|
| US4170737 | 6 juil. 1978 | 9 oct. 1979 | Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR | Top-entry transmission electron microscope |
| US6891170 | 17 juin 2002 | 10 mai 2005 | Zyvex Corporation | Modular manipulation system for manipulating a sample under study with a microscope |
| US6967335 | 17 juin 2002 | 22 nov. 2005 | Zyvex Corporation | Manipulation system for manipulating a sample under study with a microscope |
| US7196454 | 18 févr. 2005 | 27 mars 2007 | Zyvex Corporation | Positioning device for microscopic motion |
| US7220973 | 31 août 2004 | 22 mai 2007 | Zyvex Corporation | Modular manipulation system for manipulating a sample under study with a microscope |
| US7227140 | 23 sept. 2004 | 5 juin 2007 | Zyvex Instruments, LLC | Method, system and device for microscopic examination employing fib-prepared sample grasping element |
| US7285778 | 23 févr. 2005 | 23 oct. 2007 | Zyvex Corporation | Probe current imaging |
| US7319336 | 23 févr. 2005 | 15 janv. 2008 | Zyvex Instruments, LLC | Charged particle beam device probe operation |
| US7326293 | 25 mars 2005 | 5 févr. 2008 | Zyvex Labs, LLC | Patterned atomic layer epitaxy |
| US7675300 | 17 déc. 2007 | 9 mars 2010 | Zyvex Instruments, LLC | Charged particle beam device probe operation |
| US7786442 | 18 juin 2004 | 31 août 2010 | General Electric Company | Method and apparatus for ion source positioning and adjustment |
| US7799132 | 13 déc. 2007 | 21 sept. 2010 | Zyvex Labs, LLC | Patterned atomic layer epitaxy |
