 2001-03-22 2002-09-26 Thanos Karras Integration of a portal into an application service provider data archive and/or web based viewer
US6487787B1 (en) 2001-08-03 2002-12-03 Mitutoyo Corporation System and method for determination of error parameters for performing self-calibration and other functions without an external position reference in a transducer
US7142500B2 (en) * 2002-01-11 2006-11-28 Hewlett-Packard Development Company, L.P. Sensor with varying capacitance based on relative position between objects
US7233517B2 (en) * 2002-10-15 2007-06-19 Nanochip, Inc. Atomic probes and media for high density data storage
US6776043B1 (en) * 2003-02-07 2004-08-17 The Boeing Company Variable capacitance bridge accelerometer
WO2004077677A1 (en) * 2003-02-24 2004-09-10 Analog Devices, Inc. Signal-conditioning and analog-to-digital conversion circuit architecture
US6922063B2 (en) * 2003-07-11 2005-07-26 Zircon Corporation Apparatus and method for capacitive level sensor
US7124634B2 (en) * 2003-07-29 2006-10-24 The Boeing Company Single plate capacitive acceleration derivative detector
US20050243660A1 (en) * 2004-04-16 2005-11-03 Rust Thomas F Methods for erasing bit cells in a high density data storage device
US20050243592A1 (en) * 2004-04-16 2005-11-03 Rust Thomas F High density data storage device having eraseable bit cells
US7489141B1 (en) 2004-08-18 2009-02-10 Environmental Metrology Corporation Surface micro sensor and method
US7310577B2 (en) * 2004-09-29 2007-12-18 The Boeing Company Integrated capacitive bridge and integrated flexure functions inertial measurement unit
AU2005299470A1 (en) * 2004-10-22 2006-05-04 Vikram A. Bose-Mullick A signal-enhancement system for photodetector outputs
US7317317B1 (en) * 2004-11-02 2008-01-08 Environmental Metrology Corporation Shielded micro sensor and method for electrochemically monitoring residue in micro features
US7360425B2 (en) * 2004-11-22 2008-04-22 The Boeing Company Compensated composite structure
US7228739B2 (en) 2004-11-23 2007-06-12 The Boeing Company Precision flexure plate
US7331229B2 (en) * 2004-12-09 2008-02-19 The Boeing Company Magnetic null accelerometer
US7137208B2 (en) * 2004-12-14 2006-11-21 The Boeing Company Leveling device
US8599174B2 (en) 2005-03-18 2013-12-03 The Invention Science Fund I, Llc Verifying a written expression
US7296470B2 (en) * 2005-04-14 2007-11-20 The Boeing Company Extended accuracy flexured plate dual capacitance accelerometer
US7463573B2 (en) * 2005-06-24 2008-12-09 Nanochip, Inc. Patterned media for a high density data storage device
US20070041237A1 (en) * 2005-07-08 2007-02-22 Nanochip, Inc. Media for writing highly resolved domains
US20070008867A1 (en) * 2005-07-08 2007-01-11 Nanochip, Inc. High density data storage devices with a lubricant layer comprised of a field of polymer chains
US20070008866A1 (en) * 2005-07-08 2007-01-11 Nanochip, Inc. Methods for writing and reading in a polarity-dependent memory switch media
US20070008865A1 (en) * 2005-07-08 2007-01-11 Nanochip, Inc. High density data storage devices with polarity-dependent memory switching media
US7932726B1 (en) 2005-08-16 2011-04-26 Environmental Metrology Corporation Method of design optimization and monitoring the clean/rinse/dry processes of patterned wafers using an electro-chemical residue sensor (ECRS)
US20080001075A1 (en) * 2006-06-15 2008-01-03 Nanochip, Inc. Memory stage for a probe storage device
US20080175033A1 (en) * 2007-01-19 2008-07-24 Nanochip, Inc. Method and system for improving domain stability in a ferroelectric media
US20080174918A1 (en) * 2007-01-19 2008-07-24 Nanochip, Inc. Method and system for writing and reading a charge-trap media with a probe tip
US20080233672A1 (en) * 2007-03-20 2008-09-25 Nanochip, Inc. Method of integrating mems structures and cmos structures using oxide fusion bonding
JP5044348B2 (ja) * 2007-09-26 2012-10-10 株式会社東芝 センサ装置、及びこれを用いたセンサシステムと電子機器
US20090129246A1 (en) * 2007-11-21 2009-05-21 Nanochip, Inc. Environmental management of a probe storage device
US20090294028A1 (en) * 2008-06-03 2009-12-03 Nanochip, Inc. Process for fabricating high density storage device with high-temperature media
US20100039729A1 (en) * 2008-08-14 2010-02-18 Nanochip, Inc. Package with integrated magnets for electromagnetically-actuated probe-storage device
US20100039919A1 (en) * 2008-08-15 2010-02-18 Nanochip, Inc. Cantilever Structure for Use in Seek-and-Scan Probe Storage
US8081005B2 (en) * 2009-03-17 2011-12-20 The Corporation Of Mercer University Capacitive sensors for nano-positioning and methods of using the same
DE102011079704A1 (de) * 2011-07-25 2013-01-31 Robert Bosch Gmbh Suchgerät
CN105185283B (zh) 2015-10-23 2017-12-08 京东方科技集团股份有限公司 检测装置、基板架、检测基板架上基板位置的方法
US9933867B2 (en) * 2015-12-30 2018-04-03 Synaptics Incorporated Active pen capacitive displacement gauge
US10254134B2 (en) * 2016-08-04 2019-04-09 Apple Inc. Interference-insensitive capacitive displacement sensing
DE102018128023A1 (de) * 2018-11-09 2020-05-14 Schaeffler Technologies AG & Co. KG Linearführung
CN112067899B (zh) * 2020-08-31 2023-04-07 湖北长江新型显示产业创新中心有限公司 面板结构、显示装置及面板结构的对位检测方法

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US3312892A (en) * 1964-05-04 1967-04-04 Technology Instr Corp Of Calif Contactless electrical transducer having moving parts
DE2311015A1 (de) * 1973-03-06 1974-09-12 Gaby Weiss Kondensatorkarte zur ermittlung von flaechengroessen
DE2518745C3 (de) * 1975-04-26 1979-06-21 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Fehlerkompensation in Positioniersystemen
NL7905562A (nl) * 1979-07-17 1981-01-20 Heerens Willem Christiaan Capacitieve meter.
US4814845A (en) * 1986-11-03 1989-03-21 Kulite Semiconductor Products, Inc. Capacitive transducers employing high conductivity diffused regions
US4893071A (en) * 1988-05-24 1990-01-09 American Telephone And Telegraph Company, At&T Bell Laboratories Capacitive incremental position measurement and motion control
JP3043477B2 (ja) * 1991-07-17 2000-05-22 和廣 岡田 静電容量の変化を利用したセンサ
US5461319A (en) * 1992-12-28 1995-10-24 Peters; Randall D. Symmetric differential capacitance transducer employing cross coupled conductive plates to form equipotential pairs
JPH07192346A (ja) * 1993-12-24 1995-07-28 Victor Co Of Japan Ltd 静電容量値の変化の検出による記録跡の位置情報の検出装置
JP3686109B2 (ja) * 1994-10-07 2005-08-24 ヒューレット・パッカード・カンパニー メモリ装置

Also Published As

Publication number Publication date
EP0821216A2 (de) 1998-01-28
JPH1038508A (ja) 1998-02-13
US5861754A (en) 1999-01-19
DE69725071T2 (de) 2004-07-22
EP0821216A3 (de) 1999-06-16
EP0821216B1 (de) 2003-09-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, TE

8339 Ceased/non-payment of the annual fee