|
| US3968457 | 11 févr. 1975 | 6 juil. 1976 | Thomson-CSF | Microwave non-reciprocal junction device |
| US3986149 | 29 août 1975 | 12 oct. 1976 | The United States of America as represented by the Secretary of the Air Force | High power reciprocal co-planar waveguide phase shifter |
| US4027253 | 15 mai 1974 | 31 mai 1977 | Societe Lignes Telegraphiques et Telephoniques | Non-reciprocal broadband slot line device |
| US4506234 | 17 juin 1983 | 19 mars 1985 | The United States of America as represented by the Secretary of the Navy | Amplitude and phase modulation in fin-lines by electrical tuning |
| US4980657 | 29 sept. 1989 | 25 déc. 1990 | Westinghouse Electric Corp. | Coplanar waveguide frequency selective limiter |
| US5772820 | 25 juil. 1996 | 30 juin 1998 | Northrop Grumman Corporation | Process for fabricating a microwave power device |
| US7138810 | 12 nov. 2004 | 21 nov. 2006 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7138813 | 25 juil. 2003 | 21 nov. 2006 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US7164279 | 9 déc. 2005 | 16 janv. 2007 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US7176705 | 6 mai 2005 | 13 févr. 2007 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7187188 | 26 août 2004 | 6 mars 2007 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| US7190181 | 3 nov. 2004 | 13 mars 2007 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7221146 | 14 janv. 2005 | 22 mai 2007 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7221172 | 5 mars 2004 | 22 mai 2007 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
| US7250626 | 5 mars 2004 | 31 juil. 2007 | Cascade Microtech, Inc. | Probe testing structure |
| US7250779 | 25 sept. 2003 | 31 juil. 2007 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US7268533 | 6 août 2004 | 11 sept. 2007 | Cascade Microtech, Inc. | Optical testing device |
| US7292057 | 11 oct. 2006 | 6 nov. 2007 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US7295025 | 27 sept. 2006 | 13 nov. 2007 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7321233 | 11 janv. 2007 | 22 janv. 2008 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US7330023 | 21 avr. 2005 | 12 févr. 2008 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7330041 | 21 mars 2005 | 12 févr. 2008 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7348787 | 22 déc. 2005 | 25 mars 2008 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7352168 | 15 août 2005 | 1 avr. 2008 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7362115 | 19 janv. 2007 | 22 avr. 2008 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| US7368925 | 16 janv. 2004 | 6 mai 2008 | Cascade Microtech, Inc. | Probe station with two platens |
| US7423419 | 23 oct. 2007 | 9 sept. 2008 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7436170 | 20 juin 2007 | 14 oct. 2008 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7468609 | 11 avr. 2007 | 23 déc. 2008 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
| US7492147 | 27 juil. 2007 | 17 févr. 2009 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7492172 | 21 avr. 2004 | 17 févr. 2009 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7498828 | 20 juin 2007 | 3 mars 2009 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US7501810 | 23 oct. 2007 | 10 mars 2009 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7504823 | 1 déc. 2006 | 17 mars 2009 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7514915 | 23 oct. 2007 | 7 avr. 2009 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7518358 | 23 oct. 2007 | 14 avr. 2009 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7535247 | 18 janv. 2006 | 19 mai 2009 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US7550984 | 4 oct. 2007 | 23 juin 2009 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7554322 | 16 mars 2005 | 30 juin 2009 | Cascade Microtech, Inc. | Probe station |
| US7589518 | 11 févr. 2005 | 15 sept. 2009 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7595632 | 2 janv. 2008 | 29 sept. 2009 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7616017 | 17 oct. 2007 | 10 nov. 2009 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US7626379 | 24 oct. 2007 | 1 déc. 2009 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7639003 | 11 avr. 2007 | 29 déc. 2009 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7656172 | 18 janv. 2006 | 2 févr. 2010 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7688062 | 18 oct. 2007 | 30 mars 2010 | Cascade Microtech, Inc. | Probe station |
| US7688091 | 10 mars 2008 | 30 mars 2010 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| US7876115 | 17 févr. 2009 | 25 janv. 2011 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7898281 | 12 déc. 2008 | 1 mars 2011 | Cascade Mircotech, Inc. | Interface for testing semiconductors |
| US7940069 | 15 déc. 2009 | 10 mai 2011 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7969173 | 23 oct. 2007 | 28 juin 2011 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US8069491 | 20 juin 2007 | 29 nov. 2011 | Cascade Microtech, Inc. | Probe testing structure |
| USH432 | 7 août -15 | | The United States of America as represented by the Secretary of the Army | Slot line tunable bandpass filter |
