US20160154070A1 - Wafer bonding method for use in making a mems gyroscope - Google Patents
Wafer bonding method for use in making a mems gyroscope Download PDFInfo
- Publication number
- US20160154070A1 US20160154070A1 US14/512,469 US201414512469A US2016154070A1 US 20160154070 A1 US20160154070 A1 US 20160154070A1 US 201414512469 A US201414512469 A US 201414512469A US 2016154070 A1 US2016154070 A1 US 2016154070A1
- Authority
- US
- United States
- Prior art keywords
- magnetic
- mems gyroscope
- mems
- mass
- proof
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/105—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by magnetically sensitive devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B5/00—Devices comprising elements which are movable in relation to each other, e.g. comprising slidable or rotatable elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00349—Creating layers of material on a substrate
- B81C1/00357—Creating layers of material on a substrate involving bonding one or several substrates on a non-temporary support, e.g. another substrate
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C3/00—Assembling of devices or systems from individually processed components
- B81C3/001—Bonding of two components
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5705—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using masses driven in reciprocating rotary motion about an axis
- G01C19/5712—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using masses driven in reciprocating rotary motion about an axis the devices involving a micromechanical structure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5776—Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/091—Constructional adaptation of the sensor to specific applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/098—Magnetoresistive devices comprising tunnel junctions, e.g. tunnel magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0174—Manufacture or treatment of microstructural devices or systems in or on a substrate for making multi-layered devices, film deposition or growing
- B81C2201/0197—Processes for making multi-layered devices not provided for in groups B81C2201/0176 - B81C2201/0192
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/03—Bonding two components
- B81C2203/038—Bonding techniques not provided for in B81C2203/031 - B81C2203/037
Definitions
- the technical field of the examples to be disclosed in the following sections is related generally to the art of operation of microstructures, and, more particularly, to operation of MEMS devices comprising MEMS magnetic sensing structures.
- Microstructures such as microelectromechanical (hereafter MEMS) devices (e.g. accelerometers, DC relay and RF switches, optical cross connects and optical switches, microlenses, reflectors and beam splitters, filters, oscillators and antenna system components, variable capacitors and inductors, switched banks of filters, resonant comb-drives and resonant beams, and micromirror arrays for direct view and projection displays) have many applications in basic signal transduction. For example, a MEMS gyroscope measures angular rate.
- MEMS microelectromechanical
- a gyroscope (hereafter “gyro” or “gyroscope”) is based on the Coriolis effect as diagrammatically illustrated in FIG. 1 .
- Proof-mass 100 is moving with velocity V d .
- the Coriolis effect causes movement of the poof-mass ( 100 ) with velocity V s .
- V d With fixed V d , the external angular velocity can be measured from V d .
- a typical example based on the theory shown in FIG. 1 is capacitive MEMS gyroscope, as diagrammatically illustrated in FIG. 2 .
- the MEMS gyro is a typical capacitive MEMS gyro, which has been widely studied. Regardless of various structural variations, the capacitive MEMS gyro in FIG. 2 includes the very basic theory based on which all other variations are built.
- capacitive MEMS gyro 102 is comprised of proof-mass 100 , driving mode 104 , and sensing mode 102 .
- the driving mode ( 104 ) causes the proof-mass ( 100 ) to move in a predefined direction, and such movement is often in a form of resonance vibration. Under external angular rotation, the proof-mass ( 100 ) also moves along the V s direction with velocity V s .
- Such movement of V s is detected by the capacitor structure of the sensing mode ( 102 ).
- Both of the driving and sensing modes use capacitive structures, whereas the capacitive structure of the driving mode changes the overlaps of the capacitors, and the capacitive structure of the sensing mode changes the gaps of the capacitors.
- a MEMS gyroscope comprising: a first substrate having a movable portion that is movable in response to an external angular velocity, said movable portion comprising a magnetic source for generating magnetic field; a second substrate having a magnetic sensor for detecting the magnetic field from said magnetic source; and a bonding structure for bonding the first and second wafer with a predetermined distance, said bonding structure comprising: a heating mechanism for generating heating; and a bonding material.
- FIG. 1 diagrammatically illustrates the Coriolis effect in a MEMS structure
- FIG. 2 is a top view of a typical existing capacitive MEMS gyroscope having a driving mode and a sensing mode, wherein both of the driving and sensing mode utilize capacitance structures;
- FIG. 3 illustrates an exemplary MEMS gyroscope having a magnetic sensing mechanism
- FIG. 4 illustrates a top view of a portion of an exemplary implementation of the MEMS gyroscope illustrated in FIG. 3 , wherein the MEMS gyroscope illustrated in FIG. 4 having a capacitive driving mode and a magnetic sensing mechanism;
- FIG. 5 illustrates a perspective view of a portion of another exemplary implementation of the MEMS gyroscope illustrated in FIG. 3 , wherein the MEMS gyroscope illustrated in FIG. 5 having a magnetic driving mechanism for the driving mode and a magnetic sensing mechanism for the sensing mode
- FIG. 6 illustrates an exemplary magnetic driving mechanism of the MEMS gyroscope in FIG. 5 ;
- FIG. 7 illustrates an exemplary magnetic source of the MEMS gyroscope illustrated in FIG. 3 ;
- FIG. 8 illustrates an exemplary magnetic sensing mechanism that can be used in the MEMS gyroscope illustrated in FIG. 3 ;
- FIG. 9 shows an exemplary thin-film stack that can be configured into a CIP or CPP structure for use in the magnetic sensing mechanism illustrated in FIG. 8 ;
- FIG. 10 illustrates an exemplary MEMS gyroscope that comprises multiple magnetic sensing structures
- FIG. 11 illustrates an exemplary wafer bonding scheme for use in making the MEMS gyroscope shown in FIG. 3 ;
- FIG. 12 illustrates a perspective view of the water bonding scheme in FIG. 11 .
- MEMS gyroscope for sensing an angular velocity, wherein the MEMS gyroscope utilizes a magnetic sensing mechanism. It will be appreciated by those skilled in the art that the following discussion is for demonstration purposes, and should not be interpreted as a limitation. Many other variations within the scope of the following disclosure are also applicable. For example, the MEMS gyroscope and the method disclosed in the following are applicable for use in accelerometers.
- MEMS gyroscope 106 comprises magnetic sensing mechanism 114 for sensing the target angular velocity through the measurement of proof-mass 112 .
- MEMS gyroscope 106 comprises mass-substrate 108 and sensor substrate 110 .
- Mass-substrate 108 comprises proof-mass 112 that is capable of responding to an angular velocity.
- the two substrates ( 108 and 110 ) are spaced apart, for example, by a pillar (not shown herein for simplicity) such that at least the proof-mass ( 112 ) is movable in response to an angular velocity under the Coriolis effect.
- the movement of the proof-mass ( 112 ) and thus the target angular velocity can be measured by magnetic sensing mechanism 114 .
- the magnetic sensing mechanism ( 114 ) in this example comprises a magnetic source 116 and magnetic sensor 118 .
- the magnetic source ( 116 ) generates a magnetic field
- the magnetic sensor ( 118 ) detects the magnetic field and/or the magnetic field variations that is generated by the magnetic source ( 116 ).
- the magnetic source is placed on/in the proof-mass ( 112 ) and moves with the proof-mass ( 112 ).
- the magnetic sensor ( 118 ) is placed on/in the sensor substrate ( 120 ) and non-movable relative to the moving proof-mass ( 112 ) and the magnetic source ( 116 ). With this configuration, the movement of the proof-mass 12 ) can be measured from the measurement of the magnetic field from the magnetic source ( 116 ).
- the magnetic source ( 116 ) can be placed on/in the sensor substrate ( 120 ); and the magnetic sensor ( 118 ) can be placed/in the proof-mass ( 112 ).
- MEMS gyroscope illustrated in FIG. 3 can also be used as an accelerometer.
- the MEMS gyroscope as discussed above with reference to FIG. 3 can be implemented in many ways, one of which is illustrated in FIG. 4 .
- the proof-mass ( 120 ) is driven by capacitive, such as capacitive comb.
- the sensing mode is performed using the magnetic sensing mechanism illustrated in FIG. 3 . For this reason, capacitive combs can be absent from the proof-mass ( 120 ).
- the proof-mass can be driven by magnetic force, an example of which is illustrated in FIG. 5 .
- the mass substrate ( 108 ) comprises a movable proof-mass ( 126 ) that is supported by flexible structures such as flexures 128 , 129 , and 130 .
- the layout of the flexures enables the proof-mass to move in a plane substantially parallel to the major planes of mass substrate 108 .
- the flexures enables the proof-mass to move along the length and the width directions, wherein the length direction can be the driving mode direction and the width direction can be the sensing mode direction of the MEMS gyro device.
- the proof-mass ( 126 ) is connected to frame 132 through flexures ( 128 , 129 , and 130 ).
- the frame ( 132 ) is anchored by non-movable structures such as pillar 134 .
- the mass-substrate ( 108 ) and sensing substrate 110 are spaced apart by the pillar ( 134 ).
- the proof-mass 12 ) in this example is driving by a magnetic driving mechanism ( 136 ).
- the proof-mass ( 126 ) can move (e.g. vibrate) in the driving mode under magnetic force applied by magnetic driving mechanism 136 , which is better illustrated in FIG. 6 .
- the magnetic driving mechanism 136 comprise a magnet core 138 surrounded by coil 140 .
- an alternating magnetic field can be generated from the coil 140 .
- the alternating magnetic field applies magnetic force to the magnet core 140 so as to move the magnet core.
- the magnet core thus moves the proof-mass.
- the magnetic source ( 114 ) of the MEMS gyroscope ( 106 ) illustrated in FIG. 3 can be implemented in many ways, one of which is illustrated in FIG. 7 .
- conductive wire 142 is displaced on/in proof-mass 112 .
- conductive wire 142 can be placed on the lower surface of the proof-mass ( 112 ), wherein the lower surface is facing the magnetic sensors ( 118 in FIG. 3 ) on the sensor substrate ( 110 , in FIG. 3 ).
- the conductive wire ( 142 ) can be placed on the top surface of the proof-mass ( 112 ), i.e.
- the conductive wire ( 142 ) can be placed inside the proof-mass, e.g. laminated or embedded inside the proof-mass ( 112 ), which will not be detailed herein as those examples are obvious to those skilled in the art of the related technical field.
- the conductive wire ( 142 ) can be implemented in many suitable ways, one of which is illustrated in FIG. 7 .
- the conductive wire ( 142 ) comprises a center conductive segment 146 and tapered contacts 144 and 148 that extend the central conductive segment to terminals, through the terminals of which current can be driven through the central segment.
- the conductive wire ( 142 ) may have other configurations.
- the contact tapered contacts ( 144 and 148 ) and the central segment ( 146 ) maybe U-shaped such that the tapered contacts may be substantially parallel but are substantially perpendicular to the central segment, which is not shown for its obviousness.
- the magnetic sensor ( 118 ) illustrated in FIG. 3 can be implemented to comprise a reference sensor ( 150 ) and a signal sensor ( 152 ) as illustrated in FIG. 8 .
- magnetic senor 118 on/in sensor substrate 120 comprises reference sensor 150 and signal sensor 152 .
- the reference sensor ( 150 ) can be designated for dynamically measuring the magnetic signal background in which the target magnetic signal (e.g. the magnetic field from the conductive wire 146 as illustrated in FIG. 7 ) co-exists.
- the signal sensor ( 152 ) can be designated for dynamically measuring the target magnetic signal (e.g. the magnetic field from the conductive wire 146 as illustrated in FIG. 7 ).
- the signal sensor ( 152 ) can be designated for dynamically measuring the magnetic signal background in which the target magnetic signal (e.g. the magnetic field from the conductive wire 146 as illustrated in FIG. 7 ) co-exists, while the signal sensor ( 150 ) can be designated for dynamically measuring the target magnetic signal (e.g. the magnetic field from the conductive wire 146 as illustrated in FIG. 7 ).
- the reference sensor ( 150 ) and the signal sensor ( 152 ) preferably comprise magneto-resistors, such as AMRs, giant-magneto-resistors (such as spin-valves, hereafter SV), or tunneling-magneto-resistors (TMR).
- FIG. 9 illustrates a magneto-resistor structure, which can be configured into CIP (current-in-plane, such as a spin-valve) or a CPP (current-perpendicular-to-plane, such as IMP, structure). As illustrated in FIG.
- the magneto-resistor stack comprises top pin-layer 154 , free-layer 156 , spacer 158 , reference layer 160 , bottom pin layer 162 , and substrate 120 .
- Top pin layer 154 is provided for magnetically pinning free layer 156 .
- the top pin layer can be comprised of IrMn, PtMn or other suitable magnetic materials.
- the free layer ( 156 ) can be comprised of a ferromagnetic material, such as NiFe, CoFe, CoFeB, or other suitable materials or the combinations thereof.
- the spacer ( 158 ) can be comprised of a non-magnetic conductive material, such as Cu, or an oxide material, such as Al 2 O 3 or MgO or other suitable materials
- the reference layer ( 160 ) can be comprised of a ferromagnetic magnetic material, such as NiFe, CoFe, CoFeB, or other materials or the combinations thereof.
- the bottom pin layer ( 162 ) is provided for magnetic pinning the reference layer ( 160 ), which can be comprised of a IrMn, PtMn or other suitable materials or the combinations thereof.
- the substrate ( 120 ) can be comprised of any suitable materials, such as glass, silicon, or other materials or the combinations thereof.
- the magneto-resistor ( 118 ) stack can be configured into a CIP structure (i.e. spin-valve, SV), wherein the current is driven in the plane of the stack layers.
- the spacer ( 158 ) is comprised of an oxide such as Al 2 O 3 , MgO or the like
- the magneto-resistor stack ( 118 ) can be configured into a CPP structure (i.e. TMR), wherein the current is driven perpendicularly to the stack layers.
- the free layer ( 156 ) is magnetically pinned by the top pin layer ( 154 ), and the reference layer ( 160 ) is also magnetically pinned by bottom pin layer 162 .
- the top pin layer ( 154 ) and the bottom pin layer ( 162 ) preferably having different blocking temperatures.
- a blocking temperature is referred to as the temperature, above which the magnetic pin layer is magnetically decoupled with the associated pinned magnetic layer.
- the top pin layer ( 154 ) is magnetically decoupled with the free layer ( 156 ) above the blocking temperature T B of the top pin layer ( 154 ) such that the free layer ( 156 ) is “freed” from the magnetic pinning of top pin layer ( 154 ).
- the free layer ( 156 ) is magnetically pinned by the top pin layer ( 154 ) such that the magnetic orientation of the free layer ( 156 ) is substantially not affected by the external magnetic field.
- the bottom pin layer ( 162 ) is magnetically decoupled with the reference layer ( 160 ) above the blocking temperature T B of the bottom pin layer ( 162 ) such that the reference layer ( 160 ) is “freed” from the magnetic pinning of bottom pin layer ( 162 ).
- the reference layer ( 160 ) is magnetically pinned by the bottom pin layer ( 162 ) such that the magnetic orientation of the reference layer ( 162 ) is substantially not affected by the external magnetic field.
- the top and bottom pin layers ( 154 and 162 , respectively) preferably have different blocking temperatures.
- the reference layer ( 160 ) preferably remains being pinned by the bottom pin layer ( 162 ).
- the reference layer ( 160 ) can be “freed” from being pinned by the bottom pin layer ( 162 ).
- the reference layer ( 160 ) can be used as a “sensing layer” for responding to the external magnetic field such as the target magnetic field, while the free layer ( 156 ) is used as a reference layer to provide a reference magnetic orientation.
- the different blocking temperatures can be accomplished by using different magnetic materials for the top pin layer ( 154 ) and bottom pin layer ( 162 ).
- the top pin layer ( 154 ) can be comprised of IrMn, while the bottom pin layer ( 162 ) can be comprised of PtMn, vice versa.
- both of the top and bottom pin layers ( 154 and 162 ) may be comprised of the same material, such as IrMn or PtMn, but with different thicknesses such that they have different blocking temperatures.
- the magneto-resistor stack ( 118 ) is configured into sensors for sensing magnetic signals. As such, the magnetic orientations of the free layer ( 156 ) and the reference layer ( 160 ) are substantially perpendicular at the initial state. Other layers, such as protective layer Ta, seed layers for growing the stack layers on substrate 120 can be provided, It is further noted that the magnetic stack layers ( 118 ) illustrated in FIG. 9 are what is often referred to as “bottom pin” configuration in the field of art. In other examples, the stack can be configured into what is often referred as “top pinned” configuration in the field of art, which will not be detailed herein.
- multiple magnetic sensing mechanisms can be provided, an example of which is illustrated in FIG. 10 .
- magnetic sensing mechanisms 116 and 164 are provided for detecting the movements of proof-mass 112 .
- the multiple magnetic sensing mechanisms can be used for detecting the movements of proof-mass 112 in driving mode and sensing mode respectively.
- the multiple magnetic sensing mechanisms 116 and 164 can be provided for detecting the same modes (e.g. the driving mode and/or the sensing mode).
- the magnetic sensor comprises spintronic structures, such as spin-valve (SV), magnetic-tunnel-junction (MTJ) or other similar structures.
- spintronic structures such as spin-valve (SV), magnetic-tunnel-junction (MTJ) or other similar structures.
- SV spin-valve
- MTJ magnetic-tunnel-junction
- These spintronic structures in general has a blocking temperature that is 220 C or less, which means that these spintronic structures can be processed at a temperature mot higher than the blocking temperature.
- the MEMS structures generally are processed at a much higher temperature, such as 250 C or higher.
- bonding the MEMS wafer having the proof-mass and the magnetic sensor wafer having the magnetic sensor generally requires a bonding temperature of 250 C or higher to secure a reliable bonding strength.
- This problem can be solved by using a localized heating, as illustrated in FIG. 11 .
- MEMS wafer 108 has proof-mass 112 , on which magnetic source 116 is provided.
- Magnetic sensor wafer 110 has magnetic sensor 118 .
- MEMS wafer 108 and magnetic sensor wafer 110 can be bonded by using bonding structure 170 that comprises a pillar (e.g. pillar 172 and/or 174 ), localized heater 176 and bonding material 178 .
- FIG. 12 shows a perspective view of the structure in FIG. 11 to better illustrate the structure.
- localized heater 176 is disposed on the surface of pillar 174 wherein pillar 174 in this example forms a hermetic bonding even though not required in some examples.
- the localized heater is conductive such that it generates localized heating to raise the temperature in the vicinity of the heater when current is driven through.
- the localized heater has two terminals 182 fur feeding current.
- Bonding material 178 which can be any suitable bonding materials, such as a glass frit, metal alloy, or metal can be disposed on the heater. In this way, the bonding material ( 178 ) and the pillar ( 174 ) laminate the localized heater therebetween. In some examples especially when the bonding material is conductive, an insulating layer can be disposed between the localized heater ( 176 ) and bonding material 178 , which is not shown in the figure.
- a bonding process current is driven into the localized heater through terminals 182 .
- the temperature in the vicinity of the heater ( 176 ) is elevated.
- this temperature equals to or higher than the melting temperature of the bonding material 178 , the pillar ( 174 ) can be bonded to the magnetic sensor wafer ( 120 ) (which is not shown in FIG. 12 ).
- pressure can be applied.
- the bonding area (the area wherein the bonding material is disposed) can have a temperature higher than 220 C, such as 350 C or 400 C, while the area wherein the magnetic sensor is disposed may still keep a safe temperature that is lower than 200 C.
- pillar 174 forms a hermetic bonding.
- the same bonding scheme and process are also applicable examples wherein the MEMS wafer and the magnetic sensor wafer are bonded non-hermetically.
- multiple pillars can be provided; and each bonding area at individual pillars may be provided with a localized heater for generating localized heating.
- the pillar ( 172 , 174 ) can be separately provided.
- the pillar can be directly formed from the MEMS wafer ( 108 ) shown in FIG. 11 .
- the pillar can be formed from the magnetic sensor wafer, in examples of which, the localized heater and the bonding materials can be disposed in the vicinity of the MEMS wafer ( 108 ).
Abstract
A MEMS gyroscope is disclosed herein, wherein the MEMS gyroscope comprised a magnetic sensing mechanism on a magnetic sensor wafer and a magnetic source on a MEMS wafer that further comprises a proof-mass. The magnetic sensor wafer and MEMS wafer are bonded through a bonding mechanism that comprises a hearting mechanism.
Description
- CROSS-REFERENCE
- This US utility patent application claims priority from co-pending US utility patent application “A HYBRID MEMS DEVICE,” Ser. No. 13/559,625 filed Jul. 27, 2012, which claims priority from US provisional patent application “A HYBRID MEMS DEVICE,” filed May 31, 2012, Ser. No. 61/653,408 to Biao Zhang and Tao Ju. This US utility patent application also claims priority from co-pending US utility patent application “A MEMS DEVICE,” Ser. No. 13/854,972 tiled Apr. 2, 2013 to the same inventor of this US utility patent application, the subject matter of each of which is incorporated herein by reference in its entirety.
- The technical field of the examples to be disclosed in the following sections is related generally to the art of operation of microstructures, and, more particularly, to operation of MEMS devices comprising MEMS magnetic sensing structures.
- Microstructures, such as microelectromechanical (hereafter MEMS) devices (e.g. accelerometers, DC relay and RF switches, optical cross connects and optical switches, microlenses, reflectors and beam splitters, filters, oscillators and antenna system components, variable capacitors and inductors, switched banks of filters, resonant comb-drives and resonant beams, and micromirror arrays for direct view and projection displays) have many applications in basic signal transduction. For example, a MEMS gyroscope measures angular rate.
- A gyroscope (hereafter “gyro” or “gyroscope”) is based on the Coriolis effect as diagrammatically illustrated in
FIG. 1 . Proof-mass 100 is moving with velocity Vd. Under external angular velocity Ω, the Coriolis effect causes movement of the poof-mass (100) with velocity Vs. With fixed Vd, the external angular velocity can be measured from Vd. A typical example based on the theory shown inFIG. 1 is capacitive MEMS gyroscope, as diagrammatically illustrated inFIG. 2 . - The MEMS gyro is a typical capacitive MEMS gyro, which has been widely studied. Regardless of various structural variations, the capacitive MEMS gyro in
FIG. 2 includes the very basic theory based on which all other variations are built. In this typical structure,capacitive MEMS gyro 102 is comprised of proof-mass 100,driving mode 104, andsensing mode 102. The driving mode (104) causes the proof-mass (100) to move in a predefined direction, and such movement is often in a form of resonance vibration. Under external angular rotation, the proof-mass (100) also moves along the Vs direction with velocity Vs. Such movement of Vs is detected by the capacitor structure of the sensing mode (102). Both of the driving and sensing modes use capacitive structures, whereas the capacitive structure of the driving mode changes the overlaps of the capacitors, and the capacitive structure of the sensing mode changes the gaps of the capacitors. - Current capacitive MEMS gyros, however, are hard to achieve submicro-g/rtHz because the capacitance between sensing electrodes decreases with the miniaturization of the movable structure of the sensing element and the impact of the stray and parasitic capacitance increase at the same time, even with large and high aspect ratio proof-masses.
- Therefore, what is desired is a MEMS device capable of sensing angular velocities and methods of operating the same.
- In view of the foregoing, a MEMS gyroscope is disclosed herein, wherein the gyroscope comprises: a first substrate having a movable portion that is movable in response to an external angular velocity, said movable portion comprising a magnetic source for generating magnetic field; a second substrate having a magnetic sensor for detecting the magnetic field from said magnetic source; and a bonding structure for bonding the first and second wafer with a predetermined distance, said bonding structure comprising: a heating mechanism for generating heating; and a bonding material.
-
FIG. 1 diagrammatically illustrates the Coriolis effect in a MEMS structure; -
FIG. 2 is a top view of a typical existing capacitive MEMS gyroscope having a driving mode and a sensing mode, wherein both of the driving and sensing mode utilize capacitance structures; -
FIG. 3 illustrates an exemplary MEMS gyroscope having a magnetic sensing mechanism; -
FIG. 4 illustrates a top view of a portion of an exemplary implementation of the MEMS gyroscope illustrated inFIG. 3 , wherein the MEMS gyroscope illustrated inFIG. 4 having a capacitive driving mode and a magnetic sensing mechanism; -
FIG. 5 illustrates a perspective view of a portion of another exemplary implementation of the MEMS gyroscope illustrated inFIG. 3 , wherein the MEMS gyroscope illustrated inFIG. 5 having a magnetic driving mechanism for the driving mode and a magnetic sensing mechanism for the sensing mode -
FIG. 6 illustrates an exemplary magnetic driving mechanism of the MEMS gyroscope inFIG. 5 ; -
FIG. 7 illustrates an exemplary magnetic source of the MEMS gyroscope illustrated inFIG. 3 ; -
FIG. 8 illustrates an exemplary magnetic sensing mechanism that can be used in the MEMS gyroscope illustrated inFIG. 3 ; -
FIG. 9 shows an exemplary thin-film stack that can be configured into a CIP or CPP structure for use in the magnetic sensing mechanism illustrated inFIG. 8 ; -
FIG. 10 illustrates an exemplary MEMS gyroscope that comprises multiple magnetic sensing structures; -
FIG. 11 illustrates an exemplary wafer bonding scheme for use in making the MEMS gyroscope shown inFIG. 3 ; and -
FIG. 12 illustrates a perspective view of the water bonding scheme inFIG. 11 . - Disclosed herein is a MEMS gyroscope for sensing an angular velocity, wherein the MEMS gyroscope utilizes a magnetic sensing mechanism. It will be appreciated by those skilled in the art that the following discussion is for demonstration purposes, and should not be interpreted as a limitation. Many other variations within the scope of the following disclosure are also applicable. For example, the MEMS gyroscope and the method disclosed in the following are applicable for use in accelerometers.
- Referring to
FIG. 3 , an exemplary MEMS gyroscope is illustrated herein. In this example,MEMS gyroscope 106 comprisesmagnetic sensing mechanism 114 for sensing the target angular velocity through the measurement of proof-mass 112. Specifically,MEMS gyroscope 106 comprises mass-substrate 108 andsensor substrate 110. Mass-substrate 108 comprises proof-mass 112 that is capable of responding to an angular velocity. The two substrates (108 and 110) are spaced apart, for example, by a pillar (not shown herein for simplicity) such that at least the proof-mass (112) is movable in response to an angular velocity under the Coriolis effect. The movement of the proof-mass (112) and thus the target angular velocity can be measured bymagnetic sensing mechanism 114. - The magnetic sensing mechanism (114) in this example comprises a
magnetic source 116 andmagnetic sensor 118. The magnetic source (116) generates a magnetic field, and the magnetic sensor (118) detects the magnetic field and/or the magnetic field variations that is generated by the magnetic source (116). In the example illustrated herein inFIG. 3 , the magnetic source is placed on/in the proof-mass (112) and moves with the proof-mass (112). The magnetic sensor (118) is placed on/in the sensor substrate (120) and non-movable relative to the moving proof-mass (112) and the magnetic source (116). With this configuration, the movement of the proof-mass 12) can be measured from the measurement of the magnetic field from the magnetic source (116). - Other than placing the magnetic source on/in the movable proof-mass (1112), the magnetic source (116) can be placed on/in the sensor substrate (120); and the magnetic sensor (118) can be placed/in the proof-mass (112).
- It is also noted that the MEMS gyroscope illustrated in
FIG. 3 can also be used as an accelerometer. - The MEMS gyroscope as discussed above with reference to
FIG. 3 can be implemented in many ways, one of which is illustrated inFIG. 4 . Referring toFIG. 4 , the proof-mass (120) is driven by capacitive, such as capacitive comb. The sensing mode, however, is performed using the magnetic sensing mechanism illustrated inFIG. 3 . For this reason, capacitive combs can be absent from the proof-mass (120). - Alternatively, the proof-mass can be driven by magnetic force, an example of which is illustrated in
FIG. 5 . Referring toFIG. 5 , the mass substrate (108) comprises a movable proof-mass (126) that is supported by flexible structures such asflexures mass substrate 108. In particular, the flexures enables the proof-mass to move along the length and the width directions, wherein the length direction can be the driving mode direction and the width direction can be the sensing mode direction of the MEMS gyro device. The proof-mass (126) is connected toframe 132 through flexures (128, 129, and 130). The frame (132) is anchored by non-movable structures such aspillar 134. The mass-substrate (108) and sensingsubstrate 110 are spaced apart by the pillar (134). The proof-mass 12) in this example is driving by a magnetic driving mechanism (136). Specifically, the proof-mass (126) can move (e.g. vibrate) in the driving mode under magnetic force applied bymagnetic driving mechanism 136, which is better illustrated inFIG. 6 . - Referring to
FIG. 6 , themagnetic driving mechanism 136 comprise amagnet core 138 surrounded bycoil 140. By applying an alternating current throughcoil 140, an alternating magnetic field can be generated from thecoil 140. The alternating magnetic field applies magnetic force to themagnet core 140 so as to move the magnet core. The magnet core thus moves the proof-mass. - The magnetic source (114) of the MEMS gyroscope (106) illustrated in
FIG. 3 can be implemented in many ways, one of which is illustrated inFIG. 7 . Referring toFIG. 7 ,conductive wire 142 is displaced on/in proof-mass 112. In one example,conductive wire 142 can be placed on the lower surface of the proof-mass (112), wherein the lower surface is facing the magnetic sensors (118 inFIG. 3 ) on the sensor substrate (110, inFIG. 3 ). Alternatively, the conductive wire (142) can be placed on the top surface of the proof-mass (112), i.e. on the opposite side of the proof-mass (112) in view of the magnetic sensor (118). In another example, the conductive wire (142) can be placed inside the proof-mass, e.g. laminated or embedded inside the proof-mass (112), which will not be detailed herein as those examples are obvious to those skilled in the art of the related technical field. - The conductive wire (142) can be implemented in many suitable ways, one of which is illustrated in
FIG. 7 . In this example, the conductive wire (142) comprises a centerconductive segment 146 and taperedcontacts - The magnetic sensor (118) illustrated in
FIG. 3 can be implemented to comprise a reference sensor (150) and a signal sensor (152) as illustrated inFIG. 8 . Referring toFIG. 8 ,magnetic senor 118 on/insensor substrate 120 comprisesreference sensor 150 andsignal sensor 152. The reference sensor (150) can be designated for dynamically measuring the magnetic signal background in which the target magnetic signal (e.g. the magnetic field from theconductive wire 146 as illustrated inFIG. 7 ) co-exists. The signal sensor (152) can be designated for dynamically measuring the target magnetic signal (e.g. the magnetic field from theconductive wire 146 as illustrated inFIG. 7 ). In other examples, the signal sensor (152) can be designated for dynamically measuring the magnetic signal background in which the target magnetic signal (e.g. the magnetic field from theconductive wire 146 as illustrated inFIG. 7 ) co-exists, while the signal sensor (150) can be designated for dynamically measuring the target magnetic signal (e.g. the magnetic field from theconductive wire 146 as illustrated inFIG. 7 ). - The reference sensor (150) and the signal sensor (152) preferably comprise magneto-resistors, such as AMRs, giant-magneto-resistors (such as spin-valves, hereafter SV), or tunneling-magneto-resistors (TMR). For demonstration purpose,
FIG. 9 illustrates a magneto-resistor structure, which can be configured into CIP (current-in-plane, such as a spin-valve) or a CPP (current-perpendicular-to-plane, such as IMP, structure). As illustrated inFIG. 9 , the magneto-resistor stack comprises top pin-layer 154, free-layer 156,spacer 158,reference layer 160,bottom pin layer 162, andsubstrate 120.Top pin layer 154 is provided for magnetically pinningfree layer 156. The top pin layer can be comprised of IrMn, PtMn or other suitable magnetic materials. The free layer (156) can be comprised of a ferromagnetic material, such as NiFe, CoFe, CoFeB, or other suitable materials or the combinations thereof. The spacer (158) can be comprised of a non-magnetic conductive material, such as Cu, or an oxide material, such as Al2O3 or MgO or other suitable materials The reference layer (160) can be comprised of a ferromagnetic magnetic material, such as NiFe, CoFe, CoFeB, or other materials or the combinations thereof. The bottom pin layer (162) is provided for magnetic pinning the reference layer (160), which can be comprised of a IrMn, PtMn or other suitable materials or the combinations thereof. The substrate (120) can be comprised of any suitable materials, such as glass, silicon, or other materials or the combinations thereof. - In examples wherein the spacer (158) is comprised of a non-magnetic conductive layer, such as Cu, the magneto-resistor (118) stack can be configured into a CIP structure (i.e. spin-valve, SV), wherein the current is driven in the plane of the stack layers. When the spacer (158) is comprised of an oxide such as Al2O3, MgO or the like, the magneto-resistor stack (118) can be configured into a CPP structure (i.e. TMR), wherein the current is driven perpendicularly to the stack layers.
- In the example as illustrated in
FIG. 9 , the free layer (156) is magnetically pinned by the top pin layer (154), and the reference layer (160) is also magnetically pinned bybottom pin layer 162. The top pin layer (154) and the bottom pin layer (162) preferably having different blocking temperatures. In this specification, a blocking temperature is referred to as the temperature, above which the magnetic pin layer is magnetically decoupled with the associated pinned magnetic layer. For example, the top pin layer (154) is magnetically decoupled with the free layer (156) above the blocking temperature TB of the top pin layer (154) such that the free layer (156) is “freed” from the magnetic pinning of top pin layer (154). Equal to or below the blocking temperature TB of the top pin layer (154), the free layer (156) is magnetically pinned by the top pin layer (154) such that the magnetic orientation of the free layer (156) is substantially not affected by the external magnetic field. Similarly, the bottom pin layer (162) is magnetically decoupled with the reference layer (160) above the blocking temperature TB of the bottom pin layer (162) such that the reference layer (160) is “freed” from the magnetic pinning of bottom pin layer (162). Equal to or below the blocking temperature TB of the bottom pin layer (162), the reference layer (160) is magnetically pinned by the bottom pin layer (162) such that the magnetic orientation of the reference layer (162) is substantially not affected by the external magnetic field. - The top and bottom pin layers (154 and 162, respectively) preferably have different blocking temperatures. When the free layer (156) is “freed” from being pinned by the top pin layer (154), the reference layer (160) preferably remains being pinned by the bottom pin layer (162). Alternatively, when the free layer (156) is still pinned by the top pin layer (154), the reference layer (160) can be “freed” from being pinned by the bottom pin layer (162). In the later example, the reference layer (160) can be used as a “sensing layer” for responding to the external magnetic field such as the target magnetic field, while the free layer (156) is used as a reference layer to provide a reference magnetic orientation.
- The different blocking temperatures can be accomplished by using different magnetic materials for the top pin layer (154) and bottom pin layer (162). In one example, the top pin layer (154) can be comprised of IrMn, while the bottom pin layer (162) can be comprised of PtMn, vice versa. In another example, both of the top and bottom pin layers (154 and 162) may be comprised of the same material, such as IrMn or PtMn, but with different thicknesses such that they have different blocking temperatures.
- It is noted by those skilled in the art that the magneto-resistor stack (118) is configured into sensors for sensing magnetic signals. As such, the magnetic orientations of the free layer (156) and the reference layer (160) are substantially perpendicular at the initial state. Other layers, such as protective layer Ta, seed layers for growing the stack layers on
substrate 120 can be provided, It is further noted that the magnetic stack layers (118) illustrated inFIG. 9 are what is often referred to as “bottom pin” configuration in the field of art. In other examples, the stack can be configured into what is often referred as “top pinned” configuration in the field of art, which will not be detailed herein. - In some applications, multiple magnetic sensing mechanisms can be provided, an example of which is illustrated in
FIG. 10 . Referring toFIG. 10 ,magnetic sensing mechanisms mass 112. The multiple magnetic sensing mechanisms can be used for detecting the movements of proof-mass 112 in driving mode and sensing mode respectively. Alternatively, the multiplemagnetic sensing mechanisms - The MEMS gyroscope as discussed above can be fabricated in many ways. During fabrication, special concerns on the fact that magnetic sensor and MEMS proof-mass may having different properties need to be addressed. In some examples, the magnetic sensor comprises spintronic structures, such as spin-valve (SV), magnetic-tunnel-junction (MTJ) or other similar structures. These spintronic structures in general has a blocking temperature that is 220 C or less, which means that these spintronic structures can be processed at a temperature mot higher than the blocking temperature. However, the MEMS structures generally are processed at a much higher temperature, such as 250 C or higher. IN particular, bonding the MEMS wafer having the proof-mass and the magnetic sensor wafer having the magnetic sensor generally requires a bonding temperature of 250 C or higher to secure a reliable bonding strength. This problem can be solved by using a localized heating, as illustrated in
FIG. 11 . - Referring to
FIG. 11 ,MEMS wafer 108 has proof-mass 112, on whichmagnetic source 116 is provided.Magnetic sensor wafer 110 hasmagnetic sensor 118.MEMS wafer 108 andmagnetic sensor wafer 110 can be bonded by usingbonding structure 170 that comprises a pillar (e.g. pillar 172 and/or 174), localizedheater 176 andbonding material 178.FIG. 12 shows a perspective view of the structure inFIG. 11 to better illustrate the structure. - Referring to
FIG. 12 ,localized heater 176 is disposed on the surface ofpillar 174 whereinpillar 174 in this example forms a hermetic bonding even though not required in some examples. The localized heater is conductive such that it generates localized heating to raise the temperature in the vicinity of the heater when current is driven through. The localized heater has twoterminals 182 fur feeding current.Bonding material 178, which can be any suitable bonding materials, such as a glass frit, metal alloy, or metal can be disposed on the heater. In this way, the bonding material (178) and the pillar (174) laminate the localized heater therebetween. In some examples especially when the bonding material is conductive, an insulating layer can be disposed between the localized heater (176) andbonding material 178, which is not shown in the figure. - In a bonding process, current is driven into the localized heater through
terminals 182. As current flows through the localized heater, the temperature in the vicinity of the heater (176) is elevated. When this temperature equals to or higher than the melting temperature of thebonding material 178, the pillar (174) can be bonded to the magnetic sensor wafer (120) (which is not shown inFIG. 12 ). In this bonding process, pressure can be applied. - By using the localized heater (176), only the area in the vicinity of the heater (176) raises its temperature. The magnetic sensor may not experience temperature raise. As such, the bonding area (the area wherein the bonding material is disposed) can have a temperature higher than 220 C, such as 350 C or 400 C, while the area wherein the magnetic sensor is disposed may still keep a safe temperature that is lower than 200 C.
- the example shown in
FIG. 12 ,pillar 174 forms a hermetic bonding. The same bonding scheme and process are also applicable examples wherein the MEMS wafer and the magnetic sensor wafer are bonded non-hermetically. In those examples, multiple pillars can be provided; and each bonding area at individual pillars may be provided with a localized heater for generating localized heating. - The pillar (172, 174) can be separately provided. In another example, the pillar can be directly formed from the MEMS wafer (108) shown in
FIG. 11 . Alternatively, the pillar can be formed from the magnetic sensor wafer, in examples of which, the localized heater and the bonding materials can be disposed in the vicinity of the MEMS wafer (108). - It will be appreciated by those of skilled in the art that a new and useful MEMS gyroscope has been described herein. In view of the many possible embodiments, however, it should be recognized that the embodiments described herein with respect to the drawing figures are meant to be illustrative only and should not be taken as limiting the scope of what is claimed. Those of skill in the art will recognize that the illustrated embodiments can be modified in arrangement and detail. Therefore, the devices and methods as described herein contemplate all such embodiments as may come within the scope of the following claims and equivalents thereof. In the claims, only elements denoted by the words “means for” are intended to be interpreted as means plus function claims under 35 U.S.C. §112, the sixth paragraph.
Claims (7)
1. A MEMS gyroscope, comprising:
a first substrate having a movable portion that is movable in response to an external angular velocity, said movable portion comprising a magnetic source for generating magnetic field;
a second substrate having a magnetic sensor for detecting the magnetic field from said magnetic source; and
a bonding structure for bonding the first and second wafer with a predetermined distance, said bonding structure comprising:
a heating mechanism for generating heating; and
a bonding material.
2. The MEMS gyroscope of claim 1 , wherein the bonding structure further comprises an insulating layer between the heating mechanism and the bonding material.
3. The MEMS gyroscope of claim 2 , wherein the bonding material comprises a metal or a metal alloy.
4. The MEMS gyroscope of claim 2 , wherein the magnetic sensor comprises a giant-magnetic-resistor.
5. The MEMS gyroscope of claim 2 , wherein the magnetic sensors comprises a spin-valve structure.
6. The MEMS gyroscope of claim 2 , wherein the magnetic sensors comprises a tunnel-magnetic-resistor.
7. The MEMS gyroscope of claim 2 , wherein the magnetic sensors comprises a magnetic pickup coil that is an element of a fluxgate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/512,469 US20160154070A1 (en) | 2012-07-27 | 2014-10-13 | Wafer bonding method for use in making a mems gyroscope |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201213559625A | 2012-07-27 | 2012-07-27 | |
US13/854,972 US20140290365A1 (en) | 2013-04-02 | 2013-04-02 | Mems device |
US14/512,469 US20160154070A1 (en) | 2012-07-27 | 2014-10-13 | Wafer bonding method for use in making a mems gyroscope |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US201213559625A Continuation | 2012-05-31 | 2012-07-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
US20160154070A1 true US20160154070A1 (en) | 2016-06-02 |
Family
ID=49993560
Family Applications (14)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/935,558 Abandoned US20140026659A1 (en) | 2012-07-27 | 2013-07-05 | Mems device and a method of using the same |
US13/935,557 Abandoned US20140026658A1 (en) | 2012-07-27 | 2013-07-05 | Mems device and a method of using the same |
US13/936,143 Abandoned US20140190257A1 (en) | 2012-07-27 | 2013-07-06 | Mems device and a method of using the same |
US13/936,144 Abandoned US20140026660A1 (en) | 2012-07-27 | 2013-07-06 | Mems device |
US13/936,145 Abandoned US20140026661A1 (en) | 2012-07-27 | 2013-07-06 | Mems device |
US14/178,229 Abandoned US20150226555A1 (en) | 2012-07-27 | 2014-02-11 | Mems gyroscope |
US14/512,469 Abandoned US20160154070A1 (en) | 2012-07-27 | 2014-10-13 | Wafer bonding method for use in making a mems gyroscope |
US14/518,688 Expired - Fee Related US10012670B2 (en) | 2012-07-27 | 2014-10-20 | Wafer bonding method for use in making a MEMS gyroscope |
US14/518,651 Abandoned US20150033855A1 (en) | 2012-07-27 | 2014-10-20 | Mems device |
US14/518,621 Abandoned US20160154019A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,355 Abandoned US20150033854A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,712 Abandoned US20160154020A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,607 Abandoned US20160153780A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,665 Abandoned US20150033856A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
Family Applications Before (6)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/935,558 Abandoned US20140026659A1 (en) | 2012-07-27 | 2013-07-05 | Mems device and a method of using the same |
US13/935,557 Abandoned US20140026658A1 (en) | 2012-07-27 | 2013-07-05 | Mems device and a method of using the same |
US13/936,143 Abandoned US20140190257A1 (en) | 2012-07-27 | 2013-07-06 | Mems device and a method of using the same |
US13/936,144 Abandoned US20140026660A1 (en) | 2012-07-27 | 2013-07-06 | Mems device |
US13/936,145 Abandoned US20140026661A1 (en) | 2012-07-27 | 2013-07-06 | Mems device |
US14/178,229 Abandoned US20150226555A1 (en) | 2012-07-27 | 2014-02-11 | Mems gyroscope |
Family Applications After (7)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/518,688 Expired - Fee Related US10012670B2 (en) | 2012-07-27 | 2014-10-20 | Wafer bonding method for use in making a MEMS gyroscope |
US14/518,651 Abandoned US20150033855A1 (en) | 2012-07-27 | 2014-10-20 | Mems device |
US14/518,621 Abandoned US20160154019A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,355 Abandoned US20150033854A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,712 Abandoned US20160154020A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,607 Abandoned US20160153780A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
US14/518,665 Abandoned US20150033856A1 (en) | 2012-07-27 | 2014-10-20 | Mems gyroscope |
Country Status (1)
Country | Link |
---|---|
US (14) | US20140026659A1 (en) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9254992B2 (en) * | 2012-07-27 | 2016-02-09 | Tao Ju | Method of making a MEMS gyroscope having a magnetic source and a magnetic sensing mechanism |
CN103728467B (en) * | 2012-10-16 | 2016-03-16 | 无锡华润上华半导体有限公司 | Plane-parallel capacitor |
US9513346B2 (en) * | 2014-01-07 | 2016-12-06 | Invensense, Inc. | Magnetic sensors with permanent magnets magnetized in different directions |
US9513347B2 (en) * | 2013-10-31 | 2016-12-06 | Invensense, Inc. | Device with magnetic sensors with permanent magnets |
US9296606B2 (en) * | 2014-02-04 | 2016-03-29 | Invensense, Inc. | MEMS device with a stress-isolation structure |
DE102014109701A1 (en) * | 2014-07-10 | 2016-01-14 | Epcos Ag | sensor |
US9697656B2 (en) * | 2014-08-19 | 2017-07-04 | Sensormatic Electronics, LLC | Method and system for access control proximity location |
WO2016046778A2 (en) | 2014-09-25 | 2016-03-31 | Amgen Inc | Protease-activatable bispecific proteins |
US20170303646A1 (en) * | 2014-12-29 | 2017-10-26 | Loop Devices, Inc. | Functional, socially-enabled jewelry and systems for multi-device interaction |
US10373523B1 (en) | 2015-04-29 | 2019-08-06 | State Farm Mutual Automobile Insurance Company | Driver organization and management for driver's education |
US9586591B1 (en) | 2015-05-04 | 2017-03-07 | State Farm Mutual Automobile Insurance Company | Real-time driver observation and progress monitoring |
US10364140B2 (en) * | 2015-09-22 | 2019-07-30 | Nxp Usa, Inc. | Integrating diverse sensors in a single semiconductor device |
DE102015117094B4 (en) * | 2015-10-07 | 2020-04-23 | Tdk Electronics Ag | MEMS rotation rate sensor |
WO2017105472A1 (en) * | 2015-12-17 | 2017-06-22 | Intel Corporation | Microelectronic devices for isolating drive and sense signals of sensing devices |
US10982530B2 (en) * | 2016-04-03 | 2021-04-20 | Schlumberger Technology Corporation | Apparatus, system and method of a magnetically shielded wellbore gyroscope |
WO2018023033A1 (en) | 2016-07-29 | 2018-02-01 | Western Michigan University Research Foundation | Magnetic nanoparticle-based gyroscopic sensor |
US10591645B2 (en) * | 2016-09-19 | 2020-03-17 | Apple Inc. | Electronic devices having scratch-resistant antireflection coatings |
US10996125B2 (en) * | 2017-05-17 | 2021-05-04 | Infineon Technologies Ag | Pressure sensors and method for forming a MEMS pressure sensor |
US20220178692A1 (en) * | 2017-12-21 | 2022-06-09 | Mindmaze Holding Sa | System, method and apparatus of a motion sensing stack with a camera system |
CN109142785B (en) * | 2018-09-10 | 2021-03-23 | 东南大学 | Horizontal axis sensitive tunnel magnetic resistance accelerometer device based on 3D prints |
US10876839B2 (en) | 2018-09-11 | 2020-12-29 | Honeywell International Inc. | Spintronic gyroscopic sensor device |
US10871529B2 (en) | 2018-09-11 | 2020-12-22 | Honeywell International Inc. | Spintronic mechanical shock and vibration sensor device |
US10802087B2 (en) | 2018-09-11 | 2020-10-13 | Honeywell International Inc. | Spintronic accelerometer |
CN111413653A (en) * | 2019-01-07 | 2020-07-14 | 中国科学院上海微系统与信息技术研究所 | Magnetic field sensor structure and preparation method thereof |
CN109737944A (en) * | 2019-03-01 | 2019-05-10 | 成都因赛泰科技有限责任公司 | A kind of MEMS gyroscope with embedded magnetic source |
US11054438B2 (en) | 2019-03-29 | 2021-07-06 | Honeywell International Inc. | Magnetic spin hall effect spintronic accelerometer |
CN109883456A (en) | 2019-04-02 | 2019-06-14 | 江苏多维科技有限公司 | A kind of magneto-resistor inertial sensor chip |
CN111579818B (en) * | 2020-07-06 | 2021-09-28 | 吉林大学 | High-sensitivity low-noise acceleration detection device and method |
US11844284B2 (en) * | 2021-06-29 | 2023-12-12 | International Business Machines Corporation | On-chip integration of a high-efficiency and a high-retention inverted wide-base double magnetic tunnel junction device |
CN115165005B (en) * | 2022-08-26 | 2024-03-08 | 南京高华科技股份有限公司 | MEMS flow sensor and preparation method thereof |
CN116165576B (en) * | 2022-12-23 | 2023-12-12 | 南方电网数字电网研究院有限公司 | TMRz axis magnetic field sensor |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5991085A (en) * | 1995-04-21 | 1999-11-23 | I-O Display Systems Llc | Head-mounted personal visual display apparatus with image generator and holder |
US20060115323A1 (en) * | 2004-11-04 | 2006-06-01 | Coppeta Jonathan R | Compression and cold weld sealing methods and devices |
US20070209437A1 (en) * | 2005-10-18 | 2007-09-13 | Seagate Technology Llc | Magnetic MEMS device |
US20100039106A1 (en) * | 2008-08-14 | 2010-02-18 | U.S. Government As Represented By The Secretary Of The Army | Mems device with tandem flux concentrators and method of modulating flux |
Family Cites Families (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3800213A (en) * | 1972-10-24 | 1974-03-26 | Develco | Three axis toroidal fluxgate type magnetic sensor |
JP3000891B2 (en) * | 1995-06-27 | 2000-01-17 | 株式会社村田製作所 | Vibrating gyro |
GB2322196B (en) * | 1997-02-18 | 2000-10-18 | British Aerospace | A vibrating structure gyroscope |
US5911156A (en) * | 1997-02-24 | 1999-06-08 | The Charles Stark Draper Laboratory, Inc. | Split electrode to minimize charge transients, motor amplitude mismatch errors, and sensitivity to vertical translation in tuning fork gyros and other devices |
US6820896B1 (en) * | 1998-05-19 | 2004-11-23 | Peter Norton | Seat occupant weight sensing system |
US6133670A (en) | 1999-06-24 | 2000-10-17 | Sandia Corporation | Compact electrostatic comb actuator |
US6211599B1 (en) | 1999-08-03 | 2001-04-03 | Sandia Corporation | Microelectromechanical ratcheting apparatus |
US7541214B2 (en) * | 1999-12-15 | 2009-06-02 | Chang-Feng Wan | Micro-electro mechanical device made from mono-crystalline silicon and method of manufacture therefore |
US20040102880A1 (en) * | 2001-10-17 | 2004-05-27 | Brown James K | System for monitoring vehicle wheel vibration |
US7040163B2 (en) * | 2002-08-12 | 2006-05-09 | The Boeing Company | Isolated planar gyroscope with internal radial sensing and actuation |
US6944931B2 (en) * | 2002-08-12 | 2005-09-20 | The Boeing Company | Method of producing an integral resonator sensor and case |
US7168318B2 (en) * | 2002-08-12 | 2007-01-30 | California Institute Of Technology | Isolated planar mesogyroscope |
US7071594B1 (en) * | 2002-11-04 | 2006-07-04 | Microvision, Inc. | MEMS scanner with dual magnetic and capacitive drive |
US7054114B2 (en) * | 2002-11-15 | 2006-05-30 | Nve Corporation | Two-axis magnetic field sensor |
US7197928B2 (en) * | 2003-11-04 | 2007-04-03 | Chung-Shan Institute Of Science And Technology | Solid-state gyroscopes and planar three-axis inertial measurement unit |
DE102004011591A1 (en) * | 2004-03-10 | 2005-09-29 | Robert Bosch Gmbh | connecting element |
US7464590B1 (en) * | 2004-03-12 | 2008-12-16 | Thomson Licensing | Digitally programmable bandwidth for vibratory rate gyroscope |
US7200032B2 (en) * | 2004-08-20 | 2007-04-03 | Infineon Technologies Ag | MRAM with vertical storage element and field sensor |
DE602006000836T2 (en) * | 2005-03-24 | 2009-05-14 | Hitachi, Ltd. | Line control arrangement |
US20070064351A1 (en) * | 2005-09-13 | 2007-03-22 | Wang Shan X | Spin filter junction and method of fabricating the same |
SG135077A1 (en) * | 2006-02-27 | 2007-09-28 | Nanyang Polytechnic | Apparatus and method for non-invasively sensing pulse rate and blood flow anomalies |
US8397568B2 (en) * | 2006-04-24 | 2013-03-19 | Milli Sensor Systems+Actuators | Bias measurement for MEMS gyroscopes and accelerometers |
AT503995B1 (en) * | 2006-08-07 | 2009-03-15 | Arc Seibersdorf Res Gmbh | MINIATURE SENSOR ACCELERATION |
US7793541B2 (en) * | 2007-06-04 | 2010-09-14 | The Boeing Company | Planar resonator gyroscope central die attachment |
US7987714B2 (en) * | 2007-10-12 | 2011-08-02 | The Boeing Company | Disc resonator gyroscope with improved frequency coincidence and method of manufacture |
WO2009050672A2 (en) * | 2007-10-18 | 2009-04-23 | Nxp B.V. | Magnetic detection of back-side layer |
WO2009109969A2 (en) * | 2008-03-03 | 2009-09-11 | Ramot At Tel-Aviv University Ltd. | Micro scale mechanical rate sensors |
US9016126B2 (en) * | 2009-01-07 | 2015-04-28 | Honeywell International Inc. | MEMS accelerometer having a flux concentrator between parallel magnets |
US8322028B2 (en) * | 2009-04-01 | 2012-12-04 | The Boeing Company | Method of producing an isolator for a microelectromechanical system (MEMS) die |
US8393212B2 (en) * | 2009-04-01 | 2013-03-12 | The Boeing Company | Environmentally robust disc resonator gyroscope |
ITTO20091042A1 (en) * | 2009-12-24 | 2011-06-25 | St Microelectronics Srl | MICROELETTROMECHANICAL INTEGRATED GYROSCOPE WITH IMPROVED DRIVE STRUCTURE |
JP5558122B2 (en) * | 2010-01-15 | 2014-07-23 | 株式会社リブ技術研究所 | Communication circuit, relay connection circuit, and communication network |
US8453504B1 (en) * | 2010-01-23 | 2013-06-04 | Minyao Mao | Angular rate sensor with suppressed linear acceleration response |
IT1403434B1 (en) * | 2010-12-27 | 2013-10-17 | St Microelectronics Srl | MAGNETIC FIELD SENSOR WITH ANISOTROPIC MAGNETORESISTIVE ELEMENTS, WITH PERFECT ARRANGEMENT OF RELATIVE MAGNETIZATION ELEMENTS |
US9588190B2 (en) * | 2012-07-25 | 2017-03-07 | Silicon Laboratories Inc. | Resonant MEMS lorentz-force magnetometer using force-feedback and frequency-locked coil excitation |
US9429427B2 (en) * | 2012-12-19 | 2016-08-30 | Intel Corporation | Inductive inertial sensor architecture and fabrication in packaging build-up layers |
-
2013
- 2013-07-05 US US13/935,558 patent/US20140026659A1/en not_active Abandoned
- 2013-07-05 US US13/935,557 patent/US20140026658A1/en not_active Abandoned
- 2013-07-06 US US13/936,143 patent/US20140190257A1/en not_active Abandoned
- 2013-07-06 US US13/936,144 patent/US20140026660A1/en not_active Abandoned
- 2013-07-06 US US13/936,145 patent/US20140026661A1/en not_active Abandoned
-
2014
- 2014-02-11 US US14/178,229 patent/US20150226555A1/en not_active Abandoned
- 2014-10-13 US US14/512,469 patent/US20160154070A1/en not_active Abandoned
- 2014-10-20 US US14/518,688 patent/US10012670B2/en not_active Expired - Fee Related
- 2014-10-20 US US14/518,651 patent/US20150033855A1/en not_active Abandoned
- 2014-10-20 US US14/518,621 patent/US20160154019A1/en not_active Abandoned
- 2014-10-20 US US14/518,355 patent/US20150033854A1/en not_active Abandoned
- 2014-10-20 US US14/518,712 patent/US20160154020A1/en not_active Abandoned
- 2014-10-20 US US14/518,607 patent/US20160153780A1/en not_active Abandoned
- 2014-10-20 US US14/518,665 patent/US20150033856A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5991085A (en) * | 1995-04-21 | 1999-11-23 | I-O Display Systems Llc | Head-mounted personal visual display apparatus with image generator and holder |
US20060115323A1 (en) * | 2004-11-04 | 2006-06-01 | Coppeta Jonathan R | Compression and cold weld sealing methods and devices |
US20070209437A1 (en) * | 2005-10-18 | 2007-09-13 | Seagate Technology Llc | Magnetic MEMS device |
US20100039106A1 (en) * | 2008-08-14 | 2010-02-18 | U.S. Government As Represented By The Secretary Of The Army | Mems device with tandem flux concentrators and method of modulating flux |
Also Published As
Publication number | Publication date |
---|---|
US20150033856A1 (en) | 2015-02-05 |
US20150033854A1 (en) | 2015-02-05 |
US10012670B2 (en) | 2018-07-03 |
US20140026660A1 (en) | 2014-01-30 |
US20140026659A1 (en) | 2014-01-30 |
US20160154020A1 (en) | 2016-06-02 |
US20140190257A1 (en) | 2014-07-10 |
US20150226555A1 (en) | 2015-08-13 |
US20160153780A1 (en) | 2016-06-02 |
US20150033855A1 (en) | 2015-02-05 |
US20160154019A1 (en) | 2016-06-02 |
US20140026658A1 (en) | 2014-01-30 |
US20150034620A1 (en) | 2015-02-05 |
US20140026661A1 (en) | 2014-01-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10012670B2 (en) | Wafer bonding method for use in making a MEMS gyroscope | |
US9254992B2 (en) | Method of making a MEMS gyroscope having a magnetic source and a magnetic sensing mechanism | |
US20150033853A1 (en) | Mems gyroscope | |
US8742520B2 (en) | Three axis magnetic sensor device and method | |
US8407905B1 (en) | Multiple magneto meters using Lorentz force for integrated systems | |
US20140266170A1 (en) | Magnetometer using magnetic materials on accelerometer | |
JP5140291B2 (en) | Motion sensor | |
US10119988B2 (en) | MLU based accelerometer using a magnetic tunnel junction | |
CN104567848B (en) | A kind of micromechanical gyro based on tunnel magneto-resistance effect | |
CN107421525A (en) | A kind of tunnel magnetoresistive disresonance type 3 axis MEMS gyro | |
CN107356249A (en) | A kind of micro- inertia component of tunnel magnetoresistive detection | |
US20140290365A1 (en) | Mems device | |
EP3346281B1 (en) | Mems triaxial magnetic sensor with improved configuration | |
CN107131819B (en) | Single-axis micro-mechanical displacement sensor based on tunnel magnetoresistance effect | |
CN110940329A (en) | Triaxial microgyroscope device based on tunnel magnetic resistance detection | |
CN107449410A (en) | Microthrust test device is detected in electromagnetic drive type tunnel magnetoresistive face | |
CN103278148B (en) | Two-axis microgyroscope of magnetostrictive solid oscillator | |
CN207395750U (en) | Microthrust test device is detected in electromagnetic drive type tunnel magnetoresistive face | |
CN207197533U (en) | A kind of tunnel magnetoresistive disresonance type 3 axis MEMS gyro | |
JP2008224486A (en) | Magnetic pressure sensor | |
CN110966997A (en) | Piezoelectric driving type micro gyroscope device for in-plane detection of tunnel magneto-resistive | |
Lee et al. | Design and implementation of a fully-decoupled tuning fork (FDTF) MEMS vibratory gyroscope for robustness improvement | |
KR102615083B1 (en) | Electrostatically Driven 2-Axis MEMS Magnetometer Using Electromagnetic Inductor on Eccentric Resonator and manufacturing method thereof | |
CN211717457U (en) | Piezoelectric driving type micro gyroscope device for in-plane detection of tunnel magneto-resistive | |
JP2008224487A (en) | Magnetic pressure sensor |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |