USRE33344E - Apparatus and method for detecting negative ions - Google Patents
Apparatus and method for detecting negative ions Download PDFInfo
- Publication number
- USRE33344E USRE33344E US06/813,880 US81388085A USRE33344E US RE33344 E USRE33344 E US RE33344E US 81388085 A US81388085 A US 81388085A US RE33344 E USRE33344 E US RE33344E
- Authority
- US
- United States
- Prior art keywords
- ions
- negative ions
- positive
- negative
- iaddend
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/02—Tubes in which one or a few electrodes are secondary-electron emitting electrodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/28—Measuring radiation intensity with secondary-emission detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/028—Negative ion sources
Definitions
- the present invention is directed to apparatus for detecting negative ions and more particularly to apparatus where the negative ions are produced by a quadrupole mass spectrometer.
- both positive and negative ions are produced.
- positive and negative ions are produced in abundance.
- the chemical composition of the compound under investigation ultimately determines the relative intensity of positive and negative ions.
- FIG. 1A To detect positive ions a standard continuous dynode electron multiplier (CDEM) is shown in FIG. 1A which is available under the trademark GALILEO as model 4770.
- the cathode has a voltage of -1 kv to -3 kv impressed upon it. This high voltage accelerates the positive ions into its first stage. The anode end is grounded and the detection signal is obtained at ground potential.
- FIG. 1B illustrates a typical negative ion detector of the same configuration as FIG. 1A except that the cathode is operated at approximately +2 kv voltage to attract the negative ions.
- the output signal at the anode is floated at a relatively high positive voltage from +3 kv to +5 kv.
- FIG. 1A While the positive ion detector configuration of FIG. 1A is satisfactory the negative ion detector as illustrated in FIG. 1B has several disadvantages:
- the anode portion where the signal is detected is at a high potential relative to ground requiring an off grounded preamplifier and complex preamplifier circuitry.
- the negative ion detector as shown in FIG. 1B is necessarily a floating system it will be sensitive to stray electrons in the system. Also background noise will be high.
- apparatus for detecting negative ions from a source of negative ions.
- Conversion means are provided for receiving the negative ions and producing a proportional amount of positive ions. The resultant positive ions are then detected.
- FIGS. 1A and 1B are simplified diagrams of typical prior art ion CDEM detectors
- FIG. 2 is a block diagram of a mass spectrometer system embodying the present invention
- FIG. 3 is a cut away perspective view of the detector portion of FIG. 2;
- FIG. 4 is a conceptual diagram of FIG. 3.
- FIG. 5 is an alternative embodiment in conceptual form similar to FIG. 4.
- FIG. 2 illustrates a typical system in which the negative ion detector of the present invention is used.
- An ionizing region 11 produces negative ions and other particles including electrons, positive ions, and neutrals which are analyzed in the mass analyzer 12 which may be of the quadrupole filter type.
- a detector 13 senses the desired particle to indicate its abundance or amount.
- detector 13 is illustrated in FIG. 3 and is suitable for detecting negative ions.
- a gridded aperture screen 14 receives negative ions from mass analyzer 12 which bombard a conversion unit or anode 16 which converts the negative ions to positive ions.
- This conversion anode may be constructed entirely of any one of the metals Al, Cu, Ag, Cr, Be, and stainless steel and in addition oxides of these metals.
- anode 16 is oxidized copper in the form of a cube with two adjacent sides open. Alternatively a tilted flat surface or venetian blind could be used.
- Such unit forms an effective reflector for receiving the negative ions through aperture screen 14 and directing the resultant positive ions to a continuous dynode electron multiplier 20.
- Multiplier 20 is identical to FIG. 1A and includes a horn portion 21 with an incoming aperture screen 22 attached. Screen 22 prevents the escape of secondary electrons from the horn portion.
- Conversion anode 16 is supported by rectangularly shaped unit 23 shown in dashed outline.
- Anode 16 is maintained at a +3 kv voltage in order to attract the negative ions from mass analyzer 12. This voltage is not critical.
- FIG. 4 shows FIG. 3 in conceptual form where a negative ion enters through aperture screen 14 and impacts conversion anode 16 to produce a proportional amount of positive ions the amount being dependent on ion structure such as mass or other characteristics.
- the positive ions are then detected by electron multiplier 20. From a theoretical point of view the conversion of negative ions to positive ions is accomplished by impacting the primary negative ions onto or accelerating them towards the surface of the conversion anode 16. Stray electrons impacting on the anode surface do not produce positive ions and are not detected.
- Metal atoms or absorbed molecules are vaporized off the surface of the conversion anode by the energetic bombarding negative ions. A fraction of these vaporized atoms lose electrons to become positive ions which will subsequently be collected by the positive ion electron multiplier.
- the present invention is also adaptable to detect positive and negative ions simultaneously.
- One system to accomplish this is described in U.S. Pat. No. 4,066,894 entitled "Positive and Negative Ion Recording System For Mass Spectrometer" with Donald F. Hunt and the present inventor as coinventors. That patent discloses two continuous dynode electron multipliers (CDEM); one for positive ions and one for negative ions.
- FIG. 5 illustrates apparatus for substantially concurrently detecting negative and positive ions from the output of the mass analyzer 12 (FIG. 2) using a common CDEM 30. Such multiplier is similar to that showon in FIG.
- the CDEM 30 is suitable for determining the abundance of positive ions.
- negative ions from the ion beam which are of necessarily low energy (for example, less than 100 electron volts since they are produced by a quadrupole type mass analyzer) are attracted through an aperture 31 by a conversion unit 16'.
- This unit is similar to unit 16 in FIG. 4 and is maintained at a +3,000 volts for example.
- the conversion unit in response to the bombardment of negative ions produces a proportional amount of positive ions which are sensed by detector 30.
- the present invention operates at high conversion efficiencies of approximately 100% with organic (or in a broader sense polyatomic) ions.
- the positive ions in the ion beam are directed toward the multiplier 30 through the aperture 32 by the surface or plate 33 which is maintained at a relatively negative potential of -3,000 volts.
- Plate means 33 is in essence the first stage of the multiplier 30.
- the positive ions hitting plate 33 (which may be of, for example, copper-beryllium) produces electrons as indicated which are sensed by multiplier 30.
- the electrons are produced by the well-known mode of secondary electron emission. And moreover, in accordance with this mode the number of electrons produced are proportional to the abundance of positive ions impacting or hitting plate means 33.
- the output signal is proportional to the input of positive and negative ions.
- the output signal can be time multiplexed to produce a signal sequentially proportional to positive and then negative ions.
- the quadrupole mass analyzer can be sequenced by a controller unit to alternately transmit positive and negative ions at a frequency, for example, of 1 kHz.
- the 1 kHz sequencing of the quadrupole can be applied to time multiplex the output signal of multiplier 30.
- Such frequency is not critical and may range from typically 1 Hz to 100 kHz.
- multiplier 30 is shown as a continuous unit this could be in the form of several discrete stages; for example, 15 stages where the sixteenth stage would be unit 33. This is known as a box and grid type multiplier. Moreover although a plate means 33 is illustrated in FIG. 5 it is apparent that this is merely for spatial considerations and with other geometries a unit such as this could be eliminated with the positive ions directly proceeding into a common detector unit 30.
Abstract
.[.A negative ion detector converts negative ions to positive ions by means of a conversion anode which is maintained at a relatively high positive voltage. The resultant positive ions are detected by a standard continuous dynode electron multiplier which has its detection signal output at ground potential..]. .Iadd.Apparatus for detecting the abundance of negative ions from a source of negative ions, having a first conversion dynode and an electron multiplier, the electron multiplier having a second conversion dynode. The first conversion dynode is operated at a high positive potential to attract the negative ions whereby the negative ions impact the first conversion dynode with a substantial portion of the negative ions being converted to secondary positive ions. The second conversion dynode is operated at a potential which is less positive than the positive potential on the first conversion dynode to attract the secondary positive ions and to cause the secondary positive ions to be converted to electrons which are multiplied in the electron multiplier to provide an output signal indicative of the abundance of negative ions emanating from the source. .Iaddend.
Description
This application is a continuation of my copending application Ser. No. 897,150, filed Apr. 18, 1978, entitled "Apparatus for Detecting Negative Ions", now abandoned, which was a continuation-in-part of application Ser. No. 790,148, filed Apr. 22, 1977, entitled "Apparatus for Detecting Negative Ions", now abandoned.
The present invention is directed to apparatus for detecting negative ions and more particularly to apparatus where the negative ions are produced by a quadrupole mass spectrometer.
In mass spectrometers and other devices which generate ions, both positive and negative ions are produced. With the new high pressure ionization techniques positive and negative ions are produced in abundance. The chemical composition of the compound under investigation ultimately determines the relative intensity of positive and negative ions. Thus it is analytically useful to detect both polarities of ions.
To detect positive ions a standard continuous dynode electron multiplier (CDEM) is shown in FIG. 1A which is available under the trademark GALILEO as model 4770. The cathode has a voltage of -1 kv to -3 kv impressed upon it. This high voltage accelerates the positive ions into its first stage. The anode end is grounded and the detection signal is obtained at ground potential.
FIG. 1B illustrates a typical negative ion detector of the same configuration as FIG. 1A except that the cathode is operated at approximately +2 kv voltage to attract the negative ions. The output signal at the anode is floated at a relatively high positive voltage from +3 kv to +5 kv.
While the positive ion detector configuration of FIG. 1A is satisfactory the negative ion detector as illustrated in FIG. 1B has several disadvantages:
1. The anode portion where the signal is detected is at a high potential relative to ground requiring an off grounded preamplifier and complex preamplifier circuitry.
2. Since the negative ion detector as shown in FIG. 1B is necessarily a floating system it will be sensitive to stray electrons in the system. Also background noise will be high.
3. Since the output signal lead is at a relatively high positive potential microphonic noise will be severe.
On the other hand, since the positive ion detector of FIG. 1A has its signal output at ground potential it does not suffer these disadvantages and therefore is satisfactory.
It is, therefore, a general object of this invention to provide an improved negative ion detector.
In accordance with the above object there is provided apparatus for detecting negative ions from a source of negative ions. Conversion means are provided for receiving the negative ions and producing a proportional amount of positive ions. The resultant positive ions are then detected.
FIGS. 1A and 1B are simplified diagrams of typical prior art ion CDEM detectors;
FIG. 2 is a block diagram of a mass spectrometer system embodying the present invention;
FIG. 3 is a cut away perspective view of the detector portion of FIG. 2;
FIG. 4 is a conceptual diagram of FIG. 3; and
FIG. 5 is an alternative embodiment in conceptual form similar to FIG. 4.
FIG. 2 illustrates a typical system in which the negative ion detector of the present invention is used. An ionizing region 11 produces negative ions and other particles including electrons, positive ions, and neutrals which are analyzed in the mass analyzer 12 which may be of the quadrupole filter type. A detector 13 senses the desired particle to indicate its abundance or amount.
In accordance with the invention the configuration of detector 13 is illustrated in FIG. 3 and is suitable for detecting negative ions. A gridded aperture screen 14 receives negative ions from mass analyzer 12 which bombard a conversion unit or anode 16 which converts the negative ions to positive ions. This conversion anode may be constructed entirely of any one of the metals Al, Cu, Ag, Cr, Be, and stainless steel and in addition oxides of these metals. In the preferred embodiment anode 16 is oxidized copper in the form of a cube with two adjacent sides open. Alternatively a tilted flat surface or venetian blind could be used. Such unit forms an effective reflector for receiving the negative ions through aperture screen 14 and directing the resultant positive ions to a continuous dynode electron multiplier 20. Multiplier 20 is identical to FIG. 1A and includes a horn portion 21 with an incoming aperture screen 22 attached. Screen 22 prevents the escape of secondary electrons from the horn portion.
FIG. 4 shows FIG. 3 in conceptual form where a negative ion enters through aperture screen 14 and impacts conversion anode 16 to produce a proportional amount of positive ions the amount being dependent on ion structure such as mass or other characteristics. The positive ions are then detected by electron multiplier 20. From a theoretical point of view the conversion of negative ions to positive ions is accomplished by impacting the primary negative ions onto or accelerating them towards the surface of the conversion anode 16. Stray electrons impacting on the anode surface do not produce positive ions and are not detected.
Three major mechanisms are believed to be responsible singly or in combination for this negative ion to positive ion conversion process.
1. Sputtering
Metal atoms or absorbed molecules are vaporized off the surface of the conversion anode by the energetic bombarding negative ions. A fraction of these vaporized atoms lose electrons to become positive ions which will subsequently be collected by the positive ion electron multiplier.
2. Fragmentation of the Negative Ions
When the high energy (˜3 kv) primary negative ions bombard the metal surface, they may undergo extensive fragmentation. These fragments consist of neutral species, positive ions, and negative ions. Only the position ion fragments will be collected at the positive ion electron multiplier and produce an output signal.
3. Charge Stripping
When the negative ions are accelerated toward or impact the conversion anodes they may lose two electrons to become a positive ion of the same elemental composition.
Thus an improved negative ion detector is provided.
The present invention is also adaptable to detect positive and negative ions simultaneously. One system to accomplish this is described in U.S. Pat. No. 4,066,894 entitled "Positive and Negative Ion Recording System For Mass Spectrometer" with Donald F. Hunt and the present inventor as coinventors. That patent discloses two continuous dynode electron multipliers (CDEM); one for positive ions and one for negative ions. In accordance with the invention FIG. 5 illustrates apparatus for substantially concurrently detecting negative and positive ions from the output of the mass analyzer 12 (FIG. 2) using a common CDEM 30. Such multiplier is similar to that showon in FIG. 4 in that its cathode is at a relatively negative voltage of, for example, 2,000 volts and its anode is grounded. Thus, the signal output is taken at ground or is referenced to ground potential. The advantages of such grounded signal are, of course, explained above. Thus the CDEM 30 is suitable for determining the abundance of positive ions.
As indicated in FIG. 5 and also corresponding to FIG. 4, negative ions from the ion beam which are of necessarily low energy (for example, less than 100 electron volts since they are produced by a quadrupole type mass analyzer) are attracted through an aperture 31 by a conversion unit 16'. This unit is similar to unit 16 in FIG. 4 and is maintained at a +3,000 volts for example. As described above, the conversion unit in response to the bombardment of negative ions produces a proportional amount of positive ions which are sensed by detector 30.
In addition to the facility of processing low level ions the present invention operates at high conversion efficiencies of approximately 100% with organic (or in a broader sense polyatomic) ions.
The positive ions in the ion beam are directed toward the multiplier 30 through the aperture 32 by the surface or plate 33 which is maintained at a relatively negative potential of -3,000 volts. Plate means 33 is in essence the first stage of the multiplier 30. In accordance with well-known theory, the positive ions hitting plate 33 (which may be of, for example, copper-beryllium) produces electrons as indicated which are sensed by multiplier 30. The electrons, of course, are produced by the well-known mode of secondary electron emission. And moreover, in accordance with this mode the number of electrons produced are proportional to the abundance of positive ions impacting or hitting plate means 33. Thus the output signal is proportional to the input of positive and negative ions.
From a practical standpoint although the positive and negative ions of the ion beam are present substantially concurrently, the output signal can be time multiplexed to produce a signal sequentially proportional to positive and then negative ions. As disclosed in the above Hunt-Stafford patent the quadrupole mass analyzer can be sequenced by a controller unit to alternately transmit positive and negative ions at a frequency, for example, of 1 kHz. Thus, the 1 kHz sequencing of the quadrupole can be applied to time multiplex the output signal of multiplier 30. Such frequency is not critical and may range from typically 1 Hz to 100 kHz.
Although multiplier 30 is shown as a continuous unit this could be in the form of several discrete stages; for example, 15 stages where the sixteenth stage would be unit 33. This is known as a box and grid type multiplier. Moreover although a plate means 33 is illustrated in FIG. 5 it is apparent that this is merely for spatial considerations and with other geometries a unit such as this could be eliminated with the positive ions directly proceeding into a common detector unit 30.
Thus, an improved system for detecting negative and positive ions either sequentially or simultaneously has been provided.
Claims (8)
1. Apparatus for detecting the abundance of negative ions from a source of such ions comprising: conversion means maintained at a high positive voltage for attracting and accelerating only said negative ions whereby the negative ions impact the conversion means with sufficient kinetic energy to produce a proportional amount of secondary positive ions, and electron multiplier means having an input operated at a negative potential to attract said secondary positive ions and for providing an output signal indicative of the abundance of said negative ions.
2. Apparatus as in claim 1 wherein said .Iadd.high .Iaddend.positive voltage is in the order of magnitude of 2000 volts.
3. Apparatus as in claim 1 where said output signal is referenced to ground potential.
4. In a mass spectrometer of the type in which both positive and negative ions are produced, mass analyzed and applied to detection means to provide output detection signals indicative of the composition of a chemical compound, the improvement comprising a .[.signal.]. .Iadd.single .Iaddend.electron multiplier means including a first stage operated at .Iadd.a .Iaddend.negative potential to attract positive ions and provide an output signal indicative of the abundance of said positive ions and .Iadd.conversion dynode .Iaddend.means for receiving the negative ions and converting them to secondary positive ions and whereby said secondary positive ions are attracted to said electron multiplier means to provide an output signal indicative of the abundance of said negative ions whereby a single .[.detection.]. .Iadd.electron multiplier .Iaddend.means serves to provide output signals indicative of the abundance of negative or positive ions.
5. A mass spectrometer as in claim 4 wherein said electron multiplier means provides output signals referenced to ground potential.
6. A mass spectrometer system comprising: an ionizing region where a chemical composition to be analyzed is ionized to form positive and negative ions, a mass analyzer disposed to receive and analyze at least said negative ions; .Iadd.conversion dynode .Iaddend.means for converting said negative ions from said analyzer to secondary positive ions, and electron multiplier means having an input operated at a negative potential to attract said secondary positive ions from said conversion means and provide an output signal with respect to ground potential indicative of the abundance of said negative ions.
