US20120270474A1 - Polishing pad wear detecting apparatus - Google Patents
Polishing pad wear detecting apparatus Download PDFInfo
- Publication number
- US20120270474A1 US20120270474A1 US13/090,284 US201113090284A US2012270474A1 US 20120270474 A1 US20120270474 A1 US 20120270474A1 US 201113090284 A US201113090284 A US 201113090284A US 2012270474 A1 US2012270474 A1 US 2012270474A1
- Authority
- US
- United States
- Prior art keywords
- polishing pad
- detecting apparatus
- arm
- wear detecting
- pad wear
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
Definitions
- the invention generally relates to a detecting apparatus of a chemical mechanical polishing (CMP) apparatus, and more particularly, to a polishing pad wear detecting apparatus.
- CMP chemical mechanical polishing
- the planarization of the chip then depends on the chemical mechanical polishing (CMP) process.
- CMP chemical mechanical polishing
- the unique anisotropic polishing property of the CMP process is not only used for the planarization of the surface contour of the chip, but can also be applied in the fabrication of damascene structures of perpendicular and horizontal metal interconnections, the fabrication of shallow trench isolations in devices and the fabrication of advanced devices in the previous stage, and the fabrication of micro-electromechanical system planarization and the fabrication of flat displays, etc.
- the CMP process mainly utilizes a reagent in the polishing slurry for generating a chemical reaction on the front side of the wafer to faun a polishable layer. Further, with the wafer on the polishing pad, the protruding portions of the polishable layer are polished off by the mechanical polishing with the facilitation of abrasive particles in the polishing slurry. The chemical reactions and the mechanical polishing are then repeated to form a planar surface.
- the polishing pad in the CMP process is consumptive and will be worn off during the polishing process.
- the number of wafers that can be polished by using a single polishing pad is set in advance, and a polishing pad is replaced once the preset number of wafers has been polished by using the polishing pad.
- a polishing pad replacement rule cannot reflect the actual wear status of a polishing pad. If the polishing pad is already worn off and should not be used anymore before the number of wafers polished by using the polishing pad reaches the preset number, the polishing efficiency will be reduced if this polishing pad is still used for polishing more wafers. If the wear status of the polishing pad is not serious and the polishing pad can be further used after the polishing pad has been used for polishing the preset number of wafers, the consumptive material cost will be increased by replacing the polishing pad.
- the invention is directed to a polishing pad wear detecting apparatus that can precisely detect the wear status of a polishing pad in real time.
- the invention provides a polishing pad wear detecting apparatus adaptable to a chemical mechanical polishing (CMP) apparatus.
- the polishing pad wear detecting apparatus includes an arm and a height detector. One end of the arm is fastened on the CMP apparatus.
- the height detector is disposed on the arm for detecting the height variation of a polishing pad.
- the arm in the polishing pad wear detecting apparatus, may be fastened on the CMP apparatus through pivoting to allow the arm to scan above the polishing pad.
- the length of the arm may allow the height detector to be located above a central spot of the polishing pad.
- the material of the arm may be a rigid material.
- the height detector may be a non-contact height detector or a contact height detector.
- the non-contact height detector may be an electromagnetic impedance detecting device, a laser transmitting and receiving device, or an ultrasound transmitting and receiving device.
- the contact height detector may be a stylus device.
- the height detector disposed on the arm can detect the height variation of a polishing pad in real time. Accordingly, the wear status of the polishing pad can be precisely detected in real time.
- FIG. 1 is a diagram illustrating how a chemical mechanical polishing (CMP) apparatus polishes a wafer according to an embodiment of the invention.
- CMP chemical mechanical polishing
- FIG. 2 is a side view of FIG. 1 , wherein the wafer is not illustrated.
- FIG. 1 is a diagram illustrating how a chemical mechanical polishing (CMP) apparatus polishes a wafer according to an embodiment of the invention.
- FIG. 2 is a side view of FIG. 1 , wherein the wafer is not illustrated.
- CMP chemical mechanical polishing
- the polishing pad wear detecting apparatus 100 is adaptable to a CMP apparatus 200 .
- a substrate being polished is a wafer W, for example.
- the CMP apparatus 200 includes a carrier 202 and a polishing pad 204 .
- the polishing pad 204 is disposed on the carrier 202 and includes a polish area 206 and a non-polish area 208 .
- the wafer W is placed within the polish area 206 of the polishing pad 204 to be polished.
- the part of the polishing pad 204 within the non-polish area 208 does not contact the wafer W, and therefore the part of the polishing pad 204 within the non-polish area 208 won't be worn off.
- the CMP apparatus 200 may further include other components, such as a rotating plate and a polishing slurry conveying pipe. Since these components are well known to those having ordinary knowledge in the art therefore are not illustrated in FIG. 1 and will not be described.
- the polishing pad wear detecting apparatus 100 includes an arm 102 and a height detector 104 .
- One end of the arm 102 is fastened on the CMP apparatus 200 .
- the arm 102 may be fastened on the CMP apparatus 200 through pivoting to allow the arm 102 to scan above the polishing pad 204 .
- the arm 102 may be pivoted onto the carrier 202 of the CMP apparatus 200 by using a supporting shaft 106 , but the invention is not limited thereto.
- the length of the arm 102 may allow the height detector 104 to be located above the central spot of the polishing pad 204 .
- the central spot of the polishing pad 204 may be the non-polish area 208 of the polishing pad 204 .
- the arm 102 may be made of a rigid material.
- the height detector 104 is disposed on the arm 102 for detecting a height variation ⁇ H of the polishing pad 204 .
- the height detector 104 may be a non-contact height detector or a contact height detector.
- the non-contact height detector may be an electromagnetic impedance detecting device, a laser transmitting and receiving device, or an ultrasound transmitting and receiving device, and the contact height detector may be a stylus device.
- the polishing pad 204 rotates along the direction D, the polish area 206 and the non-polish area 208 of the polishing pad 204 are scanned by using the height detector 104 disposed on the arm 102 , and the height variation ⁇ H at each position on the polishing pad 204 is detected based on the height of the non-polish area 208 of the polishing pad 204 .
- the wear status of the polishing pad 204 can be precisely detected in real time according to the height variation ⁇ H of the polishing pad 204 detected by the polishing pad wear detecting apparatus 100 . Accordingly, the appropriate time for replacing the polishing pad 204 can be correctly determined.
- the polishing pad wear detecting apparatus 100 can help to determine the appropriate time for replacing the polishing pad 204 , so as to prevent the worn-out polishing pad 204 with low polishing efficiency from being still utilized for the polishing process, and to reduce the replacement cost by preventing any usable polishing pad 204 from being replaced untimely.
- the polishing pad wear detecting apparatus in an embodiment of the invention has at least following features:
- the polishing pad wear detecting apparatus can precisely detect the wear status of a polishing pad in real time
- the appropriate time for replacing a polishing pad can be determined by using the polishing pad wear detecting apparatus.
Abstract
A polishing pad wear detecting apparatus suitable for a chemical mechanical polishing (CMP) apparatus is provided. The polishing pad wear detecting apparatus includes an arm and a height detector. One end of the arm is fastened on the CMP apparatus. The height detector is disposed on the arm for detecting height variation of a polishing pad.
Description
- 1. Field of the Invention
- The invention generally relates to a detecting apparatus of a chemical mechanical polishing (CMP) apparatus, and more particularly, to a polishing pad wear detecting apparatus.
- 2. Description of Related Art
- Because the resolution of photolithography exposure increases along with the decrease in device size and the depth of field at exposure is reduced, the requirement to flatness of chip surface increases drastically. Thus, when performing the deep sub-micron process, the planarization of the chip then depends on the chemical mechanical polishing (CMP) process. The unique anisotropic polishing property of the CMP process is not only used for the planarization of the surface contour of the chip, but can also be applied in the fabrication of damascene structures of perpendicular and horizontal metal interconnections, the fabrication of shallow trench isolations in devices and the fabrication of advanced devices in the previous stage, and the fabrication of micro-electromechanical system planarization and the fabrication of flat displays, etc.
- The CMP process mainly utilizes a reagent in the polishing slurry for generating a chemical reaction on the front side of the wafer to faun a polishable layer. Further, with the wafer on the polishing pad, the protruding portions of the polishable layer are polished off by the mechanical polishing with the facilitation of abrasive particles in the polishing slurry. The chemical reactions and the mechanical polishing are then repeated to form a planar surface.
- The polishing pad in the CMP process is consumptive and will be worn off during the polishing process. When a specific product is polished, the number of wafers that can be polished by using a single polishing pad is set in advance, and a polishing pad is replaced once the preset number of wafers has been polished by using the polishing pad. However, such a polishing pad replacement rule cannot reflect the actual wear status of a polishing pad. If the polishing pad is already worn off and should not be used anymore before the number of wafers polished by using the polishing pad reaches the preset number, the polishing efficiency will be reduced if this polishing pad is still used for polishing more wafers. If the wear status of the polishing pad is not serious and the polishing pad can be further used after the polishing pad has been used for polishing the preset number of wafers, the consumptive material cost will be increased by replacing the polishing pad.
- Accordingly, the invention is directed to a polishing pad wear detecting apparatus that can precisely detect the wear status of a polishing pad in real time.
- The invention provides a polishing pad wear detecting apparatus adaptable to a chemical mechanical polishing (CMP) apparatus. The polishing pad wear detecting apparatus includes an arm and a height detector. One end of the arm is fastened on the CMP apparatus. The height detector is disposed on the arm for detecting the height variation of a polishing pad.
- According to an embodiment of the invention, in the polishing pad wear detecting apparatus, the arm may be fastened on the CMP apparatus through pivoting to allow the arm to scan above the polishing pad.
- According to an embodiment of the invention, in the polishing pad wear detecting apparatus, the length of the arm may allow the height detector to be located above a central spot of the polishing pad.
- According to an embodiment of the invention, in the polishing pad wear detecting apparatus, the material of the arm may be a rigid material.
- According to an embodiment of the invention, in the polishing pad wear detecting apparatus, the height detector may be a non-contact height detector or a contact height detector.
- According to an embodiment of the invention, in the polishing pad wear detecting apparatus, the non-contact height detector may be an electromagnetic impedance detecting device, a laser transmitting and receiving device, or an ultrasound transmitting and receiving device.
- According to an embodiment of the invention, in the polishing pad wear detecting apparatus, the contact height detector may be a stylus device.
- As described above, in a polishing pad wear detecting apparatus provided by the invention, the height detector disposed on the arm can detect the height variation of a polishing pad in real time. Accordingly, the wear status of the polishing pad can be precisely detected in real time.
- These and other exemplary embodiments, features, aspects, and advantages of the invention will be described and become more apparent from the detailed description of exemplary embodiments when read in conjunction with accompanying drawings.
- The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
-
FIG. 1 is a diagram illustrating how a chemical mechanical polishing (CMP) apparatus polishes a wafer according to an embodiment of the invention. -
FIG. 2 is a side view ofFIG. 1 , wherein the wafer is not illustrated. -
FIG. 1 is a diagram illustrating how a chemical mechanical polishing (CMP) apparatus polishes a wafer according to an embodiment of the invention.FIG. 2 is a side view ofFIG. 1 , wherein the wafer is not illustrated. - Referring to both
FIG. 1 andFIG. 2 , the polishing pad wear detectingapparatus 100 is adaptable to aCMP apparatus 200. In the present embodiment, a substrate being polished is a wafer W, for example. TheCMP apparatus 200 includes acarrier 202 and apolishing pad 204. Thepolishing pad 204 is disposed on thecarrier 202 and includes apolish area 206 and anon-polish area 208. The wafer W is placed within thepolish area 206 of thepolishing pad 204 to be polished. The part of thepolishing pad 204 within thenon-polish area 208 does not contact the wafer W, and therefore the part of thepolishing pad 204 within thenon-polish area 208 won't be worn off. In addition, theCMP apparatus 200 may further include other components, such as a rotating plate and a polishing slurry conveying pipe. Since these components are well known to those having ordinary knowledge in the art therefore are not illustrated inFIG. 1 and will not be described. - The polishing pad wear detecting
apparatus 100 includes anarm 102 and aheight detector 104. One end of thearm 102 is fastened on theCMP apparatus 200. Thearm 102 may be fastened on theCMP apparatus 200 through pivoting to allow thearm 102 to scan above thepolishing pad 204. For example, thearm 102 may be pivoted onto thecarrier 202 of theCMP apparatus 200 by using a supportingshaft 106, but the invention is not limited thereto. The length of thearm 102 may allow theheight detector 104 to be located above the central spot of thepolishing pad 204. The central spot of thepolishing pad 204 may be thenon-polish area 208 of thepolishing pad 204. Thearm 102 may be made of a rigid material. - The
height detector 104 is disposed on thearm 102 for detecting a height variation ΔH of thepolishing pad 204. Theheight detector 104 may be a non-contact height detector or a contact height detector. Herein, the non-contact height detector may be an electromagnetic impedance detecting device, a laser transmitting and receiving device, or an ultrasound transmitting and receiving device, and the contact height detector may be a stylus device. - According to the embodiment described above, when the wafer W is polished by using the
CMP apparatus 200, because thepolishing pad 204 rotates along the direction D, thepolish area 206 and thenon-polish area 208 of thepolishing pad 204 are scanned by using theheight detector 104 disposed on thearm 102, and the height variation ΔH at each position on thepolishing pad 204 is detected based on the height of thenon-polish area 208 of thepolishing pad 204. Thus, the wear status of thepolishing pad 204 can be precisely detected in real time according to the height variation ΔH of thepolishing pad 204 detected by the polishing pad wear detectingapparatus 100. Accordingly, the appropriate time for replacing thepolishing pad 204 can be correctly determined. - In addition, the polishing pad wear detecting
apparatus 100 can help to determine the appropriate time for replacing thepolishing pad 204, so as to prevent the worn-outpolishing pad 204 with low polishing efficiency from being still utilized for the polishing process, and to reduce the replacement cost by preventing anyusable polishing pad 204 from being replaced untimely. - In summary, the polishing pad wear detecting apparatus in an embodiment of the invention has at least following features:
- 1. The polishing pad wear detecting apparatus can precisely detect the wear status of a polishing pad in real time;
- 2. The appropriate time for replacing a polishing pad can be determined by using the polishing pad wear detecting apparatus.
- It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.
Claims (7)
1. A polishing pad wear detecting apparatus, suitable for a chemical mechanical polishing (CMP) apparatus, the polishing pad wear detecting apparatus comprising:
an arm, wherein one end of the arm is fastened on the CMP apparatus; and
a height detector, disposed on the arm, for detecting a height variation of a polishing pad.
2. The polishing pad wear detecting apparatus according to claim 1 , wherein the arm is fastened on the CMP apparatus through pivoting to allow the arm to scan above the polishing pad.
3. The polishing pad wear detecting apparatus according to claim 1 , wherein a length of the arm allows the height detector to be located above a central spot of the polishing pad.
4. The polishing pad wear detecting apparatus according to claim 1 , wherein a material of the arm comprises a rigid material.
5. The polishing pad wear detecting apparatus according to claim 1 , wherein the height detector comprises a non-contact height detector or a contact height detector.
6. The polishing pad wear detecting apparatus according to claim 5 , wherein the non-contact height detector comprises an electromagnetic impedance detecting device, a laser transmitting and receiving device, or an ultrasound transmitting and receiving device.
7. The polishing pad wear detecting apparatus according to claim 5 , wherein the contact height detector comprises a stylus device.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/090,284 US20120270474A1 (en) | 2011-04-20 | 2011-04-20 | Polishing pad wear detecting apparatus |
TW100115166A TW201243277A (en) | 2011-04-20 | 2011-04-29 | Polishing pad wear detecting apparatus |
CN2011101443906A CN102744677A (en) | 2011-04-20 | 2011-05-31 | Polishing pad wear detecting apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/090,284 US20120270474A1 (en) | 2011-04-20 | 2011-04-20 | Polishing pad wear detecting apparatus |
Publications (1)
Publication Number | Publication Date |
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US20120270474A1 true US20120270474A1 (en) | 2012-10-25 |
Family
ID=47021686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/090,284 Abandoned US20120270474A1 (en) | 2011-04-20 | 2011-04-20 | Polishing pad wear detecting apparatus |
Country Status (3)
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US (1) | US20120270474A1 (en) |
CN (1) | CN102744677A (en) |
TW (1) | TW201243277A (en) |
Cited By (4)
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JP2014091190A (en) * | 2012-11-02 | 2014-05-19 | Toho Engineering Kk | Service life detection method for abrasive pad |
JP2015208840A (en) * | 2014-04-30 | 2015-11-24 | 株式会社荏原製作所 | Polishing device, jig for measuring abrasive pad profile, and method for measuring abrasive pad profile |
US10525566B2 (en) | 2016-10-18 | 2020-01-07 | Samsung Electronics Co., Ltd. | Preparing conditioning disk for chemical mechanical polishing and chemical mechanical polishing method including the same |
CN115946042A (en) * | 2022-12-27 | 2023-04-11 | 西安奕斯伟材料科技有限公司 | Polishing device and working method thereof |
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WO2020028855A1 (en) * | 2018-08-02 | 2020-02-06 | Saint-Gobain Abrasives, Inc. | Abrasive article including a wear detection sensor |
US20200130136A1 (en) * | 2018-10-29 | 2020-04-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing apparatus and method |
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CN114227528B (en) * | 2021-12-07 | 2023-04-14 | 长江存储科技有限责任公司 | Chemical mechanical polishing apparatus |
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JP2014091190A (en) * | 2012-11-02 | 2014-05-19 | Toho Engineering Kk | Service life detection method for abrasive pad |
JP2015208840A (en) * | 2014-04-30 | 2015-11-24 | 株式会社荏原製作所 | Polishing device, jig for measuring abrasive pad profile, and method for measuring abrasive pad profile |
US10525566B2 (en) | 2016-10-18 | 2020-01-07 | Samsung Electronics Co., Ltd. | Preparing conditioning disk for chemical mechanical polishing and chemical mechanical polishing method including the same |
CN115946042A (en) * | 2022-12-27 | 2023-04-11 | 西安奕斯伟材料科技有限公司 | Polishing device and working method thereof |
Also Published As
Publication number | Publication date |
---|---|
TW201243277A (en) | 2012-11-01 |
CN102744677A (en) | 2012-10-24 |
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