US20110069306A1 - Referenced Inspection Device - Google Patents
Referenced Inspection Device Download PDFInfo
- Publication number
- US20110069306A1 US20110069306A1 US12/994,793 US99479309A US2011069306A1 US 20110069306 A1 US20110069306 A1 US 20110069306A1 US 99479309 A US99479309 A US 99479309A US 2011069306 A1 US2011069306 A1 US 2011069306A1
- Authority
- US
- United States
- Prior art keywords
- substrate
- tool
- air bearing
- tool head
- pressure source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Abstract
A tool for investigating a substrate, where the tool has a tool head for investigating the substrate, a chuck for disposing an upper surface of the substrate in proximity to the tool head, and an air bearing disposed on the tool head adjacent the substrate. The air bearing has a pressure source and a vacuum source, where the vacuum source draws the substrate toward the air bearing and the pressure source prevents the substrate from physically contacting the air bearing. The pressure source and the vacuum source work in cooperation to dispose the upper surface of the substrate at a known distance from the tool head. By using the air bearing as part of the tool in this manner, registration of the substrate to the tool head is accomplished relative to the upper surface of the substrate, not the back side of the substrate.
Description
- This application claims all rights and priority on U.S. provisional application Ser. No. 61/059,861 filed Jun. 6, 2008 and PCT application serial number PCT/US2009/045704 filed May 5, 2009. This invention relates to the field of integrated circuit fabrication. More particularly, this invention relates to registration of tool heads to substrate surfaces.
- During integrated circuit fabrication processes, the integrated circuits typically receive a variety of different surface inspections and measurements, such as optical inspections and measurement. As the term is used herein, “integrated circuit” includes devices such as those formed on monolithic semiconducting substrates, such as those formed of group IV materials like silicon or germanium, or group III-V compounds like gallium arsenide, or mixtures of such materials. The term includes all types of devices formed, such as memory and logic, and all designs of such devices, such as MOS and bipolar. The term also comprehends applications such as flat panel displays, solar cells, and charge coupled devices.
- The term “tool” as used herein generally refers to inspection or measurement systems used in the integrated circuit fabrication industry. The term “investigation” as used herein generally refers to the process of inspection or measurement as used in the integrated circuit fabrication industry. As used herein, the term “substrate” refers to the substrates on which the integrated circuits are fabricated, the masks or reticles from which the patterns used to form the integrated circuits are transferred, and other types of substrates as used in the integrated circuit fabrication industry.
- Current methods of investigation typically reference the backside of the substrate to a chuck while inspecting the front side of the substrate. In other words, the backside of the substrate is placed on the surface of a chuck, which is then brought into some kind of alignment with the operative head of the tool. The tool is most frequently designed to investigate the top surface of the substrate. Assumptions are made in the operation of the tool, such as that the chuck is flat and moves in a level manner, that the substrate is of a known and uniform thickness, and other such. These assumptions are used to align the head of the tool to the top surface of the substrate, when the position of the chuck is known.
- This method is vulnerable to inconsistencies in the flatness of the chuck, variances in substrate geometry that affect the height of the substrate, and other problems that make the assumptions invalid. For example, if the substrate thickness varies from what is assumed, then the distance between the head and the top surface of the substrate will vary across the substrate—unbeknownst to the tool. Similarly, if the chuck height varies from what is assumed, then the distance between the head and the top surface of the substrate will vary across the chuck—unbeknownst to the tool.
- This situation is typically resolved by using an active focusing mechanism to compensate for height changes as the substrate is moved with respect to the tool head. A typical auto-focus mechanism, including a control system, can cost thousands of dollars to implement, and many times that to engineer, especially when considering software development costs. History has proven that these are problematic mechanisms when implemented with the accuracy and repeatability that are expected by the customer. As customers demand faster through-put, the auto-focus mechanism needs to respond faster as well. Because they are mechanical in nature, these mechanisms have limited response times, which often are not sufficient to meet the through-put demanded. Some inspection systems have such large optical elements that moving them to track height variations at a high speed is just not a realistic option.
- What is needed, therefore, is a system that overcomes problems such as those described above, at least in part.
- The above and other needs are met by a tool for investigating a substrate, where the tool has a tool head for investigating the substrate, a chuck for disposing an upper surface of the substrate in proximity to the tool head, and an air bearing disposed on the tool head adjacent the substrate. The air bearing has a pressure source and a vacuum source, where the vacuum source draws the substrate toward the air bearing and the pressure source prevents the substrate from physically contacting the air bearing. The pressure source and the vacuum source work in cooperation to dispose the upper surface of the substrate at a known distance from the tool head.
- By using the air bearing as part of the tool in this manner, registration of the substrate to the tool head is accomplished relative to the upper surface of the substrate, not the back side of the substrate. Because it is the upper surface of the substrate that will be investigated, the registration is more accurate and does not rely on the assumptions made above. However, the substrate is not damaged by the tool head, because the air bearing prevents physical contact between the air bearing or the tool head and the upper surface of the substrate.
- In various embodiments, the tool is an integrated circuit inspection tool or an integrated circuit measurement tool. In some embodiments the tool performs optical-based investigations of the substrate, and in some embodiments the tool performs electrical-based investigations of the substrate. The substrate in various embodiments is a semiconductor substrate with integrated circuits at least partially formed thereon, or a mask with integrated circuit patterns formed thereon.
- In some embodiments the air bearing is formed of a porous material through which the pressure source is delivered, where the porous material forms annular channels through which the vacuum source is delivered. In other embodiments the air bearing is formed of a porous material through which the pressure source is delivered, where the porous material forms substantially evenly spaced voids through which the vacuum source is delivered. In some embodiments the air bearing is formed of a non-porous material that forms first channels through which the pressure source is delivered, and second channels through which the vacuum source is delivered.
- In some embodiments the tool head investigates the substrate through an orifice formed in a central location of the air bearing, and in other embodiments the orifice is formed in a peripheral location of the air bearing. In some embodiments retention pieces on the chuck substantially retain the substrate at desired positions within an x-y plane adjacent the air bearing, while allowing the air bearing to adjust the desired positions of the substrate in a z axis to the known distance from the tool head. In some embodiments the chuck imparts translational, rotational, and elevational movement to the substrate relative to the tool head.
- Further advantages of the invention are apparent by reference to the detailed description when considered in conjunction with the figures, which are not to scale so as to more clearly show the details, wherein like reference numbers indicate like elements throughout the several views, and wherein:
-
FIG. 1 is a cross sectional depiction of a tool according to an embodiment of the present invention. -
FIG. 2 is a cross sectional depiction of a tool head and air bearing according to an embodiment of the present invention. -
FIG. 3 is a cross sectional depiction of an air bearing according to a first embodiment of the present invention. -
FIG. 4 is a cross sectional depiction of an air bearing according to a second embodiment of the present invention. -
FIG. 5 is a cross sectional depiction of air bearings according to a third and fourth embodiment of the present invention. -
FIG. 6 is a cross sectional depiction of an air bearing according to a fifth embodiment of the present invention. -
FIG. 7 is a cross sectional depiction of an air bearing according to a sixth embodiment of the present invention. -
FIG. 8 is a cross sectional depiction of an air bearing according to a seventh embodiment of the present invention. - With reference now to
FIG. 1 , there is depicted atool 10, including atool head 20,chuck 14 andspindle 18. Asubstrate 12 is disposed on thechuck 14, and is brought via relative motion to be under thetool head 20. A vacuum preloaded air bearing 22 at the end of thetool head 20 is used to reference the top side of thesubstrate 12. Thechuck 14 includesmovable substrate 12retention pieces 16, which allow thesubstrate 12 to move up and down to some extent, so that the vertical registration of thesubstrate 12 with reference to thetool head 20 is accomplished to a fine degree with the air bearing 22, and only to a gross degree with thechuck 14. In other words, thechuck 14 brings thesubstrate 12 adjacent thehead 20, and the air bearing 22 adjusts the vertical distance of the upper surface of thesubstrate 12 to thetool head 20. Theretention pieces 16 in one embodiment hold thesubstrate 12 substantially fixed in rotation and translation, but not in elevation. - The air bearing 22 in one embodiment is attached directly to the
tool head 20, such as amicroscope objective 28 within atool head orifice 30, as depicted inFIG. 2 , and thesubstrate 12 to be inspected is then brought to thetool head 20. Once thesubstrate 12 is brought close enough to the air bearing 22, a vacuum provided alongvacuum source 26 pulls thesubstrate 12 closer to thehead 20 while a pressure provided alongpressure source 24 pushes thesubstrate 12 away, until the distance between thesubstrate 12 and the air bearing 22 creates an equilibrium condition with respect to thevacuum 26 and thepressure 24. - In this manner, the
substrate 12 is held in a very precise vertical position regardless of the geometry of thesubstrate 12, because the upper surface of thesubstrate 12 is mechanically referenced to thetool head 20. Because the air bearing 22 applies a pressure force that increases as the gap decreases between thesubstrate 12 and the air bearing 22, there is only a very low probability of thesubstrate 12 ever actually contacting the air bearing 22, and damaging the surface of thesubstrate 12. Thus, this method of referencing the surface of thesubstrate 12 is essentially a non contact method. Further, filtering the gas in thepressure source 24 makes this method substantially compatible with highly contamination sensitive applications. - The
air bearing 22 in some embodiments forms a substantially hermetic seal between thetool head orifice 30 formed in theair bearing 22 and an environment exterior to theair bearing 22. This enables a vacuum to be drawn within thetool head orifice 30, such as would be used for certain types oftools 10, such as an electron microscope. Theair bearing 22 in some embodiments forms a contamination barrier between thetool head orifice 30 formed in theair bearing 22, and an environment exterior to theair bearing 22. In this manner, contaminants—such as particulate or vapor contamination—will not interfere with the proper operation of thetool 10. - Different configurations of the
air bearing 22 are depicted inFIGS. 3-6 . InFIG. 3 , theair bearing 22 hasannular vacuum sources 26 disposed within a porous media in which thepressure sources 24 are formed, with thetool head orifice 30 disposed in the center of theair bearing 22.FIG. 4 depicts another embodiment of theair bearing 22, where thepressure sources 24 are disposed within a porous media in which thevacuum sources 26 are disposed. Atool head orifice 30 is centrally disposed in this embodiment as well. - In the embodiments depicted, it is appreciated that the
pressure sources 24 and thevacuum sources 26 could be switched as to any of the specific configurations. Alternately, in some embodiments some of the openings in the block material of theair bearing 22 arepressure sources 24 and some of the openings arevacuum sources 26. - With reference now to
FIGS. 5 and 6 , there are depicted some alternate embodiments of theair bearing 22, where thetool head orifice 30 is not disposed in the center of theair bearing 22.FIGS. 7-8 provide some detail as to other embodiments of a configuration of thepressure source 24 and thevacuum source 26. - Similar methods could be performed with
alternate air bearing 22 technologies, which utilize either porous media or orifices, as described above. In one embodiment an electrostatic chuck with alternating charge areas is used in vacuum environments. In yet another embodiment, magnetic levitation is used in a non contact manner of registering thesubstrate 12 to thetool head 20. - The embodiments as described above can be used for
substrate 12 inspection and measurement tools. As the industry demands finer and finer resolution, it is a reality that depth of field gets smaller and smaller. This requires extremelyflat chucks 14 to hold thesubstrates 12 and extremely precise mechanisms to transport them under thetool head 20 at a precisely controlled height. The mechanisms described herein can be attached directly to atool head 20, thereby reducing the precision necessary in thechuck 14 andtransport mechanism 18, while eliminating the costly auto focus mechanisms that would otherwise be required to compensate forsubstrate 12 and chuck 14 thickness and geometry variations. - The foregoing description of preferred embodiments for this invention has been presented for purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form disclosed. Obvious modifications or variations are possible in light of the above teachings. The embodiments are chosen and described in an effort to provide the best illustrations of the principles of the invention and its practical application, and to thereby enable one of ordinary skill in the art to utilize the invention in various embodiments and with various modifications as are suited to the particular use contemplated. All such modifications and variations are within the scope of the invention as determined by the appended claims when interpreted in accordance with the breadth to which they are fairly, legally, and equitably entitled.
Claims (20)
1. A tool for investigating a substrate, the tool comprising:
a tool head for investigating the substrate,
a chuck for disposing an upper surface of the substrate in proximity to the tool head, and
an air bearing disposed on the tool head adjacent the substrate, the air bearing having a pressure source and a vacuum source, the vacuum source for drawing the substrate toward the air bearing and the pressure source for preventing the substrate from physically contacting the air bearing, where the pressure source and the vacuum source work in cooperation to dispose the upper surface of the substrate at a known distance from the tool head.
2. The tool of claim 1 , wherein the air bearing forms a substantially hermetic seal between an interior orifice formed in the air bearing and an environment exterior to the air bearing.
3. The tool of claim 1 , wherein the air bearing forms a contamination barrier between an interior orifice formed in the air bearing and an environment exterior to the air bearing.
4. The tool of claim 1 , wherein the tool is an integrated circuit inspection tool.
5. The tool of claim 1 , wherein the tool is an integrated circuit measurement tool.
6. The tool of claim 1 , wherein the tool performs optical-based investigations of the substrate.
7. The tool of claim 1 , wherein the tool performs electrical-based investigations of the substrate.
8. The tool of claim 1 , wherein the substrate is a semiconductor substrate with integrated circuits at least partially formed thereon.
9. The tool of claim 1 , wherein the substrate is a mask with integrated circuit patterns formed thereon.
10. The tool of claim 1 , wherein the air bearing is formed of a porous material through which the pressure source is delivered, the porous material forming annular channels through which the vacuum source is delivered.
11. The tool of claim 1 , wherein the air bearing is formed of a porous material through which the pressure source is delivered, the porous material forming substantially evenly spaced voids through which the vacuum source is delivered.
12. The tool of claim 1 , wherein the air bearing is formed of a non-porous material that forms first channels through which the pressure source is delivered, and second channels through which the vacuum source is delivered.
13. The tool of claim 1 , wherein the tool head investigates the substrate through an orifice formed in a central location of the air bearing.
14. The tool of claim 1 , wherein the tool head investigates the substrate through an orifice formed in a peripheral location of the air bearing.
15. The tool of claim 1 , further comprising retention pieces on the chuck for substantially retaining the substrate at desired positions within an x-y plane adjacent the air bearing, while allowing the air bearing to adjust the desired positions of the substrate in a z axis to the known distance from the tool head.
16. The tool of claim 1 , wherein the chuck imparts translational, rotational, and elevational movement to the substrate relative to the tool head.
17. A tool for investigating a substrate, the tool comprising:
a tool head for investigating the substrate,
a chuck for disposing an upper surface of the substrate in proximity to the tool head,
an air bearing disposed on the tool head adjacent the substrate, the air bearing having a pressure source and a vacuum source, the vacuum source for drawing the substrate toward the air bearing and the pressure source for preventing the substrate from physically contacting the air bearing, where the pressure source and the vacuum source work in cooperation to dispose the upper surface of the substrate at a known distance from the tool head, and
retention pieces on the chuck for substantially retaining the substrate at desired positions within an x-y plane adjacent the air bearing, while allowing the air bearing to adjust the desired positions of the substrate in a z axis to the known distance from the tool head.
18. The tool of claim 17 , wherein the tool is an integrated circuit inspection tool.
19. The tool of claim 17 , wherein the tool is an integrated circuit measurement tool.
20. An optical inspection tool for inspecting a substrate, the tool comprising:
an optical tool head for inspecting the substrate,
a chuck for disposing an upper surface of the substrate in proximity to the tool head, wherein the chuck imparts translational, rotational, and elevational movement to the substrate relative to the tool head,
an air bearing disposed on the tool head adjacent the substrate, the air bearing having a pressure source and a vacuum source, the vacuum source for drawing the substrate toward the air bearing and the pressure source for preventing the substrate from physically contacting the air bearing, where the pressure source and the vacuum source work in cooperation to dispose the upper surface of the substrate at a known distance from the tool head, wherein the air bearing is formed of a porous material through which the pressure source is delivered, the porous material forming annular channels through which the vacuum source is delivered, and
retention pieces on the chuck for substantially retaining the substrate at desired positions within an x-y plane adjacent the air bearing, while allowing the air bearing to adjust the desired positions of the substrate in a z axis to the known distance from the tool head.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/994,793 US20110069306A1 (en) | 2008-06-09 | 2009-05-29 | Referenced Inspection Device |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US5986108P | 2008-06-09 | 2008-06-09 | |
PCT/US2009/045704 WO2009151984A2 (en) | 2008-06-09 | 2009-05-29 | Referenced inspection device |
US12/994,793 US20110069306A1 (en) | 2008-06-09 | 2009-05-29 | Referenced Inspection Device |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2009/045704 A-371-Of-International WO2009151984A2 (en) | 2008-06-09 | 2009-05-29 | Referenced inspection device |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/226,032 Continuation US8817250B2 (en) | 2008-06-09 | 2011-09-06 | Air bearing for substrate inspection device |
Publications (1)
Publication Number | Publication Date |
---|---|
US20110069306A1 true US20110069306A1 (en) | 2011-03-24 |
Family
ID=41417359
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/994,793 Abandoned US20110069306A1 (en) | 2008-06-09 | 2009-05-29 | Referenced Inspection Device |
US13/226,032 Active 2029-08-20 US8817250B2 (en) | 2008-06-09 | 2011-09-06 | Air bearing for substrate inspection device |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/226,032 Active 2029-08-20 US8817250B2 (en) | 2008-06-09 | 2011-09-06 | Air bearing for substrate inspection device |
Country Status (4)
Country | Link |
---|---|
US (2) | US20110069306A1 (en) |
JP (1) | JP5461534B2 (en) |
KR (1) | KR101634825B1 (en) |
WO (1) | WO2009151984A2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130067956A1 (en) * | 2011-08-24 | 2013-03-21 | Richard Hagan | Apparatus and method for characterizing glass sheets |
US10804133B2 (en) * | 2017-11-21 | 2020-10-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Article transferring method in semiconductor fabrication |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5620574B2 (en) * | 2010-06-07 | 2014-11-05 | カスケード マイクロテックインコーポレイテッドCascade Microtech,Incorporated | High voltage chuck for probe station |
US10451542B2 (en) | 2017-12-05 | 2019-10-22 | Nanometrics Incorporated | Local purge within metrology and inspection systems |
TWI794731B (en) * | 2021-01-15 | 2023-03-01 | 由田新技股份有限公司 | Air floatation platform and optical inspection system comprising thereof |
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-
2009
- 2009-05-29 KR KR1020117000561A patent/KR101634825B1/en active IP Right Grant
- 2009-05-29 US US12/994,793 patent/US20110069306A1/en not_active Abandoned
- 2009-05-29 JP JP2011512548A patent/JP5461534B2/en active Active
- 2009-05-29 WO PCT/US2009/045704 patent/WO2009151984A2/en active Application Filing
-
2011
- 2011-09-06 US US13/226,032 patent/US8817250B2/en active Active
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US20040207838A1 (en) * | 2001-04-30 | 2004-10-21 | Martin Ebert | Wafer chuck with integrated reference sample |
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US20130067956A1 (en) * | 2011-08-24 | 2013-03-21 | Richard Hagan | Apparatus and method for characterizing glass sheets |
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US10804133B2 (en) * | 2017-11-21 | 2020-10-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Article transferring method in semiconductor fabrication |
US11251063B2 (en) | 2017-11-21 | 2022-02-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Article transporter in semiconductor fabrication |
Also Published As
Publication number | Publication date |
---|---|
WO2009151984A3 (en) | 2010-03-18 |
JP2011523215A (en) | 2011-08-04 |
US8817250B2 (en) | 2014-08-26 |
KR20110033998A (en) | 2011-04-04 |
US20120062877A1 (en) | 2012-03-15 |
KR101634825B1 (en) | 2016-06-29 |
JP5461534B2 (en) | 2014-04-02 |
WO2009151984A2 (en) | 2009-12-17 |
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Legal Events
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AS | Assignment |
Owner name: KLA-TENCOR CORPORATION, CALIFORNIA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:DOYLE, PAUL;ZHAO, GUOHENG;BELYAEV, ALEXANDER;AND OTHERS;SIGNING DATES FROM 20090528 TO 20090529;REEL/FRAME:025423/0869 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |