DE8703044U1 - - Google Patents

Info

Publication number
DE8703044U1
DE8703044U1 DE8703044U DE8703044U DE8703044U1 DE 8703044 U1 DE8703044 U1 DE 8703044U1 DE 8703044 U DE8703044 U DE 8703044U DE 8703044 U DE8703044 U DE 8703044U DE 8703044 U1 DE8703044 U1 DE 8703044U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8703044U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
We-Electronic 3320 Salzgitter De GmbH
Original Assignee
We-Electronic 3320 Salzgitter De GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by We-Electronic 3320 Salzgitter De GmbH filed Critical We-Electronic 3320 Salzgitter De GmbH
Priority to DE8703044U priority Critical patent/DE8703044U1/de
Priority to DE19873739705 priority patent/DE3739705A1/en
Publication of DE8703044U1 publication Critical patent/DE8703044U1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
DE8703044U 1987-02-27 1987-02-27 Expired DE8703044U1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE8703044U DE8703044U1 (en) 1987-02-27 1987-02-27
DE19873739705 DE3739705A1 (en) 1987-02-27 1987-11-24 Device for testing electronic circuit boards

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE8703044U DE8703044U1 (en) 1987-02-27 1987-02-27

Publications (1)

Publication Number Publication Date
DE8703044U1 true DE8703044U1 (en) 1988-03-31

Family

ID=6805294

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8703044U Expired DE8703044U1 (en) 1987-02-27 1987-02-27

Country Status (1)

Country Link
DE (1) DE8703044U1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0651260A2 (en) * 1993-11-02 1995-05-03 Circuit Line S.P.A. Machine with press assembly for electrically testing a printed circuit board

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2163970A1 (en) * 1970-12-25 1972-09-21 Matsushita Electric Ind Co Ltd Test device for boards with printed circuit
GB1384550A (en) * 1971-12-01 1975-02-19 Int Computers Ltd Test probe apparatus for use in testing electrically conductive paths
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means
US4471298A (en) * 1981-12-11 1984-09-11 Cirdyne, Inc. Apparatus for automatically electrically testing printed circuit boards

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2163970A1 (en) * 1970-12-25 1972-09-21 Matsushita Electric Ind Co Ltd Test device for boards with printed circuit
GB1384550A (en) * 1971-12-01 1975-02-19 Int Computers Ltd Test probe apparatus for use in testing electrically conductive paths
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means
US4471298A (en) * 1981-12-11 1984-09-11 Cirdyne, Inc. Apparatus for automatically electrically testing printed circuit boards

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0651260A2 (en) * 1993-11-02 1995-05-03 Circuit Line S.P.A. Machine with press assembly for electrically testing a printed circuit board
EP0651260A3 (en) * 1993-11-02 1995-07-26 Circuit Line Spa Machine with press assembly for electrically testing a printed circuit board.
US5614819A (en) * 1993-11-02 1997-03-25 Circuit Line S.P.A. Multi-station machine and press assembly for electrically testing a printed circuit board having manual and automatic operating modes
US5889407A (en) * 1993-11-02 1999-03-30 Circuit Line S.P.A. Press assembly for electrically testing a printed circuit board having an exchangeable lower adapter

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