US20120311415A1 - Method and device for detecting possible corruption of sector protection information of a non-volatile memory stored in an on board volatile memory array at power-on - Google Patents

Method and device for detecting possible corruption of sector protection information of a non-volatile memory stored in an on board volatile memory array at power-on Download PDF

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US20120311415A1
US20120311415A1 US13/589,509 US201213589509A US2012311415A1 US 20120311415 A1 US20120311415 A1 US 20120311415A1 US 201213589509 A US201213589509 A US 201213589509A US 2012311415 A1 US2012311415 A1 US 2012311415A1
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volatile memory
information
sector
protection information
preset logic
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US13/589,509
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Antonino Mondello
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Micron Technology Inc
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Micron Technology Inc
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/22Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52Protection of memory contents; Detection of errors in memory contents
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/20Address safety or protection circuits, i.e. arrangements for preventing unauthorized or accidental access
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0407Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on

Definitions

  • the present invention relates to non-volatile memory devices having a plurality of addressable sectors and an ancillary volatile memory array, and more particularly, to techniques for revealing corruption of stored volatile data in the ancillary memory array and preventing unauthorized modification of non-volatile data stored in protected sectors of the memory device.
  • Protection techniques for non-volatile stored data may be of two types.
  • a first type is the relatively unburdensome storing of volatile protection information. This is the generally adopted technique for preventing accidental alterations by the users of the permanently stored information in the memory device.
  • a second type is a far more burdensome storing of non-volatile protection information. This is where a dedicated inaccessible memory region becomes inevitable when, beside prevention of accidental alterations by authorized users of the stored data, the stored data needs to be protected from malicious deliberate actions by hackers and alike.
  • Non-volatile protection systems are far more critical to design because they need to resist deliberate hacker attempts to alter the content of a programmed non-volatile memory device or sector thereof to illegally enable the use of set top boxes, cellular phones and other mobile personal apparatuses.
  • FIG. 1 schematically depicts a volatile memory array on which sector protection information is stored
  • FIG. 2 schematically depicts a possible fraudulent modification of protection information stored in the volatile memory array.
  • the protection system imposes verification of the state of protection of the addressed sector before enabling any modification of data stored in it (programming or erasing operations). Such a verification is done by reading a dedicated or reserved region of non-volatile memory containing protection information on the distinct sectors that are not accessible to the user of the memory device. This ensures robustness of the protection system because the protection information recorded in the inaccessible non-volatile memory region is inalterable from outside or external the memory.
  • the method of protecting addressable sectors of a non-volatile memory device including an ancillary volatile memory array, for preventing illicit or unauthorized modification of stored non-volatile data by an external user comprises the steps of storing protection information on the addressable sectors of the non-volatile memory device in a dedicated non-volatile memory space inaccessible to external users of the device.
  • the permanently stored protection information is checked whenever modification of data stored in a certain memory sector is attempted.
  • the read sector protection information is assumed true and the modification of data in the selected sector is allowed. If the read content of the check columns does not match the preset logic information, the event is signaled, data modification circuitry of the device is disabled and the permanently stored protection information is downloaded again from the inaccessible non-volatile memory space in the volatile memory array. This reestablishes therein the correct original protection information.
  • the preset logic information recorded in the two additional check columns is complementary. That is, if one of the two columns contains zeroes the other column should contain ones in order not to privilege any logic level in relation to the integrity check of the recorded volatile preset logic information.
  • the logic content of the two additional check columns may even be in the form of offset alternate sequences of zeroes and ones.
  • FIG. 1 schematically depicts a volatile memory array on which sector protection information is stored according to the prior art.
  • FIG. 2 schematically depicts a possible fraudulent modification of protection information stored in the volatile memory array according to the prior art.
  • FIG. 3 is a diagram of a volatile memory array for storing sector protection information modified according to the present invention.
  • FIG. 4 schematically depicts a possible fraudulent modification of protection information stored in the modified volatile memory array of FIG. 3 .
  • FIG. 5 shows a circuit implementation of the check block of FIGS. 3 and 4 .
  • FIG. 6 shows a way of enhancing the reliability of the integrity check according to the present invention.
  • FIG. 7 shows how the circuit implementation of the logic for checking the integrity of the stored volatile protection information can be modified to support the enhanced robustness implementation of the embodiment of FIG. 6 .
  • FIG. 8 shows an alternative implementation of the method according to the present invention.
  • FIG. 3 shows a basic embodiment of the memory in accordance with the present invention.
  • the volatile memory array in which sector protection information is stored at every power-on of the device includes two additional columns ck 1 and ck 2 that according to this embodiment are at the right side of the volatile array region in which the protection state of the various sectors of the non-volatile memory device are stored.
  • the volatile memory array includes as customary a row decoder, a column decoder and relative read circuitry.
  • the values read from the two added columns, ck 1 and ck 2 are checked by the integrity check block that eventually generates a protection integrity signal Prot_ok.
  • the preset logic content of additional check columns ck 1 and ck 2 may preferably be complementary. In the shown example, one of the two columns ck 1 contains zeroes while the other column ck 2 contains ones in order not to privilege any of the two logic levels.
  • the system Before modifying any data in any of the addressable sectors of the non-volatile memory device, the system reads the state of protection of the addressed sector in which data should be modified from the protection information stored in the volatile memory array of FIG. 3 . And besides the protection information, the contents of the two additional check columns ck 1 and ck 2 are also read. If the logic result corresponds to the preset logic information introduced in the two additional check columns ck 1 and ck 2 , the sector protection information read is considered reliable. Therefore, the modification of data stored in the device can proceed.
  • the integrity check block detects deformity because of an intervened modification of the logic content of the volatile memory cells of the two check columns ck 1 and ck 2 . It will disable the check signal Prot_ok.
  • Disabling of the check signal Prot_ok will in turn cause the disabling of the data modification circuitry of the non-volatile memory device. This will command a new downloading (copying) in the volatile memory array of the sector protection information from the inaccessible non-volatile memory space that contains the correct original protection information, and the writing of the preset logic information in the additional check columns ck 1 and ck 2 .
  • FIG. 5 shows a possible circuit implementation of the function of the integrity check block of FIGS. 3 and 4 for the case of a basic implementation of the method wherein in one check column all logic ones are introduced and in the other check column all zeroes are introduced.
  • the circuit diagram and symbols used for generating the check signal Prot_ok are easily recognizable by those skilled in the art.
  • the check signal Prot_ok will remain active if the preset logic pattern of the cells of the two additional check columns ck 1 and ck 2 correspond to the above-mentioned logic content, and will eventually be disabled based on an occurrence as depicted in FIG. 4 .
  • a cell of the first check column ck 1 that should contain a zero and the adjacent cell of column ck 2 on the same row that should contain a logic one are found to be in an improper logic state.
  • the preset logic information introduced in the two additional check columns ck 1 and ck 2 may be an alternating sequence of zeroes and ones, for example starting on a even numbered column with a 0 and starting an odd numbered column with a 1, as in the example shown in FIG. 6 , or vice-versa.
  • the integrity check circuitry of the common blocks need to take into account from which row the pair of read values come from. This may be implemented by monitoring the value of the least significant bit of the row address of the sector protection data array.
  • a possible circuit embodiment of such an integrity check logic circuit is depicted in FIG. 7 .
  • the operation is similar to that of the circuit of FIG. 5 with the only difference being the introduction of an input stage composed of two multiplexers (MUX) that have the function of selecting the signal path of logic the values read from the check columns containing zeroes or ones depending on the addressed row (even or odd).
  • MUX multiplexers
  • the memory device in which the method is to be implemented has sector protection data that can be contained in a volatile memory array of relatively large dimensions, it may be necessary to introduce two or even more pairs of additional check columns. This is to ensure that even locally effective actions leading to localized alterations of the logic content of the volatile memory cells in which the sector protection information is downloaded at every power-on will be sensed by at least one of the distributed pairs of check columns.
  • FIG. 8 illustrates such an alternative embodiment employing two pairs of check columns, ck 1 -ck 2 and ck 3 -ck 4 , respectively.
  • the integrity check block will in this case need to include an appropriate logic check circuit, replicated or specific, for each pair of check columns. Even in this embodiment, it will be possible to choose for all or for each pair of check columns a certain pattern of preset logic information.
  • the appropriate logic check circuits for each pair of check columns are also provided.
  • the sector protection information may be stored in a non-volatile memory array partition common to those of the addressable data storing sectors of the memory device because. This is in view of the fact that access to the stored non-volatile sector protection information is not contemplated to occur during an unauthorized use of the device. It is no longer necessary to form a dedicated read circuit. The only access to the stored non-volatile sector protection information occurs at power-on of the memory device.
  • the practical embodiment provides also circuit structures that are capable of effectively detecting and revealing a possible corruption that may have occurred of any stored volatile data in the ancillary memory array to which the pair or pairs of check columns with a preset logic content are associated.

Abstract

A non-volatile memory device includes addressable sectors and an ancillary volatile memory array. The ancillary volatile memory array stores protection information in the addressable sectors that is not accessible to users of the memory. The protection information is downloaded in the memory array at every power-on of the memory device. The memory array includes at least two additional columns containing preset logic information physically adjacent to the columns containing the downloaded information. A logic circuit is input with the logic information read from the additional check columns for checking the integrity of the preset logic information content of the check columns. An integrity check signal is output by the logic circuit.

Description

    RELATED APPLICATIONS
  • This Application is a Continuation of U.S. application Ser. No. 11/693,360, titled “METHOD AND DEVICE FOR DETECTING POSSIBLE CORRUPTION OF SECTOR PROTECTION INFORMATION OF A NON-VOLATILE MEMORY STORED IN AN ON BOARD VOLATILE MEMORY ARRAY AT POWER-ON,” filed Mar. 29, 2007, (Allowed) which is commonly assigned and incorporated herein by reference.
  • TECHNICAL FIELD
  • The present invention relates to non-volatile memory devices having a plurality of addressable sectors and an ancillary volatile memory array, and more particularly, to techniques for revealing corruption of stored volatile data in the ancillary memory array and preventing unauthorized modification of non-volatile data stored in protected sectors of the memory device.
  • BACKGROUND
  • Protection techniques for non-volatile stored data may be of two types. A first type is the relatively unburdensome storing of volatile protection information. This is the generally adopted technique for preventing accidental alterations by the users of the permanently stored information in the memory device. A second type is a far more burdensome storing of non-volatile protection information. This is where a dedicated inaccessible memory region becomes inevitable when, beside prevention of accidental alterations by authorized users of the stored data, the stored data needs to be protected from malicious deliberate actions by hackers and alike.
  • Non-volatile protection systems are far more critical to design because they need to resist deliberate hacker attempts to alter the content of a programmed non-volatile memory device or sector thereof to illegally enable the use of set top boxes, cellular phones and other mobile personal apparatuses. FIG. 1 schematically depicts a volatile memory array on which sector protection information is stored, and FIG. 2 schematically depicts a possible fraudulent modification of protection information stored in the volatile memory array.
  • A survey of relevant technical literature confirms that integrity of stored data is generally based on the use of non-volatile memory elements (flash cells) in which the state of protection of the different sectors of the memory device is recorded. The protection system imposes verification of the state of protection of the addressed sector before enabling any modification of data stored in it (programming or erasing operations). Such a verification is done by reading a dedicated or reserved region of non-volatile memory containing protection information on the distinct sectors that are not accessible to the user of the memory device. This ensures robustness of the protection system because the protection information recorded in the inaccessible non-volatile memory region is inalterable from outside or external the memory.
  • Protection information and other vital information can be written in such a reserved region of the non-volatile memory cell array, inaccessible to any external user, exclusively by an internal controller of the memory device.
  • However, the implementation of such a data protection system imposes significant architectural restraints to the non-volatile memory device. To overcome these restraints, it is possible at the expense of a non-negligible increment of circuit complexity and of the silicon area required for realizing the required additional circuitry.
  • For instance, implementation of a non-volatile protection system in dual-job flash memory devices, the inaccessible non-volatile memory region intended to store the protection information needs to be provided with dedicated read and write/erase circuitry. The non-volatile flash memory devices are capable of simultaneously reading data from one sector while being engaged in modifying data on a different sector of the memory. This is in view of the fact that it is difficult to exploit the same circuitries of the ordinary data storing sectors of the memory device addressable by an external user without jeopardizing the dual job capability.
  • SUMMARY
  • In view of the foregoing background, an object of the present invention is to overcome the above noted drawbacks without affecting the intrinsic robustness against hacker attacks offered by a protection system based on the use of inaccessible non-volatile memory elements for safely storing protection information.
  • This and other objects, advantages and features are fully achieved by a method and relative implementing structure in accordance with the present invention without any substantial increase of circuit complexity and in the silicon area being occupied.
  • The usual presence in any multi-sector non-volatile memory device of a volatile memory array, that may be a static RAM (or latch) array or even a dynamic PAM array requiring periodic refresh, may be exploited for other operating purposes of the non-volatile memory device. This is typically for providing read and write cache memory capabilities to reduce access time in reading data from the sectors of the non-volatile memory array, and for reducing the time needed for writing large amounts of data in the non-volatile memory array sectors.
  • Sector protection information permanently stored in a dedicated inaccessible region of the non-volatile memory cell array may be copied (downloaded) at every power-on in either a purposely realized volatile latch array of an appropriate size or in a volatile memory array of a relatively large size useful also for other purposes. However, differently from commonly known volatile type protection arrangements, actions that could be done by a hacker for altering the data on the protection state of the addressable sectors of the non-volatile memory array that are stored in a volatile manner in order to become able to fraudulently modify the permanently stored data are prevented.
  • Typically, one way a hacker could defeat a protection system based on stored volatile sector protection state information is to artificially lower the supply voltage of the memory device as far down as possible for causing the loss of information on the sector protection by the latches of the volatile memory array, and raising again the supply voltage to its nominal value. This would allow the hacker to be free to alter the data stored in the sectors of the non-volatile memory array.
  • A reliable manner of rendering any intervened corruption (modification) of any data that is downloaded at power-on of the device in a certain ancillary volatile memory array and inhibiting any modification of data stored in the non-volatile memory sectors provides an insurmountable obstacle to fraudulent attempts.
  • Basically, the method of protecting addressable sectors of a non-volatile memory device including an ancillary volatile memory array, for preventing illicit or unauthorized modification of stored non-volatile data by an external user, comprises the steps of storing protection information on the addressable sectors of the non-volatile memory device in a dedicated non-volatile memory space inaccessible to external users of the device. The permanently stored protection information is checked whenever modification of data stored in a certain memory sector is attempted.
  • The method may further comprise reading the permanently stored protection information from the inaccessible non-volatile memory space at every power-on of the device, and copying it in the ancillary volatile memory array including at least two additional check columns containing preset logic information. Prior to modifying data stored in a memory sector, the method may comprise reading the protection information of the sector from the volatile memory array and the content of the check columns.
  • If the read content of the additional check columns matches the preset logic information, the read sector protection information is assumed true and the modification of data in the selected sector is allowed. If the read content of the check columns does not match the preset logic information, the event is signaled, data modification circuitry of the device is disabled and the permanently stored protection information is downloaded again from the inaccessible non-volatile memory space in the volatile memory array. This reestablishes therein the correct original protection information.
  • Preferably, the preset logic information recorded in the two additional check columns is complementary. That is, if one of the two columns contains zeroes the other column should contain ones in order not to privilege any logic level in relation to the integrity check of the recorded volatile preset logic information. The logic content of the two additional check columns may even be in the form of offset alternate sequences of zeroes and ones.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 schematically depicts a volatile memory array on which sector protection information is stored according to the prior art.
  • FIG. 2 schematically depicts a possible fraudulent modification of protection information stored in the volatile memory array according to the prior art.
  • FIG. 3 is a diagram of a volatile memory array for storing sector protection information modified according to the present invention.
  • FIG. 4 schematically depicts a possible fraudulent modification of protection information stored in the modified volatile memory array of FIG. 3.
  • FIG. 5 shows a circuit implementation of the check block of FIGS. 3 and 4.
  • FIG. 6 shows a way of enhancing the reliability of the integrity check according to the present invention.
  • FIG. 7 shows how the circuit implementation of the logic for checking the integrity of the stored volatile protection information can be modified to support the enhanced robustness implementation of the embodiment of FIG. 6.
  • FIG. 8 shows an alternative implementation of the method according to the present invention.
  • DETAILED DESCRIPTION
  • FIG. 3 shows a basic embodiment of the memory in accordance with the present invention. The volatile memory array in which sector protection information is stored at every power-on of the device includes two additional columns ck1 and ck2 that according to this embodiment are at the right side of the volatile array region in which the protection state of the various sectors of the non-volatile memory device are stored. The volatile memory array includes as customary a row decoder, a column decoder and relative read circuitry.
  • The values read from the two added columns, ck1 and ck2, are checked by the integrity check block that eventually generates a protection integrity signal Prot_ok. As noted above, the preset logic content of additional check columns ck1 and ck2 may preferably be complementary. In the shown example, one of the two columns ck1 contains zeroes while the other column ck2 contains ones in order not to privilege any of the two logic levels.
  • Before modifying any data in any of the addressable sectors of the non-volatile memory device, the system reads the state of protection of the addressed sector in which data should be modified from the protection information stored in the volatile memory array of FIG. 3. And besides the protection information, the contents of the two additional check columns ck1 and ck2 are also read. If the logic result corresponds to the preset logic information introduced in the two additional check columns ck1 and ck2, the sector protection information read is considered reliable. Therefore, the modification of data stored in the device can proceed.
  • In contrast, should for any reason the logic information read from the two additional check columns ck1 and ck2 differ from the preset logic information, as schematically depicted in FIG. 4, the integrity check block detects deformity because of an intervened modification of the logic content of the volatile memory cells of the two check columns ck1 and ck2. It will disable the check signal Prot_ok.
  • Disabling of the check signal Prot_ok will in turn cause the disabling of the data modification circuitry of the non-volatile memory device. This will command a new downloading (copying) in the volatile memory array of the sector protection information from the inaccessible non-volatile memory space that contains the correct original protection information, and the writing of the preset logic information in the additional check columns ck1 and ck2.
  • Of course, such an intervention will normally not occur during an unauthorized use of the non-volatile memory device. Thus, the user will not encounter any delay or limitation in the use of the memory device.
  • FIG. 5 shows a possible circuit implementation of the function of the integrity check block of FIGS. 3 and 4 for the case of a basic implementation of the method wherein in one check column all logic ones are introduced and in the other check column all zeroes are introduced. The circuit diagram and symbols used for generating the check signal Prot_ok are easily recognizable by those skilled in the art. The check signal Prot_ok will remain active if the preset logic pattern of the cells of the two additional check columns ck1 and ck2 correspond to the above-mentioned logic content, and will eventually be disabled based on an occurrence as depicted in FIG. 4. Here, a cell of the first check column ck1 that should contain a zero and the adjacent cell of column ck2 on the same row that should contain a logic one are found to be in an improper logic state.
  • To enhance robustness of the integrity check, the preset logic information introduced in the two additional check columns ck1 and ck2 may be an alternating sequence of zeroes and ones, for example starting on a even numbered column with a 0 and starting an odd numbered column with a 1, as in the example shown in FIG. 6, or vice-versa.
  • According to this alternate embodiment, the integrity check circuitry of the common blocks need to take into account from which row the pair of read values come from. This may be implemented by monitoring the value of the least significant bit of the row address of the sector protection data array. A possible circuit embodiment of such an integrity check logic circuit is depicted in FIG. 7.
  • As will be readily understood by those skilled in the art, the operation is similar to that of the circuit of FIG. 5 with the only difference being the introduction of an input stage composed of two multiplexers (MUX) that have the function of selecting the signal path of logic the values read from the check columns containing zeroes or ones depending on the addressed row (even or odd).
  • In case the memory device in which the method is to be implemented has sector protection data that can be contained in a volatile memory array of relatively large dimensions, it may be necessary to introduce two or even more pairs of additional check columns. This is to ensure that even locally effective actions leading to localized alterations of the logic content of the volatile memory cells in which the sector protection information is downloaded at every power-on will be sensed by at least one of the distributed pairs of check columns.
  • FIG. 8 illustrates such an alternative embodiment employing two pairs of check columns, ck1-ck2 and ck3-ck4, respectively. Naturally, the integrity check block will in this case need to include an appropriate logic check circuit, replicated or specific, for each pair of check columns. Even in this embodiment, it will be possible to choose for all or for each pair of check columns a certain pattern of preset logic information. The appropriate logic check circuits for each pair of check columns are also provided.
  • Preserving unaltered the intrinsic robustness against hacker's attacks of sector protection information stored in an inaccessible non-volatile memory space achieves the following important advantages. The sector protection information may be stored in a non-volatile memory array partition common to those of the addressable data storing sectors of the memory device because. This is in view of the fact that access to the stored non-volatile sector protection information is not contemplated to occur during an unauthorized use of the device. It is no longer necessary to form a dedicated read circuit. The only access to the stored non-volatile sector protection information occurs at power-on of the memory device.
  • Greater speed and a reduced complexity of the data modification algorithms are also achieved because access to a volatile memory array is simpler and quicker. The time for reading the state of protection of a sector is significantly less than an access time to the volatile memory space. A significant saving of silicon area is achieved by not requiring the realization of dedicated read circuitry of the reserved non-volatile memory space.
  • Moreover, besides reaching the primary objectives of providing a less burdensome implementation of and faster performing sector protection, the practical embodiment provides also circuit structures that are capable of effectively detecting and revealing a possible corruption that may have occurred of any stored volatile data in the ancillary memory array to which the pair or pairs of check columns with a preset logic content are associated.
  • As noted, other vital information for the correct functioning of the memory device, besides the sector protection information, may be downloaded at power-on in the ancillary volatile memory array. Even not out of a deliberate hacker attack, other environmental conditions such as strong electromagnetic fields may corrupt the recorded volatile data. A periodic integrity check of the preset logic content of the check columns will reveal the possibility that data may have been corrupted, and command a new downloading (refresh) of the data from the reserved non-volatile memory region where they permanently reside

Claims (20)

1. A method, comprising:
reading protection information for an addressable sector of a non-volatile memory from a volatile memory space corresponding to the addressable sector;
reading preset logic information from check columns of the volatile memory space;
verifying the preset logic information with an integrity check block; and
allowing modification of data in the addressable sector of the non-volatile memory according to the state of the protection information when the preset logic information is verified with the integrity check block.
2. The method of claim 1, wherein the check columns contain complementary preset logic information.
3. The method of claim 2, wherein the preset logic information corresponding to each row of the volatile memory space that has a row address with a common least significant bit includes identical logic values.
4. The method of claim 1, and further comprising:
preventing modification of data in the addressable sector when the loaded preset logic information is not verified.
5. The method of claim 4, wherein preventing modification of data in the addressable sector comprises disabling a data modification circuit, with respect to a modification command pertaining to the addressable sector, when the preset logic information has any set of values other than the preset logic information from the dedicated memory space.
6. The method of claim 4, and further comprising:
loading new protection information for the addressable sector of the non-volatile memory from a non-volatile memory space not accessible to external users to the volatile memory space when the loaded preset logic information is not verified.
7. A method, comprising:
loading protection information for an addressable sector of a non-volatile memory device from a dedicated non-volatile memory space; and
checking the protection information for integrity when modification of data stored in the addressable sector is attempted.
8. The method of claim 7, and further comprising:
allowing modification of data in the addressable sector when the protection information is verified.
9. The method of claim 8, and further comprising:
verifying the protection information by loading the protection information into a volatile protection information sector, loading preset logic information into check columns of the volatile protection information sector, and verifying the loaded preset logic information with an integrity check block.
10. The method of claim 8, wherein loading present logic information into the check columns comprises loading complementary preset logic information in the check columns
11. The method of claim 7, wherein checking the protection information for integrity comprises:
loading preset logic information into check columns to a volatile memory space; and
verifying the loaded preset logic information.
12. The method of claim 11, and further comprising:
preventing modification of data in the addressable sector when the loaded preset logic information is not verified.
13. The method of claim 12, wherein preventing modification of data in the addressable sector comprises disabling a data modification circuit, with respect to a modification command pertaining to the addressable sector, when the loaded preset logic information is not verified.
14. The method of claim 13, and further comprising:
loading new protection information for the addressable sector of the non-volatile memory from a non-volatile memory space not accessible to external users to the volatile memory space when the loaded preset logic information is not verified.
15. A method, comprising:
reading protection information for an addressable sector of a non-volatile memory device from a volatile memory space; and
checking the protection information for integrity when modification of data stored in the addressable sector is attempted.
16. The method of claim 15, wherein checking the protection information comprises:
reading preset logic information programmed into a pair of check columns of the volatile memory space;
verifying the preset logic information with an integrity check block; and
allowing modification of data in the addressable sector according to the protection information when the preset logic information is verified.
17. The method of claim 16, and further comprising:
loading new protection information for the addressable sector of the non-volatile memory from a non-volatile memory space not accessible to external users to the volatile memory space.
18. A memory device, comprising:
a non-volatile memory space inaccessible to an external user;
an addressable memory sector of non-volatile memory cells; and
a protection information sector of non-volatile memory cells associated with the addressable memory sector of non-volatile memory cells; wherein the memory verifies protection information in the protection information sector before allowing modification of data in the addressable memory sector.
19. The memory device of claim 18, wherein the protection information sector comprises an array of memory cells for protection information, and at least two check columns for preset logic information.
20. The memory device of claim 18, wherein the at least two check columns comprise a plurality of pairs of check columns to store the check information, the plurality of pairs of check columns being spatially distributed among columns of the protection information sector.
US13/589,509 2006-03-29 2012-08-20 Method and device for detecting possible corruption of sector protection information of a non-volatile memory stored in an on board volatile memory array at power-on Abandoned US20120311415A1 (en)

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US13/589,509 US20120311415A1 (en) 2006-03-29 2012-08-20 Method and device for detecting possible corruption of sector protection information of a non-volatile memory stored in an on board volatile memory array at power-on

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EP06425214.1 2006-03-29
EP06425214A EP1840902B1 (en) 2006-03-29 2006-03-29 Method and device for detecting possible corruption of sector protection information of a non volatile memory stored in an on board volatile memory array at power-on
US11/693,360 US8250314B2 (en) 2006-03-29 2007-03-29 Method and device for checking sector protection information of a non-volatile memory
US13/589,509 US20120311415A1 (en) 2006-03-29 2012-08-20 Method and device for detecting possible corruption of sector protection information of a non-volatile memory stored in an on board volatile memory array at power-on

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US8250314B2 (en) 2012-08-21

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