WO2001038837A8 - Method and apparatus for correcting systematic error in a wavelength measuring device - Google Patents

Method and apparatus for correcting systematic error in a wavelength measuring device

Info

Publication number
WO2001038837A8
WO2001038837A8 PCT/US2000/031057 US0031057W WO0138837A8 WO 2001038837 A8 WO2001038837 A8 WO 2001038837A8 US 0031057 W US0031057 W US 0031057W WO 0138837 A8 WO0138837 A8 WO 0138837A8
Authority
WO
WIPO (PCT)
Prior art keywords
wavelength
reflected
temperature
fbgs
reference fbg
Prior art date
Application number
PCT/US2000/031057
Other languages
French (fr)
Other versions
WO2001038837A1 (en
Inventor
Michael A Davis
David R Fournier
David G Bellemore
Original Assignee
Cidra Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cidra Corp filed Critical Cidra Corp
Priority to CA002391395A priority Critical patent/CA2391395C/en
Priority to DE60025524T priority patent/DE60025524D1/en
Priority to EP00978545A priority patent/EP1236026B1/en
Priority to AU15999/01A priority patent/AU1599901A/en
Publication of WO2001038837A1 publication Critical patent/WO2001038837A1/en
Publication of WO2001038837A8 publication Critical patent/WO2001038837A8/en
Priority to NO20022416A priority patent/NO335932B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/18—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using comparison with a reference electric value

Abstract

A method and apparatus for compensating for systematic error a wavelength measure device, providing values for the wavelengths reflected from fiber Bragg gratings (FBGs) being used as sensors. The invention uses a high-precision temperature sensing and measuring circuit to measure the temperature of a reference FBG. The wavelength reflected by the reference FBG changes with temperature in a known way and the temperature of the reference FBG must be measured to know what wavelength is in fact being reflected. This wavelength is then provided to a dynamic compensator, which also receives the wavelength of light reflected from the sensor FBGs, and adjusts the wavelengths of the sensors FBGs using a correction based on the correction required to adjust the wavelength of the reference FBG so as to agree with the wavelength in fact reflected from the reference FBG. The circuit uses a reference resistor, unaffected by temperature, and a thermistor, and measures both resistances using the same exact circuit components by switching either the thermistor or the reference resistor in to the same temperature sensing and measuring circuit.
PCT/US2000/031057 1999-11-23 2000-11-13 Method and apparatus for correcting systematic error in a wavelength measuring device WO2001038837A1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CA002391395A CA2391395C (en) 1999-11-23 2000-11-13 Method and apparatus for correcting systematic error in a wavelength measuring device
DE60025524T DE60025524D1 (en) 1999-11-23 2000-11-13 METHOD AND DEVICE FOR CORRECTING SYSTEMATIC ERRORS IN A WAVE LENGTH MEASUREMENT DEVICE
EP00978545A EP1236026B1 (en) 1999-11-23 2000-11-13 Method and apparatus for correcting systematic error in a wavelength measuring device
AU15999/01A AU1599901A (en) 1999-11-23 2000-11-13 Method and apparatus for correcting systematic error in a wavelength measuring device
NO20022416A NO335932B1 (en) 1999-11-23 2002-05-22 Method and apparatus for correcting systematic errors in a wavelength measuring device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/448,003 US6403949B1 (en) 1999-11-23 1999-11-23 Method and apparatus for correcting systematic error in a wavelength measuring device
US09/448,003 1999-11-23

Publications (2)

Publication Number Publication Date
WO2001038837A1 WO2001038837A1 (en) 2001-05-31
WO2001038837A8 true WO2001038837A8 (en) 2001-11-29

Family

ID=23778633

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/031057 WO2001038837A1 (en) 1999-11-23 2000-11-13 Method and apparatus for correcting systematic error in a wavelength measuring device

Country Status (7)

