USRE36560E - Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station - Google Patents
Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station Download PDFInfo
- Publication number
- USRE36560E USRE36560E US08/079,504 US7950493A USRE36560E US RE36560 E USRE36560 E US RE36560E US 7950493 A US7950493 A US 7950493A US RE36560 E USRE36560 E US RE36560E
- Authority
- US
- United States
- Prior art keywords
- light
- lens
- detector
- signal
- light signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (25)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/079,504 USRE36560E (en) | 1988-01-29 | 1993-06-17 | Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/150,135 US5024529A (en) | 1988-01-29 | 1988-01-29 | Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
US08/079,504 USRE36560E (en) | 1988-01-29 | 1993-06-17 | Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US07/150,135 Reissue US5024529A (en) | 1988-01-29 | 1988-01-29 | Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
Publications (1)
Publication Number | Publication Date |
---|---|
USRE36560E true USRE36560E (en) | 2000-02-08 |
Family
ID=22533252
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US07/150,135 Ceased US5024529A (en) | 1988-01-29 | 1988-01-29 | Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
US08/079,504 Expired - Lifetime USRE36560E (en) | 1988-01-29 | 1993-06-17 | Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US07/150,135 Ceased US5024529A (en) | 1988-01-29 | 1988-01-29 | Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
Country Status (8)
Country | Link |
---|---|
US (2) | US5024529A (en) |
EP (1) | EP0397672B1 (en) |
JP (1) | JPH03500332A (en) |
BR (1) | BR8807464A (en) |
CA (1) | CA1287486C (en) |
DE (1) | DE3852890T2 (en) |
ES (1) | ES2012221A6 (en) |
WO (1) | WO1989007238A1 (en) |
Cited By (15)
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US6441973B1 (en) * | 1996-08-16 | 2002-08-27 | Imaging Research, Inc. | Digital imaging system for assays in well plates, gels and blots |
US6483345B1 (en) * | 1999-06-23 | 2002-11-19 | Nortel Networks Limited | High speed level shift circuit for low voltage output |
US6501554B1 (en) | 2000-06-20 | 2002-12-31 | Ppt Vision, Inc. | 3D scanner and method for measuring heights and angles of manufactured parts |
US20030020905A1 (en) * | 2001-07-26 | 2003-01-30 | Orbotech Ltd. | Electrical circuit conductor inspection |
US6522777B1 (en) * | 1998-07-08 | 2003-02-18 | Ppt Vision, Inc. | Combined 3D- and 2D-scanning machine-vision system and method |
US6624899B1 (en) * | 2000-06-29 | 2003-09-23 | Schmitt Measurement Systems, Inc. | Triangulation displacement sensor |
US20030222143A1 (en) * | 2002-06-04 | 2003-12-04 | Mitchell Phillip V. | Precision laser scan head |
US6741363B1 (en) * | 1998-12-01 | 2004-05-25 | Steinbichler Optotechnik Gmbh | Method and an apparatus for the optical detection of a contrast line |
US20050029168A1 (en) * | 2003-08-01 | 2005-02-10 | Jones William J. | Currency processing device, method and system |
US6956963B2 (en) | 1998-07-08 | 2005-10-18 | Ismeca Europe Semiconductor Sa | Imaging for a machine-vision system |
US20050275893A1 (en) * | 2002-07-16 | 2005-12-15 | Stanley Korn | Method of using printed forms to transmit the information necessary to create electronic forms |
US7142301B2 (en) | 1999-07-08 | 2006-11-28 | Ppt Vision | Method and apparatus for adjusting illumination angle |
US7353954B1 (en) | 1998-07-08 | 2008-04-08 | Charles A. Lemaire | Tray flipper and method for parts inspection |
US20100270277A1 (en) * | 2007-11-14 | 2010-10-28 | Hamamatsu Photonics K.K. | Laser machining device and laser machining method |
US8314938B2 (en) * | 2010-07-30 | 2012-11-20 | Canon Kabushiki Kaisha | Method and apparatus for measuring surface profile of an object |
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US5179287A (en) * | 1990-07-06 | 1993-01-12 | Omron Corporation | Displacement sensor and positioner |
NL9002869A (en) * | 1990-12-27 | 1992-07-16 | Philips Nv | DEVICE FOR OPTICALLY MEASURING THE HEIGHT OF A SURFACE. |
US5309222A (en) * | 1991-07-16 | 1994-05-03 | Mitsubishi Denki Kabushiki Kaisha | Surface undulation inspection apparatus |
US5237167A (en) * | 1991-12-18 | 1993-08-17 | Eastman Kodak Company | Autofocussing system having anamorphic optics |
JP2943499B2 (en) * | 1992-04-22 | 1999-08-30 | 日本電気株式会社 | Height measuring method and device |
US5412420A (en) * | 1992-10-26 | 1995-05-02 | Pheno Imaging, Inc. | Three-dimensional phenotypic measuring system for animals |
US5652658A (en) * | 1993-10-19 | 1997-07-29 | View Engineering, Inc. | Grid array inspection system and method |
US5668631A (en) | 1993-12-20 | 1997-09-16 | Minolta Co., Ltd. | Measuring system with improved method of reading image data of an object |
US6407817B1 (en) | 1993-12-20 | 2002-06-18 | Minolta Co., Ltd. | Measuring system with improved method of reading image data of an object |
US5742389A (en) * | 1994-03-18 | 1998-04-21 | Lucid Technologies Inc. | Spectrophotometer and electro-optic module especially suitable for use therein |
US5684582A (en) * | 1994-03-18 | 1997-11-04 | Lucid Technologies, Inc. | Spectrophotometry |
US5654799A (en) * | 1995-05-05 | 1997-08-05 | Measurex Corporation | Method and apparatus for measuring and controlling the surface characteristics of sheet materials such as paper |
FR2735859B1 (en) * | 1995-06-23 | 1997-09-05 | Kreon Ind | PROCESS FOR ACQUISITION AND DIGITIZATION OF OBJECTS THROUGH A TRANSPARENT WALL AND SYSTEM FOR IMPLEMENTING SUCH A PROCESS |
US5666325A (en) * | 1995-07-31 | 1997-09-09 | Nordson Corporation | Method and apparatus for monitoring and controlling the dispensing of materials onto a substrate |
US20010041843A1 (en) * | 1999-02-02 | 2001-11-15 | Mark Modell | Spectral volume microprobe arrays |
US5644141A (en) * | 1995-10-12 | 1997-07-01 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Apparatus and method for high-speed characterization of surfaces |
US6141105A (en) * | 1995-11-17 | 2000-10-31 | Minolta Co., Ltd. | Three-dimensional measuring device and three-dimensional measuring method |
US6028671A (en) * | 1996-01-31 | 2000-02-22 | General Scanning, Inc. | Method and system for suppressing unwanted reflections in an optical system |
US6049385A (en) * | 1996-06-05 | 2000-04-11 | Minolta Co., Ltd. | Three dimensional measurement system and pickup apparatus |
US5859924A (en) * | 1996-07-12 | 1999-01-12 | Robotic Vision Systems, Inc. | Method and system for measuring object features |
US5815272A (en) * | 1996-10-23 | 1998-09-29 | Harding; Kevin G. | Filter for laser gaging system |
JP3873401B2 (en) * | 1996-11-19 | 2007-01-24 | コニカミノルタセンシング株式会社 | 3D measurement system |
US6556783B1 (en) * | 1997-01-16 | 2003-04-29 | Janet L. Gelphman | Method and apparatus for three dimensional modeling of an object |
US6118540A (en) * | 1997-07-11 | 2000-09-12 | Semiconductor Technologies & Instruments, Inc. | Method and apparatus for inspecting a workpiece |
US5956134A (en) * | 1997-07-11 | 1999-09-21 | Semiconductor Technologies & Instruments, Inc. | Inspection system and method for leads of semiconductor devices |
US6134013A (en) * | 1997-09-15 | 2000-10-17 | Optimet, Optical Metrology Ltd. | Optical ball grid array inspection system |
US6072898A (en) | 1998-01-16 | 2000-06-06 | Beaty; Elwin M. | Method and apparatus for three dimensional inspection of electronic components |
US6098031A (en) * | 1998-03-05 | 2000-08-01 | Gsi Lumonics, Inc. | Versatile method and system for high speed, 3D imaging of microscopic targets |
US6366357B1 (en) | 1998-03-05 | 2002-04-02 | General Scanning, Inc. | Method and system for high speed measuring of microscopic targets |
US6233049B1 (en) * | 1998-03-25 | 2001-05-15 | Minolta Co., Ltd. | Three-dimensional measurement apparatus |
US6181472B1 (en) * | 1998-06-10 | 2001-01-30 | Robotic Vision Systems, Inc. | Method and system for imaging an object with a plurality of optical beams |
US6424422B1 (en) * | 1998-06-18 | 2002-07-23 | Minolta Co., Ltd. | Three-dimensional input device |
DE19849793C1 (en) * | 1998-10-28 | 2000-03-16 | Fraunhofer Ges Forschung | Detection of tire sidewall bulges or necking, electronically filtering-out noise from tread edges, uses flattened laser beam and imaging device with filtering and comparisons establishing only significant areas of distortion |
US6553138B2 (en) | 1998-12-30 | 2003-04-22 | New York University | Method and apparatus for generating three-dimensional representations of objects |
US7034272B1 (en) | 1999-10-05 | 2006-04-25 | Electro Scientific Industries, Inc. | Method and apparatus for evaluating integrated circuit packages having three dimensional features |
US8412377B2 (en) | 2000-01-24 | 2013-04-02 | Irobot Corporation | Obstacle following sensor scheme for a mobile robot |
US8788092B2 (en) | 2000-01-24 | 2014-07-22 | Irobot Corporation | Obstacle following sensor scheme for a mobile robot |
US6956348B2 (en) | 2004-01-28 | 2005-10-18 | Irobot Corporation | Debris sensor for cleaning apparatus |
DE10026830A1 (en) * | 2000-05-30 | 2001-12-06 | Zeiss Carl Jena Gmbh | Optical sensor for measuring the distance and / or the inclination of a surface |
EP1220596A1 (en) * | 2000-12-29 | 2002-07-03 | Icos Vision Systems N.V. | A method and an apparatus for measuring positions of contact elements of an electronic component |
US7571511B2 (en) | 2002-01-03 | 2009-08-11 | Irobot Corporation | Autonomous floor-cleaning robot |
US6690134B1 (en) | 2001-01-24 | 2004-02-10 | Irobot Corporation | Method and system for robot localization and confinement |
US8396592B2 (en) | 2001-06-12 | 2013-03-12 | Irobot Corporation | Method and system for multi-mode coverage for an autonomous robot |
US7429843B2 (en) | 2001-06-12 | 2008-09-30 | Irobot Corporation | Method and system for multi-mode coverage for an autonomous robot |
US9128486B2 (en) | 2002-01-24 | 2015-09-08 | Irobot Corporation | Navigational control system for a robotic device |
US6750974B2 (en) | 2002-04-02 | 2004-06-15 | Gsi Lumonics Corporation | Method and system for 3D imaging of target regions |
US8428778B2 (en) | 2002-09-13 | 2013-04-23 | Irobot Corporation | Navigational control system for a robotic device |
US8386081B2 (en) | 2002-09-13 | 2013-02-26 | Irobot Corporation | Navigational control system for a robotic device |
US7030383B2 (en) * | 2003-08-04 | 2006-04-18 | Cadent Ltd. | Speckle reduction method and apparatus |
US7332890B2 (en) | 2004-01-21 | 2008-02-19 | Irobot Corporation | Autonomous robot auto-docking and energy management systems and methods |
US7535071B2 (en) * | 2004-03-29 | 2009-05-19 | Evolution Robotics, Inc. | System and method of integrating optics into an IC package |
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US7706917B1 (en) | 2004-07-07 | 2010-04-27 | Irobot Corporation | Celestial navigation system for an autonomous robot |
US8972052B2 (en) | 2004-07-07 | 2015-03-03 | Irobot Corporation | Celestial navigation system for an autonomous vehicle |
US7620476B2 (en) | 2005-02-18 | 2009-11-17 | Irobot Corporation | Autonomous surface cleaning robot for dry cleaning |
US8392021B2 (en) | 2005-02-18 | 2013-03-05 | Irobot Corporation | Autonomous surface cleaning robot for wet cleaning |
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US8930023B2 (en) | 2009-11-06 | 2015-01-06 | Irobot Corporation | Localization by learning of wave-signal distributions |
US7345752B1 (en) * | 2005-06-22 | 2008-03-18 | Kla-Tencor Technologies Corp. | Multi-spot illumination and collection optics for highly tilted wafer planes |
US7385688B1 (en) | 2005-06-22 | 2008-06-10 | Kla-Tencor Technologies Corp. | Multi-spot illumination and collection optics for highly tilted wafer planes |
US7365862B2 (en) * | 2005-10-24 | 2008-04-29 | General Electric Company | Methods and apparatus for inspecting an object |
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US7483151B2 (en) * | 2006-03-17 | 2009-01-27 | Alpineon D.O.O. | Active 3D triangulation-based imaging method and device |
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US8087117B2 (en) | 2006-05-19 | 2012-01-03 | Irobot Corporation | Cleaning robot roller processing |
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Citations (11)
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US4299491A (en) * | 1979-12-11 | 1981-11-10 | United Technologies Corporation | Noncontact optical gauging system |
US4473750A (en) * | 1980-07-25 | 1984-09-25 | Hitachi, Ltd. | Three-dimensional shape measuring device |
JPS60117102A (en) * | 1983-11-30 | 1985-06-24 | Hitachi Ltd | Welding-seam profile-detecting apparatus |
US4534650A (en) * | 1981-04-27 | 1985-08-13 | Inria Institut National De Recherche En Informatique Et En Automatique | Device for the determination of the position of points on the surface of a body |
JPS61169822A (en) * | 1985-01-23 | 1986-07-31 | Hoya Corp | Orthogonal polarization type optical frequency shifter |
US4627734A (en) * | 1983-06-30 | 1986-12-09 | Canadian Patents And Development Limited | Three dimensional imaging method and device |
US4643578A (en) * | 1985-03-04 | 1987-02-17 | Robotic Vision Systems, Inc. | Arrangement for scanned 3-D measurement |
US4732485A (en) * | 1985-04-17 | 1988-03-22 | Olympus Optical Co., Ltd. | Optical surface profile measuring device |
US4758093A (en) * | 1986-07-11 | 1988-07-19 | Robotic Vision Systems, Inc. | Apparatus and method for 3-D measurement using holographic scanning |
US4796997A (en) * | 1986-05-27 | 1989-01-10 | Synthetic Vision Systems, Inc. | Method and system for high-speed, 3-D imaging of an object at a vision station |
US4798469A (en) * | 1985-10-02 | 1989-01-17 | Burke Victor B | Noncontact gage system utilizing reflected light |
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US4355904A (en) * | 1978-09-25 | 1982-10-26 | Balasubramanian N | Optical inspection device for measuring depthwise variations from a focal plane |
-
1988
- 1988-01-29 US US07/150,135 patent/US5024529A/en not_active Ceased
- 1988-11-14 BR BR888807464A patent/BR8807464A/en unknown
- 1988-11-14 EP EP89900111A patent/EP0397672B1/en not_active Expired - Lifetime
- 1988-11-14 WO PCT/US1988/004035 patent/WO1989007238A1/en active IP Right Grant
- 1988-11-14 DE DE3852890T patent/DE3852890T2/en not_active Expired - Fee Related
- 1988-11-14 JP JP1500204A patent/JPH03500332A/en active Granted
- 1988-12-06 CA CA000585053A patent/CA1287486C/en not_active Expired - Lifetime
-
1989
- 1989-01-12 ES ES8900100A patent/ES2012221A6/en not_active Expired - Fee Related
-
1993
- 1993-06-17 US US08/079,504 patent/USRE36560E/en not_active Expired - Lifetime
Patent Citations (11)
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US4299491A (en) * | 1979-12-11 | 1981-11-10 | United Technologies Corporation | Noncontact optical gauging system |
US4473750A (en) * | 1980-07-25 | 1984-09-25 | Hitachi, Ltd. | Three-dimensional shape measuring device |
US4534650A (en) * | 1981-04-27 | 1985-08-13 | Inria Institut National De Recherche En Informatique Et En Automatique | Device for the determination of the position of points on the surface of a body |
US4627734A (en) * | 1983-06-30 | 1986-12-09 | Canadian Patents And Development Limited | Three dimensional imaging method and device |
JPS60117102A (en) * | 1983-11-30 | 1985-06-24 | Hitachi Ltd | Welding-seam profile-detecting apparatus |
JPS61169822A (en) * | 1985-01-23 | 1986-07-31 | Hoya Corp | Orthogonal polarization type optical frequency shifter |
US4643578A (en) * | 1985-03-04 | 1987-02-17 | Robotic Vision Systems, Inc. | Arrangement for scanned 3-D measurement |
US4732485A (en) * | 1985-04-17 | 1988-03-22 | Olympus Optical Co., Ltd. | Optical surface profile measuring device |
US4798469A (en) * | 1985-10-02 | 1989-01-17 | Burke Victor B | Noncontact gage system utilizing reflected light |
US4796997A (en) * | 1986-05-27 | 1989-01-10 | Synthetic Vision Systems, Inc. | Method and system for high-speed, 3-D imaging of an object at a vision station |
US4758093A (en) * | 1986-07-11 | 1988-07-19 | Robotic Vision Systems, Inc. | Apparatus and method for 3-D measurement using holographic scanning |
Cited By (33)
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US6563653B2 (en) * | 1996-08-16 | 2003-05-13 | Imaging Research, Inc. | Digital imaging system for assays in well plates, gels and blots |
US6441973B1 (en) * | 1996-08-16 | 2002-08-27 | Imaging Research, Inc. | Digital imaging system for assays in well plates, gels and blots |
US7773209B2 (en) | 1998-07-08 | 2010-08-10 | Charles A. Lemaire | Method and apparatus for parts manipulation, inspection, and replacement |
US20090078620A1 (en) * | 1998-07-08 | 2009-03-26 | Charles A. Lemaire | Tray flipper, tray, and method for parts inspection |
US6522777B1 (en) * | 1998-07-08 | 2003-02-18 | Ppt Vision, Inc. | Combined 3D- and 2D-scanning machine-vision system and method |
US8408379B2 (en) | 1998-07-08 | 2013-04-02 | Charles A. Lemaire | Parts manipulation, inspection, and replacement |
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US8056700B2 (en) | 1998-07-08 | 2011-11-15 | Charles A. Lemaire | Tray flipper, tray, and method for parts inspection |
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Also Published As
Publication number | Publication date |
---|---|
CA1287486C (en) | 1991-08-13 |
JPH0585845B2 (en) | 1993-12-09 |
DE3852890T2 (en) | 1995-08-03 |
JPH03500332A (en) | 1991-01-24 |
ES2012221A6 (en) | 1990-03-01 |
US5024529A (en) | 1991-06-18 |
DE3852890D1 (en) | 1995-03-09 |
EP0397672B1 (en) | 1995-01-25 |
BR8807464A (en) | 1990-05-15 |
EP0397672A1 (en) | 1990-11-22 |
WO1989007238A1 (en) | 1989-08-10 |
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