DE69739438D1 - Anordnung und verfahren zur prüfung von integrierten schaltungseinrichtungen - Google Patents

Anordnung und verfahren zur prüfung von integrierten schaltungseinrichtungen

Info

Publication number
DE69739438D1
DE69739438D1 DE69739438T DE69739438T DE69739438D1 DE 69739438 D1 DE69739438 D1 DE 69739438D1 DE 69739438 T DE69739438 T DE 69739438T DE 69739438 T DE69739438 T DE 69739438T DE 69739438 D1 DE69739438 D1 DE 69739438D1
Authority
DE
Germany
Prior art keywords
testing
integrated circuit
circuit device
arrangement
testing integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69739438T
Other languages
English (en)
Inventor
Tord L Haulin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Telefonaktiebolaget LM Ericsson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefonaktiebolaget LM Ericsson AB filed Critical Telefonaktiebolaget LM Ericsson AB
Application granted granted Critical
Publication of DE69739438D1 publication Critical patent/DE69739438D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE69739438T 1996-02-06 1997-01-17 Anordnung und verfahren zur prüfung von integrierten schaltungseinrichtungen Expired - Fee Related DE69739438D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US59597996A 1996-02-06 1996-02-06
PCT/SE1997/000068 WO1997029384A1 (en) 1996-02-06 1997-01-17 Assembly and method for testing integrated circuit devices

Publications (1)

Publication Number Publication Date
DE69739438D1 true DE69739438D1 (de) 2009-07-16

Family

ID=24385505

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69739438T Expired - Fee Related DE69739438D1 (de) 1996-02-06 1997-01-17 Anordnung und verfahren zur prüfung von integrierten schaltungseinrichtungen

Country Status (11)

Country Link
US (1) US5996102A (de)
EP (1) EP0882239B1 (de)
JP (1) JP2000504830A (de)
KR (1) KR19990082339A (de)
CN (1) CN1084878C (de)
AT (1) ATE433121T1 (de)
AU (1) AU1678697A (de)
CA (1) CA2245549C (de)
DE (1) DE69739438D1 (de)
HK (1) HK1019930A1 (de)
WO (1) WO1997029384A1 (de)

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US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7609080B2 (en) * 2005-03-22 2009-10-27 Formfactor, Inc. Voltage fault detection and protection
US7555670B2 (en) * 2005-10-26 2009-06-30 Intel Corporation Clocking architecture using a bidirectional clock port
US8045353B2 (en) * 2005-12-30 2011-10-25 Stmicroelectronics Pvt. Ltd. Integrated circuit capable of operating at different supply voltages
US7609077B2 (en) * 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7382149B2 (en) * 2006-07-24 2008-06-03 International Business Machines Corporation System for acquiring device parameters
JP2008250725A (ja) * 2007-03-30 2008-10-16 Nec Electronics Corp インターフェース回路
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
JP4874210B2 (ja) 2007-10-16 2012-02-15 株式会社アドバンテスト 試験装置
US8112043B2 (en) * 2008-04-11 2012-02-07 Infineon Technologies Ag Radio frequency communication devices and methods
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US8230281B2 (en) * 2009-04-13 2012-07-24 Altera Corporation Techniques for boundary scan testing using transmitters and receivers
US9759772B2 (en) 2011-10-28 2017-09-12 Teradyne, Inc. Programmable test instrument
US10776233B2 (en) 2011-10-28 2020-09-15 Teradyne, Inc. Programmable test instrument
JP2013250250A (ja) * 2012-06-04 2013-12-12 Advantest Corp テスターハードウェアおよびそれを用いた試験システム
US9606183B2 (en) * 2012-10-20 2017-03-28 Advantest Corporation Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test
CN103852709A (zh) * 2012-11-28 2014-06-11 英业达科技有限公司 电路板上电子元件与电路板功能检测的系统及其方法
US8839063B2 (en) * 2013-01-24 2014-09-16 Texas Instruments Incorporated Circuits and methods for dynamic allocation of scan test resources
JP2014235127A (ja) * 2013-06-04 2014-12-15 株式会社アドバンテスト 試験システム、制御プログラム、コンフィギュレーションデータの書込方法
US10073806B2 (en) * 2015-05-13 2018-09-11 Qualcomm Incorporated Apparatus and methods for providing a reconfigurable bidirectional front-end interface
CN109061280A (zh) * 2018-07-24 2018-12-21 北方电子研究院安徽有限公司 一种用于测试电流、电压的自动测试系统
FR3093186B1 (fr) * 2019-02-22 2021-11-26 St Microelectronics Rousset Procédé et dispositif de détection sur carte de défauts éventuels dans un système fixé sur ladite carte
US11456729B1 (en) 2021-03-26 2022-09-27 Analog Devices, Inc. Deskew cell for delay and pulse width adjustment

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US5084874A (en) * 1988-09-07 1992-01-28 Texas Instruments Incorporated Enhanced test circuit
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Also Published As

Publication number Publication date
AU1678697A (en) 1997-08-28
ATE433121T1 (de) 2009-06-15
JP2000504830A (ja) 2000-04-18
CN1217062A (zh) 1999-05-19
US5996102A (en) 1999-11-30
KR19990082339A (ko) 1999-11-25
EP0882239A1 (de) 1998-12-09
WO1997029384A1 (en) 1997-08-14
CN1084878C (zh) 2002-05-15
EP0882239B1 (de) 2009-06-03
CA2245549C (en) 2003-04-08
HK1019930A1 (en) 2000-03-03
CA2245549A1 (en) 1997-08-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee