WO1998003273A1 - Wet processing methods for the manufacture of electronic components using sequential chemical processing - Google Patents
Wet processing methods for the manufacture of electronic components using sequential chemical processing Download PDFInfo
- Publication number
- WO1998003273A1 WO1998003273A1 PCT/US1997/012088 US9712088W WO9803273A1 WO 1998003273 A1 WO1998003273 A1 WO 1998003273A1 US 9712088 W US9712088 W US 9712088W WO 9803273 A1 WO9803273 A1 WO 9803273A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electronic component
- buffers
- same
- component precursors
- acid
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/67086—Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP97932574A EP0912259A4 (en) | 1996-07-19 | 1997-07-14 | Wet processing methods for the manufacture of electronic components using sequential chemical processing |
AU36000/97A AU3600097A (en) | 1996-07-19 | 1997-07-14 | Wet processing methods for the manufacture of electronic components using sequential chemical processing |
JP10507004A JP2000515324A (en) | 1996-07-19 | 1997-07-14 | Wet processing method for the production of electronic components using sequential chemical processing |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/684,543 US6132522A (en) | 1996-07-19 | 1996-07-19 | Wet processing methods for the manufacture of electronic components using sequential chemical processing |
US08/684,543 | 1996-07-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1998003273A1 true WO1998003273A1 (en) | 1998-01-29 |
Family
ID=24748489
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1997/012088 WO1998003273A1 (en) | 1996-07-19 | 1997-07-14 | Wet processing methods for the manufacture of electronic components using sequential chemical processing |
Country Status (7)
Country | Link |
---|---|
US (1) | US6132522A (en) |
EP (1) | EP0912259A4 (en) |
JP (1) | JP2000515324A (en) |
KR (1) | KR20000067903A (en) |
CN (1) | CN1096311C (en) |
AU (1) | AU3600097A (en) |
WO (1) | WO1998003273A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6165912A (en) * | 1998-09-17 | 2000-12-26 | Cfmt, Inc. | Electroless metal deposition of electronic components in an enclosable vessel |
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---|---|---|---|---|
US6149828A (en) * | 1997-05-05 | 2000-11-21 | Micron Technology, Inc. | Supercritical etching compositions and method of using same |
EP1044465A4 (en) * | 1997-12-10 | 2001-07-18 | Cfmt Inc | Wet processing methods for the manufacture of electronic components |
DE19853486A1 (en) * | 1998-11-19 | 2000-05-31 | Wacker Siltronic Halbleitermat | Process for the wet chemical treatment of semiconductor wafers |
US6799583B2 (en) * | 1999-05-13 | 2004-10-05 | Suraj Puri | Methods for cleaning microelectronic substrates using ultradilute cleaning liquids |
JP3434750B2 (en) * | 1999-09-30 | 2003-08-11 | Necエレクトロニクス株式会社 | Cleaning device line configuration and its design method |
DE19948206A1 (en) * | 1999-10-07 | 2001-04-12 | Merck Patent Gmbh | Process for the production of high-purity hydrochloric acid |
KR20030019323A (en) | 2000-03-13 | 2003-03-06 | 맷슨 테크날러지 아이피 | Processes and apparatus for treating electronic components |
US7205023B2 (en) * | 2000-06-26 | 2007-04-17 | Applied Materials, Inc. | Method and apparatus for chemical mixing in a single wafer process |
US6927176B2 (en) * | 2000-06-26 | 2005-08-09 | Applied Materials, Inc. | Cleaning method and solution for cleaning a wafer in a single wafer process |
US7456113B2 (en) * | 2000-06-26 | 2008-11-25 | Applied Materials, Inc. | Cleaning method and solution for cleaning a wafer in a single wafer process |
US6810887B2 (en) * | 2000-08-11 | 2004-11-02 | Chemtrace Corporation | Method for cleaning semiconductor fabrication equipment parts |
US20020119245A1 (en) * | 2001-02-23 | 2002-08-29 | Steven Verhaverbeke | Method for etching electronic components containing tantalum |
KR20030002517A (en) * | 2001-06-29 | 2003-01-09 | 주식회사 하이닉스반도체 | Method for cleaning |
US6638365B2 (en) * | 2001-10-09 | 2003-10-28 | Chartered Semiconductor Manufacturing Ltd. | Method for obtaining clean silicon surfaces for semiconductor manufacturing |
US6656852B2 (en) * | 2001-12-06 | 2003-12-02 | Texas Instruments Incorporated | Method for the selective removal of high-k dielectrics |
KR100805693B1 (en) * | 2001-12-14 | 2008-02-21 | 주식회사 하이닉스반도체 | Cleanung chemical and method for cleaning metal layer |
TW533499B (en) * | 2002-01-28 | 2003-05-21 | Winbond Electronics Corp | Method of fine-tuning mixed acid liquid supplement amount |
JP2003266030A (en) * | 2002-03-15 | 2003-09-24 | Seiko Epson Corp | Washing method for object to be treated, apparatus therefor, device manufacturing method, and device |
US7156927B2 (en) * | 2002-04-03 | 2007-01-02 | Fsi International, Inc. | Transition flow treatment process and apparatus |
TW536775B (en) * | 2002-04-18 | 2003-06-11 | Nanya Technology Corp | Manufacturing method of shallow trench isolation structure |
US20040002430A1 (en) * | 2002-07-01 | 2004-01-01 | Applied Materials, Inc. | Using a time critical wafer cleaning solution by combining a chelating agent with an oxidizer at point-of-use |
JP4002154B2 (en) * | 2002-08-13 | 2007-10-31 | 東芝松下ディスプレイテクノロジー株式会社 | Method and apparatus for manufacturing liquid crystal display element |
KR100464858B1 (en) * | 2002-08-23 | 2005-01-05 | 삼성전자주식회사 | Organic Stripping Composition And Method Of Etching Oxide Using Thereof |
US20040040934A1 (en) * | 2002-09-04 | 2004-03-04 | Tai Chen Chung | Method of etching a photoresist layer disposed on a semiconductor substrate |
KR100520819B1 (en) * | 2003-02-25 | 2005-10-12 | 삼성전자주식회사 | method of cleaning a substrate |
US7267726B2 (en) * | 2003-04-22 | 2007-09-11 | Texas Instruments Incorporated | Method and apparatus for removing polymer residue from semiconductor wafer edge and back side |
WO2005013349A2 (en) * | 2003-07-31 | 2005-02-10 | Fsi International, Inc. | Controlled growth of highly uniform, oxide layers, especially ultrathin layers |
US20050092348A1 (en) * | 2003-11-05 | 2005-05-05 | Ju-Chien Chiang | Method for cleaning an integrated circuit device using an aqueous cleaning composition |
US20060021634A1 (en) * | 2004-07-08 | 2006-02-02 | Liu Zhi Lewis | Method and apparatus for creating ozonated process solutions having high ozone concentration |
US20060011214A1 (en) * | 2004-07-09 | 2006-01-19 | Zhi Liu | System and method for pre-gate cleaning of substrates |
US20060011586A1 (en) * | 2004-07-14 | 2006-01-19 | Shea Kevin R | Method of etching nitrides |
KR101124569B1 (en) * | 2005-06-09 | 2012-03-15 | 삼성전자주식회사 | Echant and method for fabricating interconnection line and method for fabricating thin film transistor substrate using the same |
US7968148B2 (en) * | 2006-09-15 | 2011-06-28 | Globalfoundries Singapore Pte. Ltd. | Integrated circuit system with clean surfaces |
US20080076689A1 (en) * | 2006-09-27 | 2008-03-27 | Matthews Robert R | System using ozonated acetic anhydride to remove photoresist materials |
US20080171449A1 (en) * | 2007-01-15 | 2008-07-17 | Chao-Ching Hsieh | Method for cleaning salicide |
JP4979412B2 (en) * | 2007-02-26 | 2012-07-18 | 大日本スクリーン製造株式会社 | Substrate processing apparatus schedule creation method and program thereof |
US20080289660A1 (en) * | 2007-05-23 | 2008-11-27 | Air Products And Chemicals, Inc. | Semiconductor Manufacture Employing Isopropanol Drying |
US20100068404A1 (en) * | 2008-09-18 | 2010-03-18 | Guardian Industries Corp. | Draw-off coating apparatus for making coating articles, and/or methods of making coated articles using the same |
FR2990056B1 (en) * | 2012-04-27 | 2015-07-17 | Commissariat Energie Atomique | PROCESS FOR TREATING THE SURFACE CONDITION OF A SILICON SUBSTRATE |
US8603837B1 (en) * | 2012-07-31 | 2013-12-10 | Intermolecular, Inc. | High productivity combinatorial workflow for post gate etch clean development |
TWI629720B (en) | 2015-09-30 | 2018-07-11 | 東京威力科創股份有限公司 | Method and apparatus for dynamic control of the temperature of a wet etch process |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4498953A (en) * | 1983-07-27 | 1985-02-12 | At&T Bell Laboratories | Etching techniques |
US4582390A (en) * | 1982-01-05 | 1986-04-15 | At&T Bell Laboratories | Dielectric optical waveguide and technique for fabricating same |
US4738272A (en) * | 1984-05-21 | 1988-04-19 | Mcconnell Christopher F | Vessel and system for treating wafers with fluids |
US4778532A (en) * | 1985-06-24 | 1988-10-18 | Cfm Technologies Limited Partnership | Process and apparatus for treating wafers with process fluids |
US5169408A (en) * | 1990-01-26 | 1992-12-08 | Fsi International, Inc. | Apparatus for wafer processing with in situ rinse |
US5273609A (en) * | 1990-09-12 | 1993-12-28 | Texas Instruments Incorporated | Method and apparatus for time-division plasma chopping in a multi-channel plasma processing equipment |
US5381808A (en) * | 1992-03-12 | 1995-01-17 | Tokyo Electron Kabushiki Kaisha | Cleaning treatment apparatus |
Family Cites Families (49)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3650960A (en) * | 1969-05-06 | 1972-03-21 | Allied Chem | Etching solutions |
US4277290A (en) * | 1980-01-25 | 1981-07-07 | American Sterilizer Company | Low temperature washing and chemical sanitizing of foodware |
US4560417A (en) * | 1981-12-30 | 1985-12-24 | Technomex Development, Ltd. | Decontamination method for semiconductor wafer handling equipment |
US4856544A (en) * | 1984-05-21 | 1989-08-15 | Cfm Technologies, Inc. | Vessel and system for treating wafers with fluids |
US4984597B1 (en) * | 1984-05-21 | 1999-10-26 | Cfmt Inc | Apparatus for rinsing and drying surfaces |
US4577650A (en) * | 1984-05-21 | 1986-03-25 | Mcconnell Christopher F | Vessel and system for treating wafers with fluids |
US4740249A (en) * | 1984-05-21 | 1988-04-26 | Christopher F. McConnell | Method of treating wafers with fluid |
US4633893A (en) * | 1984-05-21 | 1987-01-06 | Cfm Technologies Limited Partnership | Apparatus for treating semiconductor wafers |
US4911761A (en) * | 1984-05-21 | 1990-03-27 | Cfm Technologies Research Associates | Process and apparatus for drying surfaces |
US4711256A (en) * | 1985-04-19 | 1987-12-08 | Robert Kaiser | Method and apparatus for removal of small particles from a surface |
US4654089A (en) * | 1985-05-31 | 1987-03-31 | Singelyn Daniel D | Counterflow spray rinse process |
EP0233184B1 (en) * | 1985-06-24 | 1992-04-01 | Cfm Technologies, Inc. | Semiconductor wafer flow treatment |
US4795497A (en) * | 1985-08-13 | 1989-01-03 | Mcconnell Christopher F | Method and system for fluid treatment of semiconductor wafers |
US4761244A (en) * | 1987-01-27 | 1988-08-02 | Olin Corporation | Etching solutions containing ammonium fluoride and an alkyl polyaccharide surfactant |
US4902608A (en) * | 1987-12-17 | 1990-02-20 | Texas Instruments Incorporated | Immersion development and rinse machine and process |
US5174855A (en) * | 1989-04-28 | 1992-12-29 | Dainippon Screen Mfg. Co. Ltd. | Surface treating apparatus and method using vapor |
US4921572A (en) * | 1989-05-04 | 1990-05-01 | Olin Corporation | Etchant solutions containing hydrogen fluoride and a polyammonium fluoride salt |
US5292273A (en) * | 1989-05-29 | 1994-03-08 | Giessl Klaus Dieter | Watertight container |
US5075256A (en) * | 1989-08-25 | 1991-12-24 | Applied Materials, Inc. | Process for removing deposits from backside and end edge of semiconductor wafer while preventing removal of materials from front surface of wafer |
US5213650A (en) * | 1989-08-25 | 1993-05-25 | Applied Materials, Inc. | Apparatus for removing deposits from backside and end edge of semiconductor wafer while preventing removal of materials from front surface of wafer |
US5101457A (en) * | 1990-02-28 | 1992-03-31 | At&T Bell Laboratories | Optical fiber with an integral lens at its end portion |
US5200024A (en) * | 1990-02-28 | 1993-04-06 | At&T Bell Laboratories | Wet chemical etching technique for optical fibers |
US5091053A (en) * | 1990-02-28 | 1992-02-25 | At&T Bell Laboratories | Matte finishes on optical fibers and other glass articles |
US5370741A (en) * | 1990-05-15 | 1994-12-06 | Semitool, Inc. | Dynamic semiconductor wafer processing using homogeneous chemical vapors |
US5578532A (en) * | 1990-07-16 | 1996-11-26 | Novellus Systems, Inc. | Wafer surface protection in a gas deposition process |
US5148823A (en) * | 1990-10-16 | 1992-09-22 | Verteg, Inc. | Single chamber megasonic energy cleaner |
US5090432A (en) * | 1990-10-16 | 1992-02-25 | Verteq, Inc. | Single wafer megasonic semiconductor wafer processing system |
JP2763204B2 (en) * | 1991-02-21 | 1998-06-11 | 株式会社東芝 | Semiconductor substrate and method of manufacturing the same |
US5242468A (en) * | 1991-03-19 | 1993-09-07 | Startec Ventures, Inc. | Manufacture of high precision electronic components with ultra-high purity liquids |
JPH04296021A (en) * | 1991-03-26 | 1992-10-20 | Mitsubishi Electric Corp | Surface treatment method for semiconductor substrate |
US5425826A (en) * | 1991-06-28 | 1995-06-20 | The Boeing Company | Method and apparatus for forming a welded identification sleeve |
JP3154814B2 (en) * | 1991-06-28 | 2001-04-09 | 株式会社東芝 | Semiconductor wafer cleaning method and cleaning apparatus |
SG67879A1 (en) * | 1991-08-22 | 1999-10-19 | At & T Corp | Removal of substrate perimeter material |
US5301701A (en) * | 1992-07-30 | 1994-04-12 | Nafziger Charles P | Single-chamber cleaning, rinsing and drying apparatus and method therefor |
JP3162497B2 (en) * | 1992-08-28 | 2001-04-25 | 富士通株式会社 | Resist developing apparatus and developing method |
US5308400A (en) * | 1992-09-02 | 1994-05-03 | United Microelectronics Corporation | Room temperature wafer cleaning process |
US5311892A (en) * | 1992-12-03 | 1994-05-17 | Cyclotron, Inc. | Apparatus for dispensing cleaning fluids to an object |
US5419351A (en) * | 1993-04-02 | 1995-05-30 | National Semiconductor Corporation | Final rinse/dry system for critical cleaning applications |
US5393712A (en) * | 1993-06-28 | 1995-02-28 | Lsi Logic Corporation | Process for forming low dielectric constant insulation layer on integrated circuit structure |
US5383484A (en) * | 1993-07-16 | 1995-01-24 | Cfmt, Inc. | Static megasonic cleaning system for cleaning objects |
JPH0737850A (en) * | 1993-07-20 | 1995-02-07 | Mitsubishi Electric Corp | Cleaning device |
JP3158264B2 (en) * | 1993-08-11 | 2001-04-23 | 東京エレクトロン株式会社 | Gas treatment equipment |
US5435885A (en) * | 1994-01-25 | 1995-07-25 | International Business Machines Corporation | Apparatus and method for fluid processing of electronic packaging with flow pattern change |
US5598493A (en) * | 1994-05-16 | 1997-01-28 | Alcatel Network Systems, Inc. | Method and system for forming an optical fiber microlens |
US5393694A (en) * | 1994-06-15 | 1995-02-28 | Micron Semiconductor, Inc. | Advanced process for recessed poly buffered locos |
US5605602A (en) * | 1994-09-08 | 1997-02-25 | Advanced Micro Devices, Inc. | Method and device for removing a thin film from a wafer backside surface |
US5600174A (en) * | 1994-10-11 | 1997-02-04 | The Board Of Trustees Of The Leeland Stanford Junior University | Suspended single crystal silicon structures and method of making same |
US5567574A (en) * | 1995-01-10 | 1996-10-22 | Mitsubishi Gas Chemical Company, Inc. | Removing agent composition for photoresist and method of removing |
US5645737A (en) * | 1996-02-21 | 1997-07-08 | Micron Technology, Inc. | Wet clean for a surface having an exposed silicon/silica interface |
-
1996
- 1996-07-19 US US08/684,543 patent/US6132522A/en not_active Expired - Fee Related
-
1997
- 1997-07-14 KR KR1019997000355A patent/KR20000067903A/en not_active Application Discontinuation
- 1997-07-14 EP EP97932574A patent/EP0912259A4/en not_active Withdrawn
- 1997-07-14 WO PCT/US1997/012088 patent/WO1998003273A1/en not_active Application Discontinuation
- 1997-07-14 CN CN97196376A patent/CN1096311C/en not_active Expired - Fee Related
- 1997-07-14 JP JP10507004A patent/JP2000515324A/en active Pending
- 1997-07-14 AU AU36000/97A patent/AU3600097A/en not_active Abandoned
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4582390A (en) * | 1982-01-05 | 1986-04-15 | At&T Bell Laboratories | Dielectric optical waveguide and technique for fabricating same |
US4498953A (en) * | 1983-07-27 | 1985-02-12 | At&T Bell Laboratories | Etching techniques |
US4738272A (en) * | 1984-05-21 | 1988-04-19 | Mcconnell Christopher F | Vessel and system for treating wafers with fluids |
US4778532A (en) * | 1985-06-24 | 1988-10-18 | Cfm Technologies Limited Partnership | Process and apparatus for treating wafers with process fluids |
US5169408A (en) * | 1990-01-26 | 1992-12-08 | Fsi International, Inc. | Apparatus for wafer processing with in situ rinse |
US5273609A (en) * | 1990-09-12 | 1993-12-28 | Texas Instruments Incorporated | Method and apparatus for time-division plasma chopping in a multi-channel plasma processing equipment |
US5381808A (en) * | 1992-03-12 | 1995-01-17 | Tokyo Electron Kabushiki Kaisha | Cleaning treatment apparatus |
Non-Patent Citations (3)
Title |
---|
"FULL-FLOW Wet Processing", Published by CFM TECHNOLOGIES INC., pages 1-23. * |
See also references of EP0912259A4 * |
WERNER KERN, "Handbook of Semiconductor Wafer Cleaning Technology", Published 1993, by NOYES PUBLICATIONS, page 24. * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6165912A (en) * | 1998-09-17 | 2000-12-26 | Cfmt, Inc. | Electroless metal deposition of electronic components in an enclosable vessel |
Also Published As
Publication number | Publication date |
---|---|
CN1225042A (en) | 1999-08-04 |
EP0912259A4 (en) | 2000-11-29 |
AU3600097A (en) | 1998-02-10 |
US6132522A (en) | 2000-10-17 |
EP0912259A1 (en) | 1999-05-06 |
KR20000067903A (en) | 2000-11-25 |
JP2000515324A (en) | 2000-11-14 |
CN1096311C (en) | 2002-12-18 |
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