EP0222344A3 - Device for testing and sorting electronic components - Google Patents

Device for testing and sorting electronic components Download PDF

Info

Publication number
EP0222344A3
EP0222344A3 EP86115464A EP86115464A EP0222344A3 EP 0222344 A3 EP0222344 A3 EP 0222344A3 EP 86115464 A EP86115464 A EP 86115464A EP 86115464 A EP86115464 A EP 86115464A EP 0222344 A3 EP0222344 A3 EP 0222344A3
Authority
EP
European Patent Office
Prior art keywords
magazine
cassette
testing
electronic components
rods
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP86115464A
Other languages
English (en)
Other versions
EP0222344A2 (de
EP0222344B1 (de
Inventor
Ekkehard Ueberreiter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to AT86115464T priority Critical patent/ATE68115T1/de
Publication of EP0222344A2 publication Critical patent/EP0222344A2/de
Publication of EP0222344A3 publication Critical patent/EP0222344A3/de
Application granted granted Critical
Publication of EP0222344B1 publication Critical patent/EP0222344B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Warehouses Or Storage Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
EP86115464A 1985-11-11 1986-11-07 Vorrichtung zum Prüfen und Sortieren von elektronischen Bauelementen Expired - Lifetime EP0222344B1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT86115464T ATE68115T1 (de) 1985-11-11 1986-11-07 Vorrichtung zum pruefen und sortieren von elektronischen bauelementen.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3539965 1985-11-11
DE19853539965 DE3539965A1 (de) 1985-11-11 1985-11-11 Vorrichtung zum pruefen und sortieren von elektronischen bauelementen

Publications (3)

Publication Number Publication Date
EP0222344A2 EP0222344A2 (de) 1987-05-20
EP0222344A3 true EP0222344A3 (en) 1988-02-03
EP0222344B1 EP0222344B1 (de) 1991-10-09

Family

ID=6285687

Family Applications (1)

Application Number Title Priority Date Filing Date
EP86115464A Expired - Lifetime EP0222344B1 (de) 1985-11-11 1986-11-07 Vorrichtung zum Prüfen und Sortieren von elektronischen Bauelementen

Country Status (4)

Country Link
US (1) US4778063A (de)
EP (1) EP0222344B1 (de)
AT (1) ATE68115T1 (de)
DE (2) DE3539965A1 (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4941795A (en) * 1988-11-21 1990-07-17 At&T Bell Laboratories Component insertion machine apparatus
JPH0643204B2 (ja) * 1989-08-26 1994-06-08 吉田工業株式会社 スライダー補給装置
US5116185A (en) * 1990-05-01 1992-05-26 Lsi Logic Corp. Vibratory tube-to-tube transfer system
US5117963A (en) * 1990-12-12 1992-06-02 Micron Technology, Inc. System for automated handling of symmetrical supply tubes
US5316649A (en) * 1991-03-05 1994-05-31 The United States Of America As Represented By The United States Department Of Energy High frequency reference electrode
TW287235B (de) * 1994-06-30 1996-10-01 Zenshin Test Co
DE19827458C2 (de) * 1998-06-19 2001-10-11 Helmuth Heigl Vereinzelungsvorrichtung für Bauelemente
US7996174B2 (en) 2007-12-18 2011-08-09 Teradyne, Inc. Disk drive testing
US8549912B2 (en) 2007-12-18 2013-10-08 Teradyne, Inc. Disk drive transport, clamping and testing
US7848106B2 (en) 2008-04-17 2010-12-07 Teradyne, Inc. Temperature control within disk drive testing systems
US20090262455A1 (en) 2008-04-17 2009-10-22 Teradyne, Inc. Temperature Control Within Disk Drive Testing Systems
US8117480B2 (en) 2008-04-17 2012-02-14 Teradyne, Inc. Dependent temperature control within disk drive testing systems
US8160739B2 (en) 2008-04-17 2012-04-17 Teradyne, Inc. Transferring storage devices within storage device testing systems
US7945424B2 (en) 2008-04-17 2011-05-17 Teradyne, Inc. Disk drive emulator and method of use thereof
US8238099B2 (en) 2008-04-17 2012-08-07 Teradyne, Inc. Enclosed operating area for disk drive testing systems
US8102173B2 (en) 2008-04-17 2012-01-24 Teradyne, Inc. Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit
US8095234B2 (en) 2008-04-17 2012-01-10 Teradyne, Inc. Transferring disk drives within disk drive testing systems
US8305751B2 (en) 2008-04-17 2012-11-06 Teradyne, Inc. Vibration isolation within disk drive testing systems
US8041449B2 (en) 2008-04-17 2011-10-18 Teradyne, Inc. Bulk feeding disk drives to disk drive testing systems
US8086343B2 (en) 2008-06-03 2011-12-27 Teradyne, Inc. Processing storage devices
US8547123B2 (en) 2009-07-15 2013-10-01 Teradyne, Inc. Storage device testing system with a conductive heating assembly
US8687356B2 (en) 2010-02-02 2014-04-01 Teradyne, Inc. Storage device testing system cooling
US7920380B2 (en) 2009-07-15 2011-04-05 Teradyne, Inc. Test slot cooling system for a storage device testing system
US8466699B2 (en) 2009-07-15 2013-06-18 Teradyne, Inc. Heating storage devices in a testing system
US7995349B2 (en) 2009-07-15 2011-08-09 Teradyne, Inc. Storage device temperature sensing
US8628239B2 (en) 2009-07-15 2014-01-14 Teradyne, Inc. Storage device temperature sensing
US8116079B2 (en) 2009-07-15 2012-02-14 Teradyne, Inc. Storage device testing system cooling
US9779780B2 (en) 2010-06-17 2017-10-03 Teradyne, Inc. Damping vibrations within storage device testing systems
US8687349B2 (en) 2010-07-21 2014-04-01 Teradyne, Inc. Bulk transfer of storage devices using manual loading
US9001456B2 (en) 2010-08-31 2015-04-07 Teradyne, Inc. Engaging test slots
US9459312B2 (en) 2013-04-10 2016-10-04 Teradyne, Inc. Electronic assembly test system
US10725091B2 (en) 2017-08-28 2020-07-28 Teradyne, Inc. Automated test system having multiple stages
US10948534B2 (en) 2017-08-28 2021-03-16 Teradyne, Inc. Automated test system employing robotics
US11226390B2 (en) 2017-08-28 2022-01-18 Teradyne, Inc. Calibration process for an automated test system
US10845410B2 (en) 2017-08-28 2020-11-24 Teradyne, Inc. Automated test system having orthogonal robots
US10983145B2 (en) 2018-04-24 2021-04-20 Teradyne, Inc. System for testing devices inside of carriers
US10775408B2 (en) 2018-08-20 2020-09-15 Teradyne, Inc. System for testing devices inside of carriers
US11754622B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Thermal control system for an automated test system
US11899042B2 (en) 2020-10-22 2024-02-13 Teradyne, Inc. Automated test system
US11754596B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Test site configuration in an automated test system
US11867749B2 (en) 2020-10-22 2024-01-09 Teradyne, Inc. Vision system for an automated test system
US11953519B2 (en) 2020-10-22 2024-04-09 Teradyne, Inc. Modular automated test system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4049123A (en) * 1976-06-01 1977-09-20 Western Electric Company, Inc. Methods of and apparatus for sorting articles in accordance with their resistivity and thickness
EP0146729A1 (de) * 1983-11-07 1985-07-03 Hans-Heinrich Willberg Vorrichtung zum Weiterleiten von Bauteilen, insbesondere von integrierten Chips, einem Eingangsmagazin zu einem Ausgangsmagazin

Family Cites Families (17)

* Cited by examiner, † Cited by third party
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DE225882C (de) *
US3308977A (en) * 1965-10-04 1967-03-14 Ibm Automatic tray handler
US3716786A (en) * 1970-10-02 1973-02-13 Cogar Corp Module tester and sorter for use in a module test system
US3727757A (en) * 1972-06-12 1973-04-17 C Boissicat Dip handling apparatus
US3896935A (en) * 1973-11-26 1975-07-29 Ramsey Eng Co Integrated circuit handler
US4124132A (en) * 1977-05-18 1978-11-07 Sola Basic Industries, Inc. Magazine apparatus for semiconductor processing device
US4234418A (en) * 1978-06-23 1980-11-18 Contrel Corporation Dip-handling apparatus
DE2855913C2 (de) * 1978-12-23 1983-05-19 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Vorrichtung zum Sortieren von Bauelementen
JPS56168566A (en) * 1980-05-30 1981-12-24 Toshiba Corp Ic autohandler
JPS5896258A (ja) * 1981-12-03 1983-06-08 Fujitsu Ltd 電子部品テスタ用オ−トハンドラにおける部品ケ−スドツキング機構
US4500246A (en) * 1983-03-01 1985-02-19 Universal Instruments Corporation Indexed feed of electronic component supply tubes
US4506213A (en) * 1983-07-18 1985-03-19 Sym-Tek Systems, Inc. Electronic device handler
DE3340185A1 (de) * 1983-11-07 1985-05-15 Multitest Elektronische Systeme GmbH, 8200 Rosenheim Vorrichtung zum aufnehmen von bauteilen, insbesondere von integrierten chips, in einem eingangs- und/oder ausgangsmagazin einer bauteile-pruefmaschine
US4588092A (en) * 1983-11-15 1986-05-13 Automated Electronic Technology, Inc. Integrated circuit handling and contact system
US4618305A (en) * 1983-11-23 1986-10-21 Daymarc Corporation Automatic feed apparatus and process for integrated circuits stored in tubes
DE3587858D1 (de) * 1984-06-29 1994-07-21 Advantest Corp IC-Testvorrichtung.
DE3505700A1 (de) * 1985-02-19 1986-08-21 Microhandling Handhabungsgeräte GmbH, 8000 München Vorrichtung zum magazinieren von laenglichen verpackungseinheiten fuer bauteile, insbesondere fuer integrierte, elektronische schaltkreise (ics)

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4049123A (en) * 1976-06-01 1977-09-20 Western Electric Company, Inc. Methods of and apparatus for sorting articles in accordance with their resistivity and thickness
EP0146729A1 (de) * 1983-11-07 1985-07-03 Hans-Heinrich Willberg Vorrichtung zum Weiterleiten von Bauteilen, insbesondere von integrierten Chips, einem Eingangsmagazin zu einem Ausgangsmagazin

Also Published As

Publication number Publication date
ATE68115T1 (de) 1991-10-15
DE3681877D1 (de) 1991-11-14
DE3539965A1 (de) 1987-05-14
US4778063A (en) 1988-10-18
EP0222344A2 (de) 1987-05-20
EP0222344B1 (de) 1991-10-09

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