US3868506A - X-ray diffraction instrument - Google Patents

X-ray diffraction instrument Download PDF

Info

Publication number
US3868506A
US3868506A US383611A US38361173A US3868506A US 3868506 A US3868506 A US 3868506A US 383611 A US383611 A US 383611A US 38361173 A US38361173 A US 38361173A US 3868506 A US3868506 A US 3868506A
Authority
US
United States
Prior art keywords
ray
guide rail
mount
specimen
incident
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US383611A
Inventor
Katsuhiko Ogiso
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Application granted granted Critical
Publication of US3868506A publication Critical patent/US3868506A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Definitions

  • a mount for X-ray tubes is rotatable around the axis of an X-ray which is incident Feb. 20, 1973 Japan 48/19,?97 upon a specimen.
  • a support for the mount is rotatable around a straight line passing through the point at which the X-ray is incident upon the specimen and a 250/278 26353928 holder for a first guide rail is rotatable around a [58] Field 278 279 straight line which intersects a first straight line at 6 6 right angles.
  • the metal weld may sometimes include a residual strain which occurs during cooling by shrinkage.
  • the residual strain may remarkably reduce the strength of the material. It is already known that the residual strain can be measured by the diffraction angle of X-ray.
  • a carbon steel in y-phase and at a high temperature is cooled rapidly, lattice modification occurs in the material which accompanies the change in volume, and the carbon steel changes into a-phase.
  • a complicated residual strain appears due to the interaction of the stress caused by the cubical expansion resulting from the lattice modification and the stress caused by shrinkage during cooling. In this case the whole carbon steel in y-phase is not modified into oz-phase but a portion of it remains in the unstable y-phase due to rapid cooling.
  • the mechanical and physical properties of the metal products such as cold-rolled steel plates and pressed products, which have been subjected to a remarkable plastic deformation, are changeable because the metal crystal of these products has an orientation.
  • the residual strain, residual austenite and aggeregation structure of crystals have an interrelationship with each other and form important factors for determining the strength of the metallic material.
  • the purpose of this invention is to provide an X-ray diffraction instrument for measuring not only the residual strain but also the residual austenite and aggregation structure at the same positions of the actual structures and components.
  • FIG. I is a front view of the X-ray diffraction instrument according to one embodiment of this invention.
  • FIG. 2 is an elevational view of the instrument shown in FIG. 1.
  • X-ray a is applied from an X-ray tube 2 onto the surface of a specimen 1 of which residual strain, residual austenite and crystal orientation are to be measured.
  • Detectors 3, 4 and are arranged for detecting the diffracted X-ray b, c and d.
  • the X-ray tube 2 is fixedly attached to a mount 6, and the detectors 3, 4 and S are mounted on a circular guide rail 7 formed on the mount 6 so that they are movable along the guide rail 7.
  • the guide rail 7 is formed into a circular configuration of which center coincides with point p at which the X-ray is incident upon the surface of the specimen.
  • An electric motor and a gear box are arranged in the mount 6 for driving the detectors 3 and 4 symmetrically about the axis of incident X-ray a and for driving the detectors 4 and 5 in the same direction at an equal angular speed.
  • Another guide rail 8 is formed into a circular configuration which has a larger diameter than the guide rail 7 and has its center at point p.
  • a support 9 is mounted on the guide rail 8 so that it is movable along the guide rail 8.
  • the mount 6 for the X-ray sources are supported by the support 9 so that it is rotatable around the axis of incident X-ray a.
  • a holder 12 is carried by a bar at the forward end of the L-shaped arm 11 fixedly attached to the shaft 10.
  • the holder 12 is supported by the guide rail 8 in such a manner that it permits the rotation of the guide rail 8 around a straight line a passing through the point p.
  • the shaft 10 is so arranged that its axis t intersects the lines at point p at right angles.
  • the shaft 10 has a worm gear 13 mounted on it for driving the shaft 10 by a worm 14.
  • An electric motor 15 is mounted on the holder 12 to drive the guide rail 8 through the gears 16 and 17 which are operatively connected to the motor 15.
  • the instrument of this invention involves a-rotation by the shaft 10, B-rotation around the line s and y-rotation around the axis of X-ray irradiation a.
  • the instrument of this invention includes a circular guide rail 7 for the X-ray sources and a second circular guide rail 8 for detectors for the diffracted X-ray.
  • the circular guide rails 7 and 8 have a common center which is point p at which the X-ray is incident on the specimen.
  • the residual strain on the surface of the specimen 1 can be determined from the output curve of the detectors 3 and 4 by making the direction a of the incident X-ray to coincide with line s and by irradiating the X-ray onto the specimen surface at a suitable angle which is selected by a-rotation of the shaft 10, and by symmetrically moving the detectors 3 and 4 along the guide rail 7.
  • the guide rail 7 is generally arranged at right angles with axis t, but depending on the configuration of the specimen and when the diffracted X-ray is shielded, measurement can be carried out with the guide rail 7 arranged in parallel with the axis 1.
  • the support 9 can be moved along the guide rail 8 and ,B-rotation allows the X-ray to be irradiated onto the specimen surface at right angles. Therefore, it is also possible to determine the internal stress from the diffraction angle in this particular case and the diffraction angle when the X-ray is irradiated onto the specimen surface at an angle of, for instance, 45.
  • the residual austenite can be determined from the ratio of the intensity of the diffracted X-ray from the carbon steel in a-phase to the intensity of the diffracted X-ray' from the carbon steel in y-phase.
  • the intensity of these diffractions can be measured with the detectors 4 and 5.
  • the errors in the measured diffraction due to the crystal orientation can be minimized by calculating the average value of measurements for various directions which can be measured during aand B-rotations. According to the instrument of this invention, it
  • the measuring device is not necessary to cut off the specimen and apply it to the measuring device, but the measuring device is installed near the specimen to carry out a non-destructive measurement.
  • the specimen has an X-ray diffraction angle of 0
  • the specimen is located so that the surface thereof is in parallel with the axis t, and the incident X-ray a and the diffracted X-ray b are both at an angle of (11/2 with axis s
  • the crystal lattice surface which is in parallel with the specimen surface can be observed. Consequently, the crystal orientation on the surface of the specimen can be measured during B- and a-rotations.
  • the instrument according to this invention permits measurement of the internal strain, residual austenite and crystal orientation at desired positions of a fixed specimen.
  • the instrument is also very excellent in that it measures strains in various directions and avoids errors from the measurements of residual austenite which may otherwise result from the crystal orientation.
  • An x-ray diffraction instrument comprising a mount for an x-ray source; an x-ray source constructed and arranged on said mount; a first circular guide rail constructed and arranged on said mount; said first circular guide rail having its center aligned with a point where an x-ray from said source is incident on a specimen; a plurality of detectors for detecting diffracted x-ray arranged on said first circular guide rail; a second circular guide rail having its center aligned with said x-ray incident point; a support for supporting said mount to rotate said mount around an axis aligned with the direction of x-ray incident onto the specimen.
  • said support being movable along said second circular guide rail; means for holding said circular guide rail to rotate said second rail around an axis formed by a vertical straight line passing through said x-ray incident point; and a shaft for carrying said meansto rotate said holder around an axis formed by a horizontal straight line intersecting said vertical straight line at said x-ray incident point.
  • An X-ray diffraction instrument characterized in that the rotation centers of the mount, first guide rail, the support and the centers of the first and second circular guide rails are all at the point where the X-ray is incident onto the specimen.
  • An x-ray diffraction instrument characterized in that the three detectors for the diffracted x-ray are arranged on the first guide rail; and an electric motor and a gear box are constructed and arranged with said mount for driving the first and second detectors in symmetrical relation with the direction of the incident x-ray and for driving the second and third detectors in the same direction at the same angular speed.

Abstract

According to this invention a mount for X-ray tubes is rotatable around the axis of an X-ray which is incident upon a specimen. A support for the mount is rotatable around a straight line passing through the point at which the X-ray is incident upon the specimen and a holder for a first guide rail is rotatable around a straight line which intersects a first straight line at right angles. Guide rails permit the X-ray sources and diffracted X-ray detectors to travel along such guide rails, so that the internal strain, residual austenite and crystal orientation of the specimen can be measured without being limited by the configuration of specimen''s surface.

Description

I United States Patent 1 [111 3,868,506 Ogiso Feb. 25, 1975 X-RAY DIFFRACTION INSTRUMENT 3,639,758 2/1972 Shimura 250/278 Inventor: Katsuhiko g y Japan 3,728,541 4/1973 Rabmovich et al 250/279 [73] Assignee: Rigaku Denki Company Limited, Primary Examiner-James W. Lawrence Tokyo, Japan Assistant Examiner-B. C. Anderson Filed J y 30 1973 Attorney, Agent, or Firm-A. W. Breiner [2]] Appl. No.: 383,611 57 ABSTRACT Foreign Application Priority Data According to this invention a mount for X-ray tubes is rotatable around the axis of an X-ray which is incident Feb. 20, 1973 Japan 48/19,?97 upon a specimen. A support for the mount is rotatable around a straight line passing through the point at which the X-ray is incident upon the specimen and a 250/278 26353928 holder for a first guide rail is rotatable around a [58] Field 278 279 straight line which intersects a first straight line at 6 6 right angles. Guide rails permit the X-ray sources and diffracted X-ray detectors to travel along such guide [56] References Cited rails, so that the internal strain, residual austenite and crystal orientation of the specimen can be measured UNITED STATES PATENTS without being limited by the configuration of speci- 2,462,374 2/1949 Firth 250/272 mens urface 3,322,948 5/1967 Baak et aL... 250/278 3,634,686 1 1972 Sekita 250/278 3 Claims, 2 Drawing Flgures l X-RAY DIFFRACTION INSTRUMENT This invention relates to an X-ray diffraction instrument. When a characteristic X-ray is applied on a metal surface, a diffraction phenomenon takes place. Since this phenomenon gives informations such as the angle of the incident X-ray from the diffracted X-ray and the intensity of the diffracted X-ray, the state of the metal crystal can be determined in a non-destructive manner by analyzing these informations.
The metal weld, for example, may sometimes include a residual strain which occurs during cooling by shrinkage. The residual strain may remarkably reduce the strength of the material. It is already known that the residual strain can be measured by the diffraction angle of X-ray. When a carbon steel in y-phase and at a high temperature is cooled rapidly, lattice modification occurs in the material which accompanies the change in volume, and the carbon steel changes into a-phase. A complicated residual strain appears due to the interaction of the stress caused by the cubical expansion resulting from the lattice modification and the stress caused by shrinkage during cooling. In this case the whole carbon steel in y-phase is not modified into oz-phase but a portion of it remains in the unstable y-phase due to rapid cooling. This is the residual austenite, which is modified with time into the stable a-phase by the external force, heat, etc. Since this is a lattice modification, it accompanies the change in volume which, in turn, results in the change in size or in residual strain. The mechanical and physical properties of the metal products such as cold-rolled steel plates and pressed products, which have been subjected to a remarkable plastic deformation, are changeable because the metal crystal of these products has an orientation. The residual strain, residual austenite and aggeregation structure of crystals have an interrelationship with each other and form important factors for determining the strength of the metallic material.
The purpose of this invention is to provide an X-ray diffraction instrument for measuring not only the residual strain but also the residual austenite and aggregation structure at the same positions of the actual structures and components.
The invention will be described in more detail with reference to the accompanying drawings, in which FIG. I is a front view of the X-ray diffraction instrument according to one embodiment of this invention; and
FIG. 2 is an elevational view of the instrument shown in FIG. 1.
X-ray a is applied from an X-ray tube 2 onto the surface of a specimen 1 of which residual strain, residual austenite and crystal orientation are to be measured. Detectors 3, 4 and are arranged for detecting the diffracted X-ray b, c and d. The X-ray tube 2 is fixedly attached to a mount 6, and the detectors 3, 4 and S are mounted on a circular guide rail 7 formed on the mount 6 so that they are movable along the guide rail 7. The guide rail 7 is formed into a circular configuration of which center coincides with point p at which the X-ray is incident upon the surface of the specimen. An electric motor and a gear box are arranged in the mount 6 for driving the detectors 3 and 4 symmetrically about the axis of incident X-ray a and for driving the detectors 4 and 5 in the same direction at an equal angular speed. Another guide rail 8 is formed into a circular configuration which has a larger diameter than the guide rail 7 and has its center at point p. A support 9 is mounted on the guide rail 8 so that it is movable along the guide rail 8. The mount 6 for the X-ray sources are supported by the support 9 so that it is rotatable around the axis of incident X-ray a. A holder 12 is carried by a bar at the forward end of the L-shaped arm 11 fixedly attached to the shaft 10. The holder 12 is supported by the guide rail 8 in such a manner that it permits the rotation of the guide rail 8 around a straight line a passing through the point p. The shaft 10 is so arranged that its axis t intersects the lines at point p at right angles.
The shaft 10 has a worm gear 13 mounted on it for driving the shaft 10 by a worm 14. An electric motor 15 is mounted on the holder 12 to drive the guide rail 8 through the gears 16 and 17 which are operatively connected to the motor 15.
As is clear from the foregoing description, the instrument of this invention involves a-rotation by the shaft 10, B-rotation around the line s and y-rotation around the axis of X-ray irradiation a. The instrument of this invention includes a circular guide rail 7 for the X-ray sources and a second circular guide rail 8 for detectors for the diffracted X-ray. The circular guide rails 7 and 8 have a common center which is point p at which the X-ray is incident on the specimen. Accordingly, when the surface of the specimen 1 is coincident with the axis t, the residual strain on the surface of the specimen 1 can be determined from the output curve of the detectors 3 and 4 by making the direction a of the incident X-ray to coincide with line s and by irradiating the X-ray onto the specimen surface at a suitable angle which is selected by a-rotation of the shaft 10, and by symmetrically moving the detectors 3 and 4 along the guide rail 7. The guide rail 7 is generally arranged at right angles with axis t, but depending on the configuration of the specimen and when the diffracted X-ray is shielded, measurement can be carried out with the guide rail 7 arranged in parallel with the axis 1. When the surface of the specimen 1 is at an angle with the axis t, the support 9 can be moved along the guide rail 8 and ,B-rotation allows the X-ray to be irradiated onto the specimen surface at right angles. Therefore, it is also possible to determine the internal stress from the diffraction angle in this particular case and the diffraction angle when the X-ray is irradiated onto the specimen surface at an angle of, for instance, 45.
The residual austenite can be determined from the ratio of the intensity of the diffracted X-ray from the carbon steel in a-phase to the intensity of the diffracted X-ray' from the carbon steel in y-phase. The intensity of these diffractions can be measured with the detectors 4 and 5. The errors in the measured diffraction due to the crystal orientation can be minimized by calculating the average value of measurements for various directions which can be measured during aand B-rotations. According to the instrument of this invention, it
is not necessary to cut off the specimen and apply it to the measuring device, but the measuring device is installed near the specimen to carry out a non-destructive measurement.
When the specimen has an X-ray diffraction angle of 0, if the specimen is located so that the surface thereof is in parallel with the axis t, and the incident X-ray a and the diffracted X-ray b are both at an angle of (11/2 with axis s, the crystal lattice surface which is in parallel with the specimen surface can be observed. Consequently, the crystal orientation on the surface of the specimen can be measured during B- and a-rotations.
It will be noted that the instrument according to this invention permits measurement of the internal strain, residual austenite and crystal orientation at desired positions of a fixed specimen. The instrument is also very excellent in that it measures strains in various directions and avoids errors from the measurements of residual austenite which may otherwise result from the crystal orientation.
I claim:
1. An x-ray diffraction instrument comprising a mount for an x-ray source; an x-ray source constructed and arranged on said mount; a first circular guide rail constructed and arranged on said mount; said first circular guide rail having its center aligned with a point where an x-ray from said source is incident on a specimen; a plurality of detectors for detecting diffracted x-ray arranged on said first circular guide rail; a second circular guide rail having its center aligned with said x-ray incident point; a support for supporting said mount to rotate said mount around an axis aligned with the direction of x-ray incident onto the specimen. said support being movable along said second circular guide rail; means for holding said circular guide rail to rotate said second rail around an axis formed by a vertical straight line passing through said x-ray incident point; and a shaft for carrying said meansto rotate said holder around an axis formed by a horizontal straight line intersecting said vertical straight line at said x-ray incident point.
2. An X-ray diffraction instrument according to claim l, characterized in that the rotation centers of the mount, first guide rail, the support and the centers of the first and second circular guide rails are all at the point where the X-ray is incident onto the specimen.
3. An x-ray diffraction instrument according to claim 1, characterized in that the three detectors for the diffracted x-ray are arranged on the first guide rail; and an electric motor and a gear box are constructed and arranged with said mount for driving the first and second detectors in symmetrical relation with the direction of the incident x-ray and for driving the second and third detectors in the same direction at the same angular speed.

Claims (3)

1. An x-ray diffraction instrument comprising a mount for an xray source; an x-ray source constructed and arranged on said mount; a first circular guide rail constructed and arranged on said mount; said first circular guide rail having its center aligned with a point where an x-ray from said source is incident on a specimen; a plurality of detectors for detecting diffracted x-ray arranged on said first circular guide rail; a second circular guide rail having its center aligned with said x-ray incident point; a support for supporting said mount to rotate said mount around an axis aligned with the direction of x-ray incident onto the specimen, said support being movable along said second circular guide rail; means for holding said circular guide rail to rotate said second rail around an axis formed by a vertical straight line passing through said x-ray incident point; and a shaft for carrying said means to rotate said holder around an axis formed by a horizontal straight line intersecting said vertical straight line at said x-ray incident point.
2. An X-ray diffraction instrument according to claim 1, characterized in that the rotation centers of the mount, first guide rail, the support and the centers of the first and second circular guide rails are all at the point where the X-ray is incident onto the specimen.
3. An x-ray diffraction instrument according to claim 1, characterized in that the three detectors for the diffracted x-ray are arranged on the first guide rail; and an electric motor and a gear box are constructed and arranged with said mount for driving the first and second detectors in symmetrical relation with the direction of the incident x-ray and for driving the second and third detectors in the same direction at the same angular speed.
US383611A 1973-02-20 1973-07-30 X-ray diffraction instrument Expired - Lifetime US3868506A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48019797A JPS5222553B2 (en) 1973-02-20 1973-02-20

Publications (1)

Publication Number Publication Date
US3868506A true US3868506A (en) 1975-02-25

Family

ID=12009325

Family Applications (1)

Application Number Title Priority Date Filing Date
US383611A Expired - Lifetime US3868506A (en) 1973-02-20 1973-07-30 X-ray diffraction instrument

Country Status (4)

Country Link
US (1) US3868506A (en)
JP (1) JPS5222553B2 (en)
DE (1) DE2340028A1 (en)
GB (1) GB1390710A (en)

Cited By (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4074132A (en) * 1976-08-24 1978-02-14 North American Philips Corporation Automatic single crystal diffractometer
FR2369823A1 (en) * 1976-11-26 1978-06-02 Varian Associates Portable medical X=ray unit - has X=ray source and detector rotatable about three axes
US4209706A (en) * 1976-11-26 1980-06-24 Varian Associates, Inc. Fluoroscopic apparatus mounting fixture
EP0120676A2 (en) * 1983-03-22 1984-10-03 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
WO1985001342A1 (en) * 1983-09-22 1985-03-28 Insinööritoimisto Mexpert Oy Procedure and measuring instrument based on x-ray diffraction for measuring stresses
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4987585A (en) * 1989-04-04 1991-01-22 General Electric Company X-ray positioner for multi-axis profiling
EP0473154A2 (en) * 1990-08-31 1992-03-04 Nisshin Steel Co., Ltd. System for making an on-line determination of degree of alloying in galvannealed steel sheets
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
EP0597668A1 (en) * 1992-11-11 1994-05-18 FISONS plc X-ray analysis apparatus
US5966423A (en) * 1997-03-28 1999-10-12 Philips Electronics North America Corporation Arc diffractometer
US6252929B1 (en) 1996-02-12 2001-06-26 American Science & Engineering, Inc. Mobile x-ray inspection system for large objects
US6693281B2 (en) * 2001-05-02 2004-02-17 Massachusetts Institute Of Technology Fast neutron resonance radiography for elemental mapping
US6721393B1 (en) * 1999-03-31 2004-04-13 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US20040086078A1 (en) * 2002-11-06 2004-05-06 William Adams X-ray backscatter mobile inspection van
US20040136496A1 (en) * 2002-02-08 2004-07-15 Mueller Dennis William Portable x-ray diffractometer
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US20050018809A1 (en) * 2003-07-22 2005-01-27 X-Ray Optical Systems, Inc. Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface
EP1608957A2 (en) * 2003-03-17 2005-12-28 Proto Manufacturing Ltd. X-ray diffraction system and method
US20060140343A1 (en) * 2003-08-04 2006-06-29 X-Ray Optical Systems, Inc. In-situ X-ray diffraction system using sources and detectors at fixed angular positions
US20060245548A1 (en) * 2005-04-22 2006-11-02 Joseph Callerame X-ray backscatter inspection with coincident optical beam
USRE39396E1 (en) * 1996-02-12 2006-11-14 American Science And Engineering, Inc. Mobile x-ray inspection system for large objects
US20070098142A1 (en) * 2005-10-24 2007-05-03 Peter Rothschild X-Ray Inspection Based on Scatter Detection
US20070269005A1 (en) * 2002-11-06 2007-11-22 Alex Chalmers X-Ray Backscatter Detection Imaging Modules
US20090103686A1 (en) * 2007-10-23 2009-04-23 American Science And Engineering, Inc. X-Ray Imaging with Continuously Variable Zoom and Lateral Relative Displacement of the Source
US20090257555A1 (en) * 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US20110026673A1 (en) * 2009-07-29 2011-02-03 American Science And Engineering, Inc. Top-Down X-Ray Inspection Trailer
US8532823B2 (en) 2010-02-12 2013-09-10 American Science And Engineering, Inc. Disruptor guidance system and methods based on scatter imaging
JP2014106004A (en) * 2012-11-22 2014-06-09 Kowa Dennetsu Keiki:Kk X-ray stress measurement device
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
US9613728B2 (en) 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US20170167988A1 (en) * 2015-06-18 2017-06-15 Sintokogio, Ltd. Residual stress measuring apparatus and residual stress measuring method
US10499861B2 (en) 2017-09-06 2019-12-10 Zap Surgical Systems, Inc. Self-shielded, integrated-control radiosurgery system
US11684446B2 (en) 2019-02-27 2023-06-27 Zap Surgical Systems, Inc. Device for radiosurgical treatment of uterine fibroids
US11826582B2 (en) 2017-05-05 2023-11-28 Zap Surgical Systems, Inc. Revolving radiation collimator

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5744841A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Method and apparatus for x-ray diffraction
GB2169480B (en) * 1985-01-03 1988-12-07 Erno Raumfahrttechnik Gmbh A method of non-destructive testing of structural members
JP5984024B2 (en) * 2014-11-04 2016-09-06 パルステック工業株式会社 X-ray diffractometer
DE102016222644A1 (en) 2016-03-14 2017-09-28 Sms Group Gmbh Process for rolling and / or heat treating a metallic product
JP6842084B2 (en) * 2017-02-03 2021-03-17 国立大学法人東北大学 Portable 3-axis stress measuring device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2462374A (en) * 1944-10-04 1949-02-22 Philips Lab Inc Stress analysis by x-ray diffraction
US3322948A (en) * 1964-12-21 1967-05-30 Owens Illinois Inc X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable
US3634686A (en) * 1969-06-17 1972-01-11 Rigaku Denki Co Ltd X-ray stress-measuring apparatus
US3639758A (en) * 1969-03-07 1972-02-01 Rigaku Denki Co Ltd X-ray stress measuring apparatus
US3728541A (en) * 1969-05-20 1973-04-17 Yale Res And Dev Co Ltd X-ray diffractometer

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS539109B2 (en) * 1971-11-24 1978-04-03

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2462374A (en) * 1944-10-04 1949-02-22 Philips Lab Inc Stress analysis by x-ray diffraction
US3322948A (en) * 1964-12-21 1967-05-30 Owens Illinois Inc X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable
US3639758A (en) * 1969-03-07 1972-02-01 Rigaku Denki Co Ltd X-ray stress measuring apparatus
US3728541A (en) * 1969-05-20 1973-04-17 Yale Res And Dev Co Ltd X-ray diffractometer
US3634686A (en) * 1969-06-17 1972-01-11 Rigaku Denki Co Ltd X-ray stress-measuring apparatus

Cited By (59)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4074132A (en) * 1976-08-24 1978-02-14 North American Philips Corporation Automatic single crystal diffractometer
FR2369823A1 (en) * 1976-11-26 1978-06-02 Varian Associates Portable medical X=ray unit - has X=ray source and detector rotatable about three axes
US4209706A (en) * 1976-11-26 1980-06-24 Varian Associates, Inc. Fluoroscopic apparatus mounting fixture
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
EP0120676A3 (en) * 1983-03-22 1985-06-12 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
EP0120676A2 (en) * 1983-03-22 1984-10-03 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
WO1985001342A1 (en) * 1983-09-22 1985-03-28 Insinööritoimisto Mexpert Oy Procedure and measuring instrument based on x-ray diffraction for measuring stresses
US4987585A (en) * 1989-04-04 1991-01-22 General Electric Company X-ray positioner for multi-axis profiling
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
EP0473154A2 (en) * 1990-08-31 1992-03-04 Nisshin Steel Co., Ltd. System for making an on-line determination of degree of alloying in galvannealed steel sheets
EP0473154A3 (en) * 1990-08-31 1993-03-24 Nisshin Steel Co., Ltd. System for making an on-line determination of degree of alloying in galvannealed steel sheets
EP0597668A1 (en) * 1992-11-11 1994-05-18 FISONS plc X-ray analysis apparatus
US6292533B1 (en) 1996-02-12 2001-09-18 American Science & Engineering, Inc. Mobile X-ray inspection system for large objects
US6252929B1 (en) 1996-02-12 2001-06-26 American Science & Engineering, Inc. Mobile x-ray inspection system for large objects
USRE39396E1 (en) * 1996-02-12 2006-11-14 American Science And Engineering, Inc. Mobile x-ray inspection system for large objects
US5966423A (en) * 1997-03-28 1999-10-12 Philips Electronics North America Corporation Arc diffractometer
US6005914A (en) * 1997-03-28 1999-12-21 Philips Electronics North America Corporation Arc diffractometer
US7242744B2 (en) 1999-03-31 2007-07-10 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US6721393B1 (en) * 1999-03-31 2004-04-13 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US20040165697A1 (en) * 1999-03-31 2004-08-26 Proto Manufacturing, Ltd. X-ray diffraction apparatus and method
US20050195942A1 (en) * 1999-03-31 2005-09-08 Michael Brauss X-ray diffraction apparatus and method
US6853706B2 (en) * 1999-03-31 2005-02-08 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US6693281B2 (en) * 2001-05-02 2004-02-17 Massachusetts Institute Of Technology Fast neutron resonance radiography for elemental mapping
US6909773B2 (en) * 2002-02-08 2005-06-21 Metscan Technologies, Llc Portable x-ray diffractometer
US20040136496A1 (en) * 2002-02-08 2004-07-15 Mueller Dennis William Portable x-ray diffractometer
US20110075808A1 (en) * 2002-11-06 2011-03-31 American Science And Engineering, Inc. X-Ray Inspection Based on Scatter Detection
US8194822B2 (en) 2002-11-06 2012-06-05 American Science And Engineering, Inc. X-ray inspection based on scatter detection
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US20090257555A1 (en) * 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7099434B2 (en) 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US7505556B2 (en) 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US20040086078A1 (en) * 2002-11-06 2004-05-06 William Adams X-ray backscatter mobile inspection van
US20070269005A1 (en) * 2002-11-06 2007-11-22 Alex Chalmers X-Ray Backscatter Detection Imaging Modules
US7218704B1 (en) 2002-11-06 2007-05-15 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
EP1608957A2 (en) * 2003-03-17 2005-12-28 Proto Manufacturing Ltd. X-ray diffraction system and method
EP1608957A4 (en) * 2003-03-17 2007-06-27 Proto Mfg Ltd X-ray diffraction system and method
US20050018809A1 (en) * 2003-07-22 2005-01-27 X-Ray Optical Systems, Inc. Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface
WO2005010512A1 (en) * 2003-07-22 2005-02-03 X-Ray Optical Systems, Inc. Method and system for x-ray diffraction measurements using an aligned source and detector rotating around a sample surface
US7711088B2 (en) 2003-07-22 2010-05-04 X-Ray Optical Systems, Inc. Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface
US20060140343A1 (en) * 2003-08-04 2006-06-29 X-Ray Optical Systems, Inc. In-situ X-ray diffraction system using sources and detectors at fixed angular positions
US7236566B2 (en) * 2003-08-04 2007-06-26 Gibson David M In-situ X-ray diffraction system using sources and detectors at fixed angular positions
US20060245548A1 (en) * 2005-04-22 2006-11-02 Joseph Callerame X-ray backscatter inspection with coincident optical beam
US7551715B2 (en) 2005-10-24 2009-06-23 American Science And Engineering, Inc. X-ray inspection based on scatter detection
US20070098142A1 (en) * 2005-10-24 2007-05-03 Peter Rothschild X-Ray Inspection Based on Scatter Detection
US20090103686A1 (en) * 2007-10-23 2009-04-23 American Science And Engineering, Inc. X-Ray Imaging with Continuously Variable Zoom and Lateral Relative Displacement of the Source
US7593510B2 (en) 2007-10-23 2009-09-22 American Science And Engineering, Inc. X-ray imaging with continuously variable zoom and lateral relative displacement of the source
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
US20110026673A1 (en) * 2009-07-29 2011-02-03 American Science And Engineering, Inc. Top-Down X-Ray Inspection Trailer
US8345819B2 (en) 2009-07-29 2013-01-01 American Science And Engineering, Inc. Top-down X-ray inspection trailer
US8532823B2 (en) 2010-02-12 2013-09-10 American Science And Engineering, Inc. Disruptor guidance system and methods based on scatter imaging
JP2014106004A (en) * 2012-11-22 2014-06-09 Kowa Dennetsu Keiki:Kk X-ray stress measurement device
US9613728B2 (en) 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US20170167988A1 (en) * 2015-06-18 2017-06-15 Sintokogio, Ltd. Residual stress measuring apparatus and residual stress measuring method
US10520455B2 (en) * 2015-06-18 2019-12-31 Sintokogio, Ltd. Residual stress measuring apparatus and residual stress measuring method
US11826582B2 (en) 2017-05-05 2023-11-28 Zap Surgical Systems, Inc. Revolving radiation collimator
US10499861B2 (en) 2017-09-06 2019-12-10 Zap Surgical Systems, Inc. Self-shielded, integrated-control radiosurgery system
US11844637B2 (en) 2017-09-06 2023-12-19 Zap Surgical Systems, Inc. Therapeutic radiation beam detector for radiation treatment systems
US11684446B2 (en) 2019-02-27 2023-06-27 Zap Surgical Systems, Inc. Device for radiosurgical treatment of uterine fibroids

Also Published As

Publication number Publication date
GB1390710A (en) 1975-04-16
JPS49110393A (en) 1974-10-21
DE2340028A1 (en) 1974-09-05
JPS5222553B2 (en) 1977-06-17

Similar Documents

Publication Publication Date Title
US3868506A (en) X-ray diffraction instrument
US9329143B2 (en) Method and apparatus for investigating the X-ray radiographic properties of samples
US2462374A (en) Stress analysis by x-ray diffraction
James et al. “PARS”—A Portable X-Ray Analyzer for Residual Stresses
US4084094A (en) Radiographic apparatus
Deslattes Single axis, two crystal x‐ray instrument
GB1277465A (en) Measuring apparatus
GB1255644A (en) Method of determining the value of a mechanical property or properties of a fibre
US3344274A (en) Ray analysis apparatus having both diffraction amd spectrometer tubes mounted on a common housing
US3030507A (en) X-ray apparatus for determination of internal stresses in materials
JPH05107203A (en) X-ray apparatus for evaluating surface condition of sample
US3727067A (en) Radiation responsive position detectors
US3411001A (en) Apparatus and process for eliminating preferred orientation in x-ray diffraction in crystals
JPH08136698A (en) Arc slider driving type goniometer and solid angle diffraction meter
Akselsson et al. A beam mapping method
JP2000258366A (en) Minute part x-ray diffraction apparatus
US3200248A (en) Apparatus for use as a goniometer and diffractometer
Schulson Some considerations of selected area channelling in the scanning electron microscope
US3504178A (en) Method for determining crystall-ographic orientation
US3631240A (en) Apparatus for holding and orienting a crystal in x-ray instruments measuring the microstructure thereof
Smirnov et al. A device for precise measurements of radiation energy from the (n, γ) reaction
JPH0666742A (en) X-ray diffraction method and small-sized x-ray difrractometer
Witt et al. Application of the Electron Microscope for Production of Pseudo‐Kossel Patterns and Their Use in the Determination of Lattice Constants of a Beryllium‐4.4 Wt% Copper Alloy
Wooster Mineralogical applications of a two-crystal Weissenberg X-ray goniometer
Pessen et al. A new absolute-scale small-angle X-ray scattering instrument