US3453783A - Apparatus for holding silicon slices - Google Patents

Apparatus for holding silicon slices Download PDF

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Publication number
US3453783A
US3453783A US561943A US3453783DA US3453783A US 3453783 A US3453783 A US 3453783A US 561943 A US561943 A US 561943A US 3453783D A US3453783D A US 3453783DA US 3453783 A US3453783 A US 3453783A
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slices
polishing
block
rings
recesses
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US561943A
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William D Queen
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Texas Instruments Inc
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Texas Instruments Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • H01L21/02024Mirror polishing
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces

Definitions

  • a conventional manner of mounting the slices involves affixing the slices to a polishing block by use of cerese wax or beeswax.
  • the metal polishing block on which the slices are to be mounted is first heated by placing the block on a hot plate or the like. When hot, the block is rubber with a solid stick of the wax which melts to form a layer of molten wax.
  • the wafers are dropped onto the molten wax and the block removed from the hot plate to permit the wax to solidify.
  • a weight is placed on the slices during solidification of the wax. Any wax contacting the top, or exposed face of the slice must be removed with a suitable solvent, such as trichloroethylene.
  • the polishing block may then be inverted and the exposed face of the wafer contacted with a rotating grinder or polisher, or alternatively the slices are rotated and contacted with a stationary grinder or polisher.
  • the wax used to affix them to the polishing block must be very clean since any particles lodging beneath the slice could cause a crack to form during application of the weight or during the grinding and polishing operations destroying the electrical properties of the silicon.
  • the polishing block When polishing of the slices has been completed, the polishing block is again placed on a hot plate or the like to remelt the wax to permit removal of the slices.
  • the slices upon removal and before treatment with doping agents and the like, must be cleaned with a suitable solvent such as trichloroethylene to remove any wax adhering to the slice.
  • the present invention involves apparatus which greatly reduces the time necessary to mount and demount slices which are to be ground and polished.
  • the invention may be generally described as apparatus for holding thin slices so that one face of the slice is exposed for polishing which includes means defining an opening having a configuration within which the slice may be relatively snugly accommodated.
  • An elastomeric member forms with the opening a recess having a depth less than the thickness of the slice, and the elastomeric element is supported in this relationship by suitable means.
  • FIGURE 1 is a top plan view of one embodiment of the invention.
  • FIGURE 2 is a cross-sectional view along line 2-2 of FIGURE 1;
  • FIGURES 3 is an enlarged cross-sectional view of a portion of the embodiment illustrated in FIGURES 1 and 2;
  • FIGURE 4 is a partial top plan view of an alternative embodiment.
  • a conventional polishing block 4 formed of a cylindrical plate of metal or the like is provided about its periphery with a plurality of teeth 5 adapted to engage a gear, not illustrated, for driving the block.
  • an adhesive 6, such as Pliobond brand adhesive is an elastomeric member which takes the form of rubber pad 7. Rubber pad 7 preferably has a durometer of about 60 and may conveniently be between and inch thick.
  • Affixed to the relatively planar elastomeric surface 10 of pad 7 by an adhesive 8, such as Pliobond brand adhesive are a plurality of opening defining members, such as annular rings 9. Rings 9 are preferably made of a relatively deformable plastic material such as Mylar film which preferably have a thickness on the order of about 7.5 mils. While a Mylar film is preferred, other relatively deformable plastics and rubbers may be used.
  • Rings 9 form with pad 7 a plurality of recesses 11 which are adapted to receive, and accommodate relatively snugly, a plurality of silicon slices 12.
  • the depth of recesses 11 is less than that of the thickness of the slices 12 so that faces 13 of the slices are exposed above the rings 9 to prevent contact between a grinding or polishing wheel and rings 9.
  • Slices 12 may be retained within recesses 11 to permit inversion of the polishing block 4 in the conventional manner by placing a drop of water on the bottom face 14 of the slice. The surface tension of the water will serve to retain the relatively light slices within recesses 11.
  • faces 13 and 14 of the slices 12 are rough before polishing.
  • Pad 7 due to its elastomeric nature, will conform to the irregularities in face 14 preventing the creation of unwanted stresses in slice 12 during polishing.
  • the rings 9 are of a relatively deformable plastic, any engagement of the periphery 15 of the slices with rings 9 during polishing will not result in chipping of the perihpery 15 of slice 12.
  • FIG- URES 1-3 While the particular embodiment illustrated in FIG- URES 1-3 is the preferred one, it is also contemplated that a plurality of recesses may be drilled in polishing block 4 and an elastomeric member placed in the bottom of the recess to abs-orb the irregularities in faces 14 of slices 12.
  • the peripheries of the recesses would be lined with a relatively deformable material to protect the peripheries 15 of the slices during the polishing.
  • rings 9 may be formed of a ferromagnetic metal in which case block 4 could be magnetized and the rings 9 adhered directly to the surface of block 4 by magnetic attraction. An elastomeric pad could then be placed in the bottom of rings 9 and adhered in place by any suitable adhesive.
  • the need for the adhesive used in the embodiment shown in FIG- URES 1-3 is eliminated.
  • the polishing block 16 is covered with an elastomeric' pad 17 which in turn is covered by a circular Mylar film 18 having a plurality of apertures 19 which, with pad 17, define recesses 20 adapted to receive silicon slices 12.
  • the elastomeric pad 17 and Mylar film 18 are retained in juxtaposition by a plurality of nuts 21 which are threadably received about a plurality of screws 22 extending through block 16, pad 17 and film 18.
  • the slices 12 illustrated in FIGURES 13 may be removed by flowing water into recesses 11 to float the slices from the recesses 11.
  • the slices 12 illustrated in FIGURE 4 are removed in the same manner.
  • the adhesive used in the embodiment illustrated in FIG- URES l-3 is preferably one which will withstand repeated application of Water without deterioration.
  • An apparatus for holding a plurality of thin wafers so that one face of each Wafer is exposed for polishing comprising:
  • annular rings comprise a magnetized ferromagnetic material.

Description

July 8, 1969 w. D. QUEEN 3,453,783
APPARATUS FOR HOLDING SILICON SLICES Filed June 50, 1966 INVENTORZ l LIAM D. U FIG. 3 WL O EEN ATTORNEY United States Patent 3,453,783 APPARATUS FOR HOLDING SILICON SLICES William D. Queens, Dallas, Tex., assignor to Texas Instruments Incorporated, Dallas, Tex., a corporation of Delaware Filed June 30, 1966, Ser. No. 561,943 Int. Cl. B24b 41/06, /00, 29/00 US. Cl. 51-216 3 Claims ABSTRACT OF THE DISCLOSURE This invention relates to apparatus for holding thin wafers for polishing, and more particularly, but not by way of limitation, to apparatus for holding silicon slices for polishing.
In the manufacture of electronic devices from silicon, it is common to form relatively thin silicon slices which must be polished on at least one face.
A conventional manner of mounting the slices involves affixing the slices to a polishing block by use of cerese wax or beeswax. The metal polishing block on which the slices are to be mounted is first heated by placing the block on a hot plate or the like. When hot, the block is rubber with a solid stick of the wax which melts to form a layer of molten wax. The wafers are dropped onto the molten wax and the block removed from the hot plate to permit the wax to solidify. To assure that the slices are level on the polishing block, a weight is placed on the slices during solidification of the wax. Any wax contacting the top, or exposed face of the slice must be removed with a suitable solvent, such as trichloroethylene. The polishing block may then be inverted and the exposed face of the wafer contacted with a rotating grinder or polisher, or alternatively the slices are rotated and contacted with a stationary grinder or polisher.
Since the slices are relatively thin, in some cases having a thickness of about mils, the wax used to affix them to the polishing block must be very clean since any particles lodging beneath the slice could cause a crack to form during application of the weight or during the grinding and polishing operations destroying the electrical properties of the silicon.
When polishing of the slices has been completed, the polishing block is again placed on a hot plate or the like to remelt the wax to permit removal of the slices. The slices, upon removal and before treatment with doping agents and the like, must be cleaned with a suitable solvent such as trichloroethylene to remove any wax adhering to the slice.
The steps of mounting and demounting the slices are time consuming, manual operations which are quite costly.
The present invention involves apparatus which greatly reduces the time necessary to mount and demount slices which are to be ground and polished. The invention may be generally described as apparatus for holding thin slices so that one face of the slice is exposed for polishing which includes means defining an opening having a configuration within which the slice may be relatively snugly accommodated. An elastomeric member forms with the opening a recess having a depth less than the thickness of the slice, and the elastomeric element is supported in this relationship by suitable means.
ice
To be more specific, reference is here made to the drawings, in which:
FIGURE 1 is a top plan view of one embodiment of the invention;
FIGURE 2 is a cross-sectional view along line 2-2 of FIGURE 1;
FIGURES 3 is an enlarged cross-sectional view of a portion of the embodiment illustrated in FIGURES 1 and 2; and
FIGURE 4 is a partial top plan view of an alternative embodiment.
With reference to FIGURES l, 2, and 3 a conventional polishing block 4 formed of a cylindrical plate of metal or the like is provided about its periphery with a plurality of teeth 5 adapted to engage a gear, not illustrated, for driving the block. Affixed to the surface of block 4 by an adhesive 6, such as Pliobond brand adhesive, is an elastomeric member which takes the form of rubber pad 7. Rubber pad 7 preferably has a durometer of about 60 and may conveniently be between and inch thick. Affixed to the relatively planar elastomeric surface 10 of pad 7 by an adhesive 8, such as Pliobond brand adhesive, are a plurality of opening defining members, such as annular rings 9. Rings 9 are preferably made of a relatively deformable plastic material such as Mylar film which preferably have a thickness on the order of about 7.5 mils. While a Mylar film is preferred, other relatively deformable plastics and rubbers may be used.
Rings 9 form with pad 7 a plurality of recesses 11 which are adapted to receive, and accommodate relatively snugly, a plurality of silicon slices 12. The depth of recesses 11 is less than that of the thickness of the slices 12 so that faces 13 of the slices are exposed above the rings 9 to prevent contact between a grinding or polishing wheel and rings 9.
Slices 12 may be retained within recesses 11 to permit inversion of the polishing block 4 in the conventional manner by placing a drop of water on the bottom face 14 of the slice. The surface tension of the water will serve to retain the relatively light slices within recesses 11.
With particular reference to FIGURE 3, it will be noted that faces 13 and 14 of the slices 12 are rough before polishing. Pad 7, due to its elastomeric nature, will conform to the irregularities in face 14 preventing the creation of unwanted stresses in slice 12 during polishing. Additionally since the rings 9 are of a relatively deformable plastic, any engagement of the periphery 15 of the slices with rings 9 during polishing will not result in chipping of the perihpery 15 of slice 12.
While the particular embodiment illustrated in FIG- URES 1-3 is the preferred one, it is also contemplated that a plurality of recesses may be drilled in polishing block 4 and an elastomeric member placed in the bottom of the recess to abs-orb the irregularities in faces 14 of slices 12. Preferably, the peripheries of the recesses would be lined with a relatively deformable material to protect the peripheries 15 of the slices during the polishing.
It is also contemplated that rings 9 may be formed of a ferromagnetic metal in which case block 4 could be magnetized and the rings 9 adhered directly to the surface of block 4 by magnetic attraction. An elastomeric pad could then be placed in the bottom of rings 9 and adhered in place by any suitable adhesive.
In the embodiment illustrated in FIGURE 4, the need for the adhesive used in the embodiment shown in FIG- URES 1-3 is eliminated. In FIGURE 4, the polishing block 16 is covered with an elastomeric' pad 17 which in turn is covered by a circular Mylar film 18 having a plurality of apertures 19 which, with pad 17, define recesses 20 adapted to receive silicon slices 12. The elastomeric pad 17 and Mylar film 18 are retained in juxtaposition by a plurality of nuts 21 which are threadably received about a plurality of screws 22 extending through block 16, pad 17 and film 18.
Once the slices 12 illustrated in FIGURES 13 have been polished, they may be removed by flowing water into recesses 11 to float the slices from the recesses 11. The slices 12 illustrated in FIGURE 4 are removed in the same manner.
Because the slices are preferably retained in recesses 11 by use of Water and are demounted by use of Water, the adhesive used in the embodiment illustrated in FIG- URES l-3 is preferably one which will withstand repeated application of Water without deterioration.
While rather specific terms have been used in describing embodiments of the invention, they are not intended nor should they be construed as a limitation on the invention as defined by the claims.
What is claimed is:
1. An apparatus for holding a plurality of thin wafers so that one face of each Wafer is exposed for polishing, comprising:
a block having a planar surface,
an elastomeric sheet affixed to said surface,
and a plurality of annular rings afiixed to said elastomeric sheet within which said wafers may be relatively snugly accommodated,
.4 said rings being of height less than the thickness of said Wafers. 2. The apparatus of claim 1, wherein said annular rings are of a relatively deformable plastic material.
3. The apparatus of claim 1, wherein said annular rings comprise a magnetized ferromagnetic material.
References Cited UNITED STATES PATENTS 1,673,903 6/1928 Cripe 51 216 XR 1,911,221 5/1933 Blair 51-216 2,112,636 3/1938 Sawyer. 2,309,080 1/1'943 Hunt 51-283 x 2,395,700 2/1946 Walker 51 216 2,539,561 1/1951 Wolfskill 51 133 2,632,288 3/1953 Diller 51 237 X 2,736,993 3/1956 Tripp 51 131 2,699,633 1/1955 Lapenas 51 216 HAROLD D. WHITEHEAD, Primary Examiner.
US. Cl. X.R. 51--13l, 237
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Cited By (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3593462A (en) * 1969-03-24 1971-07-20 Western Electric Co Apparatus for abrading articles
US3699722A (en) * 1970-11-23 1972-10-24 Radiation Inc Precision polishing of semiconductor crystal wafers
JPS49125995A (en) * 1973-04-04 1974-12-03
FR2384589A1 (en) * 1977-03-22 1978-10-20 Wacker Chemitronic PROCESS FOR BONDING DISCS INTENDED TO BE POLISHED WITH MASTIC
US4132037A (en) * 1977-02-28 1979-01-02 Siltec Corporation Apparatus for polishing semiconductor wafers
US4193226A (en) * 1977-09-21 1980-03-18 Kayex Corporation Polishing apparatus
US4239567A (en) * 1978-10-16 1980-12-16 Western Electric Company, Inc. Removably holding planar articles for polishing operations
US4332636A (en) * 1979-05-03 1982-06-01 Ferranti Limited Method of bonding an optical element to a support
US4397208A (en) * 1979-10-17 1983-08-09 Stalhut B R Jewelry tag marking method
DE3319327A1 (en) * 1982-06-01 1983-12-01 General Signal Corp., 06904 Stamford, Conn. Work support device for thin disc-like workpieces
US4512113A (en) * 1982-09-23 1985-04-23 Budinger William D Workpiece holder for polishing operation
US4519168A (en) * 1979-09-18 1985-05-28 Speedfam Corporation Liquid waxless fixturing of microsize wafers
US4530139A (en) * 1983-09-23 1985-07-23 At&T Bell Laboratories Method of contouring crystal plates
EP0185767A1 (en) * 1984-05-29 1986-07-02 MITSUI TOATSU CHEMICALS, Inc. Film for machining wafers
US4689001A (en) * 1985-04-23 1987-08-25 Plasti-Bat, Inc. Bat for potters wheel
EP0517594A1 (en) * 1991-06-06 1992-12-09 Commissariat A L'energie Atomique Polishing machine with a tensioned finishing belt and an improved work supporting head
FR2677293A1 (en) * 1991-06-06 1992-12-11 Commissariat Energie Atomique Polishing machine with improved wafer-support head
US5365700A (en) * 1991-06-04 1994-11-22 Fujitsu Limited Apparatus and method for producing magnetic head sliders
US5398459A (en) * 1992-11-27 1995-03-21 Kabushiki Kaisha Toshiba Method and apparatus for polishing a workpiece
US5533924A (en) * 1994-09-01 1996-07-09 Micron Technology, Inc. Polishing apparatus, a polishing wafer carrier apparatus, a replacable component for a particular polishing apparatus and a process of polishing wafers
US6152807A (en) * 1998-07-07 2000-11-28 International Business Machines Corporation Lapping and polishing fixture having flexible sides
US6419555B1 (en) * 1999-06-03 2002-07-16 Brian D. Goers Process and apparatus for polishing a workpiece
EP1839812A2 (en) * 2006-03-31 2007-10-03 Ebara Corporation Substrate holding apparatus, polishing apparatus, and polishing method
US20080003934A1 (en) * 2006-07-03 2008-01-03 Chung-Chih Feng Sheet for mounting polishing workpiece and method for making the same
US20080003932A1 (en) * 2006-07-03 2008-01-03 Chung-Chih Feng Sheet for mounting polishing workpiece and method for making the same
US20080064310A1 (en) * 2006-09-08 2008-03-13 Chung-Chih Feng Polishing pad having hollow fibers and the method for making the same
US20090252876A1 (en) * 2007-05-07 2009-10-08 San Fang Chemical Industry Co., Ltd. Sheet for mounting polishing workpiece and method for making the same
US20100048105A1 (en) * 2006-11-21 2010-02-25 3M Innovative Properties Company Lapping Carrier and Method
US20110281504A1 (en) * 2010-05-11 2011-11-17 Disco Corporation Grinding method for workpiece having a plurality of bumps
CN102581737A (en) * 2012-03-27 2012-07-18 赫得纳米科技(昆山)有限公司 Modified structure of polishing epoxy plate
US20130267155A1 (en) * 2012-04-09 2013-10-10 Phuong Van Nguyen Wafer Polishing Pad Holder Template

Citations (9)

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Publication number Priority date Publication date Assignee Title
US1673903A (en) * 1925-06-15 1928-06-19 Libbeyowens Sheet Glass Compan Grinding and polishing table
US1911221A (en) * 1926-05-06 1933-05-30 Libbey Owens Ford Glass Co Glass surfacing apparatus
US2112636A (en) * 1936-09-02 1938-03-29 Brush Dev Co Method of making piezoelectric units
US2309080A (en) * 1941-12-06 1943-01-19 Grover C Hunt Work holder for grinding machines
US2395700A (en) * 1943-03-23 1946-02-26 Alncin Inc Method and apparatus for shaping optical objects and the like
US2539561A (en) * 1946-12-13 1951-01-30 John M Wolfskill Piezoelectric crystal lapping apparatus
US2632288A (en) * 1951-02-02 1953-03-24 Alfred I Diller Lens grinding and polishing machine
US2699633A (en) * 1949-02-09 1955-01-18 Optron Lab Precision supporting of articles
US2736993A (en) * 1953-03-25 1956-03-06 American Optical Corp Abrading apparatus

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1673903A (en) * 1925-06-15 1928-06-19 Libbeyowens Sheet Glass Compan Grinding and polishing table
US1911221A (en) * 1926-05-06 1933-05-30 Libbey Owens Ford Glass Co Glass surfacing apparatus
US2112636A (en) * 1936-09-02 1938-03-29 Brush Dev Co Method of making piezoelectric units
US2309080A (en) * 1941-12-06 1943-01-19 Grover C Hunt Work holder for grinding machines
US2395700A (en) * 1943-03-23 1946-02-26 Alncin Inc Method and apparatus for shaping optical objects and the like
US2539561A (en) * 1946-12-13 1951-01-30 John M Wolfskill Piezoelectric crystal lapping apparatus
US2699633A (en) * 1949-02-09 1955-01-18 Optron Lab Precision supporting of articles
US2632288A (en) * 1951-02-02 1953-03-24 Alfred I Diller Lens grinding and polishing machine
US2736993A (en) * 1953-03-25 1956-03-06 American Optical Corp Abrading apparatus

Cited By (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3593462A (en) * 1969-03-24 1971-07-20 Western Electric Co Apparatus for abrading articles
US3699722A (en) * 1970-11-23 1972-10-24 Radiation Inc Precision polishing of semiconductor crystal wafers
JPS49125995A (en) * 1973-04-04 1974-12-03
US4132037A (en) * 1977-02-28 1979-01-02 Siltec Corporation Apparatus for polishing semiconductor wafers
FR2384589A1 (en) * 1977-03-22 1978-10-20 Wacker Chemitronic PROCESS FOR BONDING DISCS INTENDED TO BE POLISHED WITH MASTIC
US4193226A (en) * 1977-09-21 1980-03-18 Kayex Corporation Polishing apparatus
US4239567A (en) * 1978-10-16 1980-12-16 Western Electric Company, Inc. Removably holding planar articles for polishing operations
US4332636A (en) * 1979-05-03 1982-06-01 Ferranti Limited Method of bonding an optical element to a support
US4519168A (en) * 1979-09-18 1985-05-28 Speedfam Corporation Liquid waxless fixturing of microsize wafers
US4397208A (en) * 1979-10-17 1983-08-09 Stalhut B R Jewelry tag marking method
DE3319327A1 (en) * 1982-06-01 1983-12-01 General Signal Corp., 06904 Stamford, Conn. Work support device for thin disc-like workpieces
US4512113A (en) * 1982-09-23 1985-04-23 Budinger William D Workpiece holder for polishing operation
US4530139A (en) * 1983-09-23 1985-07-23 At&T Bell Laboratories Method of contouring crystal plates
EP0185767A1 (en) * 1984-05-29 1986-07-02 MITSUI TOATSU CHEMICALS, Inc. Film for machining wafers
EP0185767A4 (en) * 1984-05-29 1987-09-02 Mitsui Toatsu Chemicals Film for machining wafers.
US4689001A (en) * 1985-04-23 1987-08-25 Plasti-Bat, Inc. Bat for potters wheel
US5365700A (en) * 1991-06-04 1994-11-22 Fujitsu Limited Apparatus and method for producing magnetic head sliders
EP0517594A1 (en) * 1991-06-06 1992-12-09 Commissariat A L'energie Atomique Polishing machine with a tensioned finishing belt and an improved work supporting head
FR2677293A1 (en) * 1991-06-06 1992-12-11 Commissariat Energie Atomique Polishing machine with improved wafer-support head
US5398459A (en) * 1992-11-27 1995-03-21 Kabushiki Kaisha Toshiba Method and apparatus for polishing a workpiece
US5533924A (en) * 1994-09-01 1996-07-09 Micron Technology, Inc. Polishing apparatus, a polishing wafer carrier apparatus, a replacable component for a particular polishing apparatus and a process of polishing wafers
US5664988A (en) * 1994-09-01 1997-09-09 Micron Technology, Inc. Process of polishing a semiconductor wafer having an orientation edge discontinuity shape
US6152807A (en) * 1998-07-07 2000-11-28 International Business Machines Corporation Lapping and polishing fixture having flexible sides
US6442825B1 (en) 1998-07-07 2002-09-03 International Business Machines Corporation Lapping and polishing fixture having flexible sides
US6419555B1 (en) * 1999-06-03 2002-07-16 Brian D. Goers Process and apparatus for polishing a workpiece
US8485866B2 (en) 2006-03-31 2013-07-16 Ebara Corporation Substrate holding apparatus, polishing apparatus, and polishing method
US8267746B2 (en) 2006-03-31 2012-09-18 Ebara Corporation Substrate holding apparatus, polishing apparatus, and polishing method
EP1839812A3 (en) * 2006-03-31 2008-01-02 Ebara Corporation Substrate holding apparatus, polishing apparatus, and polishing method
KR101081415B1 (en) 2006-03-31 2011-11-08 가부시키가이샤 에바라 세이사꾸쇼 Substrate holding apparatus, polishing apparatus and retainer ring
US20080318492A1 (en) * 2006-03-31 2008-12-25 Hozumi Yasuda Substrate holding apparatus, polishing apparatus, and polishing method
US7967665B2 (en) 2006-03-31 2011-06-28 Ebara Corporation Substrate holding apparatus, polishing apparatus, and polishing method
US20070232193A1 (en) * 2006-03-31 2007-10-04 Hozumi Yasuda Substrate holding apparatus, polishing apparatus, and polishing method
US20080318499A1 (en) * 2006-03-31 2008-12-25 Hozumi Yasuda Substrate holding apparatus, polishing apparatus, and polishing method
EP1839812A2 (en) * 2006-03-31 2007-10-03 Ebara Corporation Substrate holding apparatus, polishing apparatus, and polishing method
US8100739B2 (en) 2006-03-31 2012-01-24 Ebara Corporation Substrate holding apparatus, polishing apparatus, and polishing method
US20080003932A1 (en) * 2006-07-03 2008-01-03 Chung-Chih Feng Sheet for mounting polishing workpiece and method for making the same
US7629554B2 (en) 2006-07-03 2009-12-08 San Fang Chemical Industry Co., Ltd. Sheet for mounting polishing workpiece and method for making the same
US7789738B2 (en) * 2006-07-03 2010-09-07 San Fang Chemical Industry Co., Ltd. Sheet for mounting polishing workpiece and method for making the same
US7316605B1 (en) 2006-07-03 2008-01-08 San Fang Chemical Industry Co., Ltd. Sheet for mounting polishing workpiece and method for making the same
US20080003934A1 (en) * 2006-07-03 2008-01-03 Chung-Chih Feng Sheet for mounting polishing workpiece and method for making the same
US20080064310A1 (en) * 2006-09-08 2008-03-13 Chung-Chih Feng Polishing pad having hollow fibers and the method for making the same
US8137157B2 (en) 2006-11-21 2012-03-20 3M Innovative Properties Company Lapping carrier and method
US20100048105A1 (en) * 2006-11-21 2010-02-25 3M Innovative Properties Company Lapping Carrier and Method
US8795033B2 (en) 2006-11-21 2014-08-05 3M Innovative Properties Company Lapping carrier and method
US20090252876A1 (en) * 2007-05-07 2009-10-08 San Fang Chemical Industry Co., Ltd. Sheet for mounting polishing workpiece and method for making the same
US20110281504A1 (en) * 2010-05-11 2011-11-17 Disco Corporation Grinding method for workpiece having a plurality of bumps
US8579678B2 (en) * 2010-05-11 2013-11-12 Disco Corporation Grinding method for workpiece having a plurality of bumps
CN102581737A (en) * 2012-03-27 2012-07-18 赫得纳米科技(昆山)有限公司 Modified structure of polishing epoxy plate
CN102581737B (en) * 2012-03-27 2015-03-18 赫得纳米科技(昆山)有限公司 Modified structure of polishing epoxy plate
US20130267155A1 (en) * 2012-04-09 2013-10-10 Phuong Van Nguyen Wafer Polishing Pad Holder Template

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