EP1859365A4 - Computer qc module testing monitor - Google Patents

Computer qc module testing monitor

Info

Publication number
EP1859365A4
EP1859365A4 EP05733179A EP05733179A EP1859365A4 EP 1859365 A4 EP1859365 A4 EP 1859365A4 EP 05733179 A EP05733179 A EP 05733179A EP 05733179 A EP05733179 A EP 05733179A EP 1859365 A4 EP1859365 A4 EP 1859365A4
Authority
EP
European Patent Office
Prior art keywords
computer
module testing
testing monitor
monitor
module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP05733179A
Other languages
German (de)
French (fr)
Other versions
EP1859365B1 (en
EP1859365A1 (en
Inventor
Ranjani Narayan
Keshavan Varadarajan
Gautham Natanasabapathy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Enterprise Development LP
Original Assignee
Hewlett Packard Development Co LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co LP filed Critical Hewlett Packard Development Co LP
Publication of EP1859365A1 publication Critical patent/EP1859365A1/en
Publication of EP1859365A4 publication Critical patent/EP1859365A4/en
Application granted granted Critical
Publication of EP1859365B1 publication Critical patent/EP1859365B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/008—Reliability or availability analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
    • G06F11/076—Error or fault detection not based on redundancy by exceeding limits by exceeding a count or rate limit, e.g. word- or bit count limit
EP05733179.5A 2005-03-03 2005-03-03 Computer qc module testing monitor Active EP1859365B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IN2005/000069 WO2006092806A1 (en) 2005-03-03 2005-03-03 Computer qc module testing monitor

Publications (3)

Publication Number Publication Date
EP1859365A1 EP1859365A1 (en) 2007-11-28
EP1859365A4 true EP1859365A4 (en) 2010-11-03
EP1859365B1 EP1859365B1 (en) 2018-09-26

Family

ID=36940867

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05733179.5A Active EP1859365B1 (en) 2005-03-03 2005-03-03 Computer qc module testing monitor

Country Status (4)

Country Link
US (1) US7756803B2 (en)
EP (1) EP1859365B1 (en)
JP (1) JP4792047B2 (en)
WO (1) WO2006092806A1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7669087B1 (en) * 2006-07-31 2010-02-23 Sun Microsystems, Inc. Method and apparatus for managing workload across multiple resources
US20090177509A1 (en) * 2008-01-09 2009-07-09 Joshua David Business Service Management Dashboard
JPWO2012056611A1 (en) * 2010-10-29 2014-03-20 日本電気株式会社 Availability model generator
US9235423B2 (en) 2010-11-26 2016-01-12 Nec Corporation Availability evaluation device and availability evaluation method
US9448824B1 (en) * 2010-12-28 2016-09-20 Amazon Technologies, Inc. Capacity availability aware auto scaling
US20130338799A1 (en) * 2011-03-04 2013-12-19 Nec Corporation Availability model generation support device, availability model generation support method, and program
JP5304972B1 (en) 2011-08-30 2013-10-02 日本電気株式会社 INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND PROGRAM
WO2013114911A1 (en) * 2012-02-01 2013-08-08 日本電気株式会社 Risk assessment system, risk assessment method, and program
JPWO2014002557A1 (en) * 2012-06-29 2016-05-30 日本電気株式会社 Shared risk impact assessment system, shared risk impact assessment method, and program
WO2014097598A1 (en) 2012-12-17 2014-06-26 日本電気株式会社 Information processing device which carries out risk analysis and risk analysis method
US9246840B2 (en) 2013-12-13 2016-01-26 International Business Machines Corporation Dynamically move heterogeneous cloud resources based on workload analysis
US9495238B2 (en) 2013-12-13 2016-11-15 International Business Machines Corporation Fractional reserve high availability using cloud command interception
US9298553B2 (en) 2014-02-08 2016-03-29 International Business Machines Corporation Methods, apparatus and system for selective duplication of subtasks
US10545839B2 (en) * 2017-12-22 2020-01-28 International Business Machines Corporation Checkpointing using compute node health information

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6442711B1 (en) * 1998-06-02 2002-08-27 Kabushiki Kaisha Toshiba System and method for avoiding storage failures in a storage array system
US20030172150A1 (en) * 2002-03-06 2003-09-11 Kennedy John G. System and method for determining availability of an arbitrary network configuration
US20030182599A1 (en) * 2002-03-21 2003-09-25 Gray William M. Method and system for assessing availability of complex electronic systems, including computer systems

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3399996B2 (en) * 1992-12-07 2003-04-28 株式会社日立製作所 Information processing system
US6041041A (en) * 1997-04-15 2000-03-21 Ramanathan; Srinivas Method and system for managing data service systems
JP2002342172A (en) * 2001-05-21 2002-11-29 Hitachi Ltd Data management system
JP3825375B2 (en) * 2002-08-02 2006-09-27 パイオニア株式会社 Information reproducing apparatus and method, and error correction system
EP1593072A2 (en) * 2003-02-07 2005-11-09 Power Measurement Ltd A method and system for calculating and distributing utility costs
GB0405711D0 (en) * 2004-03-13 2004-04-21 Hewlett Packard Development Co Method and apparatus for dumping memory

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6442711B1 (en) * 1998-06-02 2002-08-27 Kabushiki Kaisha Toshiba System and method for avoiding storage failures in a storage array system
US20030172150A1 (en) * 2002-03-06 2003-09-11 Kennedy John G. System and method for determining availability of an arbitrary network configuration
US20030182599A1 (en) * 2002-03-21 2003-09-25 Gray William M. Method and system for assessing availability of complex electronic systems, including computer systems

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
FINKELSTEIN S: "Multiple Availability on Stochastic Demand", IEEE TRANSACTIONS ON RELIABILITY, IEEE SERVICE CENTER, PISCATAWAY, NJ, US LNKD- DOI:10.1109/24.765923, vol. 48, no. 1, 1 March 1999 (1999-03-01), pages 19 - 24, XP011089617, ISSN: 0018-9529 *
GRAY J ET AL: "HIGH-AVAILABILITY COMPUTER SYSTEMS", COMPUTER, IEEE SERVICE CENTER, LOS ALAMITOS, CA, US LNKD- DOI:10.1109/2.84898, vol. 24, no. 9, 1 September 1991 (1991-09-01), pages 39 - 48, XP000264459, ISSN: 0018-9162 *
HAIRONG SUN ET AL: "Instantaneous availability and interval availability for systems with time-varying failure rate: stair-step approximation", DEPENDABLE COMPUTING, 2001. PROCEEDINGS. 2001 PACIFIC RIM INTERNATIONA L SYMPOSIUM ON SEOUL, SOUTH KOREA 17-19 DEC. 2001, LOS ALAMITOS, CA, USA,IEEE COMPUT. SOC, US LNKD- DOI:10.1109/PRDC.2001.992722, 17 December 2001 (2001-12-17), pages 371 - 374, XP010585404, ISBN: 978-0-7695-1414-7 *
PROPST J: "Calculating electrical risk and reliability", PETROLEUM AND CHEMICAL INDUSTRY CONFERENCE, 1994. RECORD OF CONFERENCE PAPERS., INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS INCORPORAT ED INDUSTRY APPLICATIONS SOCIETY 41ST ANNUAL VANCOUVER, BC, CANADA 12-14 SEPT. 1994, NEW YORK, NY, USA,IEEE L, 12 September 1994 (1994-09-12), pages 25 - 33, XP010123996, ISBN: 978-0-7803-1987-5 *
See also references of WO2006092806A1 *

Also Published As

Publication number Publication date
EP1859365B1 (en) 2018-09-26
EP1859365A1 (en) 2007-11-28
JP4792047B2 (en) 2011-10-12
US20080168314A1 (en) 2008-07-10
WO2006092806A1 (en) 2006-09-08
US7756803B2 (en) 2010-07-13
JP2008532170A (en) 2008-08-14

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