US20080003935A1 - Polishing pad having surface texture - Google Patents

Polishing pad having surface texture Download PDF

Info

Publication number
US20080003935A1
US20080003935A1 US11/478,605 US47860506A US2008003935A1 US 20080003935 A1 US20080003935 A1 US 20080003935A1 US 47860506 A US47860506 A US 47860506A US 2008003935 A1 US2008003935 A1 US 2008003935A1
Authority
US
United States
Prior art keywords
polishing pad
grooves
groove
holes
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/478,605
Inventor
Chung-Chih Feng
I-Peng Yao
Chen-Hsiang Chao
Kun-Cheng Sung
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
San Fang Chemical Industry Co Ltd
Original Assignee
San Fang Chemical Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by San Fang Chemical Industry Co Ltd filed Critical San Fang Chemical Industry Co Ltd
Priority to US11/478,605 priority Critical patent/US20080003935A1/en
Assigned to SAN FANG CHEMICAL INDUSTRY CO., LTD. reassignment SAN FANG CHEMICAL INDUSTRY CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: FENG, CHUNG-CHIH, YAO, I-PENG, CHAO, CHEN-HSIANG, SUNG, KUN-CHENG
Publication of US20080003935A1 publication Critical patent/US20080003935A1/en
Priority to US12/124,594 priority patent/US20080220702A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved

Definitions

  • the present invention relates to a polishing pad having a surface texture, and more particularly, to a polishing pad with holes to store polishing slurry.
  • Polishing generally refers to a wear control for a preliminary coarse surface in the process of chemical mechanical polishing (CMP), which makes the slurry containing fine particles evenly dispersed on the upper surface of a polishing pad, and at the same time places a polishing workpiece against the polishing pad and then rubs the workpiece repeatedly with a regular motion.
  • the polishing workpiece may be objects such as a semiconductor, a storage medium substrate, an integrated circuit, an LCD flat-panel glass, an optical glass and a photoelectric panel.
  • the upper surface of the polishing pad is usually cut with a plurality of grooves or formed with a surface texture. Therefore, the polishing effect of the polishing pad on the workpiece to be polished is easily affected by the grooves and the surface texture.
  • FIG. 1 a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 504,429 is shown.
  • the surface texture of the polishing pad 1 comprises a plurality of concentric circular grooves 11 , wherein the depth and the width of the circular grooves 11 are designed in accordance with the requirement.
  • the polishing pad 1 has the disadvantage that the impurities produced during the polishing process cannot be quickly removed from the polishing pad 1 , thus negatively affecting the polishing precision and the service life of the polishing pad 1 .
  • FIG. 2 a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 562,716 is shown.
  • the surface texture of the polishing pad 2 comprises a plurality of radial grooves 21 , wherein the radial grooves 21 are connected to the center 22 of the polishing pad 2 and the edge 23 of the polishing pad 2 .
  • the advantage of the polishing pad 2 is that the impurities produced during the polishing process can be quickly removed from the polishing pad 2 .
  • the polishing pad 2 has the disadvantage that the polishing particles in the polishing slurry are also quickly removed from the polishing pad 2 , thus negatively affecting the polishing precision and the service life of the polishing pad 2 .
  • the objective of the present invention is to provide a polishing pad having a surface texture.
  • the polishing pad comprises a surface texture disposed on a polishing surface of the polishing pad.
  • the surface texture comprises at least one first groove, at least one second groove, and a plurality of holes.
  • the second groove is connected to the edge of the polishing pad, and the first groove(s) is intersected with the second groove(s) to form a plurality of intersection points.
  • the holes are disposed at the intersection points, and the depth of the holes is larger than that of the first groove.
  • the second groove(s) enables the impurities suspended in the polishing slurry to be quickly removed, and the holes then store the polishing slurry to delay the polishing particles in the polishing slurry from departing from the polishing pad.
  • FIG. 1 is a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 504,429;
  • FIG. 2 is a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 562,716;
  • FIG. 3 is a top view of the polishing pad according to the first embodiment of the present invention.
  • FIG. 4 is a top view of the polishing pad according to the second embodiment of the present invention.
  • FIG. 5 is a top view of the polishing pad according to the third embodiment of the present invention.
  • FIG. 6 is a top view of the polishing pad according to the fourth embodiment of the present invention.
  • FIG. 7 is a top view of the polishing pad according to the fifth embodiment of the present invention.
  • the present invention provides a polishing pad having a surface texture.
  • the polishing pad is suitable for polishing an object to be polished in the chemical mechanical polishing (CMP) process.
  • the object to be polished comprises, but is not limited to, objects such as semiconductors, storage medium substrates, integrated circuits, LCD flat glass, optical glass, and photoelectric panels.
  • the polishing pad comprises a surface texture disposed on a polishing surface of the polishing pad.
  • the surface texture comprises at least one first groove, at least one second groove, and a plurality of holes. That is, the first groove, the second groove and the holes are on the same surface (polishing surface).
  • the first grooves are a plurality of circular grooves with different radii from the top view and the circular grooves are concentric grooves.
  • the first grooves can also be a plurality of rectangular grooves with different side lengths and the rectangular grooves are concentric grooves.
  • the first groove(s) may be a spiral groove, or grooves of other shapes.
  • the second groove(s) extends from a central portion of the polishing pad to an edge of the polishing pad, and the first groove(s) is intersected with the second groove(s) to form a plurality of intersection points.
  • the second groove(s) is a plurality of radial grooves from the top view, each of which is a linear or arced groove.
  • the holes are disposed at the intersection points.
  • the holes are blind holes and the depth of the holes is larger than that of the first groove(s) and the second groove(s).
  • the surface texture of the polishing pad 3 of the present embodiment comprises a plurality of the first grooves 31 , a plurality of the second grooves 32 , and a plurality of holes 33 .
