US20010045855A1

US20010045855A1 - Variable delay circuit and semiconductor integrated circuit having the same

Info

Publication number: US20010045855A1
Application number: US09/843,818
Authority: US
Inventors: Atsumasa Sako
Original assignee: Fujitsu Ltd
Current assignee: Socionext Inc
Priority date: 2000-05-26
Filing date: 2001-04-30
Publication date: 2001-11-29
Anticipated expiration: 2021-04-30
Also published as: JP3984412B2; JP2001338981A; KR100649062B1; KR20010107560A; US6459319B2

Abstract

The variable delay circuit has a delay circuit and a selector. The delay circuit is formed of a plurality of delay stages connected in cascade. The delay circuit receives an input signal at the initial delay stage and respectively outputs a delayed signal which is the input signal delayed, from the delay stages. The selector receives the delayed signals and selecting signals respectively corresponding to the delayed signals. The selector selects the delayed signal corresponding to an activated selecting signal and outputs the selected signal as a delayed output signal. The delay stage(s) subsequent to the delay stage outputting the delayed signal selected by the selector is/are inactivated. Not operating unnecessary delay stages can prevent wasteful power consumption.

Description

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a variable delay circuit which is capable of setting delay time to a predetermined value. Especially, this invention relates to a technology for reducing power consumption of the variable delay circuit.

2. Description of the Related Art

FIG. 1 shows a variable delay circuit of the prior art.

The variable delay circuit has a

delay circuit

2 in which delay stages 2 a are connected in cascade and a selector 4. The delay circuit 2 receives an input signal IN at the initial delay stage 2 a and outputs delayed signals DT1, DT2, . . . , DTn-1, DTn from each of the delay stages 2 a, respectively. Hereinafter, the delayed signals DT0 to DTn are also referred to as the delayed signal DT, collectively. The selector 4 receives the delayed signals DT0, DT1, . . . , DTn-1, DTn and selecting signals SS0, SS1, . . . , SSn-1, SSn which correspond to the delayed signals DT like the above, respectively. Hereinafter, the selecting signals SS0 to SSn are also referred to as the selecting signal SS, collectively. The selecting signals SS are outputted from a not-shown control circuit and any of these is activated. The selector 4 selects the delayed signal DT which corresponds to the activated selecting signal SS and outputs the selected delayed signal DT as a delayed output signal OUT. As a result, the variable delay circuit operates as the circuit which delays the input signal IN by a predetermined time according to the selecting signal SS.

Note that, when the aforesaid variable delay circuit receives a change of the input signal IN, it transmits the change of the input signal IN by successively operating all of the

delay stages

2 a. For example, when the selector 4 receives the activation of the selecting signal SS1 to select the delayed signal DT1, the delay stages 2 a subsequent to the delay stage 2 a which outputs the delayed signal DT1 successively output the delayed signal DT2, DT3, . . . , DTn. Thus, the variable delay circuit of the prior art has a problem of wastefully consuming power because the unnecessary delay stages 2 a are operated. Especially, when increasing a change amount of delay time or setting the delay time at smaller intervals, it is necessary to increase the delay stages 2 a in number, in which case the power consumption of the variable delay circuit is increased.

SUMMARY OF THE INVENTION

It is an object of the present invention to reduce power consumption of a variable delay circuit which is capable of setting a predetermined delay time.

According to one aspect of the present invention, the variable delay circuit has a delay circuit and a selector. The delay circuit is formed of a plurality of delay stages connected in cascade. The delay circuit receives an input signal at the initial delay stage and respectively outputs a delayed signal which is the input signal delayed, from the delay stages. The selector receives the delayed signals and selecting signals respectively corresponding to the delayed signals. The selector selects the delayed signal corresponding to an activated selecting signal and outputs the selected delayed signal as a delayed output signal. The delay stage(s) subsequent to the delay stage outputting the delayed signal selected by the selector is/are fixed (inactivated). Not operating unnecessary delay stages can prevent wasteful power consumption.

According to another aspect of the present invention, each of the delay stages has a disable terminal for stopping its operation upon receiving activation of the selecting signal corresponding to the delayed signal supplied from the previous delay stage. Further, the delay stage receiving the activated selecting signal at the disable terminal is fixed (inactivated). Since the delay stage(s) subsequent to the inactivated delay stage stop(s) its operation, wasteful power consumption can be avoided. Moreover, unnecessary delay stages are inactivated by receiving, at the disable terminal, the selecting signal used in the selector so that the variable delay circuit with low power consumption can be easily structured.

According to still another aspect of the present invention, a semiconductor integrated circuit has an adjusting circuit for adjusting an operation timing of an internal circuit. The adjusting circuit has an activation control circuit for activating any of the selecting signals. Further, the activation control circuit activates any of the selecting signals so that the delayed output signal which is the input signal delayed by a predetermined time is outputted from the variable delay circuit, thereby adjusting the operation timing of the internal circuit. Namely, an operation margin of the internal circuit is evaluated.

According to another aspect of the present invention, the adjusting circuit in the semiconductor integrated circuit has a fuse circuit for activating any of the selecting signals by blowing a fuse and a selecting circuit for validating either an activation of the selecting signal by the activation control circuit or an activation of the selecting signal by the fuse circuit. In this semiconductor integrated circuit, the selecting circuit first switches from the fuse circuit to the activation control circuit to operate the internal circuit, whereby the delayed output signal to be output at an optimal timing is determined. Next, the selecting circuit switches from the activation control circuit to the fuse circuit, and a predetermined fuse in the fuse circuit is blown so that the delayed output signal is always outputted at an optimal timing from the variable delay circuit. Namely, trimming the delayed output signal is carried out.

BRIEF DESCRIPTION OF THE DRAWINGS

The nature, principle, and utility of the invention will become more apparent from the following detailed description when read in conjunction with the accompanying drawings in which like parts are designated by identical reference numbers, in which: [0012]
FIG. 1 is a block diagram showing a variable delay circuit of the prior art; [0013]
FIG. 2 is a block diagram showing a basic principle of a variable delay circuit according to the present invention; [0014]
FIG. 3 is a block diagram showing a first embodiment of the variable delay circuit and a semiconductor integrated circuit having the variable delay circuit according to the present invention; [0015]
FIG. 4 is a block diagram showing the variable delay circuit of FIG. 3 in detail; [0016]
FIG. 5 is a block diagram showing a second embodiment of the variable delay circuit in detail; [0017]
FIG. 6 is a block diagram showing a third embodiment of the variable delay circuit in detail, and [0018]
FIG. 7 is a block diagram showing a fourth embodiment of the variable delay circuit in detail.[0019]

DESCRIPTION OF THE PREFERRED EMBODIMENTS

Hereinafter, the preferred embodiments of the present invention will be explained with reference to the drawings. Signal lines shown by bold lines in the respective drawings mean that each of these is structured by a plurality of the lines. Moreover, a part of a circuit to which the bold line is connected is structured by a plurality of components. The same numerals are given to the same circuits/signals with the circuits which are explained in the description of the related art, and detailed explanations thereof are omitted. [0020]
FIG. 2 is a block diagram showing a basic principle of a variable delay circuit according to the present invention. [0021]
The variable delay circuit has a [0022] delay circuit 6 in which a plurality of delay stages 6 a are connected in cascade, and a selector 4. The delay circuit 6 receives an input signal IN at the initial delay stage 6 a, and outputs delayed signals DT1, DT2, . . . , DTn-1, DTn from each of the delay stages 6 a, respectively. Each delay stage 6 a receives a selecting signal SS which corresponds to the delayed signal DT supplied from the previous stage as a disable signal DIS (DIS1, DIS2, . . . , DISn) at a disable terminal (not shown). The selector 4 is the same circuit as the prior art. The selector 4 selects the delayed signals DT0 to DTn which correspond to the activated selecting signals SS0 to SSn and outputs the selected delayed signal DT as a delayed output signal OUT. The selecting signals SS0 to SSn are outputted from a not-shown control circuit and any of these is activated.
In the variable delay circuit, the [0023] delay stage 6 a which receives the activated selecting signal SS (disable signal DIS) at the disable terminal is inactivated. The output level of the inactivated delayed stage 6 a is fixed. Therefore, the inactivated delay stage 6 a does not transmit the delay signal DT from the previous stage to the subsequent stage. In other words, the inactivated delay stage 6 a and the delay stages 6 a subsequent to this delay stage 6 a stop their operations. Thereby, wasteful power consumption is avoided. Further, the unnecessary delay stages 6 a are inactivated by utilizing the selecting signal SS used in the selector 4 so that the variable delay circuit with low power consumption can be easily structured.
FIG. 3 shows a first embodiment of the variable delay circuit and a semiconductor integrated circuit having the variable delay circuit according to the present invention. [0024]
The semiconductor integrated circuit is formed as DRAM by, for example, using a CMOS process on a silicon substrate. The semiconductor integrated circuit has an adjusting [0025] circuit 10, a decoder 11, an internal circuit 12 having memory cells, a sense amplifier, and the like, a variable delay circuit 14, and a not-shown input/output circuit and a control circuit.
The adjusting [0026] circuit 10 has an activation control circuit 10 a, a fuse circuit 10 b and a plurality of selecting circuits 10 c. The activation control circuit 10 a is the circuit for controlling activation signals ACT0 to ACTm (hereinafter also referred to as the activation signal ACT collectively) by being controlled by the not-shown control circuit. A predetermined activation signal ACT is activated by a control signal (not shown). The fuse circuit 10 b has a plurality of fuses (not shown) which are made of polysilicon or the like. The fuse circuit 10 b is the circuit for controlling a plurality of fuse signals FUS0 to FUSm (hereinafter also referred to as the fuse signal FUS collectively) which correspond respectively to the activation signals ACT0 to ACTm, according to a blowout of the fuse like the above. It is impossible to inactivate the fuse signal FUS again which has been activated by blowing the fuse.
The plurality of selecting [0027] circuits 10 c respectively receive the activation signals ACT0 to ACTm and the fuse signals FUS0 to FUSm, and output any of the activation signals ACT0 to ACTm or the fuse signals FUS0 to FUSm as selecting signals S0 to Sm (hereinafter also referred to as the selecting signal S collectively) by a control signal CNT. In other words, the selecting circuits 10 c validate either an activation of the selecting signal by the activation control circuit 10 a or an activation of the selecting signal by the fuse circuit 10 b.
The [0028] decoder 11 receives the selecting signal S and activates any of selecting signals SS. The variable delay circuit 14 receives the input signal IN and the selecting signal SS and outputs the delayed output signal OUT which is generated by delaying the input signal IN by a predetermined time. In this embodiment, the delayed output signal OUT is used, for example, as a timing signal for activating the sense amplifier of the internal circuit 12. The sense amplifier is activated when the delayed output signal OUT is at the low level. Namely, the delayed output signal OUT is used according to negative logic.
FIG. 4 shows the [0029] variable delay circuit 14 in detail.
The [0030] variable delay circuit 14 has a delay circuit 16 in which a plurality of delay stages 16 a are connected in cascade and a selector 18.
The [0031] delay stage 16 a of the delay circuit 16 is constructed of an AND circuit which consists of an NAND gate and an inverter. The delay circuit 16 receives an inverting signal of the input signal IN at the initial delay stage 16 a, and outputs delayed signals DT1, DT2, . . . , DTn-1, DTn from the delay stages 16 a, respectively. The respective delay stages 16 a receive selecting signals SS0 to SSn-1 which correspond to the delayed signals DT0 to DTn-1 supplied from the previous stage at a disable terminal (an input of the NAND gates), respectively.
The [0032] selector 18 has a plurality of CMOS transmission gates 18 a which correspond to the delayed signals DT, respectively. The CMOS transmission gates 18 a respectively receive the delayed signals DT at one input/output terminals. The other input/output terminals of the CMOS transmission gates 18 a are connected to each other, and to the inverter 18 b. The CMOS transmission gates 18 a are controlled by the selecting signals SS and the inverting signals of the selecting signals SS, are conducted when the selecting signals SS are at the low level. The inverter 18 b outputs the received signals as the delayed output signal OUT.
Next, operations of the aforementioned circuit will be explained. [0033]
