WO1999010705A3 - A scanning probe microscope system removably attached to an optical microscope objective - Google Patents
A scanning probe microscope system removably attached to an optical microscope objective Download PDFInfo
- Publication number
- WO1999010705A3 WO1999010705A3 PCT/US1998/015758 US9815758W WO9910705A3 WO 1999010705 A3 WO1999010705 A3 WO 1999010705A3 US 9815758 W US9815758 W US 9815758W WO 9910705 A3 WO9910705 A3 WO 9910705A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- objective
- scanning probe
- removably attached
- spm
- system removably
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
- G01Q30/025—Optical microscopes coupled with SPM
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU87606/98A AU8760698A (en) | 1997-08-22 | 1998-07-29 | Scanning probe microscope system removably attachable to an optical microscope objective |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US91683097A | 1997-08-22 | 1997-08-22 | |
US08/916,571 | 1997-08-22 | ||
US08/916,830 | 1997-08-22 | ||
US08/916,571 US5861624A (en) | 1997-08-22 | 1997-08-22 | Atomic force microscope for attachment to optical microscope |
US09/119,808 US6005251A (en) | 1997-08-22 | 1998-07-21 | Voice coil scanner for use in scanning probe microscope |
US09/119,808 | 1998-07-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1999010705A2 WO1999010705A2 (en) | 1999-03-04 |
WO1999010705A3 true WO1999010705A3 (en) | 1999-11-11 |
Family
ID=27382370
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1998/015758 WO1999010705A2 (en) | 1997-08-22 | 1998-07-29 | A scanning probe microscope system removably attached to an optical microscope objective |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU8760698A (en) |
WO (1) | WO1999010705A2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100399040C (en) * | 2005-03-31 | 2008-07-02 | 电子科技大学 | Magnetizer for magnetic probe of magnetic microscope |
US10302598B2 (en) | 2016-10-24 | 2019-05-28 | General Electric Company | Corrosion and crack detection for fastener nuts |
Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4449213A (en) * | 1980-12-18 | 1984-05-15 | Sony Corporation | Optical reading apparatus |
US4667415A (en) * | 1985-11-29 | 1987-05-26 | Gca Corporation | Microlithographic reticle positioning system |
JPS62174811A (en) * | 1986-01-29 | 1987-07-31 | Hitachi Constr Mach Co Ltd | Finely positioning device |
EP0331148A2 (en) * | 1988-03-04 | 1989-09-06 | Kabushiki Kaisha Toshiba | Microscope apparatus |
US4999495A (en) * | 1988-08-31 | 1991-03-12 | Seiko Instruments Inc. | Scanning tunneling microscope |
EP0421354A2 (en) * | 1989-10-02 | 1991-04-10 | Olympus Optical Co., Ltd. | Scanning tunneling microscope |
US5289004A (en) * | 1990-03-27 | 1994-02-22 | Olympus Optical Co., Ltd. | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light |
EP0594362A1 (en) * | 1992-10-20 | 1994-04-27 | International Business Machines Corporation | Carriage assembly and positioning device for a scanning probe |
US5345815A (en) * | 1991-01-04 | 1994-09-13 | Board Of Trustees, Leland Stanford Jr. University | Atomic force microscope having cantilever with piezoresistive deflection sensor |
WO1996007074A1 (en) * | 1994-08-27 | 1996-03-07 | International Business Machines Corporation | Fine positioning apparatus with atomic resolution |
JPH08226928A (en) * | 1994-12-08 | 1996-09-03 | Nikon Corp | Interatomic force microscope with optical microscope |
EP0763881A2 (en) * | 1995-09-13 | 1997-03-19 | Hewlett-Packard Company | Magnetic micro-mover |
US5689063A (en) * | 1993-07-15 | 1997-11-18 | Nikon Corporation | Atomic force microscope using cantilever attached to optical microscope |
EP0807799A1 (en) * | 1996-05-13 | 1997-11-19 | Seiko Instruments Inc. | Probe Scanning Apparatus |
-
1998
- 1998-07-29 AU AU87606/98A patent/AU8760698A/en not_active Abandoned
- 1998-07-29 WO PCT/US1998/015758 patent/WO1999010705A2/en active Application Filing
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4449213A (en) * | 1980-12-18 | 1984-05-15 | Sony Corporation | Optical reading apparatus |
US4667415A (en) * | 1985-11-29 | 1987-05-26 | Gca Corporation | Microlithographic reticle positioning system |
JPS62174811A (en) * | 1986-01-29 | 1987-07-31 | Hitachi Constr Mach Co Ltd | Finely positioning device |
EP0331148A2 (en) * | 1988-03-04 | 1989-09-06 | Kabushiki Kaisha Toshiba | Microscope apparatus |
US4999495A (en) * | 1988-08-31 | 1991-03-12 | Seiko Instruments Inc. | Scanning tunneling microscope |
EP0421354A2 (en) * | 1989-10-02 | 1991-04-10 | Olympus Optical Co., Ltd. | Scanning tunneling microscope |
US5289004A (en) * | 1990-03-27 | 1994-02-22 | Olympus Optical Co., Ltd. | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light |
US5345815A (en) * | 1991-01-04 | 1994-09-13 | Board Of Trustees, Leland Stanford Jr. University | Atomic force microscope having cantilever with piezoresistive deflection sensor |
EP0594362A1 (en) * | 1992-10-20 | 1994-04-27 | International Business Machines Corporation | Carriage assembly and positioning device for a scanning probe |
US5689063A (en) * | 1993-07-15 | 1997-11-18 | Nikon Corporation | Atomic force microscope using cantilever attached to optical microscope |
WO1996007074A1 (en) * | 1994-08-27 | 1996-03-07 | International Business Machines Corporation | Fine positioning apparatus with atomic resolution |
JPH08226928A (en) * | 1994-12-08 | 1996-09-03 | Nikon Corp | Interatomic force microscope with optical microscope |
EP0763881A2 (en) * | 1995-09-13 | 1997-03-19 | Hewlett-Packard Company | Magnetic micro-mover |
EP0807799A1 (en) * | 1996-05-13 | 1997-11-19 | Seiko Instruments Inc. | Probe Scanning Apparatus |
Non-Patent Citations (3)
Title |
---|
"SCANNING FORCE MICROSCOPE OBJECTIVE", IBM TECHNICAL DISCLOSURE BULLETIN, vol. 34, no. 8, 1 January 1992 (1992-01-01), pages 257 - 259, XP000302110 * |
DRAKE B ET AL: "Tunneling microscope for operation in air or fluids", REVIEW OF SCIENTIFIC INSTRUMENTS, MARCH 1986, USA, vol. 57, no. 3, ISSN 0034-6748, pages 441 - 445, XP002085938 * |
PATENT ABSTRACTS OF JAPAN vol. 012, no. 019 (P - 657) 21 January 1988 (1988-01-21) * |
Also Published As
Publication number | Publication date |
---|---|
WO1999010705A2 (en) | 1999-03-04 |
AU8760698A (en) | 1999-03-16 |
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