WO2000033059A3 - Multiple scatter system for threat identification - Google Patents

Multiple scatter system for threat identification Download PDF

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Publication number
WO2000033059A3
WO2000033059A3 PCT/US1999/028035 US9928035W WO0033059A3 WO 2000033059 A3 WO2000033059 A3 WO 2000033059A3 US 9928035 W US9928035 W US 9928035W WO 0033059 A3 WO0033059 A3 WO 0033059A3
Authority
WO
WIPO (PCT)
Prior art keywords
detectors
rays
threat identification
multiple scatter
scatter system
Prior art date
Application number
PCT/US1999/028035
Other languages
French (fr)
Other versions
WO2000033059A2 (en
Inventor
Lee Grodzins
William L Adams
Original Assignee
American Science & Eng Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science & Eng Inc filed Critical American Science & Eng Inc
Publication of WO2000033059A2 publication Critical patent/WO2000033059A2/en
Publication of WO2000033059A3 publication Critical patent/WO2000033059A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Abstract

A system and a method for determining the density of an object. The intensity of x-rays backscattered from the object is measured by at least two backscatter detectors disposed at different distances from the intersection of an incident x-ray beam with the plane of the detectors. At least one of detectors is sensitive only to x-rays that have scattered more than once in the object, the ratio of scattered x-rays measured by the detectors being a function of the density of the scattering medium.
PCT/US1999/028035 1998-11-30 1999-11-24 Multiple scatter system for threat identification WO2000033059A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11018598P 1998-11-30 1998-11-30
US60/110,185 1998-11-30

Publications (2)

Publication Number Publication Date
WO2000033059A2 WO2000033059A2 (en) 2000-06-08
WO2000033059A3 true WO2000033059A3 (en) 2000-11-23

Family

ID=22331659

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1999/028035 WO2000033059A2 (en) 1998-11-30 1999-11-24 Multiple scatter system for threat identification

Country Status (2)

Country Link
US (1) US6320933B1 (en)
WO (1) WO2000033059A2 (en)

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Publication number Publication date
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WO2000033059A2 (en) 2000-06-08

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