DE69902053T2 - Konfokales optisches rastermikroskop - Google Patents

Konfokales optisches rastermikroskop

Info

Publication number
DE69902053T2
DE69902053T2 DE69902053T DE69902053T DE69902053T2 DE 69902053 T2 DE69902053 T2 DE 69902053T2 DE 69902053 T DE69902053 T DE 69902053T DE 69902053 T DE69902053 T DE 69902053T DE 69902053 T2 DE69902053 T2 DE 69902053T2
Authority
DE
Germany
Prior art keywords
confocal optical
optical grid
spread
images
limiting apertures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69902053T
Other languages
English (en)
Other versions
DE69902053D1 (de
Inventor
Bradshaw Amos
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Medical Research Council
Original Assignee
Medical Research Council
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Medical Research Council filed Critical Medical Research Council
Publication of DE69902053D1 publication Critical patent/DE69902053D1/de
Application granted granted Critical
Publication of DE69902053T2 publication Critical patent/DE69902053T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
DE69902053T 1998-11-19 1999-07-15 Konfokales optisches rastermikroskop Expired - Fee Related DE69902053T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB9825267.9A GB9825267D0 (en) 1998-11-19 1998-11-19 Scanning confocal optical microscope system
PCT/GB1999/002284 WO2000031577A1 (en) 1998-11-19 1999-07-15 Scanning confocal optical microscope system

Publications (2)

Publication Number Publication Date
DE69902053D1 DE69902053D1 (de) 2002-08-08
DE69902053T2 true DE69902053T2 (de) 2002-11-07

Family

ID=10842647

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69902053T Expired - Fee Related DE69902053T2 (de) 1998-11-19 1999-07-15 Konfokales optisches rastermikroskop

Country Status (11)

Country Link
US (1) US6555811B1 (de)
EP (1) EP1131662B1 (de)
JP (1) JP2002530716A (de)
AT (1) ATE220215T1 (de)
AU (1) AU765975B2 (de)
CA (1) CA2343279C (de)
DE (1) DE69902053T2 (de)
DK (1) DK1131662T3 (de)
ES (1) ES2179665T3 (de)
GB (2) GB9825267D0 (de)
WO (1) WO2000031577A1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6958811B2 (en) 2000-06-29 2005-10-25 Carl Zeiss Jena Gmbh Method for the detection of dyes in fluorescence microscopy
US6747737B2 (en) 2000-06-29 2004-06-08 Carl Zeiss Jena Gmbh Method for optical detection of an illuminated specimen in a plurality of detection channels
DE20012378U1 (de) 2000-07-17 2000-10-19 Leica Microsystems Anordnung zur spektral empfindlichen Auf- und Durchlichtbeleuchtung
DE10038049A1 (de) * 2000-08-02 2002-02-14 Leica Microsystems Optische Anordnung zur Selektion und Detektion des Spektalbereichs eines Lichtstrahls
US6947133B2 (en) 2000-08-08 2005-09-20 Carl Zeiss Jena Gmbh Method for increasing the spectral and spatial resolution of detectors
US6858852B2 (en) 2000-08-08 2005-02-22 Carl Zeiss Jena Gmbh Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy
AU2000272769A1 (en) * 2000-08-17 2002-02-25 Mg Microscope Gmbh Light detector unit and method for detecting luminescence light and confocal microscope for luminescence microscopy
JP2002277744A (ja) * 2001-03-21 2002-09-25 Olympus Optical Co Ltd 走査型光学顕微鏡
JP4939703B2 (ja) * 2001-08-21 2012-05-30 オリンパス株式会社 走査型レーザー顕微鏡
US6750457B2 (en) * 2001-08-29 2004-06-15 Becton Dickinson And Company System for high throughput analysis
DE10156695B4 (de) 2001-11-17 2004-07-15 Leica Microsystems Heidelberg Gmbh Scanmikroskop, Verfahren zur Scanmikroskopie und Bandpassfilter
DE10213187A1 (de) 2002-03-23 2003-10-09 Leica Microsystems Verfahren zur Spektralanlanalyse und Scanmikroskop
DE10238100A1 (de) * 2002-08-21 2004-03-04 Leica Microsystems Heidelberg Gmbh Vorrichtung zur spektralen Selektion und Detektion eines Lichtstrahls und Scanmikroskop
US8014063B2 (en) * 2002-08-30 2011-09-06 Medical Research Council Optical projection tomography
JP4086182B2 (ja) * 2002-10-09 2008-05-14 オリンパス株式会社 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡
DE10257120B4 (de) * 2002-12-05 2020-01-16 Leica Microsystems Cms Gmbh Rastermikroskop zum Abbilden eines Objekts
JP4677728B2 (ja) * 2004-03-22 2011-04-27 株式会社ニコン 共焦点顕微鏡及び共焦点顕微鏡システム
JP4804727B2 (ja) * 2004-06-24 2011-11-02 オリンパス株式会社 光走査型共焦点顕微鏡
DE102004047820A1 (de) * 2004-09-29 2006-03-30 Leica Microsystems Cms Gmbh Rastermikroskop und rastermikroskopisches Verfahren
DE102005000915A1 (de) * 2005-01-06 2006-07-20 Leica Microsystems Cms Gmbh Vorrichtung zur multifokalen konfokalen mirkoskopischen Bestimmung der räumlichen Verteilung und zur multifokalen Fluktuationsanalyse von fluoreszenten Molekülen und Strukturen mit spektral flexibler Detektion
JP4826585B2 (ja) * 2005-07-21 2011-11-30 株式会社ニコン 共焦点顕微鏡装置
US7397561B2 (en) * 2005-11-07 2008-07-08 Wafermasters, Incorporated Spectroscopy system
US7564547B2 (en) * 2005-11-07 2009-07-21 Wafermasters, Inc. Spectroscopy system
US20070132831A1 (en) * 2005-12-13 2007-06-14 Bio-Rad Laboratories, Inc. Masking to prevent overexposure and light spillage in microarray scanning
KR100790702B1 (ko) * 2006-09-08 2008-01-02 삼성전기주식회사 공초점 전기발광 분광 현미경
GB2451442B (en) * 2007-07-30 2013-03-06 Lein Applied Diagnostics Ltd Optical measurement apparatus and method therefor
JP5541972B2 (ja) * 2010-06-09 2014-07-09 オリンパス株式会社 走査型共焦点顕微鏡
US8456637B2 (en) * 2010-08-26 2013-06-04 Mitutoyo Corporation Multiple measuring point configuration for a chromatic point sensor
DE102014116782A1 (de) * 2014-11-17 2016-05-19 Carl Zeiss Microscopy Gmbh Detektorvorrichtung für ein Mikroskop
JP2022526650A (ja) * 2019-04-12 2022-05-25 インベニオ イメージング、インコーポレイテッド 組織における術中造影剤の検出のための撮像システム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2626383B1 (fr) * 1988-01-27 1991-10-25 Commissariat Energie Atomique Procede de microscopie optique confocale a balayage et en profondeur de champ etendue et dispositifs pour la mise en oeuvre du procede
US5032720A (en) 1988-04-21 1991-07-16 White John G Confocal imaging system
GB9014263D0 (en) * 1990-06-27 1990-08-15 Dixon Arthur E Apparatus and method for spatially- and spectrally- resolvedmeasurements
US5886784A (en) * 1993-09-08 1999-03-23 Leica Lasertechink Gmbh Device for the selection and detection of at least two spectral regions in a beam of light
DE4330347C2 (de) * 1993-09-08 1998-04-09 Leica Lasertechnik Verwendung einer Vorrichtung zur Selektion und Detektion mindestens zweier Spektralbereiche eines Lichtstrahls
JP3568626B2 (ja) 1994-05-24 2004-09-22 オリンパス株式会社 走査型光学顕微鏡
DE4419940A1 (de) * 1994-06-08 1995-12-14 Eberhard Dipl Phys Tuengler 3D-Bilderkennungsverfahren mit konfokaler Lichtmikroskopie
DE19510102C1 (de) 1995-03-20 1996-10-02 Rainer Dr Uhl Konfokales Fluoreszenzmikroskop
JP2000097858A (ja) * 1998-09-22 2000-04-07 Olympus Optical Co Ltd 走査型共焦点顕微鏡
JP2000199855A (ja) * 1998-11-02 2000-07-18 Olympus Optical Co Ltd 走査型光学顕微鏡装置

Also Published As

Publication number Publication date
DK1131662T3 (da) 2002-10-14
ES2179665T3 (es) 2003-01-16
JP2002530716A (ja) 2002-09-17
CA2343279A1 (en) 2000-06-02
US6555811B1 (en) 2003-04-29
GB2344014A (en) 2000-05-24
AU4923099A (en) 2000-06-13
WO2000031577A1 (en) 2000-06-02
GB2344014B (en) 2001-02-07
DE69902053D1 (de) 2002-08-08
GB9916494D0 (en) 1999-09-15
EP1131662A1 (de) 2001-09-12
GB9825267D0 (en) 1999-01-13
CA2343279C (en) 2006-01-31
ATE220215T1 (de) 2002-07-15
EP1131662B1 (de) 2002-07-03
AU765975B2 (en) 2003-10-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee