EP0312850A1 - X-ray diagnostic apparatus - Google Patents

X-ray diagnostic apparatus Download PDF

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Publication number
EP0312850A1
EP0312850A1 EP88116591A EP88116591A EP0312850A1 EP 0312850 A1 EP0312850 A1 EP 0312850A1 EP 88116591 A EP88116591 A EP 88116591A EP 88116591 A EP88116591 A EP 88116591A EP 0312850 A1 EP0312850 A1 EP 0312850A1
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EP
European Patent Office
Prior art keywords
detector
semiconductor detector
ray
image intensifier
image
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Granted
Application number
EP88116591A
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German (de)
French (fr)
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EP0312850B1 (en
Inventor
Horst Dr. Aichinger
Karlheinz Dipl.-ing.(FH) Köhler
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Siemens AG
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Siemens AG
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/64—Circuit arrangements for X-ray apparatus incorporating image intensifiers
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/36—Temperature of anode; Brightness of image power
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/38—Exposure time
    • H05G1/42—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube
    • H05G1/44—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube in which the switching instant is determined by measuring the amount of radiation directly

Definitions

  • the invention relates to an X-ray diagnostic system with an image intensifier television chain and a detector for the average image brightness on the output fluorescent screen of the X-ray image intensifier in a predetermined range, in which the detector is a semiconductor detector with an area on which the entire output image of the X-ray image intensifier can be imaged, and at the means for selecting a predetermined area of the semiconductor detector for signal generation are present.
  • An X-ray diagnostic system of this type is described in EP-A-0 217 456.
  • An array of individual detectors is provided as the detector, which permits the formation of a brightness signal for a measuring field in the output image of the X-ray image intensifier.
  • a downstream amplifier must be provided for each detector element, which means a considerable outlay in terms of circuitry.
  • the invention is based on the object of designing an X-ray diagnostic system of the type mentioned at the outset in such a way that a lower circuit complexity than that of the prior art is provided for forming a large number of measuring fields with a variable shape.
  • the detector is a large-area semiconductor detector, in front of which there is an aperture made of a liquid crystal matrix, which can be controlled by a control device for selecting a predetermined area on the semiconductor detector that is hit by the light.
  • This solution results in a particularly low outlay for signal processing.
  • the measuring field is selected electronically using the liquid crystal matrix.
  • the formation of the measurement signal is not like that of a matrix photosensitive elements a variety of amplifiers, but only a single amplifier required.
  • FIG. 1 shows an X-ray tube 1, which is fed by an X-ray generator 2.
  • a patient 3 is irradiated by the X-rays.
  • the x-ray image is amplified by an x-ray image intensifier 4.
  • the amplified x-ray image appearing on the output screen of the x-ray image intensifier 4 is recorded by a television camera 5 and displayed on a display unit 7 via a television center 6.
  • a semiconductor detector 8 is provided as an actual value transmitter, which feeds a corresponding signal to the actual value input of a comparator 9 via a measuring transducer 10.
  • the comparator 9 has a setpoint input 11, at which there is a signal corresponding to the setpoint of the average image brightness in the measuring field of the output screen of the X-ray image intensifier 4.
  • the x-ray generator 2 is influenced by a brightness control device 13 in the sense of an adjustment of the actual value to the target value.
  • a setpoint generator 12 is provided for setting the setpoint.
  • the semiconductor detector 8 has an area on which the entire output image of the X-ray image intensifier 4 can be reproduced, with the aid of a partially transparent mirror 14 in the beam path between the exit fluorescent screen of the X-ray image intensifier 4 and the television camera 5.
  • a control device 15 selects electronically a predetermined area of the semiconductor detector 8 corresponding to the desired measuring field.
  • the semiconductor detector 8 allows the selection of a large number of measuring fields, both with regard to their position and their shape and size.
  • Fig. 2 shows an embodiment of a semiconductor detector 8 as a large-area detector, which is composed of a single detector element, e.g. is formed by a single photodiode.
  • a semiconductor detector 8 is composed of a single detector element, e.g. is formed by a single photodiode.
  • an aperture made of a liquid crystal matrix with liquid crystals 17 is arranged in the beam path in front of the semiconductor detector 8.
  • the light transmission of the individual liquid crystals 17 can be controlled by the control device 15 to select a predetermined area hit by the light on the semiconductor detector 8. 2 shows, for example, the choice of three measuring fields, a central measuring field and two lateral measuring fields.
  • signal evaluation within the measurement field is also possible.
  • the measuring signal of each individual photodiode of the measuring field matrix is electronically multiplied by a weighting factor before being added to the total actual value signal.
  • the weighting factors can be selected on an X-ray system with organ operation depending on the object.
  • a corresponding evaluation is possible in the detector embodiment according to FIG. 2, in that not all liquid crystals 17 of the liquid crystal matrix within the measuring surface are controlled for light transmission. By varying the liquid crystals controlled for permeability per unit area in the area of the measuring field, an adaptation to the object to be examined is possible.
  • peak value regulation can also take place, in that the signals of the individual matrix elements of the selected measuring field are read out serially and only the maximum value of the determined signal distribution is used for the actual value formation becomes.
  • methods of pattern recognition can also be used when selecting the matrix elements that contribute to the actual value signal formation.
  • the technique of measuring field formation shown here for a television camera can also be used in the indirect technique with a sheet film camera.
  • the semiconductor detector is also used for direct recording instead of an ionization chamber, the advantages mentioned (flexible measurement field formation, signal evaluation, mean value / peak value control) can also be used here.
  • exposure corrections are necessary for all hardening effects which occur when the radiation passes through the cassette, e.g. can be stored in tabular form in the memory of the exposure machine. If the patient transparency is determined by a previous fluoroscopy before the direct exposure is triggered and the selected display is also reported by the device to the automatic exposure device, the appropriate exposure correction can be found in the table.

Abstract

In order to regular the dose power of an X-ray diagnostic apparatus with an image intensifier-television chain, a semiconductor detector (8) with a surface is provided, on which surface the complete output image of the X-ray image intensifier can be depicted. Means (17) are present for selecting a predetermined region of the large-area semiconductor detector (8) for generating the actual-value signal for the mean image brightness in the selected measurement field. The selection of the predetermined region is made with the aid of a liquid crystal matrix (17). …<IMAGE>…

Description

Die Erfindung betrifft eine Röntgendiagnostikanlage mit einer Bildverstärker-Fernsehkette und einem Detektor für die mittlere Bildhelligkeit auf dem Ausgangsleuchtschirm des Röntgenbildver­stärkers in einem vorbestimmten Bereich, bei der der Detektor ein Halbleiterdetektor mit einer Fläche ist, auf der das ganze Ausgangsbild des Röntgenbildverstärkers abbildbar ist, und bei der Mittel zur Auswahl eines vorbestimmten Bereiches des Halb­leiterdetektors für die Signalerzeugung vorhanden sind.The invention relates to an X-ray diagnostic system with an image intensifier television chain and a detector for the average image brightness on the output fluorescent screen of the X-ray image intensifier in a predetermined range, in which the detector is a semiconductor detector with an area on which the entire output image of the X-ray image intensifier can be imaged, and at the means for selecting a predetermined area of the semiconductor detector for signal generation are present.

Eine Röntgendiagnostikanlage dieser Art ist in der EP-A-­0 217 456 beschrieben. Als Detektor ist dabei ein Array aus Einzeldetektoren vorgesehen, das die Bildung eines Helligkeits­signals für ein Meßfeld im Ausgangsbild des Röntgenbildverstär­kers erlaubt. Dabei muß für jedes Detektorelement ein nachge­schalteter Verstärker vorgesehen werden, was einen erheblichen schaltungstechnischen Aufwand bedeutet.An X-ray diagnostic system of this type is described in EP-A-0 217 456. An array of individual detectors is provided as the detector, which permits the formation of a brightness signal for a measuring field in the output image of the X-ray image intensifier. A downstream amplifier must be provided for each detector element, which means a considerable outlay in terms of circuitry.

Der Erfindung liegt die Aufgabe zugrunde, eine Röntgendiagno­stikanlage der eingangs genannten Art so auszubilden, daß zur Bildung einer Vielzahl von Meßfeldern mit variabler Form ein gegenüber dem Stand der Technik geringerer schaltungstechni­scher Aufwand vorgesehen ist.The invention is based on the object of designing an X-ray diagnostic system of the type mentioned at the outset in such a way that a lower circuit complexity than that of the prior art is provided for forming a large number of measuring fields with a variable shape.

Diese Aufgabe ist erfindungsgemäß dadurch gelöst, daß der De­tektor ein großflächiger Halbleiterdetektor ist, vor dem eine Blende aus einer Flüssigkristall-Matrix liegt, die durch eine Steuervorrichtung zur Auswahl eines vorbestimmten, vom Licht getroffenen Bereiches auf dem Halbleiterdetektor ansteuerbar ist. Bei dieser Lösung ergibt sich ein besonders geringer Auf­wand für die Signalaufbereitung. Die Meßfeldwahl erfolgt mit Hilfe der Flüssigkristall-Matrix in elektronischer Weise. Für die Bildung des Meßsignales ist nicht wie bei einer Matrix aus lichtempfindlichen Elementen eine Vielzahl von Verstärkern, sondern nur ein einziger Verstärker erforderlich.This object is achieved in that the detector is a large-area semiconductor detector, in front of which there is an aperture made of a liquid crystal matrix, which can be controlled by a control device for selecting a predetermined area on the semiconductor detector that is hit by the light. This solution results in a particularly low outlay for signal processing. The measuring field is selected electronically using the liquid crystal matrix. The formation of the measurement signal is not like that of a matrix photosensitive elements a variety of amplifiers, but only a single amplifier required.

Die Erfindung ist nachfolgend anhand eines in der Zeichnung dargestellten Ausführungsbeispiels näher erläutert. Es zeigen:

  • Fig. 1 eine Röntgendiagnostikanlage nach der Erfindung, und
  • Fig. 2 eine Ausführungsform für einen Detektor, der Röntgen­diagnostikanlage gemäß Fig. 1.
The invention is explained below with reference to an embodiment shown in the drawing. Show it:
  • Fig. 1 is an X-ray diagnostic system according to the invention, and
  • FIG. 2 shows an embodiment for a detector, the X-ray diagnostic system according to FIG. 1.

In der Fig. 1 ist eine Röntgenröhre 1 dargestellt, die von ei­nem Röntgengenerator 2 gespeist wird. Ein Patient 3 wird von der Röntgenstrahlung durchstrahlt. Das Röntgenbild wird von ei­nem Röntgenbildverstärker 4 verstärkt. Das am Ausgangsbild­schirm des Röntgenbildverstärkers 4 erscheinende, verstärkte Röntgenbild wird von einer Fernsehkamera 5 aufgenommen und über eine Fernsehzentrale 6 auf einem Sichtgerät 7 wiedergegeben.1 shows an X-ray tube 1, which is fed by an X-ray generator 2. A patient 3 is irradiated by the X-rays. The x-ray image is amplified by an x-ray image intensifier 4. The amplified x-ray image appearing on the output screen of the x-ray image intensifier 4 is recorded by a television camera 5 and displayed on a display unit 7 via a television center 6.

Zur Konstanthaltung der mittleren Bildhelligkeit in einem Meß­feld des Ausgangsschirms des Röntgenbildverstärkers 4 ist ein Halbleiterdetektor 8 als Istwertgeber vorgesehen, der ein ent­sprechendes Signal dem Istwerteingang eines Vergleicher 9 über einen Meßwandler 10 zuführt. Der Vergleicher 9 weist einen Sollwerteingang 11 auf, an dem ein dem Sollwert der mittleren Bildhelligkeit im Meßfeld des Ausgangsschirms des Röngtgenbild­verstärkers 4 entsprechendes Signal liegt. In Abhängigkeit von der Differenz zwischen Ist- und Sollwert wird der Röntgengene­rator 2 von einer Helligkeitsregeleinrichtung 13 im Sinne eines Angleiches des Istwertes an den Sollwert beeinflußt. Für die Einstellung des Sollwertes ist ein Sollwertgeber 12 vorgesehen.In order to keep the mean image brightness constant in a measuring field of the output screen of the X-ray image intensifier 4, a semiconductor detector 8 is provided as an actual value transmitter, which feeds a corresponding signal to the actual value input of a comparator 9 via a measuring transducer 10. The comparator 9 has a setpoint input 11, at which there is a signal corresponding to the setpoint of the average image brightness in the measuring field of the output screen of the X-ray image intensifier 4. Depending on the difference between the actual value and the target value, the x-ray generator 2 is influenced by a brightness control device 13 in the sense of an adjustment of the actual value to the target value. A setpoint generator 12 is provided for setting the setpoint.

Der Halbleiterdetektor 8 hat eine Fläche, auf der das ganze Ausgangsbild des Röntgenbildverstärkers 4 abbildbar ist, und zwar mit Hilfe eines teildurchlässigen Spiegels 14 im Strahlen­gang zwischen dem Ausgangsleuchtschirm des Röntgenbildverstär­kers 4 und der Fernsehkamera 5. Eine Steuervorrichtung 15 wählt dabei einen vorbestimmten Bereich des Halbleiterdetektors 8 entsprechend dem gewünschten Meßfeld elektronisch aus. Der Halbleiterdetektor 8 erlaubt dabei die Wahl einer Vielzahl von Meßfeldern, und zwar sowohl hinsichtlich ihrer Lage als auch ihrer Form und Größe.The semiconductor detector 8 has an area on which the entire output image of the X-ray image intensifier 4 can be reproduced, with the aid of a partially transparent mirror 14 in the beam path between the exit fluorescent screen of the X-ray image intensifier 4 and the television camera 5. A control device 15 selects electronically a predetermined area of the semiconductor detector 8 corresponding to the desired measuring field. The semiconductor detector 8 allows the selection of a large number of measuring fields, both with regard to their position and their shape and size.

Die Fig. 2 zeigt eine Ausführungsform eines Halbleiterdetektors 8 als großflächigen Detektor, der von einem einzigen Detektor­element, also z.B. von einer einzigen Photodiode gebildet ist. Zur Auswahl des jeweils gewünschten Meßfeldes ist im Strahlen­gang vor dem Halbleiterdetektor 8 eine Blende aus einer Flüs­sigkristall-Matrix mit Flüssigkristallen 17 angeordnet. Die einzelnen Flüssigkristalle 17 können durch die Steuervorrich­tung 15 zur Auswahl eines vorbestimmten, vom Licht getroffenen Bereiches auf dem Halbleiterdetektor 8 in ihrer Lichtdurchläs­sigkeit gesteuert werden. In Fig. 2 ist beispielsweise die Wahl dreier Meßfelder, eines zentralen Meßfeldes sowie zweier seit­licher Meßfelder dargestellt.Fig. 2 shows an embodiment of a semiconductor detector 8 as a large-area detector, which is composed of a single detector element, e.g. is formed by a single photodiode. To select the desired measuring field in each case, an aperture made of a liquid crystal matrix with liquid crystals 17 is arranged in the beam path in front of the semiconductor detector 8. The light transmission of the individual liquid crystals 17 can be controlled by the control device 15 to select a predetermined area hit by the light on the semiconductor detector 8. 2 shows, for example, the choice of three measuring fields, a central measuring field and two lateral measuring fields.

Bei der in Fig. 2 gezeigten Ausführungsform ist auch eine Si­gnalbewertung innerhalb des Meßfeldes möglich. Dabei wird das Meßsignal jeder einzelnen Photodiode der Meßfeldmatrix vor der Addition zum Gesamtistwertsignal elektronisch mit einem Ge­wichtungsfaktor multipliziert. An einer Röntgenanlage mit Or­ganbedienung kann die Wahl der Gewichtungsfaktoren objektabhän­gig erfolgen. Bei der Detektorausführung gemäß Fig. 2 ist eine entsprechende Bewertung möglich, indem nicht alle Flüssigkri­stalle 17 der Flüssigkristallmatrix innerhalb der Meßfläche auf Lichtdurchlässigkeit gesteuert werden. Durch eine Variation der auf Durchlässigkeit gesteuerten Flüssigkristalle pro Flächen­einheit im Bereich des Meßfeldes ist also eine Anpassung an das zu untersuchende Objekt möglich.In the embodiment shown in FIG. 2, signal evaluation within the measurement field is also possible. The measuring signal of each individual photodiode of the measuring field matrix is electronically multiplied by a weighting factor before being added to the total actual value signal. The weighting factors can be selected on an X-ray system with organ operation depending on the object. A corresponding evaluation is possible in the detector embodiment according to FIG. 2, in that not all liquid crystals 17 of the liquid crystal matrix within the measuring surface are controlled for light transmission. By varying the liquid crystals controlled for permeability per unit area in the area of the measuring field, an adaptation to the object to be examined is possible.

Weiterhin kann auch eine Spitzenwertregelung erfolgen, indem die Signale der einzelnen Matrixelemente des ausgewählten Meß­feldes seriell ausgelesen werden und nur der Maximalwert der ermittelten Signalverteilung zur Istwertbildung herangezogen wird. Für eine Anpassung der Regelung an unterschiedliche Ob­jekte können bei der Auswahl der Matrixelemente, die zur Ist­wert-Signalbildung beitragen, auch Methoden der Mustererkennung angewendet werden.Furthermore, peak value regulation can also take place, in that the signals of the individual matrix elements of the selected measuring field are read out serially and only the maximum value of the determined signal distribution is used for the actual value formation becomes. To adapt the control to different objects, methods of pattern recognition can also be used when selecting the matrix elements that contribute to the actual value signal formation.

Die hier für eine Fernsehkamera dargestellte Technik der Meß­feldbildung ist auch anwendbar bei der Indirekt-Technik mit einer Blattfilmkamera.The technique of measuring field formation shown here for a television camera can also be used in the indirect technique with a sheet film camera.

Wird der Halbleiterdetektor anstelle einer Ionisationskammer auch für die Direktaufnahme verwendet, so können auch hier die angeführten Vorteile (flexible Meßfeldbildung, Signal-Bewer­tung, Mittelwert-/Spitzenwertregelung) genutzt werden. Nachdem der Bildverstärker hinter der Kassette angeordnet ist, sind für alle beim Durchgang der Strahlung durch die Kassette auftreten­den Aufhärtungseffekte Belichtungskorrekturen erforderlich, die z.B. in tabellarischer Form im Speicher des Belichtungsautoma­ten abgelegt sein können. Wird vor Auslösung der Direktaufnahme die Patiententransparenz durch eine vorangehende Durchleuchtung ermittelt und wird außerdem die gewählte Einblendung vom Gerät an den Belichtungsautomaten gemeldet, kann die zutreffende Be­lichtungskorrektur der Tabelle entnommen werden.If the semiconductor detector is also used for direct recording instead of an ionization chamber, the advantages mentioned (flexible measurement field formation, signal evaluation, mean value / peak value control) can also be used here. After the image intensifier is arranged behind the cassette, exposure corrections are necessary for all hardening effects which occur when the radiation passes through the cassette, e.g. can be stored in tabular form in the memory of the exposure machine. If the patient transparency is determined by a previous fluoroscopy before the direct exposure is triggered and the selected display is also reported by the device to the automatic exposure device, the appropriate exposure correction can be found in the table.

Claims (1)

Röntgendiagnostikanlage mit einer Bildverstärker-Fernsehkette (4 bis 7) und einem Detektor (8) für die mittlere Bildhellig­keit auf dem Ausgangsleuchtschirm des Röntgenbildverstärkers (4) in einem vorbestimmten Bereich, bei der der Detektor (8) ein Halbleiterdetektor mit einer Fläche ist, auf der das ganze Ausgangsbild des Röntgenbildverstärkers (4) abbildbar ist, und bei der Mittel (15) zur Auswahl eines vorbestimmten Bereiches des Halbleiterdetektors für die Signalerzeugung vorhanden sind, dadurch gekennzeichnet, daß der Detek­tor (8) ein großflächiger Halbleiterdetektor ist, vor dem eine Blende aus einer Flüssigkristall-Matrix (17) liegt, die durch eine Steuervorrichtung (15) zur Auswahl eines vorbestimmten, vom Licht getroffenen Bereiches auf dem Halbleiterdetektor an­steuerbar ist.X-ray diagnostic system with an image intensifier television chain (4 to 7) and a detector (8) for the average image brightness on the output fluorescent screen of the X-ray image intensifier (4) in a predetermined range, in which the detector (8) is a semiconductor detector with an area on which the entire output image of the X-ray image intensifier (4) can be imaged, and in which means (15) for selecting a predetermined area of the semiconductor detector for signal generation are present, characterized in that the detector (8) is a large-area semiconductor detector in front of which an aperture is formed a liquid crystal matrix (17), which can be controlled by a control device (15) for selecting a predetermined area hit by the light on the semiconductor detector.
EP88116591A 1987-10-19 1988-10-06 X-ray diagnostic apparatus Expired - Lifetime EP0312850B1 (en)

Applications Claiming Priority (2)

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DE8714009U DE8714009U1 (en) 1987-10-19 1987-10-19
DE8714009U 1987-10-19

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EP0312850A1 true EP0312850A1 (en) 1989-04-26
EP0312850B1 EP0312850B1 (en) 1992-08-12

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DE (2) DE8714009U1 (en)

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EP0217456A1 (en) * 1985-09-20 1987-04-08 Koninklijke Philips Electronics N.V. An X-ray examination apparatus with a locally divided auxiliary detector

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2803394A1 (en) * 1999-12-30 2001-07-06 Thomson Tubes Electroniques X-RAY IMAGE DETECTION SYSTEM FOR SCANNING X-RAY GENERATOR
WO2001050481A1 (en) * 1999-12-30 2001-07-12 Thales Electron Devices S.A. Radiological image sensing system for scanning x-ray generator
US6934360B2 (en) 1999-12-30 2005-08-23 Thales Electron Devices S.A. Radiological image sensing system for a scanning x-ray generator
US7082187B2 (en) 1999-12-30 2006-07-25 Thales Electron Devices S.A. Radiological image detection system for a scanning X-ray generator

Also Published As

Publication number Publication date
DE8714009U1 (en) 1989-02-16
DE3873680D1 (en) 1992-09-17
JPH0163269U (en) 1989-04-24
US5029338A (en) 1991-07-02
EP0312850B1 (en) 1992-08-12

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