US20080152081A1 - Backscatter inspection portal - Google Patents

Backscatter inspection portal Download PDF

Info

Publication number
US20080152081A1
US20080152081A1 US11/097,092 US9709205A US2008152081A1 US 20080152081 A1 US20080152081 A1 US 20080152081A1 US 9709205 A US9709205 A US 9709205A US 2008152081 A1 US2008152081 A1 US 2008152081A1
Authority
US
United States
Prior art keywords
inspection system
radiation
pencil
source
set forth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
US11/097,092
Other versions
US7400701B1 (en
Inventor
W. Randall Cason
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34968330&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=US20080152081(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority to US11/097,092 priority Critical patent/US7400701B1/en
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Assigned to AMERICAN SCIENCE AND ENGINEERING, INC. reassignment AMERICAN SCIENCE AND ENGINEERING, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CASON, W. RANDALL
Assigned to SILICON VALLEY BANK, DBA SILICON VALLEY EAST reassignment SILICON VALLEY BANK, DBA SILICON VALLEY EAST SECURITY AGREEMENT Assignors: AMERICAN SCIENCE AND ENGINEERING, INC.
Publication of US20080152081A1 publication Critical patent/US20080152081A1/en
Priority to US12/171,020 priority patent/US7593506B2/en
Publication of US7400701B1 publication Critical patent/US7400701B1/en
Application granted granted Critical
Priority to US12/272,056 priority patent/US7809109B2/en
Assigned to AMERICAN SCIENCE AND ENGINEERING, INC. reassignment AMERICAN SCIENCE AND ENGINEERING, INC. RELEASE Assignors: SILICON VALLEY BANK
Priority to US12/687,762 priority patent/US7796734B2/en
Priority to US12/897,197 priority patent/US20110017917A1/en
Priority to US13/047,878 priority patent/US8605859B2/en
Priority to US14/057,564 priority patent/US9020100B2/en
Assigned to WELLS FARGO BANK, AS ADMINISTRATIVE AGENT reassignment WELLS FARGO BANK, AS ADMINISTRATIVE AGENT SECURITY INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AMERICAN SCIENCE AND ENGINEERING, INC.
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G01V5/222
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/167Measuring radioactive content of objects, e.g. contamination

Definitions

  • the present invention relates to systems and methods for inspecting objects with penetrating radiation, and, more particularly, the invention relates to inspection systems employing multiple sources of radiation.
  • the determination should be capable of being made while the inspected object is in motion, or, alternatively, while the inspection system is in motion with respect to the inspected person or object. Indeed, since inspection rate, and thus hourly throughput, is at a premium, it is desirable that the vehicle, for example, be driven without requiring the driver or passengers to alight. In case a detection is made, a visual image should be available for verification.
  • X-rays are scattered from matter in all directions, therefore, scatter may be detected by an x-ray detector disposed at any angle to the scattering material with respect to the direction of incidence of the illuminating radiation. Therefore, a “flying spot” irradiation system is typically used, whereby a single point on the inspected object is illuminated with penetrating radiation at any given moment, so that the locus of scatter can be determined unambiguously, at least with respect to the plane transverse to the direction of the beam of penetrating radiation.
  • multiple backscatter imaging systems may be employed in a single inspection tunnel. This may result in interference, or cross-talk, between respective imaging systems, resulting in image degradation. This is due to the lack of each flying-spot imager's ability to distinguish the origin of the scattered radiation from each imager's source. To date, this problem has been addressed by placing the imagers some distance apart to minimize cross talk. This approach causes the size of the overall system to increase. In space-limited applications, this is often undesirable.
  • an inspection system for inspecting an object that is characterized by motion in a particular direction with respect to the inspection system, by virtue of motion with respect to the local frame of reference of either the object, the inspection system, or both.
  • the inspection system has a first source for providing a first beam of penetrating radiation of specified cross-section directed in a first beam direction substantially transverse to the direction of motion of the object. It also has a second source for providing a second beam of penetrating radiation in a second beam direction, and may have additional sources of additional beams.
  • the beams of penetrating radiation are temporally interspersed.
  • the system has a plurality of scatter detectors for detecting radiation scattered from at least one of the first beam and the other beams by any scattering material within the inspected object and for generating a scattered radiation signal.
  • the system may also have one or more transmission detectors for detecting penetrating radiation transmitted through the object.
  • the system has a controller for creating an image of the scattering material based at least on the scattered radiation signal or for otherwise characterizing the scattering material.
  • the first source of penetrating radiation may be an x-ray source, as may the other sources of penetrating radiation.
  • the first beam direction and the direction of any other beam may be substantially coplanar.
  • the various sources may include a beam scanning mechanism, such as a rotating chopper wheel or an electromagnetic scanner, and one or more of the beams may be pencil beams.
  • emission of penetrating radiation in the first beam may be characterized by a first temporal period and emission of penetrating radiation in the second beam may be characterized by a second temporal period, the first and the second temporal periods offset by fixed phase relationship.
  • the temporal period of each source may be characterized by a duty cycle
  • the emission of adjacent sources may be characterized by a phase relationship with respect to an adjacent source, where the phase relationship may equal to 2 ⁇ times the duty cycle.
  • the inspection system may further including a display for displaying a scatter image of material disposed within the inspected object.
  • FIG. 1 shows a schematic cross sectional view of an x-ray inspection system that uses multiple backscatter imaging systems in accordance with embodiments of the present invention
  • FIG. 2 shows a side view of the x-ray inspection system embodiments of FIG. 1 .
  • beam cross talk is minimized between or among multiple flying-spot backscatter imaging systems configured as a multi-view backscatter inspection system, with no restriction on the distance between the individual imaging systems.
  • the individual imaging systems can be placed as close together as is physically possible, while cross talk is advantageously reduced or eliminated.
  • FIG. 1 shows a schematic cross-sectional view of the elements of an inspection system, designated generally by numeral 10 .
  • An object of inspection 18 which may be animate or inanimate, moves, or is moved, in a direction into, or out of, the page and thus traverses a portal 12 .
  • Portal 12 supports a plurality of sources 13 , 15 , and 17 of penetrating radiation.
  • Sources 13 , 15 , and 17 are typically x-ray tubes having beam forming and steering mechanisms known in the art.
  • source 13 emits penetrating radiation in a beam 23 having a cross-section of a specified shape.
  • a narrow pencil beam is typically employed.
  • Beam 23 of penetrating radiation may be, for example, a beam of x-rays such as a polychromatic x-ray beam. While source 13 of penetrating radiation is preferably an x-ray tube, for example, however other sources of penetrating radiation, such as a linac (linear accelerator), are within the scope of the present invention, and, indeed, the penetrating radiation is not limited to x-ray radiation and may include gamma ray radiation.
  • a scanning mechanism is provided for scanning beam 23 along a substantially vertical axis, such that, during a portion of a duty cycle, beam 23 is directed in a series of directions such as 24 .
  • Object 18 that is to be inspected moves past beam 23 in a substantially horizontal direction, into the page, in the depiction of FIG. 1 .
  • the source and/or other portions of the inspection system may be moved in relation to object 18 , which may be moving itself, or stationary.
  • Source 13 may include a scanning mechanism such as a flying spot rotating chopper wheel as known to persons skilled in the art.
  • a scanning mechanism such as a flying spot rotating chopper wheel as known to persons skilled in the art.
  • electromagnetic scanners may be employed, such as those described in U.S. Pat. No. 6,421,420, issued Jul. 23, 2002 and entitled “Method and Apparatus for Generating Sequential Beams of Penetrating Radiation,” which is incorporated herein by reference.
  • Beams of sources 15 and 17 are shown in typical extremal positions of their respective scans, and are labeled 25 , 26 , 27 , and 28 .
  • Inspected object 18 which, as discussed, may refer to a vehicle, a container, or a person, for example, may be self-propelled through beams 23 - 28 or may be conveyed by a mechanized conveyor or pulled by a tractor, etc.
  • the inspection system configured, for example, as a portal, may move, or be moved, over an object such as a vehicle that may, itself, be moving or stationary.
  • Beams 23 - 28 will be referred to in the present description, without limitation, as x-ray beams.
  • a rotating chopper wheel is used to develop a pencil beam 23 - 28 which may be swept in a plane substantially parallel to that of the page.
  • the cross section of pencil beam 23 is of comparable extent in each dimension and is typically substantially circular, although it may be many shapes.
  • the dimensions of pencil beam 23 - 28 typically define the scatter image resolution which may be obtained with the system. Other shapes of beam cross section may be advantageously employed in particular applications.
  • a detector arrangement typified by scatter detector 31 , is disposed in a plane parallel to the direction of motion of object 18 during the course of the scan.
  • X-rays 30 scattered by Compton scattering out of beam 24 in an essentially backward direction are detected by one or more backscatter detectors 31 disposed between source 13 and object 18 .
  • Additional detector arrangements 32 , 33 , 34 , 35 , and 36 may be used supplementarily for detecting x-rays Compton-scattered from beam 24 and similarly, as will presently be described, for each of the other beams incident, in turn, on inspected object 18 .
  • transmission detectors disposed distally to the inspected object 18 with respect to the emitting source may be used to augment the scatter image or images with an image of the object as obtained in transmitted x-rays, for example, the detector elements designated 35 and 36 detect the emission of source 13 as transmitted through the inspected object.
  • a single separate detector is disposed between the pair of scatter detectors 35 and the pair of scatter detectors 36 and is employed for detection of penetrating radiation transmitted through object 18 .
  • any x-ray detection technology known in the art may be employed for the detector arrangements 31 - 36 .
  • the detectors may be scintillation materials, either solid or liquid or gaseous, viewed by photo-sensitive detectors such as photomultipliers or solid state detectors. Liquid scintillators may be doped with tin or other element or elements of high atomic number.
  • Respective output signals from the scatter detectors 31 - 36 are transmitted to a processor 40 , and processed to obtain images of feature 42 inside the inspected object 18 . Since incident x-ray photons are scattered by scattering sources within object 18 into all directions, detectors with large areas are used to maximize the collection of the scattered photons.
  • processor 40 may also be employed to derive other characteristics of the scattering object, such as its mass, mass density, effective atomic number, etc., all as known in the art.
  • the duty-cycle of the beams emitted from the imaging systems is set less-than or equal-to the inverse of the number of imaging systems, or views, in the multi-view system. For example, if the number of views desired is six, each imaging system is set for a duty cycle of 1 ⁇ 6, or less.
  • phase relationship between each pair of adjacent sources is set to 2 ⁇ times the duty cycle. This results in sequenced radiation emission from the imagers, eliminating the possibility of concurrent emission from more than one imager. For example, a multi-view inspection system with 6 sources would require that they run at the same frequency, that their duty-cycles be 1 ⁇ 6, and that their phase relationship be 2 ⁇ /6, or 60 degrees.
  • sources may be placed in greater proximity than otherwise possible.
  • sources 13 - 17 may be disposed in a single plane, which advantageously permits virtually simultaneous on/off control of the x-rays regardless of the speed with which the object is passing by the imagers.
  • FIG. 1 shows an exemplary three-view system, with beams 23 , 25 , etc. each sweeping trajectories that are coplanar.
  • the beams from each imager sweep in sequence, such that no more than one imager is emitting radiation at a time.
  • source (or ‘imager’) 13 sweeps its beam first.
  • Radiation scattered from the object, as represented by rays 44 is received by all of the detectors.
  • the signals from each of the detectors are acquired as separate channels by an acquisition system. This process is repeated for each of the three imagers, creating “slices” of the object as it moves by.
  • FIG. 2 a side view is shown of the arrangement of FIG. 1 , with elements designated by corresponding numbers.
  • a slot 50 is shown through which the beam of source 13 passes through segments 52 and 54 of detector 31 as object 18 is scanned while moving in a lateral direction 16 .
  • the signals from the detectors can be selectively used to reconstruct an image of the object. Since scattered photons 44 detected by detectors 33 and 34 from source 13 are as useful as scattered photons from source 17 , these same detectors can be shared among all sources, and result in improved scatter collection with efficient use of the detector hardware.
  • Embodiments of this invention may advantageously allow multi-view Flying-Spot X-ray Scatter imaging to be practiced in a smaller operational footprint by eliminating cross talk, and by allowing closer positioning of the individual imagers for each view.
  • the close positioning of these imagers may also allow sharing of scatter detectors between, or among, imagers, allowing more scatter collection for improved image quality, with efficient use of detector hardware.
  • co-planar positioning of the imagers allows simultaneous on/off control of the x-rays regardless of the speed with which the object is passing by the imagers. This greatly simplifies the design of the control of x-ray emissions from each imager in the multi-view inspection system, thus individual sequencing of x-ray emissions need not be performed as is typically practiced in systems in which emission is not co-planar.
  • x-rays having maximal energies in the range between 160 keV and 300 keV are employed. At this energy, x-rays penetrate into a vehicle, and organic objects inside the Vehicle can be detected. Since lower doses of x-ray irradiation are thus possible, automobiles may be scanned using the present invention. For applications where the scanned vehicle may contain personnel, end point energies below 300 keV are preferred. The scope of the present invention, however, is not limited by the range of penetrating photons employed.

Abstract

A system and method for inspecting an object with multiple sources of penetrating radiation. Irradiation of the inspected object by the sources is temporally sequenced such that the source of detected scattered radiation is unambiguous. Thus, multiple views of the inspected object may be obtained and image quality may be enhanced, even in a compact geometry in which the beams are substantially coplanar.

Description

  • The present application claims priority from U.S. Provisional Application No. 60/561,079, filed Apr. 9, 2004, which is incorporated herein by reference.
  • TECHNICAL FIELD
  • The present invention relates to systems and methods for inspecting objects with penetrating radiation, and, more particularly, the invention relates to inspection systems employing multiple sources of radiation.
  • BACKGROUND ART
  • It is desirable to determine the presence of objects, such as contraband, weapons, or explosives, that have been concealed, for example, in a moving vehicle, or on a person, or in any inspected object, while the inspected object is moved past one or more systems that image the contents of the object using penetrating radiation. The determination should be capable of being made while the inspected object is in motion, or, alternatively, while the inspection system is in motion with respect to the inspected person or object. Indeed, since inspection rate, and thus hourly throughput, is at a premium, it is desirable that the vehicle, for example, be driven without requiring the driver or passengers to alight. In case a detection is made, a visual image should be available for verification.
  • The use of images produced by detection and analysis of penetrating radiation scattered from an irradiated object, container, or vehicle is the subject, for example, of U.S. Pat. No. 6,459,764, to Chalmers et al. (the “Chalmers Patent”), issued Oct. 1, 2002, and incorporated herein by reference. The Chalmers Patent teaches backscatter inspection of a moving vehicle by illuminating the vehicle with x-rays from above or beneath the moving vehicle, as well as from the side.
  • The use of an x-ray source and an x-ray detector, both located in a portal, for purposes of screening personnel, is the subject, for example, of U.S. Pat. No. 6,094,072, to Smith, issued Jul. 25, 2000.
  • X-rays are scattered from matter in all directions, therefore, scatter may be detected by an x-ray detector disposed at any angle to the scattering material with respect to the direction of incidence of the illuminating radiation. Therefore, a “flying spot” irradiation system is typically used, whereby a single point on the inspected object is illuminated with penetrating radiation at any given moment, so that the locus of scatter can be determined unambiguously, at least with respect to the plane transverse to the direction of the beam of penetrating radiation.
  • In order to obtain multiple views of an inspected object, multiple backscatter imaging systems may be employed in a single inspection tunnel. This may result in interference, or cross-talk, between respective imaging systems, resulting in image degradation. This is due to the lack of each flying-spot imager's ability to distinguish the origin of the scattered radiation from each imager's source. To date, this problem has been addressed by placing the imagers some distance apart to minimize cross talk. This approach causes the size of the overall system to increase. In space-limited applications, this is often undesirable.
  • SUMMARY OF THE INVENTION
  • In one embodiment of the present invention, there is provided an inspection system for inspecting an object that is characterized by motion in a particular direction with respect to the inspection system, by virtue of motion with respect to the local frame of reference of either the object, the inspection system, or both. The inspection system has a first source for providing a first beam of penetrating radiation of specified cross-section directed in a first beam direction substantially transverse to the direction of motion of the object. It also has a second source for providing a second beam of penetrating radiation in a second beam direction, and may have additional sources of additional beams. The beams of penetrating radiation are temporally interspersed. Additionally, the system has a plurality of scatter detectors for detecting radiation scattered from at least one of the first beam and the other beams by any scattering material within the inspected object and for generating a scattered radiation signal. The system may also have one or more transmission detectors for detecting penetrating radiation transmitted through the object. Finally, the system has a controller for creating an image of the scattering material based at least on the scattered radiation signal or for otherwise characterizing the scattering material.
  • In accordance with alternate embodiments of the invention, the first source of penetrating radiation may be an x-ray source, as may the other sources of penetrating radiation. The first beam direction and the direction of any other beam may be substantially coplanar. The various sources may include a beam scanning mechanism, such as a rotating chopper wheel or an electromagnetic scanner, and one or more of the beams may be pencil beams.
  • In accordance with yet further embodiments of the invention, emission of penetrating radiation in the first beam may be characterized by a first temporal period and emission of penetrating radiation in the second beam may be characterized by a second temporal period, the first and the second temporal periods offset by fixed phase relationship. The temporal period of each source may be characterized by a duty cycle, and the emission of adjacent sources may be characterized by a phase relationship with respect to an adjacent source, where the phase relationship may equal to 2π times the duty cycle.
  • In accordance with yet further embodiments of the invention, the inspection system may further including a display for displaying a scatter image of material disposed within the inspected object.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The foregoing features of the invention will be more readily understood by reference to the following detailed description, taken with reference to the accompanying drawings, in which:
  • FIG. 1 shows a schematic cross sectional view of an x-ray inspection system that uses multiple backscatter imaging systems in accordance with embodiments of the present invention; and
  • FIG. 2 shows a side view of the x-ray inspection system embodiments of FIG. 1.
  • DETAILED DESCRIPTION OF SPECIFIC EMBODIMENTS
  • In accordance with embodiments of the present invention, beam cross talk is minimized between or among multiple flying-spot backscatter imaging systems configured as a multi-view backscatter inspection system, with no restriction on the distance between the individual imaging systems. In other words, in a multi-view system comprised of individual backscatter imaging systems for each view, the individual imaging systems can be placed as close together as is physically possible, while cross talk is advantageously reduced or eliminated.
  • Methods and advantages of backscatter inspection of a moving vehicle by illuminating the vehicles with x-rays from either above or beneath the moving vehicle are described in U.S. Pat. No. 6,249,567, issued Jun. 19, 2001, which is incorporated herein by reference. In accordance with preferred embodiments of the present invention, regions of enhanced backscatter that arise due to materials concealed close to the side walls of a vehicle are revealed without requiring that penetrating radiation traverse the vehicle during the course of inspection.
  • FIG. 1 shows a schematic cross-sectional view of the elements of an inspection system, designated generally by numeral 10. An object of inspection 18, which may be animate or inanimate, moves, or is moved, in a direction into, or out of, the page and thus traverses a portal 12. Portal 12 supports a plurality of sources 13, 15, and 17 of penetrating radiation. Sources 13, 15, and 17 are typically x-ray tubes having beam forming and steering mechanisms known in the art. For example, source 13 emits penetrating radiation in a beam 23 having a cross-section of a specified shape. For scatter imaging applications, a narrow pencil beam is typically employed. Beam 23 of penetrating radiation, may be, for example, a beam of x-rays such as a polychromatic x-ray beam. While source 13 of penetrating radiation is preferably an x-ray tube, for example, however other sources of penetrating radiation, such as a linac (linear accelerator), are within the scope of the present invention, and, indeed, the penetrating radiation is not limited to x-ray radiation and may include gamma ray radiation.
  • A scanning mechanism is provided for scanning beam 23 along a substantially vertical axis, such that, during a portion of a duty cycle, beam 23 is directed in a series of directions such as 24. Object 18 that is to be inspected moves past beam 23 in a substantially horizontal direction, into the page, in the depiction of FIG. 1. In alternate embodiments of the invention, the source and/or other portions of the inspection system may be moved in relation to object 18, which may be moving itself, or stationary.
  • Source 13 may include a scanning mechanism such as a flying spot rotating chopper wheel as known to persons skilled in the art. Alternatively, electromagnetic scanners may be employed, such as those described in U.S. Pat. No. 6,421,420, issued Jul. 23, 2002 and entitled “Method and Apparatus for Generating Sequential Beams of Penetrating Radiation,” which is incorporated herein by reference.
  • Beams of sources 15 and 17 are shown in typical extremal positions of their respective scans, and are labeled 25, 26, 27, and 28. Inspected object 18, which, as discussed, may refer to a vehicle, a container, or a person, for example, may be self-propelled through beams 23-28 or may be conveyed by a mechanized conveyor or pulled by a tractor, etc. In alternate embodiments of the invention, the inspection system, configured, for example, as a portal, may move, or be moved, over an object such as a vehicle that may, itself, be moving or stationary.
  • Beams 23-28 will be referred to in the present description, without limitation, as x-ray beams. In accordance with preferred embodiments of the invention, a rotating chopper wheel is used to develop a pencil beam 23-28 which may be swept in a plane substantially parallel to that of the page. The cross section of pencil beam 23 is of comparable extent in each dimension and is typically substantially circular, although it may be many shapes. The dimensions of pencil beam 23-28 typically define the scatter image resolution which may be obtained with the system. Other shapes of beam cross section may be advantageously employed in particular applications.
  • A detector arrangement, typified by scatter detector 31, is disposed in a plane parallel to the direction of motion of object 18 during the course of the scan. X-rays 30 scattered by Compton scattering out of beam 24 in an essentially backward direction are detected by one or more backscatter detectors 31 disposed between source 13 and object 18. Additional detector arrangements 32, 33, 34, 35, and 36 may be used supplementarily for detecting x-rays Compton-scattered from beam 24 and similarly, as will presently be described, for each of the other beams incident, in turn, on inspected object 18.
  • Additionally, transmission detectors disposed distally to the inspected object 18 with respect to the emitting source may be used to augment the scatter image or images with an image of the object as obtained in transmitted x-rays, for example, the detector elements designated 35 and 36 detect the emission of source 13 as transmitted through the inspected object. In another embodiment of the invention, a single separate detector is disposed between the pair of scatter detectors 35 and the pair of scatter detectors 36 and is employed for detection of penetrating radiation transmitted through object 18.
  • Within the scope of the invention, any x-ray detection technology known in the art may be employed for the detector arrangements 31-36. The detectors may be scintillation materials, either solid or liquid or gaseous, viewed by photo-sensitive detectors such as photomultipliers or solid state detectors. Liquid scintillators may be doped with tin or other element or elements of high atomic number. Respective output signals from the scatter detectors 31-36 are transmitted to a processor 40, and processed to obtain images of feature 42 inside the inspected object 18. Since incident x-ray photons are scattered by scattering sources within object 18 into all directions, detectors with large areas are used to maximize the collection of the scattered photons. In accordance with certain embodiments of the invention, processor 40 (otherwise referred to herein as a ‘controller’) may also be employed to derive other characteristics of the scattering object, such as its mass, mass density, effective atomic number, etc., all as known in the art.
  • In order to allow views of the inspected object from multiple directions, multiple sources 13-17 are used to irradiate the inspected object. However, since the photons emitted by each source are scattered in all directions, care must be exercised in order to eliminate cross-talk, i.e., the misidentification of the source of irradiation. In accordance with embodiments of the present invention, cross talk is advantageously reduced or eliminated by ensuring that only one imager is emitting radiation at a time. First, the duty-cycle of the beams emitted from the imaging systems is set less-than or equal-to the inverse of the number of imaging systems, or views, in the multi-view system. For example, if the number of views desired is six, each imaging system is set for a duty cycle of ⅙, or less.
  • Next, the phase relationship between each pair of adjacent sources is set to 2π times the duty cycle. This results in sequenced radiation emission from the imagers, eliminating the possibility of concurrent emission from more than one imager. For example, a multi-view inspection system with 6 sources would require that they run at the same frequency, that their duty-cycles be ⅙, and that their phase relationship be 2π/6, or 60 degrees.
  • In cases where flying-spot systems are realized by mechanical means such as rotating hoops and chopper wheels, these aforesaid criteria may be met by synchronization of the motion of the mechanical chopper elements, biased by phase offsets. Thus, for example, where collimators are rotated to define the path of emergent x-ray beam 23, close-loop motion controller systems known in the art may be employed to drive the rotation of the collimators. The duty cycle is controlled by setting the fan aperture (the total sweep angle of a beam, i.e., the angle between extremal beams 23 and 24 of a single source), equal to 2π times the duty cycle. In systems where the emitted radiation can be controlled electronically, any desired sequence of irradiation or range of sweep may be set, without limitation, entirely by electronic or software control.
  • By virtue of temporal sequencing which reduces or eliminates cross-talk, sources may be placed in greater proximity than otherwise possible. In particular, sources 13-17 may be disposed in a single plane, which advantageously permits virtually simultaneous on/off control of the x-rays regardless of the speed with which the object is passing by the imagers.
  • The system described may advantageously provide for an image to be derived from the perspective of each successive source 13-17. FIG. 1 shows an exemplary three-view system, with beams 23, 25, etc. each sweeping trajectories that are coplanar.
  • The beams from each imager sweep in sequence, such that no more than one imager is emitting radiation at a time. Thus, source (or ‘imager’) 13 sweeps its beam first. Radiation scattered from the object, as represented by rays 44, is received by all of the detectors. The signals from each of the detectors are acquired as separate channels by an acquisition system. This process is repeated for each of the three imagers, creating “slices” of the object as it moves by.
  • Referring now to FIG. 2, a side view is shown of the arrangement of FIG. 1, with elements designated by corresponding numbers. A slot 50 is shown through which the beam of source 13 passes through segments 52 and 54 of detector 31 as object 18 is scanned while moving in a lateral direction 16.
  • The signals from the detectors can be selectively used to reconstruct an image of the object. Since scattered photons 44 detected by detectors 33 and 34 from source 13 are as useful as scattered photons from source 17, these same detectors can be shared among all sources, and result in improved scatter collection with efficient use of the detector hardware.
  • Embodiments of this invention, furthermore, may advantageously allow multi-view Flying-Spot X-ray Scatter imaging to be practiced in a smaller operational footprint by eliminating cross talk, and by allowing closer positioning of the individual imagers for each view. The close positioning of these imagers (where an “imager” refers to a source, at least one detector, and associated electronics and signal processing) may also allow sharing of scatter detectors between, or among, imagers, allowing more scatter collection for improved image quality, with efficient use of detector hardware.
  • In applications where scanning of selective regions of the object is desired, co-planar positioning of the imagers allows simultaneous on/off control of the x-rays regardless of the speed with which the object is passing by the imagers. This greatly simplifies the design of the control of x-ray emissions from each imager in the multi-view inspection system, thus individual sequencing of x-ray emissions need not be performed as is typically practiced in systems in which emission is not co-planar.
  • Besides imaging contents of concealing enclosures, in terms of which embodiments of the present invention have been described, other characteristics of inspected objects may be obtained within the scope of the present invention. For example, backscatter techniques may be applied, as known in the art, for deriving mass, mass density, mass distribution, mean atomic number, or likelihood of containing targeted threat material.
  • In accordance with certain embodiments of the invention, x-rays having maximal energies in the range between 160 keV and 300 keV are employed. At this energy, x-rays penetrate into a vehicle, and organic objects inside the Vehicle can be detected. Since lower doses of x-ray irradiation are thus possible, automobiles may be scanned using the present invention. For applications where the scanned vehicle may contain personnel, end point energies below 300 keV are preferred. The scope of the present invention, however, is not limited by the range of penetrating photons employed.
  • The described embodiments of the invention are intended to be merely exemplary and numerous variations and modifications will be apparent to those skilled in the art. All such variations and modifications are intended to be within the scope of the present invention as defined in the appended claims.

Claims (18)

1. An inspection system for inspecting an object characterized by motion in a direction with respect to the inspection system, the system comprising:
a. a first pencil-beam source for providing a first beam of penetrating radiation of specified cross-section directed in a first beam direction substantially transverse to the direction of motion of the object;
b. a second pencil-beam source for providing a second beam of penetrating radiation of specified cross-section substantially coplanar with, and substantially perpendicular to, the first beam of penetrating radiation, directed in a second beam direction, and temporally interspersed with the first beam of penetrating radiation;
c. a plurality of scatter detectors each scatter detector of which is disposed so as to detect radiation scattered from both the first beam and the second beam by any scattering material within the inspected object and for generating a scattered radiation signal; and
d. a controller for creating an image of the scattering material based solely on the scattered radiation signal.
2. The inspection system as set forth in claim 1, wherein the inspection system is spatially fixed.
3. (canceled)
4. The inspection system as set forth in claim 1, wherein the first source of penetrating radiation is an x-ray source.
5. (canceled)
6. The inspection system as set forth in claim 1, wherein the first source of penetrating radiation includes a beam scanning mechanism.
7. The inspection system as set forth in claim 6, wherein the beam scanning mechanism is a rotating chopper wheel.
8. The inspection system as set forth in claim 6, wherein the beam scanning mechanism includes an electromagnetic scanner.
9. (canceled)
10. The inspection system as set forth in claim 1, wherein emission of penetrating radiation in the first beam is characterized by a first temporal period and emission of penetrating radiation in the second beam is characterized by a second temporal period, the first and the second temporal periods offset by fixed phase relationship.
11. The inspection system as set forth in claim 10, wherein the temporal period of each source is characterized by a duty cycle.
12. The inspection system as set forth in claim 11, wherein the temporal period of each source is characterized by phase relationship with respect to an adjacent source equal to 2π times the duty cycle.
13. (canceled)
14. The inspection system as set forth in claim 1, further comprising at least one transmission detector for detecting at least one of the first beam and the second beam as transmitted through the inspected object and for generating a transmitted radiation signal.
15. A method for inspecting an object, the method comprising:
a. illuminating the object with penetrating radiation formed into a first pencil beam;
b. illuminating the object with penetrating radiation formed into a second pencil beam, the second pencil beam substantially coplanar with the first pencil beam, at a fixed and substantially perpendicular orientation with respect to the first pencil beam, and temporally interspersed with respect to the first pencil beam;
c. detecting radiation from the first pencil beam and the second pencil beam scattered by the object with at least one detector that detects scattering from both the first and the second pencil beams to generate a scattered radiation signal; and
d. imaging the object solely on the basis of the scattered radiation signal.
16. A method according to claim 15, further including:
e. varying the orientation of the first pencil beam with respect to the object.
17. A method according to claim 15, further including:
e. displaying a scatter image of the scattered radiation signal.
18. (canceled)
US11/097,092 2004-04-09 2005-04-01 Backscatter inspection portal Active US7400701B1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
US11/097,092 US7400701B1 (en) 2004-04-09 2005-04-01 Backscatter inspection portal
US12/171,020 US7593506B2 (en) 2004-04-09 2008-07-10 Backscatter inspection portal
US12/272,056 US7809109B2 (en) 2004-04-09 2008-11-17 Multiple image collection and synthesis for personnel screening
US12/687,762 US7796734B2 (en) 2004-04-09 2010-01-14 Multiple image collection and synthesis for personnel screening
US12/897,197 US20110017917A1 (en) 2004-04-09 2010-10-04 Multiple Image Collection and Synthesis for Personnel Screening
US13/047,878 US8605859B2 (en) 2004-04-09 2011-03-15 Multiple image collection and synthesis for personnel screening
US14/057,564 US9020100B2 (en) 2004-04-09 2013-10-18 Multiple image collection and synthesis for personnel screening

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US56107904P 2004-04-09 2004-04-09
US11/097,092 US7400701B1 (en) 2004-04-09 2005-04-01 Backscatter inspection portal

Related Child Applications (3)

Application Number Title Priority Date Filing Date
US11/737,317 Continuation US7505562B2 (en) 2004-04-09 2007-04-19 X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams
US12/171,020 Continuation US7593506B2 (en) 2004-04-09 2008-07-10 Backscatter inspection portal
US12/171,020 Continuation-In-Part US7593506B2 (en) 2004-04-09 2008-07-10 Backscatter inspection portal

Publications (2)

Publication Number Publication Date
US20080152081A1 true US20080152081A1 (en) 2008-06-26
US7400701B1 US7400701B1 (en) 2008-07-15

Family

ID=34968330

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/097,092 Active US7400701B1 (en) 2004-04-09 2005-04-01 Backscatter inspection portal
US12/171,020 Active US7593506B2 (en) 2004-04-09 2008-07-10 Backscatter inspection portal

Family Applications After (1)

Application Number Title Priority Date Filing Date
US12/171,020 Active US7593506B2 (en) 2004-04-09 2008-07-10 Backscatter inspection portal

Country Status (16)

Country Link
US (2) US7400701B1 (en)
EP (1) EP1733213B1 (en)
JP (2) JP4689663B2 (en)
KR (1) KR101000182B1 (en)
CN (1) CN1947001B (en)
AT (1) ATE458994T1 (en)
DE (1) DE602005019552D1 (en)
DK (1) DK1733213T3 (en)
ES (1) ES2338899T3 (en)
HK (1) HK1104181A1 (en)
IL (1) IL178284A (en)
NO (1) NO20064614L (en)
PL (1) PL1733213T3 (en)
PT (1) PT1733213E (en)
RU (1) RU2444723C2 (en)
WO (1) WO2005098400A2 (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120069963A1 (en) * 2010-08-06 2012-03-22 Telesecurity Sciences, Inc. Dual energy backscatter x-ray shoe scanning device
US20120221275A1 (en) * 2011-02-28 2012-08-30 Yokogawa Electric Corporation Radiation inspection apparatus
WO2017044484A1 (en) * 2015-09-08 2017-03-16 American Science And Engineering, Inc. Backscatter imaging for precision agriculture
US10942291B2 (en) 2011-02-08 2021-03-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
US10976465B2 (en) 2002-07-23 2021-04-13 Rapiscan Systems, Inc. Two-sided, multi-energy imaging system and method for the inspection of cargo
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11300703B2 (en) 2015-03-20 2022-04-12 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
US11525930B2 (en) 2018-06-20 2022-12-13 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
US11536672B2 (en) 2015-09-08 2022-12-27 American Science And Engineering, Inc. Systems and methods for using backscatter imaging in precision agriculture
US11550077B2 (en) 2013-01-31 2023-01-10 Rapiscan Systems, Inc. Portable vehicle inspection portal with accompanying workstation
US11579327B2 (en) 2012-02-14 2023-02-14 American Science And Engineering, Inc. Handheld backscatter imaging systems with primary and secondary detector arrays

Families Citing this family (93)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
GB0525593D0 (en) * 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7809109B2 (en) * 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
WO2007006042A2 (en) * 2005-07-05 2007-01-11 L-3 Communications Security And Detection Systems, Inc. Methods and apparatus for e-beam scanning
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
RU2448342C2 (en) * 2006-08-11 2012-04-20 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Object inspection system (versions)
US7492861B2 (en) 2006-10-13 2009-02-17 Tsinghua University Apparatus and method for quick imaging and inspecting moving target
US8638904B2 (en) 2010-03-14 2014-01-28 Rapiscan Systems, Inc. Personnel screening system
US8995619B2 (en) 2010-03-14 2015-03-31 Rapiscan Systems, Inc. Personnel screening system
US7796733B2 (en) * 2007-02-01 2010-09-14 Rapiscan Systems, Inc. Personnel security screening system with enhanced privacy
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
US20080253522A1 (en) * 2007-04-11 2008-10-16 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Tool associated with compton scattered X-ray visualization, imaging, or information provider
US8837677B2 (en) * 2007-04-11 2014-09-16 The Invention Science Fund I Llc Method and system for compton scattered X-ray depth visualization, imaging, or information provider
US20080253526A1 (en) * 2007-04-11 2008-10-16 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Geometric compton scattered x-ray visualizing, imaging, or information providing
US8041006B2 (en) * 2007-04-11 2011-10-18 The Invention Science Fund I Llc Aspects of compton scattered X-ray visualization, imaging, or information providing
US7742567B2 (en) * 2007-04-11 2010-06-22 Searete Llc Compton scattered X-ray visualization, imaging, or information provider with time of flight computation
US20080253525A1 (en) * 2007-04-11 2008-10-16 Boyden Edward S Compton scattered x-ray visualizing, imaging, or information providing of at least some dissimilar matter
US7711089B2 (en) * 2007-04-11 2010-05-04 The Invention Science Fund I, Llc Scintillator aspects of compton scattered X-ray visualization, imaging, or information providing
CN103064125B (en) * 2007-06-21 2016-01-20 瑞皮斯坎系统股份有限公司 For improving the system and method for the people screening guided
RU2010131017A (en) * 2007-12-25 2012-02-10 Рапискан Системз, Инк. (Us) IMPROVED SECURITY SYSTEM FOR PREVENTING PEOPLE
GB0803641D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
GB0809109D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Scanner systems
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
GB0809107D0 (en) * 2008-05-20 2008-06-25 Rapiscan Security Products Inc Scannign systems
GB0810638D0 (en) 2008-06-11 2008-07-16 Rapiscan Security Products Inc Photomultiplier and detection systems
US8963094B2 (en) 2008-06-11 2015-02-24 Rapiscan Systems, Inc. Composite gamma-neutron detection system
US8130904B2 (en) 2009-01-29 2012-03-06 The Invention Science Fund I, Llc Diagnostic delivery service
US8041008B2 (en) 2009-01-29 2011-10-18 The Invention Science Fund I, Llc Diagnostic delivery service
US9310323B2 (en) 2009-05-16 2016-04-12 Rapiscan Systems, Inc. Systems and methods for high-Z threat alarm resolution
US8275092B1 (en) 2009-06-15 2012-09-25 American Science And Engineering, Inc. Three-dimensional mapping based on scattered penetrating radiation
CN102484935B (en) 2009-07-13 2015-02-04 拉皮斯坎系统股份有限公司 Four-sided imaging system and method for detection of contraband
WO2011011583A1 (en) * 2009-07-24 2011-01-27 Nucsafe, Inc. Spatial sequenced backscatter portal
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
PL2459991T3 (en) * 2009-07-29 2020-01-31 American Science & Engineering, Inc. Top-down x-ray inspection trailer
US20110142201A1 (en) * 2009-12-15 2011-06-16 General Electric Company Multi-view imaging system and method
CA2793225A1 (en) 2010-03-14 2011-09-22 Rapiscan Systems, Inc. Multiple screen detection systems
US8848871B2 (en) * 2010-11-04 2014-09-30 Ut-Battelle, Llc X-ray backscatter imaging of nuclear materials
US8908831B2 (en) 2011-02-08 2014-12-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
RU2550319C2 (en) * 2011-02-08 2015-05-10 Американ Сайенс Энд Инжиниринг, Инк. Backscatter energy analysis for classification of materials based on positional non-commutativity
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
US8761338B2 (en) 2011-06-20 2014-06-24 The Boeing Company Integrated backscatter X-ray system
US9151721B2 (en) 2011-06-20 2015-10-06 The Boeing Company Integrated backscatter X-ray system
CN102393399B (en) * 2011-08-24 2015-10-28 屈俊健 The forming apparatus of X ray flying spot and method
WO2013036735A1 (en) 2011-09-07 2013-03-14 Rapiscan Systems, Inc. X-ray inspection system that integrates manifest data with imaging/detection processing
US8855268B1 (en) * 2011-11-01 2014-10-07 The Boeing Company System for inspecting objects underwater
CN104170051B (en) * 2012-02-03 2017-05-31 拉皮斯坎系统股份有限公司 Combination scattering and the imaging multiple views system of transmission
CN104204854B (en) 2012-02-14 2017-05-10 美国科技工程公司 X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors
CN103308535B (en) * 2012-03-09 2016-04-13 同方威视技术股份有限公司 For equipment and the method for ray scanning imaging
US9123450B2 (en) 2012-04-30 2015-09-01 The Boeing Company Single beam backscatter x-ray system
US8879688B2 (en) * 2012-05-22 2014-11-04 The Boeing Company Reconfigurable detector system
CN103901494B (en) * 2012-12-27 2017-08-29 同方威视技术股份有限公司 Human body back scattering safe examination system and its method
US9778391B2 (en) * 2013-03-15 2017-10-03 Varex Imaging Corporation Systems and methods for multi-view imaging and tomography
CA2919159A1 (en) 2013-07-23 2015-01-29 Rapiscan Systems, Inc. Methods for improving processing speed for object inspection
CN104340627B (en) * 2013-07-23 2017-03-01 同方威视技术股份有限公司 Vehicle drive system, vehicle double mode by system with inspection system
US9519853B2 (en) 2013-11-01 2016-12-13 James P Tolle Wearable, non-visible identification device for friendly force identification and intruder detection
US9557427B2 (en) 2014-01-08 2017-01-31 Rapiscan Systems, Inc. Thin gap chamber neutron detectors
RO130582B1 (en) * 2014-01-23 2021-12-30 Mb Telecom Ltd. S.R.L. System and method for complete and non-intrusive inspection of aircrafts
WO2015134802A1 (en) 2014-03-07 2015-09-11 Rapiscan Systems, Inc. Ultra wide band detectors
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
US9867271B2 (en) 2014-05-16 2018-01-09 American Science And Engineering, Inc. Source for intra-pulse multi-energy X-ray cargo inspection
US11266006B2 (en) 2014-05-16 2022-03-01 American Science And Engineering, Inc. Method and system for timing the injections of electron beams in a multi-energy x-ray cargo inspection system
WO2016003547A1 (en) 2014-06-30 2016-01-07 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
CN104101910A (en) * 2014-07-04 2014-10-15 清华大学 Distributed radiation source-based X-ray backscattering channel type vehicle security system and method
CN104062688A (en) * 2014-07-04 2014-09-24 同方威视技术股份有限公司 X-ray back scattering channel type vehicle security check system and method based on distributed radiation sources
US9594033B2 (en) * 2014-07-22 2017-03-14 The Boeing Company Visible X-ray indication and detection system for X-ray backscatter applications
KR20170109533A (en) 2014-11-25 2017-09-29 라피스캔 시스템스, 인코포레이티드 Intelligent security management system
WO2017015549A1 (en) * 2015-07-22 2017-01-26 UHV Technologies, Inc. X-ray imaging and chemical analysis of plant roots
US9989483B2 (en) * 2015-08-17 2018-06-05 The Boeing Company Systems and methods for performing backscatter three dimensional imaging from one side of a structure
GB2559500B (en) 2015-09-10 2022-02-23 American Science & Eng Inc Backscatter characterization using interlinearly adaptive electromagnetic x-ray scanning
US10345479B2 (en) 2015-09-16 2019-07-09 Rapiscan Systems, Inc. Portable X-ray scanner
EP3420563A4 (en) 2016-02-22 2020-03-11 Rapiscan Systems, Inc. Systems and methods for detecting threats and contraband in cargo
CN107280700B (en) * 2016-03-31 2023-06-20 通用电气公司 CT imaging equipment and method, X-ray receiving and transmitting assembly for CT imaging equipment
CN109791811A (en) 2016-09-30 2019-05-21 美国科学及工程股份有限公司 X-ray source for the imaging of 2D scanning light beam
CN106526688A (en) * 2016-12-28 2017-03-22 同方威视技术股份有限公司 Back scattering inspection vehicle
US10600609B2 (en) 2017-01-31 2020-03-24 Rapiscan Systems, Inc. High-power X-ray sources and methods of operation
CN106841256B (en) * 2017-02-17 2023-11-21 清华大学 Multi-view back-scattering inspection system and multi-view back-scattering inspection method
CN108227027B (en) * 2017-12-29 2020-12-01 同方威视技术股份有限公司 Vehicle-mounted backscatter inspection system
CN108008458B (en) * 2017-12-29 2020-09-08 同方威视技术股份有限公司 Vehicle-mounted backscatter inspection system
CN109521480A (en) * 2019-01-04 2019-03-26 同方威视科技(北京)有限公司 Radiation examination device and radiation testing method
US11212902B2 (en) 2020-02-25 2021-12-28 Rapiscan Systems, Inc. Multiplexed drive systems and methods for a multi-emitter X-ray source
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
EP4298433A1 (en) 2021-02-23 2024-01-03 Rapiscan Systems, Inc. Systems and methods for eliminating cross-talk in scanning systems having multiple x-ray sources
WO2024030046A1 (en) * 2022-08-01 2024-02-08 Obshhestvo S Ogranichennoj Otvetstvennost`Yu "Indikom" (Ooo "Indikom") Method for determining the spatial profile of inspected objects

Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4799247A (en) * 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
US5181234A (en) * 1990-08-06 1993-01-19 Irt Corporation X-ray backscatter detection system
US5638420A (en) * 1996-07-03 1997-06-10 Advanced Research And Applications Corporation Straddle inspection system
US5696806A (en) * 1996-03-11 1997-12-09 Grodzins; Lee Tomographic method of x-ray imaging
US5930326A (en) * 1996-07-12 1999-07-27 American Science And Engineering, Inc. Side scatter tomography system
US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
US6081580A (en) * 1997-09-09 2000-06-27 American Science And Engineering, Inc. Tomographic inspection system
US6094472A (en) * 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
US6151381A (en) * 1998-01-28 2000-11-21 American Science And Engineering, Inc. Gated transmission and scatter detection for x-ray imaging
US6192104B1 (en) * 1998-11-30 2001-02-20 American Science And Engineering, Inc. Fan and pencil beams from a common source for x-ray inspection
US6212251B1 (en) * 1997-12-03 2001-04-03 Kabushiki Kaisha Toshiba Helical scanning type X-ray CT apparatus with movable gantry
US6249567B1 (en) * 1998-12-01 2001-06-19 American Science & Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
US6421420B1 (en) * 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
US6442233B1 (en) * 1998-06-18 2002-08-27 American Science And Engineering, Inc. Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
US6459761B1 (en) * 2000-02-10 2002-10-01 American Science And Engineering, Inc. Spectrally shaped x-ray inspection system
US6473487B1 (en) * 2000-12-27 2002-10-29 Rapiscan Security Products, Inc. Method and apparatus for physical characteristics discrimination of objects using a limited view three dimensional reconstruction
US6556653B2 (en) * 2000-05-25 2003-04-29 University Of New Brunswick Non-rotating X-ray system for three-dimensional, three-parameter imaging
US6567496B1 (en) * 1999-10-14 2003-05-20 Sychev Boris S Cargo inspection apparatus and process
US6876719B2 (en) * 2002-10-01 2005-04-05 Kabushiki Kaisha Toshiba X-ray CT apparatus
US6879657B2 (en) * 2002-05-10 2005-04-12 Ge Medical Systems Global Technology, Llc Computed tomography system with integrated scatter detectors
US7103137B2 (en) * 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK131955C (en) 1973-10-09 1976-02-23 I Leunbach PROCEDURE AND SYSTEM FOR DETERMINING THE ELECTRONITY OF A PART VOLUME OF A BODY
US4064440A (en) 1976-06-22 1977-12-20 Roder Frederick L X-ray or gamma-ray examination device for moving objects
DE2939146A1 (en) 1979-09-27 1981-04-16 Philips Patentverwaltung Gmbh, 2000 Hamburg METHOD FOR EXAMINING A BODY WITH Pervasive RADIATION
US4525854A (en) 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
US4809312A (en) 1986-07-22 1989-02-28 American Science And Engineering, Inc. Method and apparatus for producing tomographic images
GB8623196D0 (en) 1986-09-26 1986-10-29 Robinson M Visual screening system
DE8717508U1 (en) 1987-10-19 1989-01-05 Heimann Gmbh, 6200 Wiesbaden, De
US4825454A (en) 1987-12-28 1989-04-25 American Science And Engineering, Inc. Tomographic imaging with concentric conical collimator
US4864142A (en) 1988-01-11 1989-09-05 Penetron, Inc. Method and apparatus for the noninvasive interrogation of objects
US5022062A (en) * 1989-09-13 1991-06-04 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy using histogram processing
US5179581A (en) 1989-09-13 1993-01-12 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy
US5247561A (en) 1991-01-02 1993-09-21 Kotowski Andreas F Luggage inspection device
JPH04344491A (en) * 1991-05-21 1992-12-01 Toshiba Corp Radioscopic examining device
JPH05133909A (en) * 1991-11-15 1993-05-28 Toshiba Corp Scattered radiation inspecting apparatus
GB9200828D0 (en) * 1992-01-15 1992-03-11 Image Research Ltd Improvements in and relating to material identification using x-rays
DE4215343A1 (en) 1992-05-09 1993-11-11 Philips Patentverwaltung Filter method for an X-ray system and arrangement for carrying out such a filter method
JPH05323039A (en) * 1992-05-21 1993-12-07 Toshiba Corp Radiation inspector
JPH06138252A (en) * 1992-10-28 1994-05-20 Toshiba Corp X-ray inspection device
US5430787A (en) 1992-12-03 1995-07-04 The United States Of America As Represented By The Secretary Of Commerce Compton scattering tomography
US5600303A (en) 1993-01-15 1997-02-04 Technology International Incorporated Detection of concealed explosives and contraband
DE4311174C2 (en) 1993-04-05 1996-02-15 Heimann Systems Gmbh & Co X-ray inspection system for containers and trucks
DE19532965C2 (en) 1995-09-07 1998-07-16 Heimann Systems Gmbh & Co X-ray inspection system for large-volume goods
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
WO1998003889A1 (en) 1996-07-22 1998-01-29 American Science And Engineering, Inc. System for rapid x-ray inspection of enclosures
US5763886A (en) 1996-08-07 1998-06-09 Northrop Grumman Corporation Two-dimensional imaging backscatter probe
US5974111A (en) 1996-09-24 1999-10-26 Vivid Technologies, Inc. Identifying explosives or other contraband by employing transmitted or scattered X-rays
WO1998020366A1 (en) 1996-11-08 1998-05-14 American Science And Engineering, Inc. Coded aperture x-ray imaging system
US5912460A (en) 1997-03-06 1999-06-15 Schlumberger Technology Corporation Method for determining formation density and formation photo-electric factor with a multi-detector-gamma-ray tool
US6236709B1 (en) 1998-05-04 2001-05-22 Ensco, Inc. Continuous high speed tomographic imaging system and method
RU2158917C2 (en) * 1998-08-24 2000-11-10 АОЗТ "Технологии металлургии" Ore-controlling plant
US6130931A (en) * 1998-09-17 2000-10-10 Process Control, Inc. X-ray fluorescence elemental analyzer
US6459764B1 (en) 1999-01-27 2002-10-01 American Science And Engineering, Inc. Drive-through vehicle inspection system
US6546072B1 (en) * 1999-07-30 2003-04-08 American Science And Engineering, Inc. Transmission enhanced scatter imaging
RU2193185C2 (en) * 2000-10-02 2002-11-20 Общество с ограниченной ответственностью Научно-производственная фирма "ТАПЕКО" Method of detection of diamonds on conveyer in flow or in specimen of diamond-bearing rock
RU2225018C2 (en) * 2002-04-22 2004-02-27 Российский научный центр "Курчатовский институт" Technique detecting objects in upper layers of ground, specifically, infantry mines
US7162005B2 (en) 2002-07-19 2007-01-09 Varian Medical Systems Technologies, Inc. Radiation sources and compact radiation scanning systems
JP2004108912A (en) * 2002-09-18 2004-04-08 Hitachi Ltd Detecting apparatus using neutron and its method
US7333587B2 (en) 2004-02-27 2008-02-19 General Electric Company Method and system for imaging using multiple offset X-ray emission points
US20070009088A1 (en) 2005-07-06 2007-01-11 Edic Peter M System and method for imaging using distributed X-ray sources

Patent Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4799247A (en) * 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
US5181234A (en) * 1990-08-06 1993-01-19 Irt Corporation X-ray backscatter detection system
US5181234B1 (en) * 1990-08-06 2000-01-04 Rapiscan Security Products Inc X-ray backscatter detection system
US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
US5696806A (en) * 1996-03-11 1997-12-09 Grodzins; Lee Tomographic method of x-ray imaging
US5638420A (en) * 1996-07-03 1997-06-10 Advanced Research And Applications Corporation Straddle inspection system
US5930326A (en) * 1996-07-12 1999-07-27 American Science And Engineering, Inc. Side scatter tomography system
US6081580A (en) * 1997-09-09 2000-06-27 American Science And Engineering, Inc. Tomographic inspection system
US6212251B1 (en) * 1997-12-03 2001-04-03 Kabushiki Kaisha Toshiba Helical scanning type X-ray CT apparatus with movable gantry
US6151381A (en) * 1998-01-28 2000-11-21 American Science And Engineering, Inc. Gated transmission and scatter detection for x-ray imaging
US6094472A (en) * 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
US6442233B1 (en) * 1998-06-18 2002-08-27 American Science And Engineering, Inc. Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
US6192104B1 (en) * 1998-11-30 2001-02-20 American Science And Engineering, Inc. Fan and pencil beams from a common source for x-ray inspection
US6421420B1 (en) * 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
US6249567B1 (en) * 1998-12-01 2001-06-19 American Science & Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
US6567496B1 (en) * 1999-10-14 2003-05-20 Sychev Boris S Cargo inspection apparatus and process
US6459761B1 (en) * 2000-02-10 2002-10-01 American Science And Engineering, Inc. Spectrally shaped x-ray inspection system
US6556653B2 (en) * 2000-05-25 2003-04-29 University Of New Brunswick Non-rotating X-ray system for three-dimensional, three-parameter imaging
US6473487B1 (en) * 2000-12-27 2002-10-29 Rapiscan Security Products, Inc. Method and apparatus for physical characteristics discrimination of objects using a limited view three dimensional reconstruction
US6879657B2 (en) * 2002-05-10 2005-04-12 Ge Medical Systems Global Technology, Llc Computed tomography system with integrated scatter detectors
US7103137B2 (en) * 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
US6876719B2 (en) * 2002-10-01 2005-04-05 Kabushiki Kaisha Toshiba X-ray CT apparatus

Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10976465B2 (en) 2002-07-23 2021-04-13 Rapiscan Systems, Inc. Two-sided, multi-energy imaging system and method for the inspection of cargo
US11143783B2 (en) 2002-07-23 2021-10-12 Rapiscan Systems, Inc. Four-sided imaging system and method for detection of contraband
US20120069963A1 (en) * 2010-08-06 2012-03-22 Telesecurity Sciences, Inc. Dual energy backscatter x-ray shoe scanning device
US9036782B2 (en) * 2010-08-06 2015-05-19 Telesecurity Sciences, Inc. Dual energy backscatter X-ray shoe scanning device
US11822041B2 (en) 2011-02-08 2023-11-21 Rapiscan Systems, Inc. Systems and methods for improved atomic-number based material discrimination
US10942291B2 (en) 2011-02-08 2021-03-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
US11307325B2 (en) 2011-02-08 2022-04-19 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
US9194823B2 (en) * 2011-02-28 2015-11-24 Yokogawa Electric Corporation Radiation inspection apparatus
US20120221275A1 (en) * 2011-02-28 2012-08-30 Yokogawa Electric Corporation Radiation inspection apparatus
US11579327B2 (en) 2012-02-14 2023-02-14 American Science And Engineering, Inc. Handheld backscatter imaging systems with primary and secondary detector arrays
US11550077B2 (en) 2013-01-31 2023-01-10 Rapiscan Systems, Inc. Portable vehicle inspection portal with accompanying workstation
US11300703B2 (en) 2015-03-20 2022-04-12 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US11561320B2 (en) 2015-03-20 2023-01-24 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US10712293B2 (en) 2015-09-08 2020-07-14 American Science And Engineering, Inc. Backscatter imaging for precision agriculture
US11536672B2 (en) 2015-09-08 2022-12-27 American Science And Engineering, Inc. Systems and methods for using backscatter imaging in precision agriculture
GB2558464B (en) * 2015-09-08 2021-09-01 American Science & Eng Inc Backscatter imaging for precision agriculture
US10955367B2 (en) 2015-09-08 2021-03-23 American Science And Engineering, Inc. Backscatter imaging for precision agriculture
GB2558464A (en) * 2015-09-08 2018-07-11 American Science & Eng Inc Backscatter imaging for precision agriculture
WO2017044484A1 (en) * 2015-09-08 2017-03-16 American Science And Engineering, Inc. Backscatter imaging for precision agriculture
US11927551B2 (en) 2015-09-08 2024-03-12 American Science And Engineering, Inc. Systems and methods for using backscatter imaging in precision agriculture
US11525930B2 (en) 2018-06-20 2022-12-13 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
US11726218B2 (en) 2020-11-23 2023-08-15 American Science arid Engineering, Inc. Methods and systems for synchronizing backscatter signals and wireless transmission signals in x-ray scanning

Also Published As

Publication number Publication date
HK1104181A1 (en) 2008-01-04
JP2010133977A (en) 2010-06-17
PT1733213E (en) 2010-05-27
KR101000182B1 (en) 2010-12-10
PL1733213T3 (en) 2010-07-30
DE602005019552D1 (en) 2010-04-08
WO2005098400A3 (en) 2005-11-24
RU2444723C2 (en) 2012-03-10
NO20064614L (en) 2007-01-09
RU2006133625A (en) 2008-03-27
CN1947001B (en) 2011-04-20
US20080310591A1 (en) 2008-12-18
JP2007532876A (en) 2007-11-15
WO2005098400A2 (en) 2005-10-20
IL178284A (en) 2010-12-30
EP1733213A2 (en) 2006-12-20
DK1733213T3 (en) 2010-05-03
IL178284A0 (en) 2006-12-31
ATE458994T1 (en) 2010-03-15
ES2338899T3 (en) 2010-05-13
JP4689663B2 (en) 2011-05-25
KR20060132990A (en) 2006-12-22
US7593506B2 (en) 2009-09-22
EP1733213B1 (en) 2010-02-24
US7400701B1 (en) 2008-07-15
CN1947001A (en) 2007-04-11

Similar Documents

Publication Publication Date Title
US7400701B1 (en) Backscatter inspection portal
US7103137B2 (en) Radiation scanning of objects for contraband
US7356115B2 (en) Radiation scanning units including a movable platform
US6453007B2 (en) X-ray inspection using co-planar pencil and fan beams
US6459764B1 (en) Drive-through vehicle inspection system
US6192104B1 (en) Fan and pencil beams from a common source for x-ray inspection
EP2963455B1 (en) X-ray backscattering safety inspection system having distributed x-ray source and method using the same
US7869566B2 (en) Integrated multi-sensor systems for and methods of explosives detection
US7672426B2 (en) Radiation scanning units with reduced detector requirements
GB2518309A (en) Multi-view cargo scanner
US20100166285A1 (en) System and method for acquiring image data
CN109691238B (en) System and method for improving penetration of a radiological imaging scanner
MXPA06011443A (en) Eliminating cross-talk in a backscatter inspection portal comprising multiples sources by ensuring that only one source is emitting radiation at a time

Legal Events

Date Code Title Description
AS Assignment

Owner name: AMERICAN SCIENCE AND ENGINEERING, INC., MASSACHUSE

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:CASON, W. RANDALL;REEL/FRAME:016584/0762

Effective date: 20050511

AS Assignment

Owner name: SILICON VALLEY BANK, DBA SILICON VALLEY EAST, CALI

Free format text: SECURITY AGREEMENT;ASSIGNOR:AMERICAN SCIENCE AND ENGINEERING, INC.;REEL/FRAME:018590/0738

Effective date: 20061116

STCF Information on status: patent grant

Free format text: PATENTED CASE

CC Certificate of correction
AS Assignment

Owner name: AMERICAN SCIENCE AND ENGINEERING, INC., MASSACHUSE

Free format text: RELEASE;ASSIGNOR:SILICON VALLEY BANK;REEL/FRAME:023556/0069

Effective date: 20091118

FPAY Fee payment

Year of fee payment: 4

FPAY Fee payment

Year of fee payment: 8

FEPP Fee payment procedure

Free format text: PAT HOLDER NO LONGER CLAIMS SMALL ENTITY STATUS, ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: STOL); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

AS Assignment

Owner name: WELLS FARGO BANK, AS ADMINISTRATIVE AGENT, NORTH C

Free format text: SECURITY INTEREST;ASSIGNOR:AMERICAN SCIENCE AND ENGINEERING, INC.;REEL/FRAME:040305/0233

Effective date: 20101015

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 12

IPR Aia trial proceeding filed before the patent and appeal board: inter partes review

Free format text: TRIAL NO: IPR2021-01585

Opponent name: VIKEN DETECTION CORPORATION

Effective date: 20210930