WO2001009665A8 - Optical beam shaper - Google Patents

Optical beam shaper

Info

Publication number
WO2001009665A8
WO2001009665A8 PCT/US2000/020946 US0020946W WO0109665A8 WO 2001009665 A8 WO2001009665 A8 WO 2001009665A8 US 0020946 W US0020946 W US 0020946W WO 0109665 A8 WO0109665 A8 WO 0109665A8
Authority
WO
WIPO (PCT)
Prior art keywords
beam shaper
optical beam
light
production
inspection system
Prior art date
Application number
PCT/US2000/020946
Other languages
French (fr)
Other versions
WO2001009665A1 (en
Inventor
James L Hanna
Original Assignee
Mectron Eng Co
James L Hanna
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mectron Eng Co, James L Hanna filed Critical Mectron Eng Co
Priority to CA002379561A priority Critical patent/CA2379561A1/en
Priority to EP00957278A priority patent/EP1198731A4/en
Publication of WO2001009665A1 publication Critical patent/WO2001009665A1/en
Publication of WO2001009665A8 publication Critical patent/WO2001009665A8/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Abstract

An optical beam shaper for production of a uniform sheet of light for use in a parts inspection system having a light source (40) including a coherent light generator (52), a diffractive beam shaper (56), and lens elements (58).
PCT/US2000/020946 1999-08-02 2000-08-01 Optical beam shaper WO2001009665A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CA002379561A CA2379561A1 (en) 1999-08-02 2000-08-01 Optical beam shaper
EP00957278A EP1198731A4 (en) 1999-08-02 2000-08-01 Optical beam shaper

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/366,027 US6313948B1 (en) 1999-08-02 1999-08-02 Optical beam shaper
US09/366,027 1999-08-02

Publications (2)

Publication Number Publication Date
WO2001009665A1 WO2001009665A1 (en) 2001-02-08
WO2001009665A8 true WO2001009665A8 (en) 2001-04-05

Family

ID=23441380

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/020946 WO2001009665A1 (en) 1999-08-02 2000-08-01 Optical beam shaper

Country Status (4)

Country Link
US (1) US6313948B1 (en)
EP (1) EP1198731A4 (en)
CA (1) CA2379561A1 (en)
WO (1) WO2001009665A1 (en)

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US9424634B2 (en) 2004-03-04 2016-08-23 Cybernet Systems Corporation Machine vision system for identifying and sorting projectiles and other objects
US20050226489A1 (en) 2004-03-04 2005-10-13 Glenn Beach Machine vision system for identifying and sorting projectiles and other objects
US7633635B2 (en) 2006-08-07 2009-12-15 GII Acquisitions, LLC Method and system for automatically identifying non-labeled, manufactured parts
US7684054B2 (en) * 2006-08-25 2010-03-23 Gii Acquisition, Llc Profile inspection system for threaded and axial components
US8077389B2 (en) * 2006-12-15 2011-12-13 Okamoto Glass Co., Ltd. Glass polarizer for visible light
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US7403872B1 (en) 2007-04-13 2008-07-22 Gii Acquisition, Llc Method and system for inspecting manufactured parts and sorting the inspected parts
US7738088B2 (en) * 2007-10-23 2010-06-15 Gii Acquisition, Llc Optical method and system for generating calibration data for use in calibrating a part inspection system
US8237935B2 (en) * 2007-10-23 2012-08-07 Gii Acquisition, Llc Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts
US7755754B2 (en) * 2007-10-23 2010-07-13 Gii Acquisition, Llc Calibration device for use in an optical part measuring system
US8550444B2 (en) * 2007-10-23 2013-10-08 Gii Acquisition, Llc Method and system for centering and aligning manufactured parts of various sizes at an optical measurement station
US7633046B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition Llc Method for estimating thread parameters of a part
US7920278B2 (en) * 2007-10-23 2011-04-05 Gii Acquisition, Llc Non-contact method and system for inspecting parts
US7738121B2 (en) * 2007-10-23 2010-06-15 Gii Acquisition, Llc Method and inspection head apparatus for optically measuring geometric dimensions of a part
US8132802B2 (en) * 2007-10-23 2012-03-13 Gii Acquisition, Llc Apparatus for quickly retaining and releasing parts to be optically measured
US7777900B2 (en) * 2007-10-23 2010-08-17 Gii Acquisition, Llc Method and system for optically inspecting parts
US7633634B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition, Llc Optical modules and method of precisely assembling same
US7812970B2 (en) * 2007-10-23 2010-10-12 Gii Acquisition, Llc Method and system for inspecting parts utilizing triangulation
US7796278B2 (en) * 2008-09-19 2010-09-14 Gii Acquisition, Llc Method for precisely measuring position of a part to be inspected at a part inspection station
US8004694B2 (en) * 2009-03-27 2011-08-23 Gll Acquistion LLC System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station
CN103492834B (en) * 2010-09-15 2016-03-30 吴乃恩 For detecting automatic utensil and the method for inspection of pivoting part quality
US8547641B2 (en) 2010-11-09 2013-10-01 Cohernet, Inc. Line-projection apparatus for arrays of diode-laser bar stacks
US8390826B2 (en) 2011-04-20 2013-03-05 Gii Acquisition, Llc Method and system for optically inspecting parts
US9228957B2 (en) 2013-05-24 2016-01-05 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts
US9370799B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
US8570504B2 (en) 2011-05-17 2013-10-29 Gii Acquisition, Llc Method and system for optically inspecting parts
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9575013B2 (en) 2011-05-17 2017-02-21 Gii Acquisition, Llc Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
US9047657B2 (en) 2011-05-17 2015-06-02 Gii Acquisition, Lcc Method and system for optically inspecting outer peripheral surfaces of parts
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US10209200B2 (en) 2012-03-07 2019-02-19 Gil Acquisition, LLC High-speed, 3-D method and system for optically inspecting parts
US8993914B2 (en) 2012-12-14 2015-03-31 Gii Acquisition, Llc High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US9486840B2 (en) 2013-05-24 2016-11-08 Gii Acquisition, Llc High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US8896844B2 (en) 2012-12-14 2014-11-25 Gii Acquisition, Llc High-speed, 3-D method and system for optically measuring a geometric dimension of manufactured parts
EP2965066B1 (en) 2013-03-07 2021-06-09 Mectron Engineering Company, Inc. Inspection system for threaded parts
US9539619B2 (en) 2013-05-24 2017-01-10 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts at a pair of inspection stations
US10207297B2 (en) 2013-05-24 2019-02-19 GII Inspection, LLC Method and system for inspecting a manufactured part at an inspection station
US9372077B2 (en) 2013-08-21 2016-06-21 Gii Acquistion, Llc High-resolution imaging and processing method and system for determining a geometric dimension of a part
US9377297B2 (en) 2013-08-21 2016-06-28 Gii Acquisition, Llc High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined
US10300510B2 (en) 2014-08-01 2019-05-28 General Inspection Llc High speed method and system for inspecting a stream of parts
AT520613A1 (en) 2017-11-13 2019-05-15 Voestalpine Tubulars Gmbh & Co Kg Device for optical measurement of the external thread profile of pipes

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Also Published As

Publication number Publication date
CA2379561A1 (en) 2001-02-08
EP1198731A1 (en) 2002-04-24
EP1198731A4 (en) 2004-08-04
US6313948B1 (en) 2001-11-06
WO2001009665A1 (en) 2001-02-08

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