First, after the semiconductor integrated circuits are fabricated, an operation test is executed to a plurality of the semiconductor integrated circuits which are connected in a shape of a wafer. The [0034] activation control circuit 10 a as shown in FIG. 3 activates the activation signals ACT0 to ACTm successively. At this moment, the fuse signal FUS is inactivated (low level). By activating (high level) the control signal CNT, the selecting circuits 10 c output the activation signal ACT to the decoder 11 as the selecting signal. Receiving the selecting signal S, the decoder 11 activates any of the selecting signals SS.
As shown in FIG. 4, the [0035] CMOS transmission gate 18 a which receives the activated selecting signal SS is turned on and transmits a predetermined delayed signal DT to the inverter 18 b. The inverter 18 b inverts the received delayed signal DT and outputs it as the delayed output signal OUT. For example, when the selecting signal SS1 is activated, the delayed signal DT1 which is delayed by a delay time of one delay stage 16 a with respect to the input signal IN is outputted as the delayed output signal OUT.
In the [0036] delay circuit 16, the delay stage 16 a is activated by receiving the inactivated selecting signal SS (high level) at the disable terminal. The delay stage 16 a is inactivated by receiving the activated selecting signal SS (low level) at the disable terminal and keeps on outputting the delayed signal DT at the low level. That is, the output level of the inactivated delay stage 16 a is fixed. For example, when the selecting signal SS1 is activated, the delay stage 16 a which receives the delay signal DT1 is inactivated to output the delayed signal DT2 at the low level. The delay stage 16 a which receives the delayed signal DT2 at the low level is inactivated to output the delayed signal DT3 (not shown) at the low level. As this result, the delay stage 16 a which receives the activated selecting signal SS and the subsequent delay stages are inactivated to stop these operations. Actually, these keep on outputting the delayed signal DT at the low level. Since the delay stages 16 a and the circuits which receive the output from the delay stages 16 a are made of CMOS circuits, power consumption of the inactivated delay stages 16 a becomes practically zero. Therefore, the power consumption of the variable delay circuit 14 is substantially decreased as compared with that of the prior art.
By performing the operation test, timing of the delayed output signal OUT at which the sense amplifier optimally operates (that is, the activation signal ACT to be activated at that moment) is determined. Then, the control signal CNT is inactivated (low level) during the operation of the semiconductor integrated circuit by blowing a predetermined fuse, so that the fuse signal FUS which corresponds to the above activation signal ACT is always activated and a predetermined selecting signal SS is always activated. Thereafter, by making the control signal CNT in the activation state (high level), the [0037] activation control circuit 10 a is allowed to activate the optional selecting signal SS even after the blowout of the fuse. The delay stage 16 a which receives the activated selecting signal SS and the subsequent stages thereto are inactivated to stop these operations, as described above. Therefore, power consumption of the variable delay circuit 14 is substantially decreased as compared with the prior art.
After the operation test, the semiconductor integrated circuits are assembled in package, and shipped after a final operation test is executed. [0038]
Incidentally, the inactivated delay stages [0039] 16 a keep on outputting the delayed signals DT at the low level. Therefore, even when the CMOS transmission gate 18 a which should be turned off is turned on due to power supply noise or the like, the delayed output signal OUT maintains the inactivated state (high level). Thereby, a malfunction of the sense amplifier due to the noise can be prevented.
As described above, in this embodiment, the [0040] delay stage 16 a which is inactivated by the selecting signal SS and the subsequent delay stages 16 a thereto stop their operations. Since the unnecessary delay stages 16 a are not operated, wasteful power consumption can be avoided.
The delay stages [0041] 16 a are inactivated by utilizing the selecting signals SS used in the selector 18. Therefore, the variable delay circuit with low power consumption can be easily structured.
The [0042] activation control circuit 10 a for activating the predetermined selecting signal SS is provided. Thereby, the selecting signals are activated successively during the operation test so that an operational margin of the internal circuit 12 can be evaluated and optimal timing of the delayed output signal OUT can be evaluated.
The predetermined selecting signal SS is activated under the control of either the [0043] activation control circuit 10 a or the fuse circuit 10 b. Therefore, the predetermined fuse of the fuse circuit 10 b is blown based on an evaluation of electric characteristics of the internal circuit 12, thereby allowing the delayed output signal OUT to be always outputted at an optimal timing.
FIG. 5 shows a second embodiment of the variable delay circuit according to the present invention. The same numerals are given to the same circuits/signals with the circuits/signals which are explained in the first embodiment, and detailed explanations thereof are omitted. [0044]
A [0045] delay circuit 22 which is formed in the variable delay circuit of this embodiment is different from that of the first embodiment. The rest of the structure is the same with that of the first embodiment.
The [0046] delay circuit 22 is structured by connecting a plurality of delay stages 22 a in cascade. The delay stage 22 a has an OR circuit which consists of a NOR gate and an inverter. The delay circuit 22 receives an inverting signal of an input signal IN at the initial delay stage 22 a, and outputs delayed signals DT1, DT2, . . . , DTn-1, DTn from each of the delay stages 22 a, respectively. The respective delay stages 22 a receive inverting signals of selecting signals SS0 to SSn-1 which correspond to the delayed signals DT0 to DTn-1 supplied from the previous stage at a disable terminal (an input of the NOR gates), respectively.
Namely, in this embodiment, the delay stages [0047] 22 a are inactivated by the activation (low level) of the selecting signals SS, and output the delayed signals DT at the high level. For this reason, a malfunction due to noise can be prevented when a delayed output signal OUT is used according to positive logic. That is, even when a CMOS transmission gate 18 a which should be off is turned on due to power supply noise or the like, the delayed output signal OUT maintains the inactivated state (low level).
The same effects as those in the aforementioned first embodiment can be obtained with the variable delay circuit according to this embodiment. [0048]
FIG. 6 shows a third embodiment of the variable delay circuit according to the present invention. The same numerals are given to the same circuits/signals with the circuits/signals which are explained in the first embodiment, and detailed explanations thereof are omitted. [0049]
A [0050] delay circuit 24 which is formed in the variable delay circuit of this embodiment is different from that of the first embodiment. The rest of the structure is the same with that of the first embodiment.
The [0051] delay circuit 24 is structured by connecting a plurality of delay stages 24 a in cascade. The delay circuit 24 receives an inverting signal of an input signal IN at the initial delay stage 24 a and outputs delayed signals DT1, DT2, . . . , DTn-1, DTn from each of the delay stages 24 a, respectively. The respective delay stages 24 a receive selecting signals SS0 to SSn-1 which correspond to the delayed signals DT0 to DTn-1 supplied from the previous stage and inverting signals thereof /SS0 to /SSn-1, respectively.
Each [0052] delay stage 24 a has a CMOS transmission gate, an inverter array which includes two inverters and an nMOS transistor. One input/output terminal of the CMOS transmission gate is connected to an input terminal and the other input/output terminal thereof is connected to an input terminal of the inverter array. The inverter array outputs the delayed signal DT. The nMOS transistor receives the inverting signal /SS of the selecting signal at the gate (disable terminal), connects a drain to the other input/output terminal of the CMOS transmission gate, and connects a source to a ground line. Inputs (disable terminals) of the CMOS transmission gate are controlled by the selecting signal SS (SS0 to SSn-1) and the inverting signal /SS (/SS0 to /SSn-1) of the selecting signal SS, and is conducted when the selecting signal SS is at the high level.
Namely, in this embodiment, the delay stages [0053] 24 a which receive the activation of the selecting signals SS (low level) output the delayed signals DT at the low level by turning off the CMOS transmission gates and turning on the nMOS transistors. The rest of the operations are the same with those of the aforesaid first embodiment.
The same effects as those in the aforementioned first embodiment can be obtained with the variable delay circuit according to this embodiment. [0054]
FIG. 7 shows a fourth embodiment of the variable delay circuit according to the present invention. The same numerals are given to the same circuits/signals with the circuits/signals which are explained in the first and the third embodiments, and detailed explanations thereof are omitted. [0055]
A [0056] delay circuit 26 which is formed in the variable delay circuit of this embodiment is different from that of the third embodiment. The rest of the structure is the same with that of the third embodiment.
The [0057] delay circuit 26 is structured by connecting a plurality of delay stages 26 a in cascade. The delay circuit 26 receives an inverting signal of an input signal IN at the initial delay stage 26 a and outputs delayed signals DT1, DT2, . . . , DTn-1, DTn from each of the delay stages 26 a, respectively. The respective delay stages 26 a receive selecting signals SS0 to SSn-1 which correspond to the delayed signals DT0 to DTn-1 supplied from the previous stage and inverting signals thereof /SS0 to /SSn-1, respectively.
Each [0058] delay stage 26 a has a CMOS transmission gate, an inverter array which comprises two inverters and a pMOS transistor. One input/output terminal of the CMOS transmission gate is connected to an input terminal and the other input/output terminal thereof is connected to an input terminal of the inverter array. The inverter array outputs the delayed signal DT. The pMOS transistor receives the selecting signal SS at the gate (disable terminal), connects a drain to the other input/output terminal of the CMOS transmission gate, and connects a source to a power supply line. Inputs (disable terminals) of the CMOS transmission gate are controlled by the selecting signal SS (SS0 to SSn-1) and the inverting signal /SS (/SS0 to /SSn-1) of the selecting signal SS, and is conducted when the selecting signal SS is at the high level.
Namely, in this embodiment, the delay stages [0059] 26 a which receive the activation of the selecting signals SS (low level) output the delayed signals DT at the high level by turning off the CMOS transmission gates and turning on the pMOS transistors. The rest of the operations are the same with those of the aforesaid first and second embodiments.
The same effects as those in the aforementioned first and second embodiments can be obtained with the variable delay circuit according to this embodiment. [0060]
Incidentally, in the above embodiments, the example in which the delayed output signal OUT is used as the timing signal for activating the sense amplifier is described. However, it should be noted that the present invention is not limited to these embodiments. For example, the delayed output signal OUT may be used as a timing signal for activating a ward line or a column line. Moreover, the variable delay circuit of the present invention may be used as a delay circuit of a clock signal of clock synchronous type DRAM (for example, SDRAM). [0061]
In the above-described embodiment, the example in which the present invention is applied to DRAM is described. However, the present invention is not limited to these embodiments. For example, the present invention may be applied to other semiconductor memory such as SRAM, microcomputer, logic LSI, or system LSI. [0062]
Further, the semiconductor fabrication process to which the present invention is applied is not limited to the CMOS process, but may be a Bi-CMOS process. [0063]
The invention is not limited to the above embodiments and various modifications may be made without departing from the spirit and the scope of the invention. Any improvement may be made in part or all of the components. [0064]

Claims

What is claimed is:

1. A variable delay circuit comprising:

a delay circuit having a plurality of delay stages connected in cascade for receiving an input signal at an initial delay stage and respectively outputting delayed signals; and

a selector for selecting one of said delayed signals in response to one of selecting signals, and outputting a selected delayed signal as a delayed output signal, and wherein output(s) of said subsequent delay stage(s) to said delay stage outputting said selected delayed signal, is/are fixed.

2. The variable delay circuit according to

claim 1

, wherein:

each of said delay stages comprises a disable terminal for stopping its operation upon receiving an activation of said selecting signal corresponding to said delayed signal supplied from the previous delay stage; and

said delay stage receiving the activated selecting signal is fixed.

3. A semiconductor integrated circuit having a variable delay circuit, wherein the variable delay circuit comprises:

a selector for selecting one of said delayed signals in response to one of selecting signals, and outputting a selected delayed signal as a delayed output signal, and wherein

output(s) of said subsequent delay stage(s) to said delay stage outputting said selected delayed signal, is/are fixed.

4. The semiconductor integrated circuit having a variable delay circuit according to

claim 3

, wherein:

said delay stage receiving the activated selecting signal is fixed.

5. The semiconductor integrated circuit having a variable delay circuit according to

claim 3

, further comprising an adjusting circuit for adjusting an operation timing of an internal circuit included therein, wherein

said adjusting circuit comprises an activation control circuit for activating any of said selecting signals.

6. The semiconductor integrated circuit having a variable delay circuit according to

claim 5

, wherein said adjusting circuit comprises:

a fuse circuit for activating any of said selecting signals by blowing a fuse; and

a selecting circuit for validating one of an activation of said selecting signal by said activation control circuit and an activation of said selecting signal by said fuse circuit.