US3632462A - Dicing of semiconductors - Google Patents

Dicing of semiconductors Download PDF

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Publication number
US3632462A
US3632462A US797610A US3632462DA US3632462A US 3632462 A US3632462 A US 3632462A US 797610 A US797610 A US 797610A US 3632462D A US3632462D A US 3632462DA US 3632462 A US3632462 A US 3632462A
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United States
Prior art keywords
acid
tray
wafer
etching
devices
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Expired - Lifetime
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US797610A
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Colin Arthur Barrington
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ZF International UK Ltd
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Lucas Industries Ltd
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00Control of temperature
    • G05D23/19Control of temperature characterised by the use of electric means
    • G05D23/1919Control of temperature characterised by the use of electric means characterised by the type of controller
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00Etching metallic material by chemical means
    • C23F1/08Apparatus, e.g. for photomechanical printing surfaces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Definitions

  • Apparatus comprises a tray on which the wafer is placed, means for circulating an etching acid in a path including said tray, and means in said path for controlling the temperature of the acid.
  • the usual arrangement is merely to pour acid into the tray without any circulation or temperature control. For this reason the life of a given batch of acid is limited, because if the acid temperature is too low the etching time is increased, but if the acid temperature becomes too high, the wax masks tend to become lifted from the wafer.
  • a typical arrangement using three liters of acid will etch 20 wafers.
  • An arrangement in accordance with one example of the invention using 12 liters of acid which was circulated was found to etch successfully 160 wafers of the same size, an overall improvement of 100 percent.
  • a tray 11 in which wafers to be etched are placed, the tray having an inlet for a suitable etching acid, and an outlet, so that acid flows through the tray continuously.
  • a suitable acid is of known fon'n including nitric acid, hydrofluoric acid and acetic acid. From the outlet, acid flows to a reservoir 12, from which a pump 13 supplies the acid to a water-cooled heat exchanger 14, which in turn supplies the acid to the inlet of the tray.
  • the outlet of the pump may be connected to the tray through some form of valve 15 to control the amount of acid supplied to the tray.
  • a temperature probe 16 for sensing the temperature of the acid leaving the tray, the probe being connected to a solenoid which operates a valve controlling the amount of water flowing to the heat exchanger.
  • Water is circulated from a reservoir 17 to the heat exchanger 14 by a pump 18 at a rate determined by a valve 19 which in turn is controlled by a solenoid 21 connected to an controlled by the probe 16.
  • the arrangement is such that the acid is kept at a constant temperature which is chosen to be sufficiently low to avoid removal of the wax masks on the wafer, but sufficiently high to ensure that etching takes place at an acceptable rate.
  • a suitable temperature using a typical wax having a melting point of C. is in the range 10 to 14 C., preferably.
  • an apparatus for performing a separation etching operation on a wax-masked semiconductor wafer, to dice said wafer comprising a tray on which the wafer is placed and means for circulating an etching acid in a path including said tray, the improvement comprising cooling means in said path for controlling the temperature of the acid.
  • a pump supplies acid to the tray through a heat exchanger, the temperature of the etching acid being sensed by a temperature probe which controls the rate of supply of coolant to the heat exchanger.
  • Apparatus as claimed in claim 2 including a valve for controlling the rate of flow of the etching acid.
  • a method of dicing semiconductors comprising the steps of forming a number of devices on one wafer; applying wax masks to the individual devices to protect the individual devices; placing the devices on a tray and circulating etching acid therethrough; the improvement comprising cooling the circulating etching acid.

Abstract

In the manufacture of semiconductors by forming a large number of devices on one wafer, protecting the individual devices by wax masks and then subjecting the wafer to an etching acid to separate the devices, apparatus is used for separating the wafers comprising a tray on which the wafer is placed. Means is provided for circulating an etching acid in a path including the tray, and in this path there is means for controlling the temperature of the acid.

Description

United States Patent m1 3,632,462
[72] Inventor Colin Arthur Harrington [50] Field of Search 156/345, 17
Sutton Coldfield, England [21] Appl. No. 797,610 Relerences Cited [22] Filed Feb. 7, 1969 UNITED STATES PATENTS Patented Jan. 4, 1972 std Limited 3,095,463 6/ 1963 Chang et al [56/345 UX [73] Amgnee g es) Primary Examiner-Jacob H. Steinberg 32 Priority Feb. 9, 1968 5mm [3 3] Great Britain ABSTRACT: In the manufacture of semiconductors by forming a large number of devices on one wafer, protecting the in- [54] meme 0F SEMCONDUCTORS dividual devices by wax masks and then subjecting the wafe;
4 Claims 1 Dnwing a. to an etchrng acid to separate the devices, apparatus IS use for separating the wafers compnsmg a tray on which the wafer [52] US. Cl. 156/345, is placed, Means is provided for circulating an etching acid in 156/17 a path including the tray, and in this path there is means for [5] 1 Int. Cl. controlling the temperature of the acid HE T /4 PUMP EXCHANGE? rmmeum 41972 31632462 L? 15 i5? EXCHANGEE I/ H i 15 PUMP /7 {9 INVE TO? I xi" AWO ENEYS meme F SEMICONDUCTORS In the manufacture of semiconductors it is common to form a large number of devices on one wafer, then to protect the individual devices by wax masks and to subject the wafer to an etching acid to separate and dice the devices. This invention relates to apparatus for performing the etching operation.
Apparatus according to the invention comprises a tray on which the wafer is placed, means for circulating an etching acid in a path including said tray, and means in said path for controlling the temperature of the acid.
The usual arrangement is merely to pour acid into the tray without any circulation or temperature control. For this reason the life of a given batch of acid is limited, because if the acid temperature is too low the etching time is increased, but if the acid temperature becomes too high, the wax masks tend to become lifted from the wafer. Using the conventional technique, a typical arrangement using three liters of acid will etch 20 wafers. An arrangement in accordance with one example of the invention using 12 liters of acid which was circulated was found to etch successfully 160 wafers of the same size, an overall improvement of 100 percent.
An example of the invention is illustrated diagrammatically in the accompanying drawing.
Referring to the drawing, there is provided a tray 11 in which wafers to be etched are placed, the tray having an inlet for a suitable etching acid, and an outlet, so that acid flows through the tray continuously. A suitable acid is of known fon'n including nitric acid, hydrofluoric acid and acetic acid. From the outlet, acid flows to a reservoir 12, from which a pump 13 supplies the acid to a water-cooled heat exchanger 14, which in turn supplies the acid to the inlet of the tray. The outlet of the pump may be connected to the tray through some form of valve 15 to control the amount of acid supplied to the tray.
Between the outlet of the tray and the reservoir 12 is a temperature probe 16 for sensing the temperature of the acid leaving the tray, the probe being connected to a solenoid which operates a valve controlling the amount of water flowing to the heat exchanger. Water is circulated from a reservoir 17 to the heat exchanger 14 by a pump 18 at a rate determined by a valve 19 which in turn is controlled by a solenoid 21 connected to an controlled by the probe 16. The arrangement is such that the acid is kept at a constant temperature which is chosen to be sufficiently low to avoid removal of the wax masks on the wafer, but sufficiently high to ensure that etching takes place at an acceptable rate. A suitable temperature using a typical wax having a melting point of C. is in the range 10 to 14 C., preferably.
Having thus described my invention what I claim as new and desire to secure by Letters Patent is:
1. ln an apparatus for performing a separation etching operation on a wax-masked semiconductor wafer, to dice said wafer comprising a tray on which the wafer is placed and means for circulating an etching acid in a path including said tray, the improvement comprising cooling means in said path for controlling the temperature of the acid.
2. Apparatus as claimed in claim 1 in which a pump supplies acid to the tray through a heat exchanger, the temperature of the etching acid being sensed by a temperature probe which controls the rate of supply of coolant to the heat exchanger.
3. Apparatus as claimed in claim 2 including a valve for controlling the rate of flow of the etching acid.
4. In a method of dicing semiconductors, said method comprising the steps of forming a number of devices on one wafer; applying wax masks to the individual devices to protect the individual devices; placing the devices on a tray and circulating etching acid therethrough; the improvement comprising cooling the circulating etching acid.

Claims (4)

1. In an apparatus for performing a separation etching operation on a wax-masked semiconductor wafer, to dice said wafer comprising a tray on which the wafer is placed and means for circulating an etching acid in a path including said tRay, the improvement comprising cooling means in said path for controlling the temperature of the acid.
2. Apparatus as claimed in claim 1 in which a pump supplies acid to the tray through a heat exchanger, the temperature of the etching acid being sensed by a temperature probe which controls the rate of supply of coolant to the heat exchanger.
3. Apparatus as claimed in claim 2 including a valve for controlling the rate of flow of the etching acid.
4. In a method of dicing semiconductors, said method comprising the steps of forming a number of devices on one wafer; applying wax masks to the individual devices to protect the individual devices; placing the devices on a tray and circulating etching acid therethrough; the improvement comprising cooling the circulating etching acid.
US797610A 1968-02-09 1969-02-07 Dicing of semiconductors Expired - Lifetime US3632462A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB646268 1968-02-09

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US3632462A true US3632462A (en) 1972-01-04

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US (1) US3632462A (en)
DE (1) DE1905732A1 (en)
GB (1) GB1239573A (en)
NL (1) NL6901837A (en)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4950872A (en) * 1972-09-18 1974-05-17
US3964957A (en) * 1973-12-19 1976-06-22 Monsanto Company Apparatus for processing semiconductor wafers
US4142893A (en) * 1977-09-14 1979-03-06 Raytheon Company Spray etch dicing method
US4633893A (en) * 1984-05-21 1987-01-06 Cfm Technologies Limited Partnership Apparatus for treating semiconductor wafers
US4738272A (en) * 1984-05-21 1988-04-19 Mcconnell Christopher F Vessel and system for treating wafers with fluids
US4740249A (en) * 1984-05-21 1988-04-26 Christopher F. McConnell Method of treating wafers with fluid
US4778532A (en) * 1985-06-24 1988-10-18 Cfm Technologies Limited Partnership Process and apparatus for treating wafers with process fluids
US4856544A (en) * 1984-05-21 1989-08-15 Cfm Technologies, Inc. Vessel and system for treating wafers with fluids
US4911761A (en) * 1984-05-21 1990-03-27 Cfm Technologies Research Associates Process and apparatus for drying surfaces
US4984597A (en) * 1984-05-21 1991-01-15 Cfm Technologies Research Associates Apparatus for rinsing and drying surfaces
US5286657A (en) * 1990-10-16 1994-02-15 Verteq, Inc. Single wafer megasonic semiconductor wafer processing system
US6143087A (en) * 1991-10-04 2000-11-07 Cfmt, Inc. Methods for treating objects
US6328809B1 (en) 1998-10-09 2001-12-11 Scp Global Technologies, Inc. Vapor drying system and method
US20080006292A1 (en) * 1996-09-30 2008-01-10 Bran Mario E System for megasonic processing of an article

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3095463A (en) * 1958-03-12 1963-06-25 Crucible Steel Co America Temperature control apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3095463A (en) * 1958-03-12 1963-06-25 Crucible Steel Co America Temperature control apparatus

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4950872A (en) * 1972-09-18 1974-05-17
US3964957A (en) * 1973-12-19 1976-06-22 Monsanto Company Apparatus for processing semiconductor wafers
US4142893A (en) * 1977-09-14 1979-03-06 Raytheon Company Spray etch dicing method
US4911761A (en) * 1984-05-21 1990-03-27 Cfm Technologies Research Associates Process and apparatus for drying surfaces
US4984597A (en) * 1984-05-21 1991-01-15 Cfm Technologies Research Associates Apparatus for rinsing and drying surfaces
US4740249A (en) * 1984-05-21 1988-04-26 Christopher F. McConnell Method of treating wafers with fluid
US4738272A (en) * 1984-05-21 1988-04-19 Mcconnell Christopher F Vessel and system for treating wafers with fluids
US4856544A (en) * 1984-05-21 1989-08-15 Cfm Technologies, Inc. Vessel and system for treating wafers with fluids
US4633893A (en) * 1984-05-21 1987-01-06 Cfm Technologies Limited Partnership Apparatus for treating semiconductor wafers
US4917123A (en) * 1984-05-21 1990-04-17 Cfm Technologies Limited Partnership Apparatus for treating wafers with process fluids
US4778532A (en) * 1985-06-24 1988-10-18 Cfm Technologies Limited Partnership Process and apparatus for treating wafers with process fluids
US5286657A (en) * 1990-10-16 1994-02-15 Verteq, Inc. Single wafer megasonic semiconductor wafer processing system
US6143087A (en) * 1991-10-04 2000-11-07 Cfmt, Inc. Methods for treating objects
US6348101B1 (en) 1991-10-04 2002-02-19 Cfmt, Inc. Methods for treating objects
US20080006292A1 (en) * 1996-09-30 2008-01-10 Bran Mario E System for megasonic processing of an article
US7518288B2 (en) 1996-09-30 2009-04-14 Akrion Technologies, Inc. System for megasonic processing of an article
US8257505B2 (en) 1996-09-30 2012-09-04 Akrion Systems, Llc Method for megasonic processing of an article
US8771427B2 (en) 1996-09-30 2014-07-08 Akrion Systems, Llc Method of manufacturing integrated circuit devices
US6328809B1 (en) 1998-10-09 2001-12-11 Scp Global Technologies, Inc. Vapor drying system and method

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Publication number Publication date
GB1239573A (en) 1971-07-21
NL6901837A (en) 1969-08-12
DE1905732A1 (en) 1969-11-20

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