7. Apparatus as in claim 6 where said negative ions are polyatomic and said amount of secondary positive ions for polyatomic ions is substantially 100% of said negative ions. .Iadd.8. Apparatus for detecting the abundance of negative ions from a source of such ions comprising: conversion dynode means maintained at a high positive voltage for attracting and accelerating only said negative ions whereby the negative ions impact the conversion dynode means with sufficient kinetic energy to produce a substantially proportional amount of secondary positive ions, and electron multiplier means having an input operated at a potential to attract said secondary positive ions and for providing an output signal indicative of the abundance of said negative ions. .Iaddend. .Iadd.9. Apparatus as in claim 8 wherein said high positive voltage is in the order of magnitude of 3000 volts. .Iaddend. .Iadd.10. Apparatus as in claim 8 where said output signal is referenced to ground potential. .Iaddend. .Iadd.11. In a mass spectrometer of the type in which both positive and negative ions are produced, mass analyzed and applied to detection means to provide output detection signals indicative of the composition of a chemical compound, the improvement comprising a single electron multiplier means including a first stage operated at a potential to attract positive ions and provide an output signal indicative of the abundance of said positive ions and conversion dynode means operated at a positive potential substantially more positive than the potential on the first stage of the electron multiplier means for receiving the negative ions and converting them to secondary positive ions and whereby said secondary positive ions are attracted to said electron multiplier means to provide an output signal indicative of the abundance of said negative ions whereby said single electron multiplier means serves to provide output signals indicative of the abundance of negative and positive ions. .Iaddend. .Iadd.12. A mass spectrometer as in claim 11 wherein said electron multiplier means provides output signals referenced to ground potential. .Iaddend. .Iadd.13. A mass spectrometer system comprising: an ionizing region where a chemical composition to be analyzed is ionized to form positive and negative ions, a mass analyzer disposed to receive and analyze at least said negative ions; conversion dynode means operated at a high positive potential for converting said negative ions from said analyzer to secondary positive ions, and electron multiplier means having an input operated at a potential which is less positive than the potential on said conversion dynode means to attract said secondary positive ions from said conversion dynode means and provide an output signal with respect to ground potential indicative of the abundance of said negative ions. .Iaddend. .Iadd.14. Apparatus as in claim 13 where said negative ions are polyatomic and said amount of secondary positive ions for polyatomic ions is a high proportion of said negative ions. .Iaddend. .Iadd.15. In an apparatus for detecting the abundance of negative ions from a source of negative ions, a first conversion dynode operated at a high positive potential for attracting the negative ions from said source of negative ions and causing a substantial portion of the negative ions impacting said first conversion dynode to be converted into secondary positive ions, electron multiplier means including a second conversion dynode operated at a potential which is less positive than the potential on the first conversion dynode for attracting the secondary positive ions created at said first conversion dynode and converting the secondary positive ions to electrons, said electron multiplier means multiplying the electrons emitted from the second conversion dynode to provide an output signal indicative of the abundance of negative ions emanating from the source. .Iaddend. .Iadd.16. Apparatus as in claim 15 together with means for causing said output signal to be referenced to ground potential. .Iaddend. .Iadd.17. Apparatus as in claim 15 wherein said second conversion dynode is operated at a potential which is negative with respect to ground potential. .Iaddend. .Iadd.18. Apparatus as in claim 15 wherein said electron multiplier means is a continuous dynode electron multiplier. .Iaddend. .Iadd.19. Apparatus as in claim 15 wherein said electron multiplier means is comprised of a multiplicity of discrete dynode stages. .Iaddend. .Iadd.20. In a method for detecting the abundance of negative ions from a source of negative ions, attracting the negative ions with a high positive potential converting a substantial portion of the negative ions to secondary positive ions, attracting the secondary positive ions and converting the secondary positive ions to electrons, and multiplying the electrons to provide an output signal indicative of the abundance of negative ions emanating from said source. .Iaddend. .Iadd.21. A method as in claim 20 wherein in the output signal is referenced to ground
