USRE43739E1 - Test probe for finger tester and corresponding finger tester - Google Patents
Test probe for finger tester and corresponding finger tester Download PDFInfo
- Publication number
- USRE43739E1 USRE43739E1 US12/248,166 US24816608A USRE43739E US RE43739 E1 USRE43739 E1 US RE43739E1 US 24816608 A US24816608 A US 24816608A US RE43739 E USRE43739 E US RE43739E
- Authority
- US
- United States
- Prior art keywords
- test
- retaining arms
- mount
- needle
- test needle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 339
- 239000000523 sample Substances 0.000 title claims abstract description 165
- 239000004020 conductor Substances 0.000 claims abstract description 29
- 230000003287 optical effect Effects 0.000 claims description 16
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 11
- 230000004907 flux Effects 0.000 description 44
- 239000000696 magnetic material Substances 0.000 description 11
- 238000005259 measurement Methods 0.000 description 7
- 230000003068 static effect Effects 0.000 description 7
- 230000005284 excitation Effects 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 229920003023 plastic Polymers 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- -1 polytetrafluoroethylene Polymers 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 229910000639 Spring steel Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229920002457 flexible plastic Polymers 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003278 mimic effect Effects 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/0675—Needle-like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
Abstract
Description
-
- if an armature element 45 is located in the area between two
pole walls 38 of twoopposite pole pieces 36, then a section of thearmature plate 43 made ofnon-magnetic material 44 is arranged in the area between the twoother pole walls 38 of thesame pole pieces 36, and - there are in each case border zones between armature elements 45 and sections of non-magnetic material between the pairs of
pole walls 38 of theother pole pieces 36 of thelinear motor 30.
- if an armature element 45 is located in the area between two
Claims (46)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/248,166 USRE43739E1 (en) | 2001-12-07 | 2008-10-09 | Test probe for finger tester and corresponding finger tester |
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10160119 | 2001-12-07 | ||
DE10160119A DE10160119A1 (en) | 2001-12-07 | 2001-12-07 | Test probe for a finger tester |
PCT/EP2002/012770 WO2003048787A1 (en) | 2001-12-07 | 2002-11-14 | Test probe for a finger tester and corresponding finger tester |
US10/859,795 US7119558B2 (en) | 2001-12-07 | 2004-06-03 | Test probe for finger tester and corresponding finger tester |
US12/248,166 USRE43739E1 (en) | 2001-12-07 | 2008-10-09 | Test probe for finger tester and corresponding finger tester |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/859,795 Reissue US7119558B2 (en) | 2001-12-07 | 2004-06-03 | Test probe for finger tester and corresponding finger tester |
Publications (1)
Publication Number | Publication Date |
---|---|
USRE43739E1 true USRE43739E1 (en) | 2012-10-16 |
Family
ID=7708348
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/859,795 Ceased US7119558B2 (en) | 2001-12-07 | 2004-06-03 | Test probe for finger tester and corresponding finger tester |
US11/121,802 Expired - Lifetime US7190182B2 (en) | 2001-12-07 | 2005-05-04 | Test probe for finger tester and corresponding finger tester |
US11/466,663 Expired - Lifetime US7355424B2 (en) | 2001-12-07 | 2006-08-24 | Test probe for finger tester and corresponding finger tester |
US12/248,166 Expired - Lifetime USRE43739E1 (en) | 2001-12-07 | 2008-10-09 | Test probe for finger tester and corresponding finger tester |
Family Applications Before (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/859,795 Ceased US7119558B2 (en) | 2001-12-07 | 2004-06-03 | Test probe for finger tester and corresponding finger tester |
US11/121,802 Expired - Lifetime US7190182B2 (en) | 2001-12-07 | 2005-05-04 | Test probe for finger tester and corresponding finger tester |
US11/466,663 Expired - Lifetime US7355424B2 (en) | 2001-12-07 | 2006-08-24 | Test probe for finger tester and corresponding finger tester |
Country Status (10)
Country | Link |
---|---|
US (4) | US7119558B2 (en) |
EP (2) | EP1542023B1 (en) |
JP (2) | JP4073024B2 (en) |
KR (1) | KR100670115B1 (en) |
CN (1) | CN1292258C (en) |
AT (2) | ATE350672T1 (en) |
AU (1) | AU2002358505A1 (en) |
DE (3) | DE10160119A1 (en) |
TW (1) | TWI275802B (en) |
WO (1) | WO2003048787A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100271060A1 (en) * | 1998-07-14 | 2010-10-28 | Cascade Microtech, Inc. | Membrane probing method using improved contact |
US20110273203A1 (en) * | 2009-01-14 | 2011-11-10 | Dtg International Gmbh | Method for the testing of circuit boards |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10160119A1 (en) | 2001-12-07 | 2003-10-02 | Atg Test Systems Gmbh | Test probe for a finger tester |
DE10220343B4 (en) * | 2002-05-07 | 2007-04-05 | Atg Test Systems Gmbh & Co. Kg Reicholzheim | Apparatus and method for testing printed circuit boards and probes |
DE10320925B4 (en) * | 2003-05-09 | 2007-07-05 | Atg Test Systems Gmbh & Co.Kg | Method for testing unpopulated printed circuit boards |
DE102006005800B4 (en) * | 2006-02-08 | 2007-12-06 | Atg Test Systems Gmbh | Method and apparatus for testing unpopulated printed circuit boards |
DE102006006255A1 (en) | 2006-02-10 | 2007-08-23 | Atg Test Systems Gmbh | Finger tester for testing unpopulated printed circuit boards and method for testing unpopulated printed circuit boards with a finger tester |
US7648130B2 (en) * | 2006-06-08 | 2010-01-19 | Research In Motion Limited | Use of magnets to provide resilience |
DE102006056646B4 (en) * | 2006-11-29 | 2009-04-30 | Suss Microtec Test Systems Gmbh | Probe holder for a probe for testing semiconductor devices |
KR100876940B1 (en) * | 2007-06-19 | 2009-01-07 | 주식회사 새한마이크로텍 | Probe card using isolinear needle |
CN101487851B (en) * | 2008-12-30 | 2011-04-13 | 南京协力电子科技集团有限公司 | Test probe apparatus |
DE102012107556A1 (en) * | 2012-08-17 | 2014-02-20 | HARTING Electronics GmbH | Device and method for reversible, mechanical fixation and electrical contacting of electrical conductors |
CN110031658B (en) * | 2012-11-21 | 2021-11-30 | 康拉德有限责任公司 | Method and device for testing workpieces |
US9989583B2 (en) | 2013-03-13 | 2018-06-05 | Xcerra Corporation | Cross-bar unit for a test apparatus for circuit boards, and test apparatus containing the former |
DE102013102564A1 (en) | 2013-03-13 | 2014-09-18 | Dtg International Gmbh | Truss unit for a tester for printed circuit boards, as well as tester with it |
TWI574013B (en) * | 2013-03-15 | 2017-03-11 | 穩懋半導體股份有限公司 | Probe card, probe structure and method for manufacturing the same |
JP2014181937A (en) * | 2013-03-18 | 2014-09-29 | Fujitsu Semiconductor Ltd | Test device, cleaning method, and manufacturing method of semiconductor device |
EP3120515B1 (en) * | 2014-03-17 | 2020-07-08 | Telefonaktiebolaget LM Ericsson (publ) | Improved end-to-end data protection |
US9857413B2 (en) | 2014-07-02 | 2018-01-02 | Avery Dennison Retail Information Services, Llc | Systems and methods for testing RFID straps |
TWI645193B (en) * | 2014-07-29 | 2018-12-21 | 日商日置電機股份有限公司 | Probe unit, probe unit manufacturing method and detection method |
JP6532755B2 (en) * | 2014-07-29 | 2019-06-19 | 日置電機株式会社 | Probe unit, probe unit manufacturing method and inspection method |
CN104251923B (en) * | 2014-09-17 | 2017-06-30 | 大族激光科技产业集团股份有限公司 | Measure with two cable probe unit and its application process |
CN104237579B (en) * | 2014-09-17 | 2017-04-19 | 大族激光科技产业集团股份有限公司 | Four-line test probe device and application method thereof |
CN104950250A (en) * | 2015-07-29 | 2015-09-30 | 江苏杰进微电子科技有限公司 | Integrated circuit (IC) test head and device with same |
GB2545496B (en) * | 2015-12-18 | 2020-06-03 | Teraview Ltd | A Test System |
WO2017111885A1 (en) * | 2015-12-21 | 2017-06-29 | Intel Corporation | Magnetic pick and place probe |
CN105527578A (en) * | 2016-01-14 | 2016-04-27 | 广州蓝奇电子实业有限公司 | Battery detection control system |
US10060950B2 (en) * | 2016-01-15 | 2018-08-28 | Formfactor Beaverton, Inc. | Shielded probe systems |
DE102017102700A1 (en) | 2017-02-10 | 2018-09-13 | Atg Luther & Maelzer Gmbh | Test apparatus and method for testing printed circuit boards |
KR101729583B1 (en) | 2017-02-24 | 2017-04-25 | (주)테스트테크 | Test probes for PCB electrical testing |
DE102018101031A1 (en) | 2018-01-18 | 2019-07-18 | Xcerra Corp. | Test needle, test probe and finger tester for testing printed circuit boards |
CN111566488A (en) | 2018-01-18 | 2020-08-21 | 艾克斯塞拉公司 | Test pin, test probe, and flying probe tester for testing printed circuit board |
CN109116214A (en) * | 2018-03-30 | 2019-01-01 | Tcl王牌电器(惠州)有限公司 | The LVDS/V-by-one signal testing jig of chip main board |
TWI705248B (en) * | 2019-02-15 | 2020-09-21 | 萬潤科技股份有限公司 | Probe driving method and device |
KR102141535B1 (en) * | 2020-03-03 | 2020-08-05 | 장용철 | Multi flying probe tester |
TWI814176B (en) * | 2020-12-22 | 2023-09-01 | 財團法人工業技術研究院 | Magnetic field structure |
DE102021114443B4 (en) | 2021-06-04 | 2023-06-15 | Xcerra Corp. | Probe for a finger tester and finger tester with several such probes and method for testing printed circuit boards |
CN114966143B (en) * | 2022-06-13 | 2023-01-31 | 法特迪精密科技(苏州)有限公司 | Electromagnetic drive rotary probe and fixed socket structure |
CN114966142B (en) * | 2022-06-13 | 2023-01-31 | 法特迪精密科技(苏州)有限公司 | Matching method of electromagnetic drive rotary probe and fixed socket |
Citations (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3458687A (en) | 1967-03-08 | 1969-07-29 | Bunker Ramo | Electronic component test fixture |
US3648169A (en) | 1969-05-26 | 1972-03-07 | Teledyne Inc | Probe and head assembly |
US4123706A (en) | 1975-03-03 | 1978-10-31 | Electroglas, Inc. | Probe construction |
US4394620A (en) | 1979-09-26 | 1983-07-19 | Bell Telephone Laboratories, Incorporated | Electrical access tool for engaging recessed test points |
US4956923A (en) | 1989-11-06 | 1990-09-18 | The Micromanipulator Co., Inc. | Probe assembly including touchdown sensor |
US4967147A (en) | 1988-05-26 | 1990-10-30 | Zehntel, Inc. | Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies |
EP0460911A2 (en) | 1990-06-08 | 1991-12-11 | Cascade Microtech, Inc. | Electrical probe with contact force protection |
EP0468153A1 (en) | 1990-07-25 | 1992-01-29 | atg test systems GmbH | Device for contacting elements for testing |
JPH06289054A (en) | 1993-04-02 | 1994-10-18 | Tescon:Kk | Dual head for probe of printed board inspection apparatus |
EP0660387A2 (en) | 1993-12-22 | 1995-06-28 | International Business Machines Corporation | Method and apparatus for measuring oxide charge on a semiconductor wafer |
US5489855A (en) | 1990-08-22 | 1996-02-06 | Poisel; C. Edward | Apparatus and process providing controlled probing |
WO1996024069A1 (en) | 1995-02-02 | 1996-08-08 | Ita Ingenieurbüro Für Testaufgaben Gmbh | Test device for flat electronic assemblies |
EP0853242A1 (en) | 1997-01-09 | 1998-07-15 | Atg test systems GmbH | Method for testing printed-circuit boards |
US5804982A (en) | 1995-05-26 | 1998-09-08 | International Business Machines Corporation | Miniature probe positioning actuator |
US6037764A (en) | 1997-01-17 | 2000-03-14 | Dell U.S.A., L.P. | Rotatable mechanical hold-down finger for holding a circuit board in a test fixture |
US6046599A (en) | 1996-05-20 | 2000-04-04 | Microconnect, Inc. | Method and device for making connection |
EP0990912A2 (en) | 1998-09-28 | 2000-04-05 | atg test systems GmbH | Test probe actuator |
US6051978A (en) | 1998-04-27 | 2000-04-18 | Delaware Capital Formation, Inc. | TDR tester for x-y prober |
JP2000131340A (en) | 1998-10-28 | 2000-05-12 | Hioki Ee Corp | Contact probe device |
US6127832A (en) | 1998-01-06 | 2000-10-03 | International Business Machines Corporation | Electrical test tool having easily replaceable electrical probe |
US6369592B1 (en) | 1999-05-24 | 2002-04-09 | International Business Machines Corporation | Probe for testing and repairing printed circuit features |
US6426638B1 (en) | 2000-05-02 | 2002-07-30 | Decision Track Llc | Compliant probe apparatus |
US6677773B2 (en) | 2000-03-20 | 2004-01-13 | Atg Test Systems Gmbh & Co. Kg | Testing device for printed circuit boards |
US7190182B2 (en) | 2001-12-07 | 2007-03-13 | Atg Test Systems Gmbh & Co. Kg | Test probe for finger tester and corresponding finger tester |
US20080272793A1 (en) * | 2006-02-10 | 2008-11-06 | Atg Luther & Maelzer Gmbh | Finger Tester for Testing Unpopulated Printed Circuit Boards and Method for Testing Unpopulated Printed Circuit Boards Using a Finger Tester |
-
2001
- 2001-12-07 DE DE10160119A patent/DE10160119A1/en not_active Withdrawn
-
2002
- 2002-11-14 CN CNB02822468XA patent/CN1292258C/en not_active Expired - Lifetime
- 2002-11-14 AT AT05002153T patent/ATE350672T1/en not_active IP Right Cessation
- 2002-11-14 EP EP05002153A patent/EP1542023B1/en not_active Expired - Lifetime
- 2002-11-14 JP JP2003549931A patent/JP4073024B2/en not_active Expired - Lifetime
- 2002-11-14 TW TW091133428A patent/TWI275802B/en not_active IP Right Cessation
- 2002-11-14 KR KR1020047007869A patent/KR100670115B1/en active IP Right Grant
- 2002-11-14 AT AT02792764T patent/ATE305613T1/en active
- 2002-11-14 AU AU2002358505A patent/AU2002358505A1/en not_active Abandoned
- 2002-11-14 EP EP02792764A patent/EP1451594B1/en not_active Expired - Lifetime
- 2002-11-14 DE DE50209202T patent/DE50209202D1/en not_active Expired - Lifetime
- 2002-11-14 WO PCT/EP2002/012770 patent/WO2003048787A1/en active IP Right Grant
- 2002-11-14 DE DE50204420T patent/DE50204420D1/en not_active Expired - Lifetime
-
2004
- 2004-06-03 US US10/859,795 patent/US7119558B2/en not_active Ceased
-
2005
- 2005-05-04 US US11/121,802 patent/US7190182B2/en not_active Expired - Lifetime
-
2006
- 2006-08-24 US US11/466,663 patent/US7355424B2/en not_active Expired - Lifetime
-
2007
- 2007-11-22 JP JP2007303001A patent/JP4780677B2/en not_active Expired - Lifetime
-
2008
- 2008-10-09 US US12/248,166 patent/USRE43739E1/en not_active Expired - Lifetime
Patent Citations (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3458687A (en) | 1967-03-08 | 1969-07-29 | Bunker Ramo | Electronic component test fixture |
US3648169A (en) | 1969-05-26 | 1972-03-07 | Teledyne Inc | Probe and head assembly |
US4123706A (en) | 1975-03-03 | 1978-10-31 | Electroglas, Inc. | Probe construction |
US4394620A (en) | 1979-09-26 | 1983-07-19 | Bell Telephone Laboratories, Incorporated | Electrical access tool for engaging recessed test points |
US4967147A (en) | 1988-05-26 | 1990-10-30 | Zehntel, Inc. | Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies |
US4956923A (en) | 1989-11-06 | 1990-09-18 | The Micromanipulator Co., Inc. | Probe assembly including touchdown sensor |
EP0460911A2 (en) | 1990-06-08 | 1991-12-11 | Cascade Microtech, Inc. | Electrical probe with contact force protection |
EP0468153A1 (en) | 1990-07-25 | 1992-01-29 | atg test systems GmbH | Device for contacting elements for testing |
US5489855A (en) | 1990-08-22 | 1996-02-06 | Poisel; C. Edward | Apparatus and process providing controlled probing |
JPH06289054A (en) | 1993-04-02 | 1994-10-18 | Tescon:Kk | Dual head for probe of printed board inspection apparatus |
EP0660387A2 (en) | 1993-12-22 | 1995-06-28 | International Business Machines Corporation | Method and apparatus for measuring oxide charge on a semiconductor wafer |
WO1996024069A1 (en) | 1995-02-02 | 1996-08-08 | Ita Ingenieurbüro Für Testaufgaben Gmbh | Test device for flat electronic assemblies |
CA2211703A1 (en) | 1995-02-02 | 1996-08-08 | Ita Ingenieurburo Fur Testaufgaben Gmbh | Test device for flat electronic assemblies |
CA2211703C (en) | 1995-02-02 | 2002-08-06 | Ita Ingenieurburo Fur Testaufgaben Gmbh | Test device for flat electronic assemblies |
US5804982A (en) | 1995-05-26 | 1998-09-08 | International Business Machines Corporation | Miniature probe positioning actuator |
US6046599A (en) | 1996-05-20 | 2000-04-04 | Microconnect, Inc. | Method and device for making connection |
EP0853242A1 (en) | 1997-01-09 | 1998-07-15 | Atg test systems GmbH | Method for testing printed-circuit boards |
US6037764A (en) | 1997-01-17 | 2000-03-14 | Dell U.S.A., L.P. | Rotatable mechanical hold-down finger for holding a circuit board in a test fixture |
US6127832A (en) | 1998-01-06 | 2000-10-03 | International Business Machines Corporation | Electrical test tool having easily replaceable electrical probe |
US6051978A (en) | 1998-04-27 | 2000-04-18 | Delaware Capital Formation, Inc. | TDR tester for x-y prober |
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Also Published As
Publication number | Publication date |
---|---|
EP1542023B1 (en) | 2007-01-03 |
EP1542023A2 (en) | 2005-06-15 |
EP1542023A3 (en) | 2005-06-29 |
EP1451594B1 (en) | 2005-09-28 |
US20050001639A1 (en) | 2005-01-06 |
EP1451594A1 (en) | 2004-09-01 |
DE50209202D1 (en) | 2007-02-15 |
CN1585901A (en) | 2005-02-23 |
US20050206398A1 (en) | 2005-09-22 |
AU2002358505A1 (en) | 2003-06-17 |
US7119558B2 (en) | 2006-10-10 |
DE50204420D1 (en) | 2005-11-03 |
WO2003048787A1 (en) | 2003-06-12 |
ATE305613T1 (en) | 2005-10-15 |
ATE350672T1 (en) | 2007-01-15 |
JP2005512062A (en) | 2005-04-28 |
US7355424B2 (en) | 2008-04-08 |
KR100670115B1 (en) | 2007-01-16 |
JP4073024B2 (en) | 2008-04-09 |
JP4780677B2 (en) | 2011-09-28 |
TWI275802B (en) | 2007-03-11 |
TW200300842A (en) | 2003-06-16 |
KR20050044592A (en) | 2005-05-12 |
US20070001693A1 (en) | 2007-01-04 |
CN1292258C (en) | 2006-12-27 |
DE10160119A1 (en) | 2003-10-02 |
US7190182B2 (en) | 2007-03-13 |
JP2008122392A (en) | 2008-05-29 |
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