WO1992009877A3 - Ftir remote sensor apparatus and method - Google Patents

Ftir remote sensor apparatus and method Download PDF

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Publication number
WO1992009877A3
WO1992009877A3 PCT/US1991/009574 US9109574W WO9209877A3 WO 1992009877 A3 WO1992009877 A3 WO 1992009877A3 US 9109574 W US9109574 W US 9109574W WO 9209877 A3 WO9209877 A3 WO 9209877A3
Authority
WO
WIPO (PCT)
Prior art keywords
target area
ftir
gases
sensor apparatus
remote sensor
Prior art date
Application number
PCT/US1991/009574
Other languages
French (fr)
Other versions
WO1992009877A2 (en
Inventor
Orman A Simpson
Robert H Kagann
Original Assignee
Mda Scient Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mda Scient Inc filed Critical Mda Scient Inc
Priority to JP4507587A priority Critical patent/JPH07503532A/en
Publication of WO1992009877A2 publication Critical patent/WO1992009877A2/en
Publication of WO1992009877A3 publication Critical patent/WO1992009877A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G01N21/3518—Devices using gas filter correlation techniques; Devices using gas pressure modulation techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/031—Multipass arrangements
    • G01N2021/0314—Double pass, autocollimated path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1793—Remote sensing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G01N2021/3513—Open path with an instrumental source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR

Abstract

An apparatus (16) and method for analyzing one or more gases in a target area (10). A modulated infrared light source (40) provides an infrared beam (20) that is capable of being absorbed at different wavelengths by the gases being analyzed. An optical arrangement (30) transmits the infrared beam (20) from the light source (40) in a first path (22) across the target area (10) where a reflective element (26) is positioned to return the infrared beam back along the first path to the optical arrangement (30). Based upon the absorption spectrum of the received beam (28), a determination can be made of the gases present and the concentrations thereof in the target area (10).
PCT/US1991/009574 1990-07-16 1991-07-15 Ftir remote sensor apparatus and method WO1992009877A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4507587A JPH07503532A (en) 1990-07-16 1991-07-15 FTIR remote sensor device and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US55451190A 1990-07-16 1990-07-16
US554,511 1990-07-16

Publications (2)

Publication Number Publication Date
WO1992009877A2 WO1992009877A2 (en) 1992-06-11
WO1992009877A3 true WO1992009877A3 (en) 1993-01-21

Family

ID=24213648

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1991/009574 WO1992009877A2 (en) 1990-07-16 1991-07-15 Ftir remote sensor apparatus and method

Country Status (5)

Country Link
EP (1) EP0541734A4 (en)
JP (1) JPH07503532A (en)
AU (1) AU1567392A (en)
CA (1) CA2087439C (en)
WO (1) WO1992009877A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9366621B2 (en) 2012-04-19 2016-06-14 Zolo Technologies, Inc. In-furnace retro-reflectors with steerable tunable diode laser absorption spectrometer

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2274163B (en) * 1993-01-12 1996-11-20 Pollution Monitor Syst Ltd Gas analyser
GB2373045B (en) * 2001-05-01 2003-01-29 Golden River Traffic Ltd Measurement of vehicle emissions
GB2507721A (en) * 2012-09-28 2014-05-14 Thales Holdings Uk Plc Optical cell comprising a telescope
GB2583377A (en) * 2019-04-26 2020-10-28 Univ Heriot Watt Systems and methods using active FTIR spectroscopy for detection of chemical targets
GB2593195B (en) * 2020-03-18 2023-02-22 Thermo Fisher Scient Ecublens Sarl Multipass cell

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2930893A (en) * 1956-05-21 1960-03-29 Lane B Carpenter Long path infrared detection of atmospheric contaminants
JPS5759145A (en) * 1980-09-27 1982-04-09 Fujitsu Ltd Apparatus for spectroscopic analysis by infrared ray
JPS57108640A (en) * 1980-12-25 1982-07-06 Fujitsu Ltd Method for detecting gas concentration
JPS58213235A (en) * 1982-06-04 1983-12-12 Fujitsu Ltd Gas detection system
US4426640A (en) * 1979-09-05 1984-01-17 Imperial Chemical Industries Limited Laser scanning apparatus
DD207258A1 (en) * 1982-04-16 1984-02-22 Dieter Schubert ARRANGEMENT FOR GENERATING PARALLEL LIGHT BILLING
NL8503360A (en) * 1985-12-05 1987-07-01 Tno METHOD FOR DETERMINING THE DISTRIBUTION OF A GAS IN A SPACE, RETRO-REFLECTIVE INFRARED RADIATION SCREEN AND DEVICE FOR DETERMINING THE INFRARED RADIATION OF A GAS DISTRIBUTION USING SUCH A SCREEN AND RADIATION SOURCE.
US4746218A (en) * 1984-06-12 1988-05-24 Syconex Corporation Gas detectors and gas analyzers utilizing spectral absorption
US4794258A (en) * 1986-07-21 1988-12-27 Erwin Sick Gmbh Optik-Elektronik Spectroanalytical gas measuring apparatus
US4924095A (en) * 1987-06-02 1990-05-08 West Lodge Research Remote gas analyzer for motor vehicle exhaust emissions surveillance

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2930893A (en) * 1956-05-21 1960-03-29 Lane B Carpenter Long path infrared detection of atmospheric contaminants
US4426640A (en) * 1979-09-05 1984-01-17 Imperial Chemical Industries Limited Laser scanning apparatus
JPS5759145A (en) * 1980-09-27 1982-04-09 Fujitsu Ltd Apparatus for spectroscopic analysis by infrared ray
JPS57108640A (en) * 1980-12-25 1982-07-06 Fujitsu Ltd Method for detecting gas concentration
DD207258A1 (en) * 1982-04-16 1984-02-22 Dieter Schubert ARRANGEMENT FOR GENERATING PARALLEL LIGHT BILLING
JPS58213235A (en) * 1982-06-04 1983-12-12 Fujitsu Ltd Gas detection system
US4746218A (en) * 1984-06-12 1988-05-24 Syconex Corporation Gas detectors and gas analyzers utilizing spectral absorption
NL8503360A (en) * 1985-12-05 1987-07-01 Tno METHOD FOR DETERMINING THE DISTRIBUTION OF A GAS IN A SPACE, RETRO-REFLECTIVE INFRARED RADIATION SCREEN AND DEVICE FOR DETERMINING THE INFRARED RADIATION OF A GAS DISTRIBUTION USING SUCH A SCREEN AND RADIATION SOURCE.
EP0235404A2 (en) * 1985-12-05 1987-09-09 Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno Method and device for determining the spatial distribution of a gas
US4794258A (en) * 1986-07-21 1988-12-27 Erwin Sick Gmbh Optik-Elektronik Spectroanalytical gas measuring apparatus
US4924095A (en) * 1987-06-02 1990-05-08 West Lodge Research Remote gas analyzer for motor vehicle exhaust emissions surveillance

Non-Patent Citations (12)

* Cited by examiner, † Cited by third party
Title
83rd Annual Meeting of the Air and Waste Management Association, Pittsburgh, Pennsylvania (24-29 June 1990), R.F. KAGANN et al., "Open Path FTIR Measurements of Gaseous Emissions from a Chemical Plant waste Water Treatment Basin". *
83rd Annual Meeting of the Air and Waste Management Association, Pittsburgh, Pennsylvania (24-29 June 1990), W.K. WHITCRAFT et al., "Use of Remote Sensing to Measure Wastewater Plant Emissions". Paper 90-86.4, pp. 1-9. *
Am. Ind. Hyg. Assoc. J., Vol. 50, No. 2 (February 1989), C.R. STRANG et al., "The Limits of Detection for the Monitoring of Semiconductor Manufacturing Gas and Vapor Emissions by Fourier Transform Infrared (FTIR) Spectroscopy", pp. 78-84. *
Am. Ind. Hyg. Assoc. J., Vol. 50, No. 2, (February 1989), C.R. STRANG et al., "A Preliminary Evalution of the Fourier Transform Infrared (FTIR) Spectrometer as a Quantitative Air Monitor for Semiconductor Manufacturing Process Emissions", pp. 70-77. *
American Laboratory (December 1982), W.F. HERGET, "Analysis of gaseous air pollutants using a mobile FTIR system," pp. 72-78. *
Applied Optics, Vol. 21, No. 4 (15 February 1982), W.F. HERGET, "Remote and cross-stack measurement of stack gas concentrations using a mobil FT-IR system", pp. 635-641. *
Atmospheric Pollution, Proceedings of the 12th International Colloquium on Atmospheric Pollution, Paris, France (5-7 May 1976), M.M.H. MOREAU, "The Remote Sensing of Atmospheric Pollutants by a CO2 Laser Apparatus", pp. 405-418. Copyright Elsevier scientific publishing Company, Amsterdam. *
AWMA/EPA Symposium on Toxics Monitoring, Ralaigh, North Carolina, (May 1990), R.F. KAGANN et al., "Remote FTIR Measurement of Chemical Emissions". *
Environmental Science & Technology, Vol. 11, No. 10 (October 1977), W.F. HERGET et al., "Instrumental sensing of stationary source emissions", pp. 962-967. *
J. Opt. Soc. Am., Vol. 68, No. 11 (November 1978), F.V. KOWALSKI et al., "An improved wavemeter for cw lasers", pp. 1611-1613. *
Journal of the Air Pollution control Association, Vol. 33, No. 3 (March 1983), L.W. CHANEY, "The Remote Measurement of Traffic Generated Carbon Monoxide", pp. 220-222. *
Optical Engineering, Vol. 19, No. 4 (July/August 1980), W.F. HERGET et al., "Remote Fourier Transform Infrared Air Pollution Studies", pp. 508-513. *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9366621B2 (en) 2012-04-19 2016-06-14 Zolo Technologies, Inc. In-furnace retro-reflectors with steerable tunable diode laser absorption spectrometer

Also Published As

Publication number Publication date
CA2087439C (en) 1996-07-09
EP0541734A1 (en) 1993-05-19
WO1992009877A2 (en) 1992-06-11
AU1567392A (en) 1992-06-25
JPH07503532A (en) 1995-04-13
EP0541734A4 (en) 1993-07-28

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