potential. .Iaddend. .Iadd.22. A method as in claim 20 wherein the second conversion dynode is operated at a potential which is negative with respect to ground potential. .Iaddend.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/813,880 USRE33344E (en) | 1977-04-22 | 1985-12-24 | Apparatus and method for detecting negative ions |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US79014877A | 1977-04-22 | 1977-04-22 | |
| US06/059,961 US4423324A (en) | 1977-04-22 | 1979-07-23 | Apparatus for detecting negative ions |
| US06/813,880 USRE33344E (en) | 1977-04-22 | 1985-12-24 | Apparatus and method for detecting negative ions |
Related Parent Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US05/897,150 Continuation US4286128A (en) | 1977-04-29 | 1978-04-17 | Electric gas-switch |
| US06/059,961 Reissue US4423324A (en) | 1977-04-22 | 1979-07-23 | Apparatus for detecting negative ions |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USRE33344E true USRE33344E (en) | 1990-09-18 |
Family
ID=27369774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US06/813,880 Expired - Lifetime USRE33344E (en) | 1977-04-22 | 1985-12-24 | Apparatus and method for detecting negative ions |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USRE33344E (en) |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5105081A (en) * | 1991-02-28 | 1992-04-14 | Teledyne Cme | Mass spectrometry method and apparatus employing in-trap ion detection |
| US5202561A (en) * | 1990-06-13 | 1993-04-13 | Finnigan Gmbh | Device and method for analyzing ions of high mass |
| US5272337A (en) * | 1992-04-08 | 1993-12-21 | Martin Marietta Energy Systems, Inc. | Sample introducing apparatus and sample modules for mass spectrometer |
| US5464975A (en) * | 1993-12-14 | 1995-11-07 | Massively Parallel Instruments | Method and apparatus for charged particle collection, conversion, fragmentation or detection |
| US5665966A (en) * | 1995-09-29 | 1997-09-09 | Lockheed Martin Idaho Technologies Company | Current measuring system |
| US5773822A (en) * | 1995-11-30 | 1998-06-30 | Jeol Ltd. | Ion detector and high-voltage power supply |
| US20050029443A1 (en) * | 1999-07-21 | 2005-02-10 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry |
| US7075068B2 (en) | 1999-07-21 | 2006-07-11 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray augmented high field asymmetric ion mobility spectrometry |
| US20080121794A1 (en) * | 2002-02-21 | 2008-05-29 | Sionex Corporation | Systems and methods for ion mobility control |
| US20090294654A1 (en) * | 2008-05-30 | 2009-12-03 | Urs Steiner | Detection of positive and negative ions |
| US7714284B2 (en) | 2001-06-30 | 2010-05-11 | Sionex Corporation | Methods and apparatus for enhanced sample identification based on combined analytical techniques |
| US8217344B2 (en) | 2007-02-01 | 2012-07-10 | Dh Technologies Development Pte. Ltd. | Differential mobility spectrometer pre-filter assembly for a mass spectrometer |
| US8378293B1 (en) * | 2011-09-09 | 2013-02-19 | Agilent Technologies, Inc. | In-situ conditioning in mass spectrometer systems |
| US10580632B2 (en) | 2017-12-18 | 2020-03-03 | Agilent Technologies, Inc. | In-situ conditioning in mass spectrometry systems |
| US11410838B2 (en) | 2020-09-03 | 2022-08-09 | Thermo Finnigan Llc | Long life electron multiplier |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2213140A (en) * | 1938-02-12 | 1940-08-27 | Ig Farbenindustrie Ag | Device for generating a beam of ions of high velocity |
| US2816243A (en) * | 1956-04-09 | 1957-12-10 | High Voltage Engineering Corp | Negative ion source |
| US3136908A (en) * | 1960-07-28 | 1964-06-09 | Weinman James Adolf | Plurally charged ion beam generation method |
| US3573454A (en) * | 1968-04-22 | 1971-04-06 | Applied Res Lab | Method and apparatus for ion bombardment using negative ions |
| US3660655A (en) * | 1969-09-08 | 1972-05-02 | Ass Elect Ind | Ion probe with means for mass analyzing neutral particles sputtered from a specimen |
| US3730696A (en) * | 1967-12-05 | 1973-05-01 | Co Saint Gobain | Method and apparatus for gas phase ion interchange in solids |
| US3774028A (en) * | 1970-06-09 | 1973-11-20 | Atomic Energy Authority Uk | Ion beam intensity measuring apparatus |
| US3786359A (en) * | 1969-03-28 | 1974-01-15 | Alpha Ind Inc | Ion accelerator and ion species selector |
| US3898456A (en) * | 1974-07-25 | 1975-08-05 | Us Energy | Electron multiplier-ion detector system |
| US4037100A (en) * | 1976-03-01 | 1977-07-19 | General Ionex Corporation | Ultra-sensitive spectrometer for making mass and elemental analyses |
| US4066894A (en) * | 1976-01-20 | 1978-01-03 | University Of Virginia | Positive and negative ion recording system for mass spectrometer |
| US4093855A (en) * | 1974-04-29 | 1978-06-06 | Extranuclear Laboratories, Inc. | Detector for heavy ions following mass analysis |
| US4267448A (en) * | 1978-06-12 | 1981-05-12 | Varian Mat Gmbh | Ion detector with bipolar accelerating electrode |
-
1985
- 1985-12-24 US US06/813,880 patent/USRE33344E/en not_active Expired - Lifetime
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2213140A (en) * | 1938-02-12 | 1940-08-27 | Ig Farbenindustrie Ag | Device for generating a beam of ions of high velocity |
| US2816243A (en) * | 1956-04-09 | 1957-12-10 | High Voltage Engineering Corp | Negative ion source |
| US3136908A (en) * | 1960-07-28 | 1964-06-09 | Weinman James Adolf | Plurally charged ion beam generation method |
| US3730696A (en) * | 1967-12-05 | 1973-05-01 | Co Saint Gobain | Method and apparatus for gas phase ion interchange in solids |
| US3573454A (en) * | 1968-04-22 | 1971-04-06 | Applied Res Lab | Method and apparatus for ion bombardment using negative ions |
| US3786359A (en) * | 1969-03-28 | 1974-01-15 | Alpha Ind Inc | Ion accelerator and ion species selector |
| US3660655A (en) * | 1969-09-08 | 1972-05-02 | Ass Elect Ind | Ion probe with means for mass analyzing neutral particles sputtered from a specimen |
| US3774028A (en) * | 1970-06-09 | 1973-11-20 | Atomic Energy Authority Uk | Ion beam intensity measuring apparatus |
| US4093855A (en) * | 1974-04-29 | 1978-06-06 | Extranuclear Laboratories, Inc. | Detector for heavy ions following mass analysis |
| US3898456A (en) * | 1974-07-25 | 1975-08-05 | Us Energy | Electron multiplier-ion detector system |
| US4066894A (en) * | 1976-01-20 | 1978-01-03 | University Of Virginia | Positive and negative ion recording system for mass spectrometer |
| US4037100A (en) * | 1976-03-01 | 1977-07-19 | General Ionex Corporation | Ultra-sensitive spectrometer for making mass and elemental analyses |
| US4267448A (en) * | 1978-06-12 | 1981-05-12 | Varian Mat Gmbh | Ion detector with bipolar accelerating electrode |
| US4267448B1 (en) * | 1978-06-12 | 1985-09-24 |
Non-Patent Citations (28)
| Title |
|---|
| Andersen et al., Science, Feb. 1972, pp. 853 860. * |
| Andersen et al., Science, Feb. 1972, pp. 853-860. |
| Andersen, J. Mass Spectrometry and Ion Physics, vol. 2 (1969), pp. 61 74. * |
| Andersen, J. Mass Spectrometry and Ion Physics, vol. 2 (1969), pp. 61-74. |
| Andersen, J. Mass Spectrometry and Ion Physics, vol. 3 (1970), pp. 413 428. * |
| Andersen, J. Mass Spectrometry and Ion Physics, vol. 3 (1970), pp. 413-428. |
| Andersen, Microprobe Analysis, pp. 531 553. * |
| Andersen, Microprobe Analysis, pp. 531-553. |
| Baumgartner et al., J. Physics E: Scientific Instruments, vol. 9, 1976, pp. 321 329. * |
| Baumgartner et al., J. Physics E: Scientific Instruments, vol. 9, 1976, pp. 321-329. |
| Benninghoven et al., Physics Letters, vol. 40A, No. 2, Jul. 2, 1972, pp. 169 170. * |
| Benninghoven et al., Physics Letters, vol. 40A, No. 2, Jul. 2, 1972, pp. 169-170. |
| Bradley, Jour. Applied Physics, vol. 30, No. 1, Jan. 1959, pp. 1 8. * |
| Bradley, Jour. Applied Physics, vol. 30, No. 1, Jan. 1959, pp. 1-8. |
| Gibbs et al., Review of Scientific Instruments, vol. 37, No. 10, Oct. 1966, pp. 1385 1390. * |
| Gibbs et al., Review of Scientific Instruments, vol. 37, No. 10, Oct. 1966, pp. 1385-1390. |
| Goodings et al., Int. J. Mass Spectrometers and Ion Physics, vol. 9, 1972, pp. 417 420. * |
| Goodings et al., Int. J. Mass Spectrometers and Ion Physics, vol. 9, 1972, pp. 417-420. |
| La Lau, Advances in Analytic Chemistry and Instrumentation, vol. 8, 1970, pp. 93 120. * |
| La Lau, Advances in Analytic Chemistry and Instrumentation, vol. 8, 1970, pp. 93-120. |
| Large Aperture Detector by Gibbs & Cummins Rev. Sci. Inst. vol. 37, No. 10, Oct. 1966, pp. 1385 1390. * |
| Large Aperture Detector by Gibbs & Cummins Rev. Sci. Inst. vol. 37, No. 10, Oct. 1966, pp. 1385-1390. |
| Larsen et al., Int. J. Mass Spectrometry and Ion Physics, vol. 11, pp. 149 155 (1973). * |
| Larsen et al., Int. J. Mass Spectrometry and Ion Physics, vol. 11, pp. 149-155 (1973). |
| Ridley, Nuclear Instruments and Methods, vol. 14, 1961, pp. 231 236. * |
| Ridley, Nuclear Instruments and Methods, vol. 14, 1961, pp. 231-236. |
| Secondary Positive Ion . . . by Bradley Jour. Applied Physics vol. 30, No. 1, Jan. 1959, pp. 1 8. * |
| Secondary Positive Ion . . . by Bradley Jour. Applied Physics vol. 30, No. 1, Jan. 1959, pp. 1-8. |
Cited By (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5202561A (en) * | 1990-06-13 | 1993-04-13 | Finnigan Gmbh | Device and method for analyzing ions of high mass |
| US5105081A (en) * | 1991-02-28 | 1992-04-14 | Teledyne Cme | Mass spectrometry method and apparatus employing in-trap ion detection |
| WO1992015391A1 (en) * | 1991-02-28 | 1992-09-17 | Teledyne Mec | Mass spectrometry method and apparatus employing in-trap ion detection |
| US5272337A (en) * | 1992-04-08 | 1993-12-21 | Martin Marietta Energy Systems, Inc. | Sample introducing apparatus and sample modules for mass spectrometer |
| US5464975A (en) * | 1993-12-14 | 1995-11-07 | Massively Parallel Instruments | Method and apparatus for charged particle collection, conversion, fragmentation or detection |
| US5665966A (en) * | 1995-09-29 | 1997-09-09 | Lockheed Martin Idaho Technologies Company | Current measuring system |
| US5773822A (en) * | 1995-11-30 | 1998-06-30 | Jeol Ltd. | Ion detector and high-voltage power supply |
| US20050029443A1 (en) * | 1999-07-21 | 2005-02-10 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry |
| US20050263699A1 (en) * | 1999-07-21 | 2005-12-01 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray augmented high field asymmetric ion mobility spectrometry |
| US7075068B2 (en) | 1999-07-21 | 2006-07-11 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray augmented high field asymmetric ion mobility spectrometry |
| US7176453B2 (en) | 1999-07-21 | 2007-02-13 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry |
| US7365316B2 (en) | 1999-07-21 | 2008-04-29 | The Charles Stark Draper Laboratory | Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry |
| US20080128612A1 (en) * | 1999-07-21 | 2008-06-05 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for chromatography high field asymmetric waveform ion mobility spectrometry |
| US7462825B2 (en) | 1999-07-21 | 2008-12-09 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry |
| US7714284B2 (en) | 2001-06-30 | 2010-05-11 | Sionex Corporation | Methods and apparatus for enhanced sample identification based on combined analytical techniques |
| US20080121794A1 (en) * | 2002-02-21 | 2008-05-29 | Sionex Corporation | Systems and methods for ion mobility control |
| US7598489B2 (en) | 2002-02-21 | 2009-10-06 | Sionex Corporation | Systems and methods for ion mobility control |
| US8217344B2 (en) | 2007-02-01 | 2012-07-10 | Dh Technologies Development Pte. Ltd. | Differential mobility spectrometer pre-filter assembly for a mass spectrometer |
| US20090294654A1 (en) * | 2008-05-30 | 2009-12-03 | Urs Steiner | Detection of positive and negative ions |
| US7855361B2 (en) * | 2008-05-30 | 2010-12-21 | Varian, Inc. | Detection of positive and negative ions |
| US8378293B1 (en) * | 2011-09-09 | 2013-02-19 | Agilent Technologies, Inc. | In-situ conditioning in mass spectrometer systems |
| US8513593B2 (en) * | 2011-09-09 | 2013-08-20 | Agilent Technologies, Inc. | In-situ conditioning in mass spectrometer systems |
| US10580632B2 (en) | 2017-12-18 | 2020-03-03 | Agilent Technologies, Inc. | In-situ conditioning in mass spectrometry systems |
| US11410838B2 (en) | 2020-09-03 | 2022-08-09 | Thermo Finnigan Llc | Long life electron multiplier |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4423324A (en) | Apparatus for detecting negative ions | |
| USRE33344E (en) | Apparatus and method for detecting negative ions | |
| US6229142B1 (en) | Time of flight mass spectrometer and detector therefor | |
| Katakuse et al. | Correlation between mass distributions of zinc, cadmium clusters and electronic shell structure | |
| US6051831A (en) | High-mass detector with high mass-resolution for time-of-flight mass spectrometers | |
| EP1636819B1 (en) | Particle detector suitable for detecting ions and electrons | |
| SE8700017L (en) | JONPLASMAELEKTROKANON | |
| Stafford | Instrumental aspects of positive and negative ion chemical ionization mass spectrometry. | |
| US5898173A (en) | High resolution ion detection for linear time-of-flight mass spectrometers | |
| US6614019B2 (en) | Mass spectrometry detector | |
| US4107526A (en) | Ion scattering spectrometer with modified bias | |
| GB1576915A (en) | Apparatus for detecting negative ions | |
| US5481108A (en) | Method for ion detection and mass spectrometry and apparatus thereof | |
| US5784424A (en) | System for studying a sample of material using a heavy ion induced mass spectrometer source | |
| JPS587229B2 (en) | Device that detects negative ions | |
| Gersch et al. | Postionization of sputtered neutrals by a focused electron beam | |
| US20030127582A1 (en) | Method for enhancing photomultiplier tube speed | |
| JPH0475622B2 (en) | ||
| SU801141A1 (en) | Quadrupole three-dimensional mass spectrometer and method of manufacturing same | |
| Chakraborty et al. | Apparatus for the study of secondary ions from solid surfaces under ion bombardment | |
| Daolio et al. | Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions | |
| Yang et al. | Analytical performance of a microsecond-pulse glow discharge time of flight mass spectrometer | |
| Ishitani et al. | Surface Analyzer Combining Secondary Ion Mass Spectrometry and Ion Scattering Spectrometry | |
| JPH10116583A (en) | Ion mass spectrometer | |
| JPH0330249A (en) | Ion detector |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AS | Assignment |
Owner name: THERMO FINNIGAN LLC, CALIFORNIA Free format text: CHANGE OF NAME;ASSIGNOR:FINNIGAN CORPORATION;REEL/FRAME:011898/0886 Effective date: 20001025 |