US20150194359A1 - Semiconductor device - Google Patents
Semiconductor device Download PDFInfo
- Publication number
- US20150194359A1 US20150194359A1 US14/535,919 US201414535919A US2015194359A1 US 20150194359 A1 US20150194359 A1 US 20150194359A1 US 201414535919 A US201414535919 A US 201414535919A US 2015194359 A1 US2015194359 A1 US 2015194359A1
- Authority
- US
- United States
- Prior art keywords
- lid
- side wall
- base plate
- package
- curved surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/10—Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D55/00—Accessories for container closures not otherwise provided for
- B65D55/02—Locking devices; Means for discouraging or indicating unauthorised opening or removal of closure
- B65D55/10—Locking pins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
Abstract
Description
- 1. Field of the Invention
- The present invention relates to a semiconductor hermetically sealed package.
- 2. Background Art
- In semiconductor hermetically sealed packages, a semiconductor element is mounted in a package and then a lid is seam-welded to secure air tightness. The package and the lid are positioned by pressing a protrusion provided on the lid against a package inner wall.
- The protrusion of the lid is provided with a curved surface through press molding and the inner diameter of the package is designed in such a way that the package inner diameter does not interfere with this curved surface. This causes a backlash between the package and the lid to increase, causing the lid to stick out of the package. To solve this problem, a technique is proposed which provides the package and the lid with height differences respectively to make the lid to fit into the package (e.g., see Japanese Patent Laid-Open No. 10-65036).
- In the prior art that provides height differences between the package and the lid, a large curved surface is produced when the height differences are formed by etching. Applying cutting to reduce this curved surface results in a cost increase. Moreover, since the curved surface cannot be reduced to 0, its positioning accuracy is low.
- In view of the above-described problems, an object of the present invention is to provide a semiconductor device capable of improving positioning accuracy of the lid while reducing the cost.
- According to the present invention, a semiconductor device includes: a package including a base plate and a side wall provided on a perimeter of the base plate; a semiconductor element on the base plate; and a lid joined to a top of the side wall and covering the semiconductor element, wherein a first curved surface is provided inside the package at the top of the side wall, a second curved surface is provided on a perimeter of an undersurface of the lid, and the first curved surface of the side wall is in contact with the second curved surface of the lid.
- The present invention makes it possible to improve positioning accuracy of the lid while reducing the cost.
- Other and further objects, features and advantages of the invention will appear more fully from the following description.
-
FIG. 1 is a perspective view illustrating a semiconductor device according to a first embodiment of the present invention. -
FIG. 2 is a cross-sectional view illustrating the semiconductor device according to the first embodiment of the present invention. -
FIG. 3 is a cross-sectional view illustrating a semiconductor device according to a second embodiment of the present invention. -
FIG. 4 is a cross-sectional view illustrating a semiconductor device according to a third embodiment of the present invention. -
FIG. 5 is a top view illustrating the semiconductor device according to the third embodiment of the present invention. -
FIG. 6 is a top view illustrating a semiconductor device according to a fourth embodiment of the present invention. -
FIG. 7 is a top view illustrating a semiconductor device according to a fifth embodiment of the present invention. - A semiconductor device according to an embodiment of the present invention will be described with reference to the accompanying drawings. The same or corresponding components will be assigned the same reference numerals and duplicate description may be omitted.
-
FIG. 1 is a perspective view illustrating a semiconductor device according to a first embodiment of the present invention.FIG. 2 is a cross-sectional view illustrating the semiconductor device according to the first embodiment of the present invention. Apackage 1 includes abase plate 2 and aside wall 3 provided on the perimeter of thebase plate 2. Thebase plate 2 and theside wall 3 are rectangular in a plan view. Asemiconductor element 4 is provided on thebase plate 2. Alid 5 is joined to the top of theside wall 3 so as to cover thesemiconductor element 4. - A curved surface (R) is provided inside the
package 1 at the top of theside wall 3. A curved surface is provided on the perimeter of the undersurface of thelid 5. The perimeter of thelid 5 sits atop theside wall 3 and the curved surface of theside wall 3 is in contact with the curved surface of thelid 5. The radius of the curved surface of theside wall 3 is smaller than the radius of the curved surface of thelid 5. - The present embodiment provides the curved surfaces on the
package 1 and thelid 5, and can thereby decrease a backlash between the two and improve positioning accuracy. In addition, the present embodiment can also reduce the cost compared to the prior art that provides height differences between the package and the lid. By making the radius of the curved surface of theside wall 3 smaller than the radius of the curved surface of thelid 5, it is possible to prevent thelid 5 from floating and forming a gap. -
FIG. 3 is a cross-sectional view illustrating a semiconductor device according to a second embodiment of the present invention. The top of theside wall 3 has a rectangular shape. Step-like height differences are provided at the perimeter of the undersurface of thelid 5. At the top of theside wall 3, a corner inside thepackage 1 is in contact with a height difference of thelid 5. This prevents a backlash between thepackage 1 and thelid 5, and can thereby improve positioning accuracy. - However, a gap may be produced between the
package 1 and thelid 5 in a condition in which the perimeter of thelid 5 sits atop theside wall 3, which may cause a welding fault. Thus, thelid 5 is made thinner and thelid 5 is made to deform under the load of the electrode during seam welding to eliminate any gap between thepackage 1 and thelid 5. - Furthermore, the
lid 5 can be positioned by providing a height difference only on thelid 5 side and height differences need not be provided in both thelid 5 and thepackage 1. Therefore, it is possible to reduce the cost compared to the prior art that provides height differences between the package and the lid. Since thepackage 1 is provided with no height difference, theside wall 3 can be made thinner. This makes it possible to reduce the size of the outside shape of thepackage 1 while securing the inner region. -
FIG. 4 is a cross-sectional view illustrating a semiconductor device according to a third embodiment of the present invention.FIG. 5 is a top view illustrating the semiconductor device according to the third embodiment of the present invention. A plurality ofpins 7 are provided as stoppers on four sides at the top of theside wall 3. Thelid 5 is positioned by the plurality ofpins 7. - This prevents the
lid 5 from sticking out of thepackage 1 without providing any positioning structure in thelid 5. Moreover, while providing height differences in thepackage 1 or thelid 5 produces curved surfaces, only providing thepins 7 produces no curved surface, and it is thereby possible to improve positioning accuracy of the lid while reducing the cost. -
FIG. 6 is a top view illustrating a semiconductor device according to a fourth embodiment of the present invention. Thepins 7 are provided only on two sides of therectangular side wall 3 in a plan view. Thelid 5 is positioned by being pressed against the twopins 7 provided in one direction. This reduces by half an expansion of the outside shape of thepackage 1 caused by the positioning structure. -
FIG. 7 is a top view illustrating a semiconductor device according to a fifth embodiment of the present invention. Theside wall 3 has aprotrusion 8 at the top only in one corner of theside wall 3 which has a rectangular shape in a plan view. Theprotrusion 8 is formed by machining theside wall 3 of thepackage 1. Thelid 5 is positioned by being pressed against theprotrusion 8. This reduces by half the expansion of the outside shape of thepackage 1 caused by the positioning structure. Moreover, providing the positioning structure only in one direction, it is possible to reduce the size of the outside shape of thepackage 1 while securing the inner region. - Obviously many modifications and variations of the present invention are possible in the light of the above teachings. It is therefore to be understood that within the scope of the appended claims the invention may be practiced otherwise than as specifically described.
- The entire disclosure of Japanese Patent Application No. 2014-000502, filed on Jan. 6, 2014 including specification, claims, drawings, and summary, on which the Convention priority of the present application is based, is incorporated herein by reference in its entirety.
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014-000502 | 2014-01-06 | ||
JP2014000502A JP6264044B2 (en) | 2014-01-06 | 2014-01-06 | Semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
US20150194359A1 true US20150194359A1 (en) | 2015-07-09 |
US9093309B1 US9093309B1 (en) | 2015-07-28 |
Family
ID=53495783
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/535,919 Active US9093309B1 (en) | 2014-01-06 | 2014-11-07 | Semiconductor device |
Country Status (3)
Country | Link |
---|---|
US (1) | US9093309B1 (en) |
JP (1) | JP6264044B2 (en) |
CN (1) | CN104766829B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140146451A1 (en) * | 2012-11-26 | 2014-05-29 | Seiko Epson Corporation | Method for manufacturing electronic device, cover body, electronic device, electronic apparatus, and moving object |
US20180129038A1 (en) * | 2016-11-04 | 2018-05-10 | Point Engineering Co., Ltd. | Optical Device Substrate, Optical Device Substrate Manufacturing Method, and Optical Device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6674159B1 (en) * | 2000-05-16 | 2004-01-06 | Sandia National Laboratories | Bi-level microelectronic device package with an integral window |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0266961A (en) * | 1988-08-31 | 1990-03-07 | Mitsui Petrochem Ind Ltd | Semiconductor device and manufacture thereof |
JPH08213502A (en) * | 1995-02-01 | 1996-08-20 | Nippon Avionics Co Ltd | Semiconductor hermetically sealed package |
JPH09181287A (en) * | 1995-10-24 | 1997-07-11 | Sony Corp | Light receiving device and manufacture thereof |
JP3031035U (en) * | 1996-05-09 | 1996-11-12 | 株式会社ウチコン | Gutter structure |
JPH1065036A (en) | 1996-08-21 | 1998-03-06 | Oki Business:Kk | Airtight sealing structure of module and manufacturing method thereof |
JPH1098122A (en) * | 1996-09-24 | 1998-04-14 | Matsushita Electron Corp | Semiconductor device |
JP2003154082A (en) * | 2001-11-22 | 2003-05-27 | Heiwa Corp | Set plate mounting apparatus |
JP3878899B2 (en) | 2002-06-27 | 2007-02-07 | 京セラ株式会社 | Electronic device and manufacturing method thereof |
JP3135724U (en) * | 2007-07-11 | 2007-09-27 | 京セラケミカル株式会社 | Hollow package |
JP5171228B2 (en) | 2007-11-28 | 2013-03-27 | 日本電波工業株式会社 | Crystal device for surface mounting |
CN101562191B (en) * | 2008-06-29 | 2010-08-04 | 天水华天科技股份有限公司 | Photoelectric packaging part with cavity and production method thereof |
CN202003974U (en) * | 2010-12-15 | 2011-10-05 | 中国电子科技集团公司第十三研究所 | Ultrathin tube shell |
CN102299116A (en) * | 2011-09-13 | 2011-12-28 | 中国电子科技集团公司第四十三研究所 | Airtight metal packaging shell |
JP2013091126A (en) * | 2011-10-25 | 2013-05-16 | Ihi Corp | Device and method for positioning laminar workpiece |
JP2013203047A (en) * | 2012-03-29 | 2013-10-07 | Sumitomo Chemical Co Ltd | Hollow molded body and method for manufacturing hollow molded body |
-
2014
- 2014-01-06 JP JP2014000502A patent/JP6264044B2/en active Active
- 2014-11-07 US US14/535,919 patent/US9093309B1/en active Active
-
2015
- 2015-01-06 CN CN201510005664.1A patent/CN104766829B/en active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6674159B1 (en) * | 2000-05-16 | 2004-01-06 | Sandia National Laboratories | Bi-level microelectronic device package with an integral window |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140146451A1 (en) * | 2012-11-26 | 2014-05-29 | Seiko Epson Corporation | Method for manufacturing electronic device, cover body, electronic device, electronic apparatus, and moving object |
US9350318B2 (en) * | 2012-11-26 | 2016-05-24 | Seiko Epson Corporation | Method for manufacturing electronic device, cover body, electronic device, electronic apparatus, and moving object |
US20180129038A1 (en) * | 2016-11-04 | 2018-05-10 | Point Engineering Co., Ltd. | Optical Device Substrate, Optical Device Substrate Manufacturing Method, and Optical Device |
Also Published As
Publication number | Publication date |
---|---|
JP2015130383A (en) | 2015-07-16 |
CN104766829B (en) | 2017-12-01 |
CN104766829A (en) | 2015-07-08 |
US9093309B1 (en) | 2015-07-28 |
JP6264044B2 (en) | 2018-01-24 |
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