  • the first grooves 31 are a plurality of concentric circular grooves, and the first grooves are a plurality of circular grooves with different radii from the top view.
  • the second grooves 32 are a plurality of radial grooves, and each of the second grooves 32 is a linear groove extending from a central portion of the polishing pad 3 to the edge 34 of the polishing pad 3 .
  • the first grooves 31 are intersected with the second grooves 32 to form a plurality of intersection points.
  • the holes 33 are disposed at the intersection points, and the depth of the holes 33 is larger than that of the first grooves 31 and the second grooves 32 .
  • the diameter of the hole 33 is larger than the width of the first grooves 31 and the second grooves 32 .
  • the surface texture of the polishing pad 4 of the present embodiment comprises a plurality of the first grooves 41 , a plurality of the second grooves 42 , and a plurality of holes 43 .
  • the first grooves 41 are a plurality of concentric circular grooves.
  • the second grooves 42 are a plurality of radial grooves, and each of the second grooves 42 is a linear groove extending from a central portion of the polishing pad 4 to the edge 44 of the polishing pad 4 .
  • the first grooves 41 are intersected with the second grooves 42 to form a plurality of intersection points.
  • the holes 43 are disposed at the intersection points, and the depth of the holes 43 is larger than that of the first grooves 41 and the second grooves 42 .
  • the diameter of the hole 43 is larger than the width of the first grooves 41 and the second grooves 42 .
  • the difference between the surface texture of the polishing pad 4 of the present embodiment and that of the polishing pad 3 of the first embodiment is that the first groove 411 at the innermost circle of the polishing pad 4 are not intersected with the second grooves 42 .
  • the surface texture of the polishing pad 5 of the present embodiment comprises a plurality of the first grooves 51 , a plurality of the second grooves 52 , a plurality of the first holes 53 , and a plurality of the second holes 55 .
  • the first grooves 51 are a plurality of concentric circular grooves.
  • the second grooves 52 are a plurality of radial grooves, and each of the second grooves 52 is a linear groove extending from a central portion of the polishing pad 5 to the edge 54 of the polishing pad 5 .
  • the first grooves 51 are intersected with the second grooves 52 to form a plurality of intersection points.
  • the first holes 53 are disposed at the intersection points, and the depth of the first holes 53 is larger than that of the first grooves 51 and the second grooves 52 .
  • the second holes 55 are disposed on the second grooves 52 except for the intersection points, and the depth of the second holes 55 is the same as that of the first holes 53 .
  • the diameters of the first hole 53 and the second holes 55 are larger than the widths of the first grooves 51 and the second grooves 52 .
  • the surface texture of the polishing pad 6 of the present embodiment comprises a plurality of the first grooves 61 , a plurality of the second grooves 62 , and a plurality of holes 63 .
  • the first grooves 61 are a plurality of concentric rectangular grooves from the top view, and the first grooves 61 are a plurality of rectangular grooves with different side lengths.
  • the second grooves 62 are a plurality of radial grooves, and each of the second grooves 62 is a linear groove extending from a central portion of the polishing pad 6 to the edge 64 of the polishing pad 6 .
  • the first grooves 61 are intersected with the second grooves 62 to form a plurality of intersection points.
  • the holes 63 are disposed at the intersection points, and the depth of the holes 63 is larger than that of the first grooves 61 and the second grooves 62 .
  • the surface texture of the polishing pad 7 of the present embodiment comprises a first groove 71 , a plurality of the second grooves 72 , and a plurality of holes 73 .
  • the first groove 71 is a spiral groove from the top view.
  • the second grooves 72 are a plurality of radial grooves, and each of the second grooves 72 is a linear groove extending from a central portion of the polishing pad 7 to the edge 74 of the polishing pad 7 .
  • the first groove 71 is intersected with the second grooves 72 to form a plurality of intersection points.
  • the holes 73 are disposed at the intersection points, and the depth of the holes 73 is larger than that of the first groove 71 and the second grooves 72 .
  • the diameter of the hole 73 is larger than the widths of the first grooves 71 and the second grooves 72 .
  • the surface texture of the polishing pad 8 of the present embodiment comprises a plurality of the first grooves 81 , a plurality of the second grooves 82 , and a plurality of holes 83 .
  • the first grooves 81 are a plurality of concentric circular grooves.
  • the second grooves 82 are a plurality of radial grooves, and each of the second grooves 82 is an arced groove extending from a central portion of the polishing pad 8 to the edge 84 of the polishing pad 8 .
  • the first grooves 81 are intersected with the second grooves 82 to form a plurality of intersection points.
  • the holes 83 are disposed at the intersection points and the depth of the holes 83 is larger than that of the first grooves 81 and the second grooves 82 .
  • the diameter of the hole 83 is larger than the widths of the first grooves 81 and the second grooves 82 .

Abstract

The present invention relates to a polishing pad having a surface texture. The surface texture is disposed on the polishing surface of the polishing pad. The surface texture comprises at least one first groove, at least one second groove, and a plurality of holes. The second groove extends from a central portion of the polishing pad to the edge of the polishing pad, and the first groove(s) is intersected with the second groove(s) to form a plurality of intersection points. The holes are disposed at the intersection points, and the depth of the holes is larger than that of the first groove. Thus, the second groove(s) enables impurities suspended in the polishing slurry to be quickly removed from the polishing pad, and the holes can store the polishing slurry to delay the polishing particles in the polishing slurry from departing from the polishing pad.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention
  • The present invention relates to a polishing pad having a surface texture, and more particularly, to a polishing pad with holes to store polishing slurry.
  • 2. Description of the Related Art
  • Polishing generally refers to a wear control for a preliminary coarse surface in the process of chemical mechanical polishing (CMP), which makes the slurry containing fine particles evenly dispersed on the upper surface of a polishing pad, and at the same time places a polishing workpiece against the polishing pad and then rubs the workpiece repeatedly with a regular motion. The polishing workpiece may be objects such as a semiconductor, a storage medium substrate, an integrated circuit, an LCD flat-panel glass, an optical glass and a photoelectric panel. In order to maintain the distribution and flow of the polishing slurry and the planarization and polishing efficiency after the chemical mechanical polishing, the upper surface of the polishing pad is usually cut with a plurality of grooves or formed with a surface texture. Therefore, the polishing effect of the polishing pad on the workpiece to be polished is easily affected by the grooves and the surface texture.
  • Referring to FIG. 1, a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 504,429 is shown. The surface texture of the polishing pad 1 comprises a plurality of concentric circular grooves 11, wherein the depth and the width of the circular grooves 11 are designed in accordance with the requirement. However, the polishing pad 1 has the disadvantage that the impurities produced during the polishing process cannot be quickly removed from the polishing pad 1, thus negatively affecting the polishing precision and the service life of the polishing pad 1.
  • Referring to FIG. 2, a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 562,716 is shown. The surface texture of the polishing pad 2 comprises a plurality of radial grooves 21, wherein the radial grooves 21 are connected to the center 22 of the polishing pad 2 and the edge 23 of the polishing pad 2. The advantage of the polishing pad 2 is that the impurities produced during the polishing process can be quickly removed from the polishing pad 2. However, the polishing pad 2 has the disadvantage that the polishing particles in the polishing slurry are also quickly removed from the polishing pad 2, thus negatively affecting the polishing precision and the service life of the polishing pad 2.
  • Consequently, there is an existing need for a polishing pad having a surface texture to solve the above-mentioned problems.
  • SUMMARY OF THE INVENTION
  • The objective of the present invention is to provide a polishing pad having a surface texture. The polishing pad comprises a surface texture disposed on a polishing surface of the polishing pad. The surface texture comprises at least one first groove, at least one second groove, and a plurality of holes. The second groove is connected to the edge of the polishing pad, and the first groove(s) is intersected with the second groove(s) to form a plurality of intersection points. The holes are disposed at the intersection points, and the depth of the holes is larger than that of the first groove.
  • Thus, the second groove(s) enables the impurities suspended in the polishing slurry to be quickly removed, and the holes then store the polishing slurry to delay the polishing particles in the polishing slurry from departing from the polishing pad.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 504,429;
  • FIG. 2 is a top view of a polishing pad having a surface texture disclosed in the ROC (Taiwan) Patent Publication No. 562,716;
  • FIG. 3 is a top view of the polishing pad according to the first embodiment of the present invention;
  • FIG. 4 is a top view of the polishing pad according to the second embodiment of the present invention;
  • FIG. 5 is a top view of the polishing pad according to the third embodiment of the present invention;
  • FIG. 6 is a top view of the polishing pad according to the fourth embodiment of the present invention;
  • FIG. 7 is a top view of the polishing pad according to the fifth embodiment of the present invention; and
  • FIG. 8 is a top view of the polishing pad according to the sixth embodiment of the present invention.
  • DETAILED DESCRIPTION OF THE INVENTION
  • The present invention provides a polishing pad having a surface texture. The polishing pad is suitable for polishing an object to be polished in the chemical mechanical polishing (CMP) process. The object to be polished comprises, but is not limited to, objects such as semiconductors, storage medium substrates, integrated circuits, LCD flat glass, optical glass, and photoelectric panels.
  • According to the present invention, the polishing pad comprises a surface texture disposed on a polishing surface of the polishing pad. The surface texture comprises at least one first groove, at least one second groove, and a plurality of holes. That is, the first groove, the second groove and the holes are on the same surface (polishing surface).In a preferred embodiment, the first grooves are a plurality of circular grooves with different radii from the top view and the circular grooves are concentric grooves. However, the first grooves can also be a plurality of rectangular grooves with different side lengths and the rectangular grooves are concentric grooves. Alternatively, the first groove(s) may be a spiral groove, or grooves of other shapes.
  • The second groove(s) extends from a central portion of the polishing pad to an edge of the polishing pad, and the first groove(s) is intersected with the second groove(s) to form a plurality of intersection points. Preferably, the second groove(s) is a plurality of radial grooves from the top view, each of which is a linear or arced groove. The holes are disposed at the intersection points. The holes are blind holes and the depth of the holes is larger than that of the first groove(s) and the second groove(s). Thus, the second groove enables the impurities suspended in the polishing slurry to be quickly removed, and the holes then store the polishing slurry to delay the polishing particles in the polishing slurry from departing from the polishing pad.
  • The present invention will be described in detail with the following examples, but it does not mean that the present invention is limited to the content disclosed by the examples.
  • EXAMPLE 1
  • Referring to FIG. 3, a top view of the polishing pad according to the first embodiment of the present invention is shown. The surface texture of the polishing pad 3 of the present embodiment comprises a plurality of the first grooves 31, a plurality of the second grooves 32, and a plurality of holes 33. The first grooves 31 are a plurality of concentric circular grooves, and the first grooves are a plurality of circular grooves with different radii from the top view. The second grooves 32 are a plurality of radial grooves, and each of the second grooves 32 is a linear groove extending from a central portion of the polishing pad 3 to the edge 34 of the polishing pad 3. The first grooves 31 are intersected with the second grooves 32 to form a plurality of intersection points. The holes 33 are disposed at the intersection points, and the depth of the holes 33 is larger than that of the first grooves 31 and the second grooves 32. The diameter of the hole 33 is larger than the width of the first grooves 31 and the second grooves 32.
  • EXAMPLE 2
  • Referring to FIG. 4, a top view of the polishing pad according to the second embodiment of the present invention is shown. The surface texture of the polishing pad 4 of the present embodiment comprises a plurality of the first grooves 41, a plurality of the second grooves 42, and a plurality of holes 43. The first grooves 41 are a plurality of concentric circular grooves. The second grooves 42 are a plurality of radial grooves, and each of the second grooves 42 is a linear groove extending from a central portion of the polishing pad 4 to the edge 44 of the polishing pad 4. The first grooves 41 are intersected with the second grooves 42 to form a plurality of intersection points. The holes 43 are disposed at the intersection points, and the depth of the holes 43 is larger than that of the first grooves 41 and the second grooves 42. The diameter of the hole 43 is larger than the width of the first grooves 41 and the second grooves 42. The difference between the surface texture of the polishing pad 4 of the present embodiment and that of the polishing pad 3 of the first embodiment is that the first groove 411 at the innermost circle of the polishing pad 4 are not intersected with the second grooves 42.
  • EXAMPLE 3
  • Referring to FIG. 5, a top view of the polishing pad according to the third embodiment of the present invention is shown. The surface texture of the polishing pad 5 of the present embodiment comprises a plurality of the first grooves 51, a plurality of the second grooves 52, a plurality of the first holes 53, and a plurality of the second holes 55. The first grooves 51 are a plurality of concentric circular grooves. The second grooves 52 are a plurality of radial grooves, and each of the second grooves 52 is a linear groove extending from a central portion of the polishing pad 5 to the edge 54 of the polishing pad 5. The first grooves 51 are intersected with the second grooves 52 to form a plurality of intersection points. The first holes 53 are disposed at the intersection points, and the depth of the first holes 53 is larger than that of the first grooves 51 and the second grooves 52. The second holes 55 are disposed on the second grooves 52 except for the intersection points, and the depth of the second holes 55 is the same as that of the first holes 53. The diameters of the first hole 53 and the second holes 55 are larger than the widths of the first grooves 51 and the second grooves 52.
  • EXAMPLE 4
  • Referring to FIG. 6, a top view of the polishing pad according to the fourth embodiment of the present invention is shown. The surface texture of the polishing pad 6 of the present embodiment comprises a plurality of the first grooves 61, a plurality of the second grooves 62, and a plurality of holes 63. The first grooves 61 are a plurality of concentric rectangular grooves from the top view, and the first grooves 61 are a plurality of rectangular grooves with different side lengths. The second grooves 62 are a plurality of radial grooves, and each of the second grooves 62 is a linear groove extending from a central portion of the polishing pad 6 to the edge 64 of the polishing pad 6. The first grooves 61 are intersected with the second grooves 62 to form a plurality of intersection points. The holes 63 are disposed at the intersection points, and the depth of the holes 63 is larger than that of the first grooves 61 and the second grooves 62.
  • EXAMPLE 5
  • Referring to FIG. 7, a top view of the polishing pad according to the fifth embodiment of the present invention is shown. The surface texture of the polishing pad 7 of the present embodiment comprises a first groove 71, a plurality of the second grooves 72, and a plurality of holes 73. The first groove 71 is a spiral groove from the top view. The second grooves 72 are a plurality of radial grooves, and each of the second grooves 72 is a linear groove extending from a central portion of the polishing pad 7 to the edge 74 of the polishing pad 7. The first groove 71 is intersected with the second grooves 72 to form a plurality of intersection points. The holes 73 are disposed at the intersection points, and the depth of the holes 73 is larger than that of the first groove 71 and the second grooves 72. The diameter of the hole 73 is larger than the widths of the first grooves 71 and the second grooves 72.
  • EXAMPLE 6
  • Referring to FIG. 8, a top view of the polishing pad according to the sixth embodiment of the present invention is shown. The surface texture of the polishing pad 8 of the present embodiment comprises a plurality of the first grooves 81, a plurality of the second grooves 82, and a plurality of holes 83. The first grooves 81 are a plurality of concentric circular grooves. The second grooves 82 are a plurality of radial grooves, and each of the second grooves 82 is an arced groove extending from a central portion of the polishing pad 8 to the edge 84 of the polishing pad 8. The first grooves 81 are intersected with the second grooves 82 to form a plurality of intersection points. The holes 83 are disposed at the intersection points and the depth of the holes 83 is larger than that of the first grooves 81 and the second grooves 82. The diameter of the hole 83 is larger than the widths of the first grooves 81 and the second grooves 82.
  • While several embodiments of the present invention have been illustrated and described, various modifications and improvements can be made by those skilled in the art. The embodiments of the present invention are therefore described in an illustrative but not restrictive sense. It is intended that the present invention may not be limited to the particular forms as illustrated, and that all modifications which maintain the spirit and scope of the present invention are within the scope as defined in the appended claims.

Claims (15)

1. A polishing pad comprising:
a textured polishing surface;
at least one first groove exposed at and formed in the textured polishing surface;
at least one second groove exposed at and formed in the textured polishing surface, the at least one second groove extending from a central portion of the polishing surface to an edge of the polishing surface, wherein the at least one first groove intersects with the at least one second groove to form a plurality of intersection points; and
a plurality of holes exposed at and formed in the textured polishing surface, the plurality of holes disposed at the intersection points, wherein the depth of the holes is larger than that of the at least one first groove.
2. The polishing pad as claimed in claim 1, wherein the at least one first groove comprises a plurality of concentric circular grooves surrounding a center of the textured polishing surface.
3. The polishing pad as claimed in claim 1, wherein the at least one first groove comprises a plurality of concentric rectangular grooves surrounding a center of the textured polishing surface.
4. The polishing pad as claimed in claim 1, wherein the at least one first groove is a spiral groove.
5. The polishing pad as claimed in claim 1, wherein the at least one second groove comprises a plurality of radial grooves.
6. The polishing pad as claimed in claim 5, wherein each of the radial grooves is a linear groove.
7. The polishing pad as claimed in claim 5, wherein each of the radial grooves is an arced groove.
8. A polishing pad comprising:
a textured polishing surface;
a plurality of concentric circular grooves exposed at and located in the textured polishing surface;
a plurality of radial grooves exposed at and located in the textured polishing surface, the plurality of radial groove extending from a central portion of the polishing surface to an edge of the polishing surface, wherein the circular grooves intersect with the radial grooves to form a plurality of intersection points; and
a plurality of the first holes exposed at and located in the textured polishing surface, wherein the plurality of first holes are disposed at the intersection points, and wherein the depth of the holes is larger than that of the circular grooves.
9. The polishing pad as claimed in claim 8, wherein each of the radial grooves is a linear groove.
10. The polishing pad as claimed in claim 8, wherein each of the radial grooves is an arced groove.
11. The polishing pad as claimed in claim 8, further comprising a plurality of the second holes disposed on the circular grooves and spaced from the intersection points.
12. The polishing pad as claimed in claim 1, wherein the holes are blind holes.
13. The polishing pad as claimed in claim 1, wherein a diameter of the holes is larger than a width of the at least one first groove and a width of the at least one second groove.
14. The polishing pad as claimed in claim 8, wherein a diameter of the first holes is larger than a width of the circular grooves and a width of the radials grooves.
15. The polishing pad as claimed in claim 11, wherein a diameter of the second holes is larger than a width of the circular grooves.
US11/478,605 2006-07-03 2006-07-03 Polishing pad having surface texture Abandoned US20080003935A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US11/478,605 US20080003935A1 (en) 2006-07-03 2006-07-03 Polishing pad having surface texture
US12/124,594 US20080220702A1 (en) 2006-07-03 2008-05-21 Polishing pad having surface texture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/478,605 US20080003935A1 (en) 2006-07-03 2006-07-03 Polishing pad having surface texture

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/124,594 Continuation-In-Part US20080220702A1 (en) 2006-07-03 2008-05-21 Polishing pad having surface texture

Publications (1)

Publication Number Publication Date
US20080003935A1 true US20080003935A1 (en) 2008-01-03

Family

ID=38877303

Family Applications (1)

Application Number Title Priority Date Filing Date
US11/478,605 Abandoned US20080003935A1 (en) 2006-07-03 2006-07-03 Polishing pad having surface texture

Country Status (1)

Country Link
US (1) US20080003935A1 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120040532A1 (en) * 2007-07-26 2012-02-16 Macronix International Co., Ltd. Pad and method for chemical mechanical polishing
US9180570B2 (en) 2008-03-14 2015-11-10 Nexplanar Corporation Grooved CMP pad
US10071461B2 (en) 2014-04-03 2018-09-11 3M Innovative Properties Company Polishing pads and systems and methods of making and using the same
CN110732983A (en) * 2019-10-30 2020-01-31 郑州伯利森新材料科技有限公司 Repair-free superhard grinding wheel for processing hard and brittle materials and preparation method thereof
USD1000928S1 (en) * 2022-06-03 2023-10-10 Beng Youl Cho Polishing pad
USD1004393S1 (en) * 2021-11-09 2023-11-14 Ehwa Diamond Industrial Co., Ltd. Grinding pad
US11878388B2 (en) * 2018-06-15 2024-01-23 Taiwan Semiconductor Manufacturing Company, Ltd. Polishing pad, polishing apparatus and method of manufacturing semiconductor package using the same

Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5177908A (en) * 1990-01-22 1993-01-12 Micron Technology, Inc. Polishing pad
US5645469A (en) * 1996-09-06 1997-07-08 Advanced Micro Devices, Inc. Polishing pad with radially extending tapered channels
US5725420A (en) * 1995-10-25 1998-03-10 Nec Corporation Polishing device having a pad which has grooves and holes
US5795218A (en) * 1996-09-30 1998-08-18 Micron Technology, Inc. Polishing pad with elongated microcolumns
US5882251A (en) * 1997-08-19 1999-03-16 Lsi Logic Corporation Chemical mechanical polishing pad slurry distribution grooves
US5888121A (en) * 1997-09-23 1999-03-30 Lsi Logic Corporation Controlling groove dimensions for enhanced slurry flow
US6089966A (en) * 1997-11-25 2000-07-18 Arai; Hatsuyuki Surface polishing pad
US6120366A (en) * 1998-12-29 2000-09-19 United Microelectronics Corp. Chemical-mechanical polishing pad
US6159088A (en) * 1998-02-03 2000-12-12 Sony Corporation Polishing pad, polishing apparatus and polishing method
US6254456B1 (en) * 1997-09-26 2001-07-03 Lsi Logic Corporation Modifying contact areas of a polishing pad to promote uniform removal rates
US6273806B1 (en) * 1997-05-15 2001-08-14 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus
US20030143925A1 (en) * 2002-01-28 2003-07-31 Yang Charles Chiun-Chieh Polishing pad window for a chemical-mechanical polishing tool
US6692338B1 (en) * 1997-07-23 2004-02-17 Lsi Logic Corporation Through-pad drainage of slurry during chemical mechanical polishing
US6729950B2 (en) * 2001-08-16 2004-05-04 Skc Co., Ltd. Chemical mechanical polishing pad having wave shaped grooves
US6749714B1 (en) * 1999-03-30 2004-06-15 Nikon Corporation Polishing body, polisher, polishing method, and method for producing semiconductor device
US20040266327A1 (en) * 2000-02-17 2004-12-30 Liang-Yuh Chen Conductive polishing article for electrochemical mechanical polishing
US20050095957A1 (en) * 2003-10-29 2005-05-05 International Business Machines Corporation Two-sided chemical mechanical polishing pad for semiconductor processing
US20050153633A1 (en) * 2002-02-07 2005-07-14 Shunichi Shibuki Polishing pad, polishing apparatus, and polishing method
US20050260929A1 (en) * 2004-05-20 2005-11-24 Jsr Corporation Chemical mechanical polishing pad and chemical mechanical polishing method
US20060002377A1 (en) * 2004-07-05 2006-01-05 Telefonaktiebolaget Lm Ericsson (Publ) Methods and devices for changing quality of service
US7021995B2 (en) * 2004-03-16 2006-04-04 Noritake Co., Limited CMP pad conditioner having working surface inclined in radially outer portion

Patent Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5177908A (en) * 1990-01-22 1993-01-12 Micron Technology, Inc. Polishing pad
US5725420A (en) * 1995-10-25 1998-03-10 Nec Corporation Polishing device having a pad which has grooves and holes
US5645469A (en) * 1996-09-06 1997-07-08 Advanced Micro Devices, Inc. Polishing pad with radially extending tapered channels
US5795218A (en) * 1996-09-30 1998-08-18 Micron Technology, Inc. Polishing pad with elongated microcolumns
US6273806B1 (en) * 1997-05-15 2001-08-14 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus
US6692338B1 (en) * 1997-07-23 2004-02-17 Lsi Logic Corporation Through-pad drainage of slurry during chemical mechanical polishing
US5882251A (en) * 1997-08-19 1999-03-16 Lsi Logic Corporation Chemical mechanical polishing pad slurry distribution grooves
US5888121A (en) * 1997-09-23 1999-03-30 Lsi Logic Corporation Controlling groove dimensions for enhanced slurry flow
US6254456B1 (en) * 1997-09-26 2001-07-03 Lsi Logic Corporation Modifying contact areas of a polishing pad to promote uniform removal rates
US6089966A (en) * 1997-11-25 2000-07-18 Arai; Hatsuyuki Surface polishing pad
US6159088A (en) * 1998-02-03 2000-12-12 Sony Corporation Polishing pad, polishing apparatus and polishing method
US6120366A (en) * 1998-12-29 2000-09-19 United Microelectronics Corp. Chemical-mechanical polishing pad
US6749714B1 (en) * 1999-03-30 2004-06-15 Nikon Corporation Polishing body, polisher, polishing method, and method for producing semiconductor device
US20040266327A1 (en) * 2000-02-17 2004-12-30 Liang-Yuh Chen Conductive polishing article for electrochemical mechanical polishing
US6729950B2 (en) * 2001-08-16 2004-05-04 Skc Co., Ltd. Chemical mechanical polishing pad having wave shaped grooves
US20030143925A1 (en) * 2002-01-28 2003-07-31 Yang Charles Chiun-Chieh Polishing pad window for a chemical-mechanical polishing tool
US20050153633A1 (en) * 2002-02-07 2005-07-14 Shunichi Shibuki Polishing pad, polishing apparatus, and polishing method
US20050095957A1 (en) * 2003-10-29 2005-05-05 International Business Machines Corporation Two-sided chemical mechanical polishing pad for semiconductor processing
US7021995B2 (en) * 2004-03-16 2006-04-04 Noritake Co., Limited CMP pad conditioner having working surface inclined in radially outer portion
US20050260929A1 (en) * 2004-05-20 2005-11-24 Jsr Corporation Chemical mechanical polishing pad and chemical mechanical polishing method
US20060002377A1 (en) * 2004-07-05 2006-01-05 Telefonaktiebolaget Lm Ericsson (Publ) Methods and devices for changing quality of service

