WO2000046605A3 - Scattering parameter calibration system and method - Google Patents

Scattering parameter calibration system and method Download PDF

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Publication number
WO2000046605A3
WO2000046605A3 PCT/CA2000/000087 CA0000087W WO0046605A3 WO 2000046605 A3 WO2000046605 A3 WO 2000046605A3 CA 0000087 W CA0000087 W CA 0000087W WO 0046605 A3 WO0046605 A3 WO 0046605A3
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WO
WIPO (PCT)
Prior art keywords
test
error
ports
localized
calibrations
Prior art date
Application number
PCT/CA2000/000087
Other languages
French (fr)
Other versions
WO2000046605A2 (en
Inventor
Robert Peach
Nicholas Svensson
Thai Vo
Original Assignee
Com Dev Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Com Dev Ltd filed Critical Com Dev Ltd
Priority to DE60034121T priority Critical patent/DE60034121T2/en
Priority to EP00901456A priority patent/EP1181562B8/en
Priority to CA002361666A priority patent/CA2361666C/en
Publication of WO2000046605A2 publication Critical patent/WO2000046605A2/en
Publication of WO2000046605A3 publication Critical patent/WO2000046605A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Abstract

A system and method of calibrating an S parameter measurement instrument (10, 30) (such as a vector network analyzer) in which the number of calibrations required to fully characterize the error model of an n-port system is n/2 calibrations for an even number of ports and (n+1)/2 calibrations for an odd number of ports. Each test port (52-58) in the system is involved in at least one full calibration, thus n/2 test paths are fully calibrated. For each measured test path, the error terms of the applicable error model are calculated. These error terms are then decoupled from the associated test path into error parameters that are localized to the individual test ports of the test path. Having localized the error parameters, the error model for each test port can then be treated independently from the other test ports. The error terms for the test paths that are not calibrated are then constructed using the localized error parameters for the individual test ports.
PCT/CA2000/000087 1999-02-02 2000-02-01 Scattering parameter calibration system and method WO2000046605A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE60034121T DE60034121T2 (en) 1999-02-02 2000-02-01 METHOD AND DEVICE FOR STREUPARAMETER CALIBRATION
EP00901456A EP1181562B8 (en) 1999-02-02 2000-02-01 Scattering parameter calibration system and method
CA002361666A CA2361666C (en) 1999-02-02 2000-02-01 Scattering parameter calibration system and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/241,704 1999-02-02
US09/241,704 US6300775B1 (en) 1999-02-02 1999-02-02 Scattering parameter calibration system and method

Publications (2)

Publication Number Publication Date
WO2000046605A2 WO2000046605A2 (en) 2000-08-10
WO2000046605A3 true WO2000046605A3 (en) 2001-11-29

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CA2000/000087 WO2000046605A2 (en) 1999-02-02 2000-02-01 Scattering parameter calibration system and method

Country Status (5)

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US (1) US6300775B1 (en)
EP (1) EP1181562B8 (en)
CA (1) CA2361666C (en)
DE (1) DE60034121T2 (en)
WO (1) WO2000046605A2 (en)

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Also Published As

Publication number Publication date
WO2000046605A2 (en) 2000-08-10
EP1181562B1 (en) 2007-03-28
CA2361666C (en) 2005-11-01
EP1181562A2 (en) 2002-02-27
EP1181562B8 (en) 2007-06-27
DE60034121D1 (en) 2007-05-10
US6300775B1 (en) 2001-10-09
CA2361666A1 (en) 2000-08-10
DE60034121T2 (en) 2007-11-08

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