Country Link
US (1) US6403949B1 (en)
EP (1) EP1236026B1 (en)
AU (1) AU1599901A (en)
CA (1) CA2391395C (en)
DE (1) DE60025524D1 (en)
NO (1) NO335932B1 (en)
WO (1) WO2001038837A1 (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3829910B2 (en) * 2000-06-29 2006-10-04 横河電機株式会社 Wavelength multiplexed signal light analysis method and apparatus
US7180601B1 (en) * 2000-11-01 2007-02-20 Cidra Corporation Optical system featuring chirped Bragg grating etalon for providing precise reference wavelengths
US6947637B2 (en) * 2001-08-09 2005-09-20 Corning Incorporated Measurement of fiber strain during processing
US6915686B2 (en) 2003-02-11 2005-07-12 Optoplan A.S. Downhole sub for instrumentation
US7159653B2 (en) 2003-02-27 2007-01-09 Weatherford/Lamb, Inc. Spacer sub
US7245382B2 (en) * 2003-10-24 2007-07-17 Optoplan As Downhole optical sensor system with reference
US7145823B2 (en) * 2004-06-30 2006-12-05 Intel Corporation Method and apparatus to implement a temperature control mechanism on a memory device
US7603041B2 (en) * 2005-06-09 2009-10-13 Cubic Corporation Temperature compensated dynamic optical tag modulator system and method
US7413343B2 (en) * 2005-09-16 2008-08-19 Kyocera Wireless Corp. Apparatus for determining a temperature sensing element
TWI262289B (en) * 2005-09-23 2006-09-21 Univ Nat Chiao Tung Optical-fiber raster double-bearing type inclination sensor for sensing stratum displacement
WO2009058890A2 (en) * 2007-10-29 2009-05-07 Cubic Corporation Resonant quantum well modulator driver
JP5215060B2 (en) * 2008-07-02 2013-06-19 テルモ株式会社 Electronic thermometer and operation control method
US9091151B2 (en) 2009-11-19 2015-07-28 Halliburton Energy Services, Inc. Downhole optical radiometry tool
CA2756285C (en) * 2009-12-23 2014-01-07 Halliburton Energy Services, Inc. Interferometry-based downhole analysis tool
BR112012027653A2 (en) 2010-06-01 2016-08-16 Halliburton Energy Services Inc method and system for measuring formation properties
EP2583297A4 (en) 2010-06-16 2013-10-02 Halliburton Energy Serv Inc Downhole sources having enhanced ir emission
TWI445936B (en) 2011-06-03 2014-07-21 Univ Nat Taiwan Science Tech Temperature sensing system for supporting single-point calibration
US9562844B2 (en) 2014-06-30 2017-02-07 Baker Hughes Incorporated Systems and devices for sensing corrosion and deposition for oil and gas applications
WO2016153520A1 (en) * 2015-03-26 2016-09-29 Halliburton Energy Services, Inc. Photopeak location systems and methods
TWI577975B (en) * 2015-06-02 2017-04-11 國立成功大學 Fiber signal scanning device and fiber signal scanning method
US11143786B2 (en) * 2018-07-05 2021-10-12 Halliburton Energy Services, Inc. Intrinsic geological formation carbon to oxygen ratio measurements
US10527784B1 (en) * 2018-11-15 2020-01-07 General Electric Company Systems and methods for providing a stable wavelength reference in an integrated photonic circuit
CN112344973B (en) * 2020-09-27 2022-07-26 北京遥测技术研究所 Fiber grating etalon based on closed cavity metal plate temperature control and use method
US11698308B2 (en) * 2020-10-05 2023-07-11 Openlight Photonics, Inc. Optical temperature measurements in photonic circuits

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE205524C (en)
US4065715A (en) 1975-12-18 1977-12-27 General Motors Corporation Pulse duration modulated signal transducer
US4121461A (en) 1977-11-17 1978-10-24 General Electric Company Electronic temperature sensor
US4488823A (en) 1979-12-31 1984-12-18 Whirlpool Corporation Selective temperature control system
US4315413A (en) 1979-12-31 1982-02-16 Whirlpool Corporation Selective temperature control system
JPS59225324A (en) 1983-06-06 1984-12-18 Terumo Corp Electronic thermometer
US4765184A (en) 1986-02-25 1988-08-23 Delatorre Leroy C High temperature switch
US4841458A (en) 1987-07-07 1989-06-20 Honeywell, Incorporated Analog to digital conversion by measuring the ratio of RC time constants
JPS6439502A (en) 1987-08-05 1989-02-09 Man Design Co Length measuring instrument
SU1506297A1 (en) 1987-12-25 1989-09-07 Уфимский Нефтяной Институт Device for measuring temperature
US5046859A (en) 1988-06-17 1991-09-10 Ricoh Company, Ltd. Temperature measuring device and thermal head device having the same
SU1560989A1 (en) 1988-07-15 1990-04-30 Центральное конструкторское бюро гидрометеорологического приборостроения Digital thermometer of remote measuring of temperature
DE3879211T2 (en) 1988-11-04 1993-09-16 Horiba Ltd TEMPERATURE COMPENSATION CIRCUIT.
US5042898A (en) 1989-12-26 1991-08-27 United Technologies Corporation Incorporated Bragg filter temperature compensated optical waveguide device
US5255975A (en) 1991-11-26 1993-10-26 Honeywell Inc. Low cost calibration system for frequency varying temperature sensing means for a thermostat
GB2269230A (en) 1992-07-31 1994-02-02 Sinar Agritec Ltd Measuring light wavelength.
US5469520A (en) 1994-09-30 1995-11-21 United Technologies Corporation Compression-tuned fiber grating
US5691999A (en) 1994-09-30 1997-11-25 United Technologies Corporation Compression-tuned fiber laser
US5892582A (en) * 1996-10-18 1999-04-06 Micron Optics, Inc. Fabry Perot/fiber Bragg grating multi-wavelength reference
US5838437A (en) 1997-04-09 1998-11-17 Micron Optics, Inc. Reference system for optical devices including optical scanners and spectrum analyzers
US5862170A (en) 1996-11-06 1999-01-19 Lockheed Martin Energy Research Corporation Temperature measurement method using temperature coefficient timing for resistive or capacitive sensors
NO307357B1 (en) 1997-02-14 2000-03-20 Optoplan As Device for painting optical wavelengths
GB2326471B (en) 1997-06-19 2001-05-30 British Aerospace A strain isolated optical fibre bragg grating sensor
US5877426A (en) 1997-06-27 1999-03-02 Cidra Corporation Bourdon tube pressure gauge with integral optical strain sensors for measuring tension or compressive strain
EP0932034B1 (en) 1998-01-27 2004-06-09 Michael Hesky GmbH Temperature measuring and monitoring device

Also Published As

Publication number Publication date
NO20022416L (en) 2002-07-18
NO335932B1 (en) 2015-03-30
DE60025524D1 (en) 2006-04-06
EP1236026A1 (en) 2002-09-04
EP1236026B1 (en) 2006-01-11
AU1599901A (en) 2001-06-04
NO20022416D0 (en) 2002-05-22
CA2391395C (en) 2006-08-22
CA2391395A1 (en) 2001-05-31
US6403949B1 (en) 2002-06-11
WO2001038837A1 (en) 2001-05-31

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