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120040532A1 (en) * 2007-07-26 2012-02-16 Macronix International Co., Ltd. Pad and method for chemical mechanical polishing
US9180570B2 (en) 2008-03-14 2015-11-10 Nexplanar Corporation Grooved CMP pad
US10071461B2 (en) 2014-04-03 2018-09-11 3M Innovative Properties Company Polishing pads and systems and methods of making and using the same
US10252396B2 (en) 2014-04-03 2019-04-09 3M Innovative Properties Company Polishing pads and systems and methods of making and using the same
US11878388B2 (en) * 2018-06-15 2024-01-23 Taiwan Semiconductor Manufacturing Company, Ltd. Polishing pad, polishing apparatus and method of manufacturing semiconductor package using the same
CN110732983A (en) * 2019-10-30 2020-01-31 郑州伯利森新材料科技有限公司 Repair-free superhard grinding wheel for processing hard and brittle materials and preparation method thereof
USD1004393S1 (en) * 2021-11-09 2023-11-14 Ehwa Diamond Industrial Co., Ltd. Grinding pad
USD1000928S1 (en) * 2022-06-03 2023-10-10 Beng Youl Cho Polishing pad

Similar Documents

Publication Publication Date Title
US20080220702A1 (en) Polishing pad having surface texture
US20080003935A1 (en) Polishing pad having surface texture
KR100471527B1 (en) Polishing body, polisher, polishing method, and method for producing semiconductor device
KR102148050B1 (en) Polishing pad with offset concentric grooving pattern and method for polishing a substrate therewith
US20160303705A1 (en) Grinding Tool and Method of Manufacturing the Same
JP6993090B2 (en) Polishing scrap removal groove for CMP polishing pad
US9409276B2 (en) CMP polishing pad having edge exclusion region of offset concentric groove pattern
US20160303704A1 (en) Grinding Tool
CN100562401C (en) Polishing pad
CN100478138C (en) Grinding cushion with surface texture
US20080090503A1 (en) Polishing pad and chemical mechanical polishing apparatus comprising the same
DE102005059547A1 (en) CMP polishing pad having grooves disposed therein to enhance use of a polishing medium
JP2004358653A (en) Polishing pad having optimized grooves and method of forming same
US8657652B2 (en) Optimized CMP conditioner design for next generation oxide/metal CMP
US20150283672A1 (en) Chemical mechanical polishing conditioner having different heights
CN1694227A (en) Semiconductor device including semiconductor memory element and method for producing same
CN100537148C (en) Polishing pad and chemico-mechanical polishing method
CN100537149C (en) Polishing pad and chemico-mechanical polishing method
US7229341B2 (en) Method and apparatus for chemical mechanical polishing
JP2008238389A (en) Cmp pad conditioner
KR20100110989A (en) Cmp pad conditioner and its manufacturing method
US9193028B2 (en) Sheet for mounting a workpiece
TWI676526B (en) Polishing pad, manufacturing method of a polishing pad and polishing method
CN113246015A (en) Polishing pad with end point detection window and application thereof
KR101128932B1 (en) Polishing cloth, polishing cloth processing method, and substrate manufacturing method using same

Legal Events

Date Code Title Description
AS Assignment

Owner name: SAN FANG CHEMICAL INDUSTRY CO., LTD., TAIWAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:FENG, CHUNG-CHIH;YAO, I-PENG;CHAO, CHEN-HSIANG;AND OTHERS;REEL/FRAME:018027/0513;SIGNING DATES FROM 20060619 TO 20060621

Owner name: SAN FANG CHEMICAL INDUSTRY CO., LTD., TAIWAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:FENG, CHUNG-CHIH;YAO, I-PENG;CHAO, CHEN-HSIANG;AND OTHERS;SIGNING DATES FROM 20060619 TO 20060621;REEL/FRAME:018027/0513

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION