US4411528A - Optical displacement and contour measuring - Google Patents
Optical displacement and contour measuring Download PDFInfo
- Publication number
- US4411528A US4411528A US06/226,305 US22630581A US4411528A US 4411528 A US4411528 A US 4411528A US 22630581 A US22630581 A US 22630581A US 4411528 A US4411528 A US 4411528A
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- US
- United States
- Prior art keywords
- ring
- light
- image
- collimated
- test surface
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
Definitions
- the invention relates to apparatus for optically measuring displacement, obliguity and/or contour of a surface.
- Optical displacement or range finders using a triangulation technique are well known in the art. See e.g., U.S. Pat. Nos. 3,671,126 to Erb and 3,692,414 to Hosterman et al. Some of these devices have included the capability to gauge the surfaces tilt or contour. See e.g., U.S. Pat. Nos. 3,523,736 to Bottomley, 3,734,626 to Roberts et al., 3,885,875 to Rosenfeld et al., and 3,894,802 to Higgins. At least one patent, Higgins '414, supra, has disclosed a circular sweep in conjunction with triangulation to increase the scan range of the instrument, but not for the purpose of gauging tilt or contour. None have disclosed a projected ring of light for the purpose of simultaneous measurement of displacement and obliquity or contour.
- the invention essentially comprises projecting an inwardly angled circular beam of light on the surface whose range and contour or obliquity are to be measured.
- the circular beam of light will form a ring of light on the surface the diameter of which varies with the distance of the surface from an imaginary reference surface and the center of which varies with the obliquity of the surface relative to the imaginary reference surface.
- an optical system aligned on the center of an imaginary ring projected on the imaginary surface, conveys the image of the ring of light on the test surface to a diode array, where the circumference of the image on the array is compared to the circumference of the reference image stored in an electronic memory to compute the displacement of the test surface from the reference surface about the entire circumference. This computation also yields the test surface's contour or obliquity relative to the reference surface.
- FIG. 1 shows a generalized schematic of the preferred embodiment.
- FIG. 2 shows the shape of the projected ring on various surfaces.
- FIG. 1 shows a preferred embodiment of the present invention.
- Laser 10 projects a collimated beam of light 12 against plain mirror 14, which deflects the beam 90°.
- the source of the collimated beam need not be a laser.
- a laser is chosen because it inexpensively yields an intense source of very bright light.
- the collimated beam 12 thereafter impinges on the center of transverse mounted convex mirror 16, which reflects the beam in a diverging pattern 18.
- This diverging beam 18 impinges on concave mirror 20 which recollimates the beam.
- Only the outer edge portions of concave mirror 20 are mirrored. (Alternatively, the central portion of the mirror may be left open as an aperture.)
- the recollimated beam 22 possesses the form of a circle.
- This circular beam 22 then impinges on a conical mirror 24, which is center mounted transverse the recollimated beam 22 with the large diameter opening 26 directed toward concave mirror 20 and the small diameter opening 28 directed toward the test surface 30.
- the circular collimated beam 22 is directed inwardly toward point P, such that movement of the test surface laterally toward or away from point P results in proportionally varying the diameter of the ring of light formed by the intersection 34 of the beam 32 with the test surface 30.
- the image of the ring of light 34 on the test surface 30 is collimated by relay lens 36, reflected 90° by plane mirror 38, and transmitted through rotatably mounted dove prism 40 to scanning camera 42, which is essentially composed of a lens 41 focused at an infinity and a linear diode array 43 mounted transverse the optical axis of the camera 42 and centered on that axis.
- a linear diode array is a Self-Scanning Photo Diode Array available from EG&G Reticon of Sunnyvale, California.
- a computer 46 Connected to the outputs of the photo diode array is a computer 46 or similar electronics, whose operation will shortly be described, but which has stored in its memory the two diode locations which would intercept the image of the beam 32 were it to impinge upon an imaginary reference surface 44.
- the rotation of a dove prism through 180° rotates the transmitted image 360°.
- the dove prism 40 is rotated, either in step fashion or continuously as may be preferred, under control of the computer to sweep all points of the imaged ring through the linear diode array.
- the computer may by simple triangulation determine the vertical displacement (relative to the axis of projection of the ring) of discrete points on the circumference of the ring from corresponding points on the circumference of the imaginary reference image. The measurement of these displacements throughout 360° enables the computer to reconstruct the contour of the test surface and its relative displacement from the imaginary reference surface 44.
- FIG. 2 shows the shapes in sizes of several ring images for various exemplary surfaces.
- dove prism 40 may be omitted in the present invention if and when two-dimensional diode arrays become commercially available or if one chooses to rotate the diode array itself through the image, rather than vice versa.
- the invention encompasses other optical arrangements for forming an inwardly converging circular beam of light for projection onto a test surface. These may include, without limitation, the scanning of a single spot of light in a circular pattern, such as may be achieved by rotation of a dove prism in the beam projection system.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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US06/226,305 US4411528A (en) | 1981-01-19 | 1981-01-19 | Optical displacement and contour measuring |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/226,305 US4411528A (en) | 1981-01-19 | 1981-01-19 | Optical displacement and contour measuring |
Publications (1)
Publication Number | Publication Date |
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US4411528A true US4411528A (en) | 1983-10-25 |
Family
ID=22848388
Family Applications (1)
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US06/226,305 Expired - Fee Related US4411528A (en) | 1981-01-19 | 1981-01-19 | Optical displacement and contour measuring |
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Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0145957A1 (en) * | 1983-11-25 | 1985-06-26 | Firma Carl Zeiss | Process and device for the contactless measuring of objects |
US4539481A (en) * | 1981-11-30 | 1985-09-03 | Siemens Aktiengesellschaft | Method for adjusting a reference signal for a laser device operating in a giant pulse mode |
US4549207A (en) * | 1984-04-09 | 1985-10-22 | Avco Corporation | Gap measuring apparatus |
WO1986004676A2 (en) * | 1985-02-05 | 1986-08-14 | Optische Werke G. Rodenstock | Device for optical determination of low-order errors in shape |
US4647193A (en) * | 1985-06-10 | 1987-03-03 | Rca Corporation | Optical target ranging apparatus |
US4798469A (en) * | 1985-10-02 | 1989-01-17 | Burke Victor B | Noncontact gage system utilizing reflected light |
US4837615A (en) * | 1987-09-29 | 1989-06-06 | Textron Inc. | Gap measuring apparatus |
US5661561A (en) * | 1995-06-02 | 1997-08-26 | Accu-Sort Systems, Inc. | Dimensioning system |
US5714762A (en) * | 1993-11-09 | 1998-02-03 | British Nuclear Fuels Plc | Determination of the surface properties of an object |
US20060152728A1 (en) * | 1998-06-16 | 2006-07-13 | Orbotech Ltd. | Illuminator for inspecting substantially flat surfaces |
US20060215178A1 (en) * | 2005-03-28 | 2006-09-28 | Fuji Xerox Co., Ltd. | Position measurement system |
US20090270682A1 (en) * | 2005-03-14 | 2009-10-29 | Koninklijke Philips Electronics N.V. | Surgical instrument |
US20160084644A1 (en) * | 2014-09-24 | 2016-03-24 | General Electric Company | System and method of measuring geometric characteristics of object |
US20230341752A1 (en) * | 2019-12-23 | 2023-10-26 | Apple Inc. | External recording indicators |
Citations (13)
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---|---|---|---|---|
US2759106A (en) * | 1951-05-25 | 1956-08-14 | Wolter Hans | Optical image-forming mirror system providing for grazing incidence of rays |
US3187185A (en) * | 1960-12-22 | 1965-06-01 | United States Steel Corp | Apparatus for determining surface contour |
US3199400A (en) * | 1961-10-09 | 1965-08-10 | Edward F Zabinski | Interferometric device and method for determining range |
GB1002805A (en) * | 1960-11-28 | 1965-09-02 | Aga Ab | Improvements in optical rangefinders |
US3519829A (en) * | 1967-10-10 | 1970-07-07 | Zeiss Jena Veb Carl | Optical system for radiation sensitive rangefinder |
US3770940A (en) * | 1971-11-12 | 1973-11-06 | Ibm | Optical bar coding scanning apparatus |
US3889117A (en) * | 1971-04-29 | 1975-06-10 | Cincinnati Electronics Corp | Tapered detector scanning array system |
US4102575A (en) * | 1977-03-28 | 1978-07-25 | Acuity Systems, Incorporated | Back vertex annular aperture |
SU637705A2 (en) * | 1977-05-05 | 1978-12-15 | Новосибирский электротехнический институт | Device for quality control of article hole machining |
GB2027948A (en) * | 1978-06-16 | 1980-02-27 | Universal Pioneer Corp | Automatic focus servomechanism in an optical information rading device |
JPS55101003A (en) * | 1979-10-05 | 1980-08-01 | Canon Inc | Distance detector |
US4281931A (en) * | 1977-12-21 | 1981-08-04 | Machida Endoscope Co., Ltd. | Measuring apparatus comprising light optics utilizing cylindrical focusing glass fiber |
US4305661A (en) * | 1979-02-27 | 1981-12-15 | Diffracto, Ltd. | Method and apparatus for determining physical characteristics of objects and object surfaces |
-
1981
- 1981-01-19 US US06/226,305 patent/US4411528A/en not_active Expired - Fee Related
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2759106A (en) * | 1951-05-25 | 1956-08-14 | Wolter Hans | Optical image-forming mirror system providing for grazing incidence of rays |
GB1002805A (en) * | 1960-11-28 | 1965-09-02 | Aga Ab | Improvements in optical rangefinders |
US3187185A (en) * | 1960-12-22 | 1965-06-01 | United States Steel Corp | Apparatus for determining surface contour |
US3199400A (en) * | 1961-10-09 | 1965-08-10 | Edward F Zabinski | Interferometric device and method for determining range |
US3519829A (en) * | 1967-10-10 | 1970-07-07 | Zeiss Jena Veb Carl | Optical system for radiation sensitive rangefinder |
US3889117A (en) * | 1971-04-29 | 1975-06-10 | Cincinnati Electronics Corp | Tapered detector scanning array system |
US3770940A (en) * | 1971-11-12 | 1973-11-06 | Ibm | Optical bar coding scanning apparatus |
US4102575A (en) * | 1977-03-28 | 1978-07-25 | Acuity Systems, Incorporated | Back vertex annular aperture |
SU637705A2 (en) * | 1977-05-05 | 1978-12-15 | Новосибирский электротехнический институт | Device for quality control of article hole machining |
US4281931A (en) * | 1977-12-21 | 1981-08-04 | Machida Endoscope Co., Ltd. | Measuring apparatus comprising light optics utilizing cylindrical focusing glass fiber |
GB2027948A (en) * | 1978-06-16 | 1980-02-27 | Universal Pioneer Corp | Automatic focus servomechanism in an optical information rading device |
US4305661A (en) * | 1979-02-27 | 1981-12-15 | Diffracto, Ltd. | Method and apparatus for determining physical characteristics of objects and object surfaces |
JPS55101003A (en) * | 1979-10-05 | 1980-08-01 | Canon Inc | Distance detector |
Non-Patent Citations (4)
Title |
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Buck, T. M., "A Silicon Diode Array for Image Sensing", Proc. Conf. on Semiconductor Nuclear-Particle Detectors & Circuits, Gatlinburg, Tenn., 1968, pp. 306-310. * |
Karizomenov et al., "Photoelectric Instrument for Automatic Measurement of Dimensions in Cutting", Meas. Tech., (USA), vol. 15 #1, 1-1972, pp. 47-50. * |
Khoury, H. A., "Linear Photodiode Feedback Automatic Alignment System", IBM Tech. Disc. Bull., 3-1975, pp. 2887-2889. * |
Shafer, D. R., "Laser Beam Expander-A New Design", Proc. Soc. Photo-Dpt. Instrum. Eng. (USA), SPIE vol. 190, LASL Optics Conf. 1979, pp. 15-20. * |
Cited By (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4539481A (en) * | 1981-11-30 | 1985-09-03 | Siemens Aktiengesellschaft | Method for adjusting a reference signal for a laser device operating in a giant pulse mode |
US4660970A (en) * | 1983-11-25 | 1987-04-28 | Carl-Zeiss-Stiftung | Method and apparatus for the contact-less measuring of objects |
EP0145957A1 (en) * | 1983-11-25 | 1985-06-26 | Firma Carl Zeiss | Process and device for the contactless measuring of objects |
US4549207A (en) * | 1984-04-09 | 1985-10-22 | Avco Corporation | Gap measuring apparatus |
WO1986004676A2 (en) * | 1985-02-05 | 1986-08-14 | Optische Werke G. Rodenstock | Device for optical determination of low-order errors in shape |
WO1986004676A3 (en) * | 1985-02-05 | 1986-10-23 | Rodenstock Optik G | Device for optical determination of low-order errors in shape |
US4763006A (en) * | 1985-02-05 | 1988-08-09 | Optische Werke G. Rodenstock | Device determining surface element inclination angle for the optical detection of form errors of a low order |
US4647193A (en) * | 1985-06-10 | 1987-03-03 | Rca Corporation | Optical target ranging apparatus |
US4798469A (en) * | 1985-10-02 | 1989-01-17 | Burke Victor B | Noncontact gage system utilizing reflected light |
US4837615A (en) * | 1987-09-29 | 1989-06-06 | Textron Inc. | Gap measuring apparatus |
US5714762A (en) * | 1993-11-09 | 1998-02-03 | British Nuclear Fuels Plc | Determination of the surface properties of an object |
US5661561A (en) * | 1995-06-02 | 1997-08-26 | Accu-Sort Systems, Inc. | Dimensioning system |
US5969823A (en) * | 1995-06-02 | 1999-10-19 | Accu-Sort Systems, Inc. | Dimensioning system |
US6177999B1 (en) | 1995-06-02 | 2001-01-23 | Accu-Sort Systems, Inc. | Dimensioning system |
US6775012B2 (en) | 1995-06-02 | 2004-08-10 | Accu-Sort Systems, Inc. | System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface |
US20060152728A1 (en) * | 1998-06-16 | 2006-07-13 | Orbotech Ltd. | Illuminator for inspecting substantially flat surfaces |
US7215417B2 (en) * | 1998-06-16 | 2007-05-08 | Orbotech Ltd. | Illuminator for inspecting substantially flat surfaces |
US20090270682A1 (en) * | 2005-03-14 | 2009-10-29 | Koninklijke Philips Electronics N.V. | Surgical instrument |
US20060215178A1 (en) * | 2005-03-28 | 2006-09-28 | Fuji Xerox Co., Ltd. | Position measurement system |
US7474418B2 (en) * | 2005-03-28 | 2009-01-06 | Fuji Xerox Co., Ltd. | Position measurement system |
US20160084644A1 (en) * | 2014-09-24 | 2016-03-24 | General Electric Company | System and method of measuring geometric characteristics of object |
US9970753B2 (en) * | 2014-09-24 | 2018-05-15 | General Electric Company | System and method of measuring geometric characteristics of object |
US20230341752A1 (en) * | 2019-12-23 | 2023-10-26 | Apple Inc. | External recording indicators |
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